JP2015046381A5 - - Google Patents

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Publication number
JP2015046381A5
JP2015046381A5 JP2014146622A JP2014146622A JP2015046381A5 JP 2015046381 A5 JP2015046381 A5 JP 2015046381A5 JP 2014146622 A JP2014146622 A JP 2014146622A JP 2014146622 A JP2014146622 A JP 2014146622A JP 2015046381 A5 JP2015046381 A5 JP 2015046381A5
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JP
Japan
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voltage
sample
mass
pulse
application
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JP2014146622A
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English (en)
Japanese (ja)
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JP6339883B2 (ja
JP2015046381A (ja
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Publication of JP2015046381A5 publication Critical patent/JP2015046381A5/ja
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JP2014146622A 2013-08-02 2014-07-17 イオン化装置、それを有する質量分析装置及び画像作成システム Active JP6339883B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2014146622A JP6339883B2 (ja) 2013-08-02 2014-07-17 イオン化装置、それを有する質量分析装置及び画像作成システム

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2013160898 2013-08-02
JP2013160898 2013-08-02
JP2014146622A JP6339883B2 (ja) 2013-08-02 2014-07-17 イオン化装置、それを有する質量分析装置及び画像作成システム

Publications (3)

Publication Number Publication Date
JP2015046381A JP2015046381A (ja) 2015-03-12
JP2015046381A5 true JP2015046381A5 (https=) 2017-08-24
JP6339883B2 JP6339883B2 (ja) 2018-06-06

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JP2014146622A Active JP6339883B2 (ja) 2013-08-02 2014-07-17 イオン化装置、それを有する質量分析装置及び画像作成システム

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US (1) US8957370B1 (https=)
JP (1) JP6339883B2 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8519330B2 (en) * 2010-10-01 2013-08-27 Ut-Battelle, Llc Systems and methods for laser assisted sample transfer to solution for chemical analysis
JP5955033B2 (ja) * 2012-03-01 2016-07-20 キヤノン株式会社 イオン化方法、質量分析方法、抽出方法及び精製方法
US9269557B2 (en) * 2012-09-07 2016-02-23 Canon Kabushiki Kaisha Ionization device, mass spectrometer including the ionization device, and image generation system including the ionization device
JP2015032463A (ja) * 2013-08-02 2015-02-16 キヤノン株式会社 質量分析装置、質量分析方法および画像化システム
JP6437002B2 (ja) * 2013-12-24 2018-12-12 ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド 高速極性スイッチ飛行時間型質量分析計
JP2015107391A (ja) * 2015-03-09 2015-06-11 株式会社大一商会 遊技機
WO2017098600A1 (ja) * 2015-12-09 2017-06-15 株式会社日立製作所 イオン化装置
US11361955B2 (en) 2018-01-26 2022-06-14 Shimadzu Corporation Probe electrospray ionization mass spectrometer
CN112243496B (zh) * 2018-05-31 2025-01-07 株式会社岛津制作所 探针电喷雾离子化质谱分析装置
US11600481B2 (en) * 2019-07-11 2023-03-07 West Virginia University Devices and processes for mass spectrometry utilizing vibrating sharp-edge spray ionization

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5396065A (en) * 1993-12-21 1995-03-07 Hewlett-Packard Company Sequencing ion packets for ion time-of-flight mass spectrometry
WO2003065405A1 (fr) * 2002-01-31 2003-08-07 Hitachi High-Technologies Corporation Spectrometre de masse a ionisation par electrospray et procede associe
JP2005098909A (ja) * 2003-09-26 2005-04-14 Shimadzu Corp イオン化装置およびこれを用いた質量分析装置
CA2571728A1 (en) * 2004-07-01 2006-02-09 Ciphergen Biosystems, Inc. Dynamic biasing of ion optics in a mass spectrometer
US7408151B2 (en) * 2004-07-01 2008-08-05 Bio-Rad Laboratories, Inc. Dynamic biasing of ion optics in a mass spectrometer
JP2007165116A (ja) * 2005-12-14 2007-06-28 Shimadzu Corp 質量分析装置
JP2009074987A (ja) * 2007-09-21 2009-04-09 Sii Nanotechnology Inc 走査型プローブ顕微鏡及び表面情報測定方法
JP5955033B2 (ja) 2012-03-01 2016-07-20 キヤノン株式会社 イオン化方法、質量分析方法、抽出方法及び精製方法
JP5955032B2 (ja) 2012-03-01 2016-07-20 キヤノン株式会社 イオン化方法、質量分析方法、抽出方法及び精製方法
US9269557B2 (en) * 2012-09-07 2016-02-23 Canon Kabushiki Kaisha Ionization device, mass spectrometer including the ionization device, and image generation system including the ionization device
US9058966B2 (en) * 2012-09-07 2015-06-16 Canon Kabushiki Kaisha Ionization device, mass spectrometer including ionization device, image display system including mass spectrometer, and analysis method
US8710436B2 (en) * 2012-09-07 2014-04-29 Canon Kabushiki Kaisha Ionization device, mass spectrometer including the ionization device, and image generation system including the ionization device

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