JP2016518745A5 - - Google Patents

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Publication number
JP2016518745A5
JP2016518745A5 JP2016502907A JP2016502907A JP2016518745A5 JP 2016518745 A5 JP2016518745 A5 JP 2016518745A5 JP 2016502907 A JP2016502907 A JP 2016502907A JP 2016502907 A JP2016502907 A JP 2016502907A JP 2016518745 A5 JP2016518745 A5 JP 2016518745A5
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JP
Japan
Prior art keywords
illustrates
test environment
accordance
timing diagram
exemplary embodiments
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Ceased
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JP2016502907A
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English (en)
Japanese (ja)
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JP2016518745A (ja
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Priority claimed from US13/894,817 external-priority patent/US9077535B2/en
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Publication of JP2016518745A publication Critical patent/JP2016518745A/ja
Publication of JP2016518745A5 publication Critical patent/JP2016518745A5/ja
Ceased legal-status Critical Current

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JP2016502907A 2013-03-15 2014-03-14 データストリーム低減を強制しつつ無線周波多重入出力データパケットトランシーバをテストするためのシステム及び方法 Ceased JP2016518745A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201361799296P 2013-03-15 2013-03-15
US61/799,296 2013-03-15
US13/894,817 2013-05-15
US13/894,817 US9077535B2 (en) 2013-03-15 2013-05-15 System and method for testing a radio frequency multiple-input multiple-output data packet transceiver while forcing fewer data streams
PCT/US2014/028809 WO2014144410A1 (en) 2013-03-15 2014-03-14 System and method for testing a radio frequency multiple-input multiple-output data packet transceiver while forcing fewer data streams

Publications (2)

Publication Number Publication Date
JP2016518745A JP2016518745A (ja) 2016-06-23
JP2016518745A5 true JP2016518745A5 (enExample) 2017-04-06

Family

ID=51526928

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016502907A Ceased JP2016518745A (ja) 2013-03-15 2014-03-14 データストリーム低減を強制しつつ無線周波多重入出力データパケットトランシーバをテストするためのシステム及び方法

Country Status (5)

Country Link
US (1) US9077535B2 (enExample)
JP (1) JP2016518745A (enExample)
KR (1) KR20150130341A (enExample)
CN (1) CN105164946B (enExample)
WO (1) WO2014144410A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014149814A1 (en) * 2013-03-15 2014-09-25 Vivint, Inc. Bandwidth estimation based on location in a wireless network
US9871601B2 (en) * 2015-09-14 2018-01-16 Litepoint Corporation Method for testing a low power radio frequency (RF) data packet signal transceiver
CN109039486A (zh) * 2018-07-26 2018-12-18 Oppo广东移动通信有限公司 多用户多入多出设备通信性能测试系统、方法及装置
US11575450B2 (en) * 2018-10-26 2023-02-07 Qualcomm Incorporated Self-radiated loopback test procedure for millimeter wave antennas
US12362867B2 (en) 2021-08-17 2025-07-15 Litepoint Corporation System and method for using a tester to perform time-switched multiple input, multiple output (MIMO) data packet signal analysis
US12407426B2 (en) 2022-05-12 2025-09-02 Litepoint Corporation Probes for device testing
CN118859066A (zh) 2023-04-26 2024-10-29 莱特普茵特公司 从功率谱密度测量值移除测试设备噪声
CN118859067A (zh) 2023-04-26 2024-10-29 莱特普茵特公司 从功率谱密度测量值移除测试设备互调干扰和噪声

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040187049A1 (en) 2003-02-27 2004-09-23 Nptest, Inc. Very small pin count IC tester
EP1583265B1 (en) 2004-04-01 2012-12-12 Intel Mobile Communications GmbH Methods for calibrating a transmitter and a receiver path of a communication device and test system therefor
JP4665559B2 (ja) 2005-03-04 2011-04-06 日本電気株式会社 プリエンファシス調整方法、受信装置、送信装置、及び、信号伝送システム
US7379716B2 (en) 2005-03-24 2008-05-27 University Of Florida Research Foundation, Inc. Embedded IC test circuits and methods
US8913517B2 (en) 2005-06-01 2014-12-16 Litepoint Corporation Method for measuring sensitivity of data packet signal receiver
US20070243826A1 (en) * 2006-04-13 2007-10-18 Accton Technology Corporation Testing apparatus and method for a multi-paths simulating system
US7689213B2 (en) 2006-04-14 2010-03-30 Litepoint Corp. Method for testing embedded wireless transceiver with minimal interaction between wireless transceiver and host processor during testing
US7962823B2 (en) * 2006-06-06 2011-06-14 Litepoint Corporation System and method for testing multiple packet data transmitters
DE102008018385A1 (de) * 2008-04-11 2009-10-15 Rohde & Schwarz Gmbh & Co. Kg Testgerät zum Testen der Übertragungsqualität eines Funkgeräts
US8030959B2 (en) 2008-06-12 2011-10-04 Texas Instruments Incorporated Device-under-test power management
US7773531B2 (en) 2008-07-10 2010-08-10 Litepoint Corporation Method for testing data packet transceiver using loop back packet generation
US7948254B2 (en) * 2008-11-20 2011-05-24 Litepoint Corporation Digital communications test system for multiple input, multiple output (MIMO) systems
US8412112B2 (en) 2009-05-06 2013-04-02 Ets-Lindgren, L.P. Systems and methods for simulating a multipath radio frequency environment
EP2432073A4 (en) * 2009-05-12 2014-12-24 Panasonic Ip Corp America ANTENNA ASSESSMENT APPARATUS AND ANTENNA ASSESSMENT METHOD
US8811194B2 (en) * 2010-09-01 2014-08-19 Litepoint Corporation Method for testing wireless devices using predefined test segments initiated by over-the-air signal characteristics
US20120100813A1 (en) 2010-10-20 2012-04-26 Mow Matt A System for testing multi-antenna devices using bidirectional faded channels
US8811192B2 (en) * 2011-02-10 2014-08-19 Apple Inc. Methods for testing wireless local area network transceivers in wireless electronic devices
US8576947B2 (en) * 2011-04-19 2013-11-05 Litepoint Corporation System and method for simultaneous MIMO signal testing with single vector signal analyzer
US8312329B1 (en) * 2011-06-13 2012-11-13 Litepoint Corporation System and method for using a single vector signal generator to verify device under test
US8693351B2 (en) 2011-07-26 2014-04-08 Litepoint Corporation System and method for deterministic testing of packet error rate in electronic devices
US9002290B2 (en) * 2012-05-09 2015-04-07 Litepoint Corporation System and method for testing a radio frequency (RF) multiple-input-multiple-output (MIMO) device under test (DUT)
US8995926B2 (en) * 2012-09-27 2015-03-31 Apple Inc. Methods and apparatus for performing coexistence testing for multi-antenna electronic devices
US9094840B2 (en) * 2013-01-10 2015-07-28 Apple Inc. Methods for testing receiver sensitivity of wireless electronic devices
US9369369B2 (en) * 2013-03-05 2016-06-14 Ixia Systems and methods for using protocol information to trigger waveform analysis

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