JP2015055480A5 - - Google Patents

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Publication number
JP2015055480A5
JP2015055480A5 JP2013187173A JP2013187173A JP2015055480A5 JP 2015055480 A5 JP2015055480 A5 JP 2015055480A5 JP 2013187173 A JP2013187173 A JP 2013187173A JP 2013187173 A JP2013187173 A JP 2013187173A JP 2015055480 A5 JP2015055480 A5 JP 2015055480A5
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JP
Japan
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light
image
optical system
optical
dimensional
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JP2013187173A
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Japanese (ja)
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JP2015055480A (ja
JP6260157B2 (ja
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Publication of JP2015055480A5 publication Critical patent/JP2015055480A5/ja
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JP2013187173A 2013-09-10 2013-09-10 分光測定装置 Expired - Fee Related JP6260157B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2013187173A JP6260157B2 (ja) 2013-09-10 2013-09-10 分光測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2013187173A JP6260157B2 (ja) 2013-09-10 2013-09-10 分光測定装置

Publications (3)

Publication Number Publication Date
JP2015055480A JP2015055480A (ja) 2015-03-23
JP2015055480A5 true JP2015055480A5 (fr) 2016-09-08
JP6260157B2 JP6260157B2 (ja) 2018-01-17

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Family Applications (1)

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JP2013187173A Expired - Fee Related JP6260157B2 (ja) 2013-09-10 2013-09-10 分光測定装置

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JP (1) JP6260157B2 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107727232B (zh) * 2017-10-24 2023-07-04 中国科学院上海技术物理研究所 一种几何配准测试装置和方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4678332A (en) * 1984-02-21 1987-07-07 Dan Rock Broadband spectrometer with fiber optic reformattor
TWI292030B (en) * 2006-01-13 2008-01-01 Ind Tech Res Inst High density multi-channel detecting device
JP2009287979A (ja) * 2008-05-27 2009-12-10 Sony Corp 光計測装置及び光計測装置のフォーカス調整方法
JP2010002255A (ja) * 2008-06-19 2010-01-07 Topcon Corp 測定用光学系
JP2010025558A (ja) * 2008-07-15 2010-02-04 Topcon Corp 測定用光学系
CN102435311B (zh) * 2011-09-07 2014-05-07 杭州远方光电信息股份有限公司 一种光纤束光谱仪
US20150022810A1 (en) * 2012-01-30 2015-01-22 Shimadzu Corporation Spectrophotometer and image partial extraction device

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