JP2015141899A5 - - Google Patents

Download PDF

Info

Publication number
JP2015141899A5
JP2015141899A5 JP2015012456A JP2015012456A JP2015141899A5 JP 2015141899 A5 JP2015141899 A5 JP 2015141899A5 JP 2015012456 A JP2015012456 A JP 2015012456A JP 2015012456 A JP2015012456 A JP 2015012456A JP 2015141899 A5 JP2015141899 A5 JP 2015141899A5
Authority
JP
Japan
Prior art keywords
sample
image
lens
particle
optical axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2015012456A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015141899A (ja
JP6047592B2 (ja
Filing date
Publication date
Priority claimed from EP14152582.4A external-priority patent/EP2899743B1/en
Application filed filed Critical
Publication of JP2015141899A publication Critical patent/JP2015141899A/ja
Publication of JP2015141899A5 publication Critical patent/JP2015141899A5/ja
Application granted granted Critical
Publication of JP6047592B2 publication Critical patent/JP6047592B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2015012456A 2014-01-27 2015-01-26 相関光学及び荷電粒子顕微鏡 Expired - Fee Related JP6047592B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP14152582.4 2014-01-27
EP14152582.4A EP2899743B1 (en) 2014-01-27 2014-01-27 Correlative optical and charged particle microscope

Publications (3)

Publication Number Publication Date
JP2015141899A JP2015141899A (ja) 2015-08-03
JP2015141899A5 true JP2015141899A5 (OSRAM) 2016-05-19
JP6047592B2 JP6047592B2 (ja) 2016-12-21

Family

ID=49998160

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015012456A Expired - Fee Related JP6047592B2 (ja) 2014-01-27 2015-01-26 相関光学及び荷電粒子顕微鏡

Country Status (4)

Country Link
US (1) US9293297B2 (OSRAM)
EP (1) EP2899743B1 (OSRAM)
JP (1) JP6047592B2 (OSRAM)
CN (1) CN104810230B (OSRAM)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9564291B1 (en) * 2014-01-27 2017-02-07 Mochii, Inc. Hybrid charged-particle beam and light beam microscopy
DE102014103360A1 (de) 2014-03-12 2015-09-17 Leibniz-Institut Für Neue Materialien Gemeinnützige Gmbh Vorrichtung für die korrelative Raster-Transmissionselektronenmikroskopie (STEM) und Lichtmikroskopie
DE102014108331A1 (de) 2014-06-13 2015-12-17 Leibniz-Institut Für Neue Materialien Gemeinnützige Gesellschaft Mit Beschränkter Haftung Spezifische Proteinmarkierung sowie Verfahren zur Identifizierung der statistischen Verteilung der Proteinstöchiometrie
DE102014108825A1 (de) * 2014-06-24 2015-12-24 Leibniz-Institut Für Neue Materialien Gemeinnützige Gesellschaft Mit Beschränkter Haftung Vorrichtung und Verfahren für die stöchiometrische Analyse von Proben
US10176567B2 (en) * 2015-12-21 2019-01-08 Canon Kabushiki Kaisha Physical registration of images acquired by Fourier Ptychography
WO2017216941A1 (ja) 2016-06-17 2017-12-21 株式会社 日立ハイテクノロジーズ 荷電粒子線装置
US10176963B2 (en) 2016-12-09 2019-01-08 Waviks, Inc. Method and apparatus for alignment of optical and charged-particle beams in an electron microscope
JP6739668B2 (ja) * 2017-04-27 2020-08-12 キング・アブドゥッラー・ユニバーシティ・オブ・サイエンス・アンド・テクノロジー 画像系列整列システム及び方法
JP6775003B2 (ja) * 2018-12-26 2020-10-28 株式会社日立ハイテク 荷電粒子線装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6373070B1 (en) 1999-10-12 2002-04-16 Fei Company Method apparatus for a coaxial optical microscope with focused ion beam
TW200703409A (en) * 2005-03-03 2007-01-16 Ebara Corp Mapping projection type electron beam apparatus and defects inspection system using such apparatus
EP1724809A1 (en) * 2005-05-18 2006-11-22 FEI Company Particle-optical apparatus for the irradiation of a sample
EP1953791A1 (en) 2007-02-05 2008-08-06 FEI Company Apparatus for observing a sample with a particle beam and an optical microscope
US7781733B2 (en) * 2007-05-16 2010-08-24 International Business Machines Corporation In-situ high-resolution light-optical channel for optical viewing and surface processing in parallel with charged particle (FIB and SEM) techniques
JP2008300354A (ja) 2007-05-31 2008-12-11 Fei Co 荷電粒子装置内での試料キャリアの使用、当該試料キャリアの使用方法、及び当該試料キャリアを用いるように備えられた装置
JP5276860B2 (ja) * 2008-03-13 2013-08-28 株式会社日立ハイテクノロジーズ 走査電子顕微鏡
JP5842308B2 (ja) * 2010-04-06 2016-01-13 大学共同利用機関法人自然科学研究機構 複合顕微鏡装置
US8698098B2 (en) * 2010-07-30 2014-04-15 E.A. Fischione Instruments, Inc. In situ holder assembly
JP5814741B2 (ja) * 2011-10-20 2015-11-17 株式会社日立ハイテクノロジーズ 走査電子顕微鏡

Similar Documents

Publication Publication Date Title
JP6047592B2 (ja) 相関光学及び荷電粒子顕微鏡
JP2015141899A5 (OSRAM)
CN101241087B (zh) 用于通过粒子束和光学显微镜观测样品的设备
Mayo et al. Quantitative X‐ray projection microscopy: phase‐contrast and multi‐spectral imaging
US8476588B2 (en) Method of electron diffraction tomography
Le Gros et al. Biological soft X-ray tomography on beamline 2.1 at the Advanced Light Source
JP5354850B2 (ja) 表面分析用分光装置と分析方法
US20150055745A1 (en) Phase Contrast Imaging Using Patterned Illumination/Detector and Phase Mask
JP7577403B2 (ja) サンプルからエネルギー分析器および電子分光計装置への電子伝達のための装置および方法
JP2003014667A (ja) 電子線を用いた観察装置及び観察方法
JP5842308B2 (ja) 複合顕微鏡装置
JP5002604B2 (ja) 偏光位相顕微鏡
Kaech Introduction to Electron Microscopy
CN114730684A (zh) 阴极射线发光电子显微镜
Matsuyama et al. Development of X-ray imaging of intracellular elements and structure
JP7278983B2 (ja) マルチビーム走査透過荷電粒子顕微鏡
US20250166956A1 (en) Transmission electron microscopy with square beams
JPWO2007058182A1 (ja) 位相差電子顕微鏡装置
CN119731762A (zh) 用于样品材料的多模态分析的装置
EP4391007A1 (en) Pole piece incorporating optical cavity for improved phase-contrast in electron microscope imaging
CN104819987B (zh) 一种超高谱分辨的x射线掠入射显微成像系统
JP6636061B2 (ja) Tem内での特徴のない薄膜の位置合わせ
Tromp Catadioptric aberration correction in cathode lens microscopy
JP2005127967A (ja) 高分解能・化学結合電子・2次イオン顕微鏡装置
Le Gros et al. ARTICLE IN PRESS–J. Synchrotron Rad.