JP2015038473A5 - - Google Patents

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Publication number
JP2015038473A5
JP2015038473A5 JP2014146027A JP2014146027A JP2015038473A5 JP 2015038473 A5 JP2015038473 A5 JP 2015038473A5 JP 2014146027 A JP2014146027 A JP 2014146027A JP 2014146027 A JP2014146027 A JP 2014146027A JP 2015038473 A5 JP2015038473 A5 JP 2015038473A5
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JP
Japan
Prior art keywords
combinational circuit
scan
seed
xor network
lfsr
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JP2014146027A
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English (en)
Japanese (ja)
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JP6391336B2 (ja
JP2015038473A (ja
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Priority to JP2014146027A priority Critical patent/JP6391336B2/ja
Priority claimed from JP2014146027A external-priority patent/JP6391336B2/ja
Priority to PCT/JP2014/069103 priority patent/WO2015008843A1/ja
Publication of JP2015038473A publication Critical patent/JP2015038473A/ja
Publication of JP2015038473A5 publication Critical patent/JP2015038473A5/ja
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Publication of JP6391336B2 publication Critical patent/JP6391336B2/ja
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JP2014146027A 2013-07-17 2014-07-16 スキャンｂｉｓｔのｌｆｓｒシード生成法及びそのプログラムを記憶する記憶媒体 Active JP6391336B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2014146027A JP6391336B2 (ja) 2013-07-17 2014-07-16 スキャンｂｉｓｔのｌｆｓｒシード生成法及びそのプログラムを記憶する記憶媒体
PCT/JP2014/069103 WO2015008843A1 (ja) 2013-07-17 2014-07-17 スキャンｂｉｓｔのｌｆｓｒシード生成法及びそのプログラムを記憶する記憶媒体

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2013148812 2013-07-17
JP2013148663 2013-07-17
JP2013148663 2013-07-17
JP2013148812 2013-07-17
JP2014146027A JP6391336B2 (ja) 2013-07-17 2014-07-16 スキャンｂｉｓｔのｌｆｓｒシード生成法及びそのプログラムを記憶する記憶媒体

Publications (3)

Publication Number Publication Date
JP2015038473A JP2015038473A (ja) 2015-02-26
JP2015038473A5 true JP2015038473A5 (enExample) 2015-04-09
JP6391336B2 JP6391336B2 (ja) 2018-09-19

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ID=52346285

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JP2014146027A Active JP6391336B2 (ja) 2013-07-17 2014-07-16 スキャンｂｉｓｔのｌｆｓｒシード生成法及びそのプログラムを記憶する記憶媒体

Country Status (2)

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JP (1) JP6391336B2 (enExample)
WO (1) WO2015008843A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7083728B2 (ja) * 2018-08-24 2022-06-13 ルネサスエレクトロニクス株式会社 自己診断装置、半導体装置及び自己診断方法
JP2022017646A (ja) 2020-07-14 2022-01-26 ソニーセミコンダクタソリューションズ株式会社 固体撮像素子、車両制御システム、および、固体撮像素子の制御方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55123744A (en) * 1979-03-15 1980-09-24 Nec Corp Logic integrated circuit easy to check
US6611933B1 (en) * 2000-04-12 2003-08-26 International Business Machines Corporation Real-time decoder for scan test patterns

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