JP2014195040A - Led素子の製造方法、led素子製造用ウェハ基材およびled素子の製造装置 - Google Patents

Led素子の製造方法、led素子製造用ウェハ基材およびled素子の製造装置 Download PDF

Info

Publication number
JP2014195040A
JP2014195040A JP2013213701A JP2013213701A JP2014195040A JP 2014195040 A JP2014195040 A JP 2014195040A JP 2013213701 A JP2013213701 A JP 2013213701A JP 2013213701 A JP2013213701 A JP 2013213701A JP 2014195040 A JP2014195040 A JP 2014195040A
Authority
JP
Japan
Prior art keywords
led element
led
manufacturing
wafer
scribe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2013213701A
Other languages
English (en)
Japanese (ja)
Inventor
Fumiyoshi Nakatani
郁祥 中谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsuboshi Diamond Industrial Co Ltd
Original Assignee
Mitsuboshi Diamond Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsuboshi Diamond Industrial Co Ltd filed Critical Mitsuboshi Diamond Industrial Co Ltd
Priority to JP2013213701A priority Critical patent/JP2014195040A/ja
Publication of JP2014195040A publication Critical patent/JP2014195040A/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • H01L33/0095Post-treatment of devices, e.g. annealing, recrystallisation or short-circuit elimination
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • H01L33/0093Wafer bonding; Removal of the growth substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/075Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00
    • H01L25/0753Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00 the devices being arranged next to each other
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/483Containers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2933/00Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
    • H01L2933/0008Processes
    • H01L2933/0033Processes relating to semiconductor body packages

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Dicing (AREA)
  • Laser Beam Processing (AREA)
  • Drying Of Semiconductors (AREA)
  • Led Devices (AREA)
JP2013213701A 2013-02-27 2013-10-11 Led素子の製造方法、led素子製造用ウェハ基材およびled素子の製造装置 Pending JP2014195040A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2013213701A JP2014195040A (ja) 2013-02-27 2013-10-11 Led素子の製造方法、led素子製造用ウェハ基材およびled素子の製造装置

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
JP2013037367 2013-02-27
JP2013037368 2013-02-27
JP2013037369 2013-02-27
JP2013037370 2013-02-27
JP2013037368 2013-02-27
JP2013037369 2013-02-27
JP2013037367 2013-02-27
JP2013037370 2013-02-27
JP2013213701A JP2014195040A (ja) 2013-02-27 2013-10-11 Led素子の製造方法、led素子製造用ウェハ基材およびled素子の製造装置

Publications (1)

Publication Number Publication Date
JP2014195040A true JP2014195040A (ja) 2014-10-09

Family

ID=51369710

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013213701A Pending JP2014195040A (ja) 2013-02-27 2013-10-11 Led素子の製造方法、led素子製造用ウェハ基材およびled素子の製造装置

Country Status (4)

Country Link
JP (1) JP2014195040A (zh)
KR (1) KR20140107121A (zh)
CN (1) CN104009129A (zh)
TW (1) TW201436017A (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20160051552A (ko) 2014-10-31 2016-05-11 미쓰보시 다이야몬도 고교 가부시키가이샤 브레이크 장치, 브레이크 장치로의 브레이크날의 부착 방법 및, 브레이크날용 카트리지
KR20160051554A (ko) 2014-10-31 2016-05-11 미쓰보시 다이야몬도 고교 가부시키가이샤 브레이크 장치

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109148559A (zh) * 2017-06-28 2019-01-04 矽创电子股份有限公司 晶圆结构
CN107946284B (zh) * 2017-11-03 2021-11-02 马鞍山太时芯光科技有限公司 一种led芯片切割道标识及其制作方法
CN111384200A (zh) * 2018-12-28 2020-07-07 北京铂阳顶荣光伏科技有限公司 一种太阳能电池的制备方法

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07169715A (ja) * 1993-10-21 1995-07-04 Nichia Chem Ind Ltd 窒化ガリウム系化合物半導体チップの製造方法
JP2002192368A (ja) * 2000-09-13 2002-07-10 Hamamatsu Photonics Kk レーザ加工装置
JP2004259846A (ja) * 2003-02-25 2004-09-16 Ogura Jewel Ind Co Ltd 基板上形成素子の分離方法
JP2005166728A (ja) * 2003-11-28 2005-06-23 Mitsubishi Cable Ind Ltd 窒化物系半導体素子の製造方法
JP2010225787A (ja) * 2009-03-23 2010-10-07 Yamaguchi Univ サファイア基板の製造方法、および半導体装置
CN101908505A (zh) * 2010-06-24 2010-12-08 上海蓝光科技有限公司 一种发光二极管芯片的制造方法
WO2011090024A1 (ja) * 2010-01-19 2011-07-28 シャープ株式会社 機能素子およびその製造方法
US20120175652A1 (en) * 2011-01-06 2012-07-12 Electro Scientific Industries, Inc. Method and apparatus for improved singulation of light emitting devices

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1756857B1 (en) * 2004-06-11 2013-08-14 Showa Denko K.K. Production method of compound semiconductor device wafer
US9138913B2 (en) * 2005-09-08 2015-09-22 Imra America, Inc. Transparent material processing with an ultrashort pulse laser
JP5060880B2 (ja) * 2007-09-11 2012-10-31 三星ダイヤモンド工業株式会社 脆性材料基板の分断装置および分断方法
US8217488B2 (en) * 2010-07-19 2012-07-10 Walsin Lihwa Corporation GaN light emitting diode and method for increasing light extraction on GaN light emitting diode via sapphire shaping
CN102569543B (zh) * 2010-12-30 2015-09-02 比亚迪股份有限公司 一种发光二极管芯片的制作方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07169715A (ja) * 1993-10-21 1995-07-04 Nichia Chem Ind Ltd 窒化ガリウム系化合物半導体チップの製造方法
JP2002192368A (ja) * 2000-09-13 2002-07-10 Hamamatsu Photonics Kk レーザ加工装置
JP2004259846A (ja) * 2003-02-25 2004-09-16 Ogura Jewel Ind Co Ltd 基板上形成素子の分離方法
JP2005166728A (ja) * 2003-11-28 2005-06-23 Mitsubishi Cable Ind Ltd 窒化物系半導体素子の製造方法
JP2010225787A (ja) * 2009-03-23 2010-10-07 Yamaguchi Univ サファイア基板の製造方法、および半導体装置
WO2011090024A1 (ja) * 2010-01-19 2011-07-28 シャープ株式会社 機能素子およびその製造方法
CN101908505A (zh) * 2010-06-24 2010-12-08 上海蓝光科技有限公司 一种发光二极管芯片的制造方法
US20120175652A1 (en) * 2011-01-06 2012-07-12 Electro Scientific Industries, Inc. Method and apparatus for improved singulation of light emitting devices

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20160051552A (ko) 2014-10-31 2016-05-11 미쓰보시 다이야몬도 고교 가부시키가이샤 브레이크 장치, 브레이크 장치로의 브레이크날의 부착 방법 및, 브레이크날용 카트리지
KR20160051554A (ko) 2014-10-31 2016-05-11 미쓰보시 다이야몬도 고교 가부시키가이샤 브레이크 장치

Also Published As

Publication number Publication date
KR20140107121A (ko) 2014-09-04
TW201436017A (zh) 2014-09-16
CN104009129A (zh) 2014-08-27

Similar Documents

Publication Publication Date Title
US9789566B2 (en) Manufacturing method of substrate, cutting method of processing object and laser processing apparatus
US7241667B2 (en) Method of separating layers of material
JP5494592B2 (ja) Ledパターン付き基板の加工方法
US20150214432A1 (en) Optical device and manufacturing method therefor
JP2013042119A (ja) 発光素子の製造方法
WO2014030519A1 (ja) 加工対象物切断方法
US9531154B2 (en) Lift-off method
JP5732685B2 (ja) 結晶性膜、デバイス、及び、結晶性膜又はデバイスの製造方法
WO2013176089A1 (ja) 加工対象物切断方法、加工対象物、及び、半導体素子
TW201041027A (en) Method of manufacturing a semiconductor element
JP6620825B2 (ja) 半導体素子の製造方法
JP2011181909A (ja) 半導体チップ製造方法
JP2014195040A (ja) Led素子の製造方法、led素子製造用ウェハ基材およびled素子の製造装置
WO2014030520A1 (ja) 加工対象物切断方法
TW201130591A (en) Method for cutting workpiece
US20150207297A1 (en) Optical device and manufacturing method therefor
TW202010010A (zh) 光元件晶圓加工方法
JP2013027887A (ja) レーザダイシング方法
WO2014012322A1 (zh) 倒装焊氮化物发光二极管及其透光衬底和制造方法
KR20120069302A (ko) 레이저 리프트 오프 장치
WO2014030517A1 (ja) 加工対象物切断方法
JP2015162565A (ja) Ledパターン付き基板とその製造方法およびled素子の製造方法
JP2015144180A (ja) Led素子製造用ウェハとその作製方法、およびled素子
JP2013118413A (ja) Ledチップ
JP6020505B2 (ja) レーザリフトオフ装置

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20160826

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20170428

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20170516

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20171107