JP2014115109A - 距離計測装置及び方法 - Google Patents

距離計測装置及び方法 Download PDF

Info

Publication number
JP2014115109A
JP2014115109A JP2012267557A JP2012267557A JP2014115109A JP 2014115109 A JP2014115109 A JP 2014115109A JP 2012267557 A JP2012267557 A JP 2012267557A JP 2012267557 A JP2012267557 A JP 2012267557A JP 2014115109 A JP2014115109 A JP 2014115109A
Authority
JP
Japan
Prior art keywords
unit
projection
measurement
target object
distance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2012267557A
Other languages
English (en)
Japanese (ja)
Other versions
JP2014115109A5 (enExample
Inventor
Hiroyuki Osawa
弘幸 大澤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2012267557A priority Critical patent/JP2014115109A/ja
Priority to US14/097,080 priority patent/US9835438B2/en
Publication of JP2014115109A publication Critical patent/JP2014115109A/ja
Publication of JP2014115109A5 publication Critical patent/JP2014115109A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10141—Special mode during image acquisition
    • G06T2207/10152—Varying illumination

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2012267557A 2012-12-06 2012-12-06 距離計測装置及び方法 Pending JP2014115109A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2012267557A JP2014115109A (ja) 2012-12-06 2012-12-06 距離計測装置及び方法
US14/097,080 US9835438B2 (en) 2012-12-06 2013-12-04 Distance measuring apparatus and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012267557A JP2014115109A (ja) 2012-12-06 2012-12-06 距離計測装置及び方法

Publications (2)

Publication Number Publication Date
JP2014115109A true JP2014115109A (ja) 2014-06-26
JP2014115109A5 JP2014115109A5 (enExample) 2016-01-28

Family

ID=51171279

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012267557A Pending JP2014115109A (ja) 2012-12-06 2012-12-06 距離計測装置及び方法

Country Status (2)

Country Link
US (1) US9835438B2 (enExample)
JP (1) JP2014115109A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017181401A (ja) * 2016-03-31 2017-10-05 セコム株式会社 物体検出センサ
JP2020046229A (ja) * 2018-09-14 2020-03-26 株式会社ミツトヨ 三次元形状測定装置及び三次元形状測定方法
US11055863B2 (en) * 2017-03-07 2021-07-06 Omron Corporation Three-dimensional shape measurement device, three-dimensional shape measurement method, and program
JP2023509729A (ja) * 2020-01-15 2023-03-09 華為技術有限公司 固体ｌｉｄａｒ装置の較正

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014064824A1 (ja) * 2012-10-26 2014-05-01 Ｎｅｃディスプレイソリューションズ株式会社 識別子制御装置、識別子制御システム、多画面表示システム、識別子制御方法及びプログラム
JP5799273B2 (ja) * 2013-10-02 2015-10-21 パナソニックＩｐマネジメント株式会社 寸法計測装置、寸法計測方法、寸法計測システム、プログラム
WO2016158856A1 (ja) * 2015-04-02 2016-10-06 株式会社ニコン 撮像システム、撮像装置、撮像方法、及び撮像プログラム
JP6529463B2 (ja) * 2016-06-14 2019-06-12 日本電信電話株式会社 道路構造化装置、道路構造化方法、及び道路構造化プログラム
EP3258211B1 (en) 2016-06-17 2023-12-13 Hexagon Technology Center GmbH Determining object reflection properties with respect to particular optical measurement
JP6673266B2 (ja) * 2017-03-08 2020-03-25 オムロン株式会社 相互反射検出装置、相互反射検出方法、およびプログラム
JP2019015706A (ja) * 2017-07-11 2019-01-31 ソニーセミコンダクタソリューションズ株式会社 撮像装置及びモニタリング装置
EP3438699A1 (de) * 2017-07-31 2019-02-06 Hexagon Technology Center GmbH Distanzmesser mit spad-anordnung zur berücksichtigung von mehrfachzielen
TWI622960B (zh) * 2017-11-10 2018-05-01 財團法人工業技術研究院 深度影像擷取裝置的校正方法
TWI738098B (zh) * 2019-10-28 2021-09-01 阿丹電子企業股份有限公司 光學式體積測定裝置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006275529A (ja) * 2005-03-28 2006-10-12 Citizen Watch Co Ltd ３次元形状測定方法及び測定装置
JP2008309551A (ja) * 2007-06-13 2008-12-25 Nikon Corp 形状測定方法、記憶媒体、および形状測定装置
JP2009019942A (ja) * 2007-07-11 2009-01-29 Nikon Corp 形状測定方法、プログラム、および形状測定装置
JP2009236917A (ja) * 2008-03-25 2009-10-15 Steinbichler Optotechnik Gmbh 物体の３ｄ座標を決定するための方法及び装置
JP2011257293A (ja) * 2010-06-10 2011-12-22 Konica Minolta Sensing Inc 情報処理装置、プログラム、および情報処理システム
JP2012098087A (ja) * 2010-10-29 2012-05-24 Canon Inc 測定装置及び測定方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6549647B1 (en) * 2000-01-07 2003-04-15 Cyberoptics Corporation Inspection system with vibration resistant video capture
US8265343B2 (en) * 2006-12-25 2012-09-11 Nec Corporation Apparatus, method and program for distance measurement
JP5448599B2 (ja) * 2009-06-24 2014-03-19 キヤノン株式会社 測定システム及び測定処理方法
JP5460341B2 (ja) * 2010-01-06 2014-04-02 キヤノン株式会社 ３次元計測装置及びその制御方法
JP5338718B2 (ja) * 2010-02-26 2013-11-13 セイコーエプソン株式会社 補正情報算出装置、画像処理装置、画像表示システム、および画像補正方法
KR101216953B1 (ko) * 2011-05-19 2012-12-31 (주)로봇에버 코드 라인을 이용하여 3차원 영상을 복원하는 3차원 거리 측정 시스템
US9324190B2 (en) * 2012-02-24 2016-04-26 Matterport, Inc. Capturing and aligning three-dimensional scenes

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006275529A (ja) * 2005-03-28 2006-10-12 Citizen Watch Co Ltd ３次元形状測定方法及び測定装置
JP2008309551A (ja) * 2007-06-13 2008-12-25 Nikon Corp 形状測定方法、記憶媒体、および形状測定装置
JP2009019942A (ja) * 2007-07-11 2009-01-29 Nikon Corp 形状測定方法、プログラム、および形状測定装置
JP2009236917A (ja) * 2008-03-25 2009-10-15 Steinbichler Optotechnik Gmbh 物体の３ｄ座標を決定するための方法及び装置
JP2011257293A (ja) * 2010-06-10 2011-12-22 Konica Minolta Sensing Inc 情報処理装置、プログラム、および情報処理システム
JP2012098087A (ja) * 2010-10-29 2012-05-24 Canon Inc 測定装置及び測定方法

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017181401A (ja) * 2016-03-31 2017-10-05 セコム株式会社 物体検出センサ
US11055863B2 (en) * 2017-03-07 2021-07-06 Omron Corporation Three-dimensional shape measurement device, three-dimensional shape measurement method, and program
JP2020046229A (ja) * 2018-09-14 2020-03-26 株式会社ミツトヨ 三次元形状測定装置及び三次元形状測定方法
JP7219034B2 (ja) 2018-09-14 2023-02-07 株式会社ミツトヨ 三次元形状測定装置及び三次元形状測定方法
JP2023509729A (ja) * 2020-01-15 2023-03-09 華為技術有限公司 固体ｌｉｄａｒ装置の較正
JP7417750B2 (ja) 2020-01-15 2024-01-18 華為技術有限公司 固体ｌｉｄａｒ装置の較正

Also Published As

Publication number Publication date
US9835438B2 (en) 2017-12-05
US20140307085A1 (en) 2014-10-16

Similar Documents

Publication Publication Date Title
JP2014115109A (ja) 距離計測装置及び方法
JP7716712B2 (ja) 三次元モデル生成方法、情報処理装置およびプログラム
KR102096806B1 (ko) 3차원 센서 시스템 및 3차원 데이터 획득방법
CN103673925B (zh) 用于测量对象物体的信息处理装置及方法
JP6363863B2 (ja) 情報処理装置および情報処理方法
CN101821580B (zh) 用于实物形状的三维测量的系统和方法
JP7640661B2 (ja) 対向配置チャネルを有する三次元センサ
JP6596433B2 (ja) ２つのカメラからの曲線の集合の構造化光整合
US20060210146A1 (en) Creating 3D images of objects by illuminating with infrared patterns
JP6071363B2 (ja) 距離計測装置及び方法
JP2013036983A (ja) 計測装置および情報処理装置
US11803982B2 (en) Image processing device and three-dimensional measuring system
KR20230065978A (ko) 구조화된 광을 사용하여 장면에서 평면 표면들을 직접 복구하기 위한 시스템, 방법 및 매체
JP6097903B2 (ja) ３次元形状の取得装置、処理方法およびプログラム
JP6351201B2 (ja) 距離計測装置および方法
JP2015194477A (ja) 情報処理装置、情報処理方法及びプログラム
US10252417B2 (en) Information processing apparatus, method of controlling information processing apparatus, and storage medium
JP6486083B2 (ja) 情報処理装置、情報処理方法及びプログラム
JP2011064617A (ja) 三次元情報計測装置および三次元情報計測方法
US9204130B2 (en) Method and system for creating a three dimensional representation of an object
Li et al. Geometric calibration of a camera-projector 3D imaging system
JP2018009927A (ja) 画像処理装置、画像処理方法及びプログラム
Kasuya et al. Robust and accurate one-shot 3D reconstruction by 2C1P system with wave grid pattern
Xue et al. A novel stripe extraction scheme for the multi-line structured light systems
JP2020046229A (ja) 三次元形状測定装置及び三次元形状測定方法

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20151204

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20151204

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20161017

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20161025

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20161221

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20170606