JP2015125084A5 - - Google Patents

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Publication number
JP2015125084A5
JP2015125084A5 JP2013270762A JP2013270762A JP2015125084A5 JP 2015125084 A5 JP2015125084 A5 JP 2015125084A5 JP 2013270762 A JP2013270762 A JP 2013270762A JP 2013270762 A JP2013270762 A JP 2013270762A JP 2015125084 A5 JP2015125084 A5 JP 2015125084A5
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JP
Japan
Prior art keywords
reflective film
light
wavelength
interference filter
observation apparatus
Prior art date
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Application number
JP2013270762A
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English (en)
Japanese (ja)
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JP2015125084A (ja
JP6323004B2 (ja
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Priority to JP2013270762A priority Critical patent/JP6323004B2/ja
Priority claimed from JP2013270762A external-priority patent/JP6323004B2/ja
Publication of JP2015125084A publication Critical patent/JP2015125084A/ja
Publication of JP2015125084A5 publication Critical patent/JP2015125084A5/ja
Application granted granted Critical
Publication of JP6323004B2 publication Critical patent/JP6323004B2/ja
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JP2013270762A 2013-12-27 2013-12-27 蛍光観察装置、及び光学部材 Active JP6323004B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2013270762A JP6323004B2 (ja) 2013-12-27 2013-12-27 蛍光観察装置、及び光学部材

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013270762A JP6323004B2 (ja) 2013-12-27 2013-12-27 蛍光観察装置、及び光学部材

Publications (3)

Publication Number Publication Date
JP2015125084A JP2015125084A (ja) 2015-07-06
JP2015125084A5 true JP2015125084A5 (he) 2017-01-19
JP6323004B2 JP6323004B2 (ja) 2018-05-16

Family

ID=53535877

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013270762A Active JP6323004B2 (ja) 2013-12-27 2013-12-27 蛍光観察装置、及び光学部材

Country Status (1)

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JP (1) JP6323004B2 (he)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10724958B2 (en) * 2017-11-06 2020-07-28 Senors Unlimited, Inc. Imaging devices, imaging arrangements, and imaging methods
JP2019148540A (ja) * 2018-02-28 2019-09-05 セイコーエプソン株式会社 光測定装置、及び電子機器
KR102380565B1 (ko) * 2020-09-18 2022-03-30 (주)얼라인드제네틱스 시료의 형광을 검출하기 위한 시료 검사 장치

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5852498A (en) * 1997-04-04 1998-12-22 Kairos Scientific Inc. Optical instrument having a variable optical filter
US8395770B1 (en) * 2004-10-05 2013-03-12 Photon Systems Spectroscopic chemical analysis methods and apparatus
US7764361B2 (en) * 2006-07-27 2010-07-27 Northwestern University Systems and methods to analyze multiplexed bead-based assays using backscattered light
JP4669995B2 (ja) * 2006-08-02 2011-04-13 ナノフォトン株式会社 光学顕微鏡及び観察方法
JP2010197173A (ja) * 2009-02-24 2010-09-09 Sumitomo Electric Ind Ltd 異物の識別方法
JP4979777B2 (ja) * 2010-01-18 2012-07-18 オリンパス株式会社 顕微鏡画像処理装置
JP6010275B2 (ja) * 2010-03-15 2016-10-19 セイコーエプソン株式会社 光フィルター並びにそれを用いた分析機器及び光機器
US10564412B2 (en) * 2010-12-10 2020-02-18 Nkt Photonics A/S Tunable filter including an angular dispersive element for a broad band source
WO2013108626A1 (ja) * 2012-01-18 2013-07-25 株式会社ニコン 構造化照明装置、構造化照明顕微鏡装置、構造化照明方法

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