JP2014042950A - Grinding apparatus - Google Patents

Grinding apparatus Download PDF

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JP2014042950A
JP2014042950A JP2012185586A JP2012185586A JP2014042950A JP 2014042950 A JP2014042950 A JP 2014042950A JP 2012185586 A JP2012185586 A JP 2012185586A JP 2012185586 A JP2012185586 A JP 2012185586A JP 2014042950 A JP2014042950 A JP 2014042950A
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grinding
grinding wheel
workpiece
wheel
rough
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JP5973284B2 (en
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Kohei Asai
宏平 浅井
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Disco Corp
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Disco Abrasive Systems Ltd
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Abstract

PROBLEM TO BE SOLVED: To provide a grinding apparatus which allows a footprint to be downsized.SOLUTION: A double wheel 35 is constructed by concentrically arranging a finishing grinding wheel 36 and a rough grinding wheel 37 having a larger diameter than the finishing grinding wheel 36. A diameter D1 of the finishing grinding wheel 36 is equal to or larger than a diameter d of a processed object 1, whereas a diameter D2 of the rough grinding wheel 37 is equal to or larger than the double of the diameter d of the processed object 1, and a difference between a radius R1 of the finishing grinding wheel 36 and a radius R2 of the rough grinding wheel is equal to or larger than a radius r of the processed object 1. The double wheel 35 is rotated and the processed object 1 is horizontally moved below the rough grinding wheel 37 to carry out rough grinding, and subsequently an outer periphery of the finishing grinding wheel 36 is positioned at a center of the processed object 1 having passed the rough grinding wheel 37, in order to carry out finishing grinding of the auto-rotating processed object 1 with the finishing grinding wheel 36.

Description

本発明は、例えば半導体ウェーハ等の板状物を被加工物として研削する研削装置に関する。   The present invention relates to a grinding apparatus for grinding a plate-like object such as a semiconductor wafer as a workpiece.

半導体デバイスの製造工程では、シリコンやガリウムヒ素等の半導体材料からなるウェーハの表面に格子状の分割予定ラインが設定され、この分割予定ラインで囲まれた多数の矩形状領域に、ICやLSI等の電子回路を有するデバイスが形成される。そしてこのウェーハは、裏面が研削されて設定厚さに薄化されるなどの所定の工程を経てから、分割予定ラインに沿って切断されることにより、多数のチップ状のデバイスに分割される。このようにして得られたデバイスは、樹脂やセラミックでパッケージングされ、各種電子機器に実装される。   In the manufacturing process of semiconductor devices, lattice-shaped division planned lines are set on the surface of a wafer made of a semiconductor material such as silicon or gallium arsenide, and ICs, LSIs, etc. are formed in a large number of rectangular regions surrounded by the planned division lines. A device having the electronic circuit is formed. This wafer is divided into a large number of chip-like devices by cutting along a predetermined division line after undergoing a predetermined process such as grinding the back surface and thinning it to a set thickness. The device thus obtained is packaged with resin or ceramic and mounted on various electronic devices.

ウェーハの研削装置としては、保持テーブル上に被加工面を上方に露出した状態でウェーハを保持し、保持テーブルの上方に配設した研削ホイールを回転させながら、研削ホイールが有する研削砥石をウェーハに押し付けて研削する形式のものが一般的である。ウェーハを研削するにあたっては、はじめに粗研削を行い、引き続き仕上げ研削を行うと効率的な研削がなされ、これを実現するために、粗研削用と仕上げ研削用の研削ホイールが並列して配設され、これら研削ホイールに対しウェーハが回転するターンテーブルによって順に搬送される構成のものが知られている(例えば特許文献1)。   As a wafer grinding apparatus, the wafer is held on the holding table with the work surface exposed upward, and the grinding wheel provided on the grinding wheel is rotated on the wafer while rotating the grinding wheel disposed above the holding table. A type of grinding by pressing is common. When grinding wafers, rough grinding is performed first, followed by finish grinding to achieve efficient grinding. To achieve this, grinding wheels for rough grinding and finish grinding are arranged in parallel. A configuration is known in which wafers are sequentially transferred to these grinding wheels by a turntable rotating (for example, Patent Document 1).

特開2000−288881号公報JP 2000-288888 A

ところで、近年では半導体ウェーハの大型化が進んでおり、例えばφ(直径)450mmといったウェーハの開発が進んでいる。ウェーハの大型化に伴って、ウェーハを加工する各種装置も大型化することは否めないが、フットプリントをできるだけ小型化することが切望されており、それは上記のウェーハ研削装置も同様である。   By the way, in recent years, semiconductor wafers have been increased in size, and development of wafers having a diameter of 450 mm, for example, has been progressing. It is undeniable that various apparatuses for processing a wafer are increased in size with an increase in the size of the wafer, but it is desired to make the footprint as small as possible. The same applies to the above-described wafer grinding apparatus.

本発明は上記事情に鑑みてなされたものであり、その主たる課題は、フットプリントの小型化を可能とする研削装置を提供することにある。   This invention is made | formed in view of the said situation, The main subject is providing the grinding device which enables size reduction of a footprint.

本発明の研削装置は、被加工物を回転可能に保持する保持テーブルと該保持テーブルで保持された被加工物を研削する研削手段とを備えた研削装置であって、前記研削手段は、仕上げ研削砥石を含み被加工物の直径以上の直径を有した仕上げ研削ホイールと 該仕上げ研削ホイールの外周側に同心円状に配設された粗研削砥石を含む被加工物の直径の2倍以上の直径を有した粗研削ホイールと、を有し、該粗研削ホイールの半径と該仕上げ研削ホイールの半径との差が被加工物の半径以上である二重ホイールと、該二重ホイールが装着されて該二重ホイールを回転させるスピンドルと、を有し、該研削手段を鉛直方向に移動させる鉛直移動手段と、所定高さに位置付けられた前記粗研削ホイールの下方で被加工物を保持した前記保持テーブルを水平方向に移動させて被加工物に粗研削を施すとともに、該粗研削ホイールを通過した被加工物の中心に前記仕上げ研削ホイールの外周が位置付けられるように該保持テーブルを移動させる水平移動手段と、を備えることを特徴とする。   The grinding apparatus of the present invention is a grinding apparatus comprising a holding table that rotatably holds a workpiece, and a grinding means that grinds the workpiece held by the holding table. A finish grinding wheel that includes a grinding wheel and has a diameter equal to or greater than the diameter of the work piece, and a diameter that is at least twice the diameter of the work piece that includes a rough grinding wheel disposed concentrically on the outer peripheral side of the finish grinding wheel. A double grinding wheel having a difference between a radius of the rough grinding wheel and a radius of the finish grinding wheel equal to or greater than a radius of the workpiece; and the double wheel is mounted. A spindle for rotating the double wheel, and a vertical moving means for moving the grinding means in the vertical direction, and the holding for holding the workpiece under the rough grinding wheel positioned at a predetermined height. table Horizontal movement means for moving the holding table so that the outer periphery of the finish grinding wheel is positioned at the center of the work piece that has been moved in the horizontal direction to perform rough grinding on the work piece that has passed through the rough grinding wheel; It is characterized by providing.

本発明によれば、水平移動手段により保持テーブルを水平移動させ、保持テーブルに保持した被加工物を、回転する二重ホイールを通過させることで、被加工物を粗研削ホイールと仕上げ研削ホイールとで連続して研削することができる。二重ホイールの粗研削ホイールと仕上げ研削ホイールとが同心状に配設されているため、これら研削ホイールを並列して配設した場合と比べるとフットプリントは小さくなる。二重ホイールの粗研削ホイールの半径と仕上げ研削ホイールの半径との差が被加工物の半径以上であることにより、粗研削および仕上げ研削の各工程で被加工面の全面を研削可能である。   According to the present invention, the holding table is horizontally moved by the horizontal moving means, and the workpiece held on the holding table is passed through the rotating double wheel, so that the workpiece is roughly ground and the finish grinding wheel. Can be ground continuously. Since the double grinding wheel and the finishing grinding wheel are arranged concentrically, the footprint is smaller than when these grinding wheels are arranged in parallel. When the difference between the radius of the rough grinding wheel of the double wheel and the radius of the finish grinding wheel is equal to or larger than the radius of the workpiece, the entire surface of the workpiece can be ground in each step of rough grinding and finish grinding.

本発明では、前記仕上げ研削ホイールの研削面は、前記粗研削ホイールの研削面よりも鉛直方向上方に形成される形態を含む。この形態では、二重ホイールの粗研削ホイールの半径と仕上げ研削ホイールの半径との差が被加工物の半径以上であって被加工物の直径以下の場合に、粗研削および仕上げ研削の各工程で被加工面の全面を確実に研削可能となる。   In the present invention, the grinding surface of the finish grinding wheel includes a form that is formed vertically above the grinding surface of the rough grinding wheel. In this configuration, when the difference between the radius of the rough grinding wheel of the double wheel and the radius of the finish grinding wheel is equal to or greater than the workpiece radius and equal to or less than the workpiece diameter, each process of the rough grinding and the finish grinding is performed. This makes it possible to reliably grind the entire work surface.

本発明によれば、フットプリントの小型化を可能とする研削装置が提供されるといった効果を奏する。   According to the present invention, it is possible to provide a grinding apparatus that can reduce the footprint.

本発明の一実施形態に係る研削装置の全体斜視図である。1 is an overall perspective view of a grinding apparatus according to an embodiment of the present invention. 同研削装置の二重ホイールを示す(a)側断面図、(b)下面図である。It is the (a) side sectional view and the (b) bottom view showing the double wheel of the grinding device. 粗研削ホイールで粗研削を行っている状態を示す(a)側断面図、(b)平面的なイメージを示す図である。It is the (a) sectional side view which shows the state which is performing rough grinding with a rough grinding wheel, (b) is a figure which shows a planar image. 仕上げ研削ホイールで仕上げ研削を行っている状態を示す(a)側断面図、(b)平面的なイメージを示す図である。It is (a) sectional side view which shows the state which is performing finish grinding with a finish grinding wheel, (b) is a figure which shows a planar image. 二重ホイールの変形例を示す側断面図である。It is a sectional side view which shows the modification of a double wheel.

以下、図面を参照して本発明の一実施形態を説明する。
(1)研削装置の基本的な構成および動作
はじめに、一実施形態の研削装置の基本的な構成および動作について説明する。
図1は、一実施形態に係る研削装置10の全体を示している。この研削装置10は、シリコンウェーハ等の円板状の半導体ウェーハ等を被加工物(図3の符号1)とし、この被加工物1の少なくとも片面を所定厚さになるまで研削して薄化するように用いられる。
Hereinafter, an embodiment of the present invention will be described with reference to the drawings.
(1) Basic configuration and operation of grinding apparatus First, a basic configuration and operation of a grinding apparatus according to an embodiment will be described.
FIG. 1 shows an entire grinding apparatus 10 according to an embodiment. The grinding apparatus 10 uses a disk-shaped semiconductor wafer such as a silicon wafer as a workpiece (reference numeral 1 in FIG. 3), and grinds and thins at least one surface of the workpiece 1 to a predetermined thickness. Used to do.

図1で符号11は装置台であり、この装置台11の長手方向一端部(図1の右奥側の端部)には、壁部12が立設されている。図1では、装置台11の長手方向、幅方向および鉛直方向を、それぞれY方向、X方向およびZ方向としている。   In FIG. 1, reference numeral 11 denotes a device base, and a wall portion 12 is erected at one end portion in the longitudinal direction of the device base 11 (the end portion on the right back side in FIG. 1). In FIG. 1, the longitudinal direction, the width direction, and the vertical direction of the apparatus base 11 are set as a Y direction, an X direction, and a Z direction, respectively.

装置台11上においては、長手方向のほぼ中間部分から壁部12側に凹所13が形成されており、この凹所13内には、移動台(水平移動手段)14を介して、真空チャック式の円板状の保持テーブル20がY方向に移動可能に設けられている。移動台14は、装置台11内に配設された図示せぬ移動機構によりY方向に沿って往復移動する。   On the apparatus base 11, a recess 13 is formed on the side of the wall 12 from an approximately middle portion in the longitudinal direction. A vacuum chuck is provided in the recess 13 via a moving base (horizontal moving means) 14. A disc-shaped holding table 20 of the type is provided so as to be movable in the Y direction. The moving table 14 reciprocates along the Y direction by a moving mechanism (not shown) disposed in the apparatus table 11.

移動台14の移動経路は、移動台14の移動方向両側に設けられた蛇腹状のカバー15,16によって覆われている。カバー15,16は移動台14の移動に伴って伸縮し、これらカバー15,16によって該移動経路への研削屑の落下が防がれるようになっている。   The moving path of the moving table 14 is covered with bellows-like covers 15 and 16 provided on both sides of the moving table 14 in the moving direction. The covers 15 and 16 expand and contract as the moving table 14 moves, and the covers 15 and 16 prevent the grinding scraps from falling on the moving path.

保持テーブル20は、移動台14に回転可能に支持され、図示せぬ回転駆動機構により一方向または双方向に回転駆動させられ、また、回転停止状態が保持される。保持テーブル20の上面は、被加工物1が載置される円形状の保持面21に形成されている。この保持面21は多孔質体により水平に形成されている。保持面21の直径は、被加工物1の直径と同等である。   The holding table 20 is rotatably supported by the movable table 14 and is driven to rotate in one or both directions by a rotation driving mechanism (not shown), and the rotation stopped state is held. The upper surface of the holding table 20 is formed on a circular holding surface 21 on which the workpiece 1 is placed. The holding surface 21 is formed horizontally by a porous body. The diameter of the holding surface 21 is equivalent to the diameter of the workpiece 1.

保持面21は図示せぬ吸引機構の運転によって負圧状態となり、保持面21に載置された被加工物1は、負圧作用によって保持面21に吸引、保持される。このようにして保持テーブル20に保持された被加工物1は、移動台14が壁部12側に移動することにより研削領域11Aに位置付けられる。その研削領域11Aの上方には、研削手段30が配設されている。   The holding surface 21 is brought into a negative pressure state by the operation of a suction mechanism (not shown), and the workpiece 1 placed on the holding surface 21 is sucked and held by the holding surface 21 by the negative pressure action. The workpiece 1 held on the holding table 20 in this way is positioned in the grinding region 11A when the movable table 14 moves to the wall 12 side. A grinding means 30 is disposed above the grinding region 11A.

研削手段30は、装置台11の壁部12の前面に、鉛直移動手段40によってZ方向に昇降自在に設けられている。鉛直移動手段40は、壁部12の前面に固定された左右一対のZ方向に延びるガイドレール41と、ガイドレール41に摺動可能に支持された昇降スライダ42と、昇降スライダ42に螺合して連結されたボールねじ43と、ボールねじ43を正逆回転させるモータ44とから構成され、ボールねじ43の回転により昇降スライダ42をガイドレール41に沿って昇降させるものである。   The grinding means 30 is provided on the front surface of the wall portion 12 of the apparatus base 11 so as to be movable up and down in the Z direction by the vertical movement means 40. The vertical movement means 40 is screwed into the lift slider 42 and a pair of left and right guide rails 41 fixed to the front surface of the wall portion 12 and extending in the Z direction, supported by the guide rail 41 so as to be slidable. The ball screw 43 and the motor 44 that rotate the ball screw 43 forward and backward are configured to raise and lower the elevating slider 42 along the guide rail 41 by the rotation of the ball screw 43.

研削手段30は、軸方向がZ方向に延びる円筒状のハウジング31と、ハウジング31内に同軸的、かつ回転可能に支持されたスピンドル32(図2(a)に示す)と、スピンドル32を回転駆動するサーボモータ33と、スピンドル32の下端に円板状のマウント34を介して同軸的に固定され、研削領域11Aに位置付けられる被加工物1に対面する二重ホイール35とから構成されている。   The grinding means 30 includes a cylindrical housing 31 whose axial direction extends in the Z direction, a spindle 32 coaxially and rotatably supported in the housing 31 (shown in FIG. 2A), and the spindle 32. The servomotor 33 to be driven and the double wheel 35 which is coaxially fixed to the lower end of the spindle 32 via a disk-shaped mount 34 and faces the workpiece 1 positioned in the grinding region 11A. .

二重ホイール35は被加工物1を研削する研削ホイールであって、図2に示すように、環状の仕上げ研削ホイール36と、仕上げ研削ホイール36よりも大径の環状の粗研削ホイール37とが同心状に配設されて構成されたものである。   The double wheel 35 is a grinding wheel for grinding the workpiece 1. As shown in FIG. 2, the double wheel 35 includes an annular finish grinding wheel 36 and an annular coarse grinding wheel 37 having a larger diameter than the finish grinding wheel 36. They are arranged concentrically.

研削手段30は、ハウジング31がホルダ39を介して鉛直移動手段40の昇降スライダ42に固定されており、昇降スライダ42と一体に鉛直方向に昇降する。これにより二重ホイール35は保持テーブル20に保持された被加工物1に対して近接離反させられる。サーボモータ33でスピンドル32が回転駆動されることにより、二重ホイール35は回転する。   In the grinding means 30, the housing 31 is fixed to the elevating slider 42 of the vertical moving means 40 via the holder 39, and moves up and down integrally with the elevating slider 42. As a result, the double wheel 35 is moved close to and away from the workpiece 1 held on the holding table 20. When the spindle 32 is rotationally driven by the servo motor 33, the double wheel 35 rotates.

移動台14が研削領域11Aから壁部12と離れる方向に移動した移動端が、搬入出領域11Bとなっている。保持テーブル20に保持された被加工物1は、移動台14の移動により、研削領域11Aと搬入出領域11Bとを往復移動させられる。   The moving end at which the moving table 14 moves away from the grinding region 11A in the direction away from the wall 12 is a carry-in / out region 11B. The workpiece 1 held on the holding table 20 is reciprocated between the grinding area 11A and the carry-in / out area 11B by the movement of the moving table 14.

装置台11の凹所13より手前側は被加工物1の供給・回収エリア17となっている。供給・回収エリア17の中央には、2節リンク式のピックアップロボット50が設置されており、このピックアップロボット50の周囲には、上から見た状態で、反時計回りに、カセット51、位置決め手段52、搬入手段53、搬出手段54、スピンナ式の洗浄手段55、カセット56が、それぞれ配置されている。   The front side of the recess 13 of the apparatus base 11 is a supply / recovery area 17 for the workpiece 1. In the center of the supply / recovery area 17, a two-bar link type pickup robot 50 is installed. Around the pickup robot 50, the cassette 51 and positioning means are counterclockwise as viewed from above. 52, carry-in means 53, carry-out means 54, spinner-type cleaning means 55, and cassette 56 are arranged.

カセット51、位置決め手段52および搬入手段53は、被加工物1を保持テーブル20に搬入する系統であり、搬出手段54、洗浄手段55およびカセット56は、研削後の被加工物1を保持テーブル20から搬出する系統である。2つのカセット51,56は同一の構造であり、ここでは用途別に、搬入カセット51、搬出カセット56と称する。これらカセット51,56は、複数の被加工物1を積層状態で収容して運搬可能とするもので、装置台11の所定位置にセットされる。搬入手段53および搬出手段54はともに同様の構造であって、それぞれ水平旋回アーム53a,54aの先端に、被加工物1の上面を負圧作用で吸着する吸着パッド53b,54bが取り付けられたものである。   The cassette 51, the positioning means 52 and the carry-in means 53 are a system for carrying the workpiece 1 into the holding table 20, and the carry-out means 54, the cleaning means 55 and the cassette 56 hold the workpiece 1 after grinding on the holding table 20. It is a system to carry out from. The two cassettes 51 and 56 have the same structure, and are referred to as a carry-in cassette 51 and a carry-out cassette 56 according to applications. These cassettes 51 and 56 are configured to accommodate and transport a plurality of workpieces 1 in a stacked state, and are set at predetermined positions on the apparatus base 11. Both the carrying-in means 53 and the carrying-out means 54 have the same structure, and suction pads 53b and 54b for sucking the upper surface of the workpiece 1 by negative pressure action are attached to the tips of the horizontal swivel arms 53a and 54a, respectively. It is.

以上の構成を有する研削装置10では、次のようにして被加工物1が研削される。
はじめに、ピックアップロボット50によって搬入カセット51内から1枚の被加工物1が取り出され、その被加工物1は、ピックアップロボット50によって位置決め手段52上に被加工面を上側にして載置される。位置決め手段52上で被加工物1は所定の搬送開始位置に位置決めされ、次いでその被加工物1は、搬入手段53の吸着パッド53bで保持され、水平旋回アーム53aの旋回により、予め搬入出領域11Bに位置付けられている保持テーブル20の保持面21に同心状に載置される。
In the grinding apparatus 10 having the above configuration, the workpiece 1 is ground as follows.
First, one workpiece 1 is taken out from the carry-in cassette 51 by the pickup robot 50, and the workpiece 1 is placed on the positioning means 52 by the pickup robot 50 with the processing surface facing upward. The workpiece 1 is positioned at a predetermined transfer start position on the positioning means 52, and then the workpiece 1 is held by the suction pad 53b of the loading means 53, and is previously loaded and unloaded by swiveling the horizontal swivel arm 53a. It is mounted concentrically on the holding surface 21 of the holding table 20 positioned at 11B.

被加工物1は保持テーブル20の保持面21に負圧作用で吸着、保持され、移動台14が壁部12側に移動して研削領域11Aに送られる。そして、二重ホイール35を回転させた研削手段30を鉛直移動手段40によって二重ホイール35が所定の研削高さになるまで下降させる動作と、移動台14を被加工物1の搬入出領域11B方向に移動させる動作とを適宜組み合わせることにより、被加工物1の被加工面が研削される。   The workpiece 1 is adsorbed and held on the holding surface 21 of the holding table 20 by negative pressure action, and the moving table 14 moves to the wall 12 side and is sent to the grinding region 11A. Then, the grinding means 30 that rotates the double wheel 35 is lowered by the vertical movement means 40 until the double wheel 35 reaches a predetermined grinding height, and the moving table 14 is moved in and out of the work piece 1 11B. The surface to be processed of the workpiece 1 is ground by appropriately combining the movement in the direction.

研削は被加工面に対し粗研削ホイール37による粗研削が先に行われ、次いで仕上げ研削ホイール36による仕上げ研削が行われる。研削の際には図示せぬ加工液供給手段から被加工面に加工液が供給される。また、被加工物1の厚さが図示せぬ厚さ測定手段で測定される。被加工物1の被加工面全面が研削されて厚さが目的厚さに達したら、研削手段30を上昇させて二重ホイール35を被加工物1から離間させ、研削を終える。   The grinding is performed first on the surface to be processed by the rough grinding wheel 37 and then by the finish grinding wheel 36. At the time of grinding, a machining liquid is supplied to a surface to be processed from a machining liquid supply unit (not shown). Further, the thickness of the workpiece 1 is measured by a thickness measuring means (not shown). When the entire surface of the workpiece 1 is ground and the thickness reaches the target thickness, the grinding means 30 is raised to separate the double wheel 35 from the workpiece 1 and finish the grinding.

研削後は、保持テーブル20を搬入出領域11Bまで移動させるとともに保持面21への被加工物1の吸着が解除され、被加工物1は搬出手段54によって洗浄手段55内に移送される。被加工物1は、洗浄手段55内で水洗、乾燥処理され、この後、ピックアップロボット50によって搬出カセット56内に移送、収容される。   After grinding, the holding table 20 is moved to the carry-in / out area 11B, and the workpiece 1 is not attracted to the holding surface 21, and the workpiece 1 is transferred into the cleaning means 55 by the carry-out means 54. The workpiece 1 is washed with water and dried in the cleaning means 55, and then transferred and accommodated in the carry-out cassette 56 by the pickup robot 50.

以上が1枚の被加工物1を研削加工して洗浄し、回収するサイクルであり、このサイクルが繰り返し行われる。そして搬入カセット51内の全ての被加工物1に対して処理が終わったら、被加工物1は搬出カセット56ごと次の工程に移される。   The above is a cycle in which one workpiece 1 is ground, washed and collected, and this cycle is repeated. When all the workpieces 1 in the carry-in cassette 51 have been processed, the workpiece 1 is moved to the next step together with the carry-out cassette 56.

(2)二重ホイール
以上が研削装置10の基本的な構成および動作であり、次に、上記二重ホイール35について詳述する。
(2) Double wheel The above is the basic configuration and operation of the grinding apparatus 10, and the double wheel 35 will be described in detail.

(2−1)二重ホイールの構成
上記のように二重ホイール35は内周側の仕上げ研削ホイール36と外周側の粗研削ホイール37とが同心状に配設されて構成されたもので、図2に示すように、これら研削ホイール36,37は円板状のフレーム38の下面に設けられている。フレーム38は上記マウント34に同心状、かつ着脱可能に固定される。マウント34は、上記スピンドル32の先端軸心に突出形成されたチャック321に対して着脱可能に固定され、各研削ホイールは、スピンドル32とともに回転する。
(2-1) Configuration of Double Wheel As described above, the double wheel 35 is configured by concentrically arranging the inner peripheral side finish grinding wheel 36 and the outer peripheral side rough grinding wheel 37, As shown in FIG. 2, these grinding wheels 36 and 37 are provided on the lower surface of a disk-shaped frame 38. The frame 38 is fixed to the mount 34 so as to be concentric and detachable. The mount 34 is detachably fixed to a chuck 321 formed to protrude from the tip axis of the spindle 32, and each grinding wheel rotates together with the spindle 32.

各研削ホイール36,37は、チップ状に形成された直方体状の複数の砥石(仕上げ研削砥石361および粗研削砥石371)が、それぞれフレーム38の下面に環状に固着されて構成されている。各砥石361,371は、例えば、ガラス質のボンド材中にダイヤモンド砥粒を混合して成形し、焼結したものなどが用いられる。仕上げ研削ホイール36および粗研削ホイール37の下面で形成される各研削面362,372は、スピンドル32の軸方向に直交する平面であって保持テーブル20の保持面21と平行に形成されている。そして、図2(a)に示すように、仕上げ研削ホイール36の研削面362は粗研削ホイール37の研削面372よりも所定高さ鉛直方向上方に形成されている。   Each of the grinding wheels 36 and 37 is configured by a plurality of rectangular parallelepiped-shaped grindstones (finished grinding grindstone 361 and rough grinding grindstone 371) that are annularly fixed to the lower surface of the frame 38, respectively. As each of the grindstones 361 and 371, for example, a material obtained by mixing and molding diamond abrasive grains in a vitreous bond material is used. The grinding surfaces 362 and 372 formed on the lower surfaces of the finish grinding wheel 36 and the rough grinding wheel 37 are planes orthogonal to the axial direction of the spindle 32 and are formed in parallel with the holding surface 21 of the holding table 20. As shown in FIG. 2A, the grinding surface 362 of the finish grinding wheel 36 is formed above the grinding surface 372 of the rough grinding wheel 37 by a predetermined height in the vertical direction.

図3(b)に示すように、仕上げ研削ホイール36の直径D1は、被加工物1の直径d以上の直径を有しており、粗研削ホイール37の直径D2は、被加工物1の直径dの2倍以上の直径を有している。そして、仕上げ研削ホイール36の半径R1と粗研削ホイール37の半径R2との差は、被加工物1の半径r以上であって被加工物1の直径d以下に設定されている。   As shown in FIG. 3B, the diameter D1 of the finish grinding wheel 36 has a diameter equal to or larger than the diameter d of the workpiece 1, and the diameter D2 of the rough grinding wheel 37 is the diameter of the workpiece 1. It has a diameter that is at least twice as large as d. The difference between the radius R1 of the finish grinding wheel 36 and the radius R2 of the rough grinding wheel 37 is set to be not less than the radius r of the workpiece 1 and not more than the diameter d of the workpiece 1.

(2−2)二重ホイールによる研削
上記構成を有する二重ホイール35では、次のようにして被加工物1が研削される。
はじめの粗研削では、被加工物1を研削領域11Aに送る前に、研削手段30を、鉛直移動手段40によって粗研削ホイール37の研削面372が被加工物1の被加工面1aを粗研削する高さ位置になるまで下降させ、二重ホイール35を回転させる。そして、保持テーブル20を回転停止状態とし、移動台14を壁部12側に移動させて被加工物1を研削領域11Aに送る。図3に示すように、被加工物1が加工送りされるに伴って被加工面1aは回転する粗研削ホイール37の研削面372により研削される。
(2-2) Grinding with a double wheel In the double wheel 35 having the above-described configuration, the workpiece 1 is ground as follows.
In the first rough grinding, before the workpiece 1 is sent to the grinding region 11A, the grinding means 30 and the vertical movement means 40 cause the grinding surface 372 of the rough grinding wheel 37 to roughly grind the workpiece surface 1a of the workpiece 1. Then, the double wheel 35 is rotated. And the holding table 20 is made into a rotation stop state, the moving stand 14 is moved to the wall part 12 side, and the workpiece 1 is sent to the grinding area | region 11A. As shown in FIG. 3, the workpiece surface 1 a is ground by the grinding surface 372 of the rotating rough grinding wheel 37 as the workpiece 1 is fed.

粗研削ホイール37の下方を外周側から内周側に向けて通過することで、被加工物1の被加工面1aは全面が研削される。仕上げ研削ホイール36の研削面362は粗研削ホイール37の研削面372よりも上方にあるため、被加工物1は仕上げ研削ホイール36に干渉せず、被加工面1aの全面が粗研削される。   By passing the lower side of the rough grinding wheel 37 from the outer peripheral side toward the inner peripheral side, the entire processing surface 1a of the workpiece 1 is ground. Since the grinding surface 362 of the finish grinding wheel 36 is above the grinding surface 372 of the rough grinding wheel 37, the workpiece 1 does not interfere with the finish grinding wheel 36, and the entire surface 1a is roughly ground.

被加工物1が粗研削による所定厚さに達したら、図4に示すように被加工面1aの中心を仕上げ研削ホイール36の外周下方に位置付け、保持テーブル20を回転させて被加工物1を自転させる。そして、研削手段30を下降させ、回転する仕上げ研削ホイール36の研削面362を、回転する被加工面1aに押し付ける。これにより、仕上げ研削ホイール36の研削面362は回転する被加工面1aの中心を通過し、被加工面1aの全面が研削面362で仕上げ研削される。   When the workpiece 1 reaches a predetermined thickness by rough grinding, the center of the workpiece surface 1a is positioned below the outer periphery of the finish grinding wheel 36, as shown in FIG. Rotate. Then, the grinding means 30 is lowered and the grinding surface 362 of the rotating finish grinding wheel 36 is pressed against the rotating workpiece surface 1a. As a result, the grinding surface 362 of the finish grinding wheel 36 passes through the center of the rotating workpiece surface 1a, and the entire surface of the workpiece surface 1a is finish-ground by the grinding surface 362.

仕上げ研削により被加工物1が目的厚さに達したら、研削手段30を上昇させて仕上げ研削ホイール36を被加工物1から離間させ、研削を終える。この後は、上記のように被加工物1は洗浄手段55で洗浄され、搬出カセット56内に収容される。   When the workpiece 1 reaches the target thickness by finish grinding, the grinding means 30 is raised to separate the finish grinding wheel 36 from the workpiece 1 and finish grinding. Thereafter, as described above, the workpiece 1 is cleaned by the cleaning means 55 and stored in the carry-out cassette 56.

(3)一実施形態の作用効果
上記研削装置10によれば、仕上げ研削ホイール36と粗研削ホイール37とを同心状に配設して二重ホイール35とした構成により、これら研削ホイールを並列して配設した場合と比べるとフットプリントを小さくすることができる。
(3) Operational Effects of One Embodiment According to the grinding device 10 described above, the grinding wheel 36 and the rough grinding wheel 37 are arranged concentrically to form the double wheel 35, so that these grinding wheels are arranged in parallel. The footprint can be reduced as compared with the case where it is arranged.

また、仕上げ研削ホイール36の研削面362を粗研削ホイール37の研削面372よりも鉛直方向上方に形成しているため、本実施形態のように各研削ホイール36,37の半径R1,R2の差が被加工物1の半径r以上であって被加工物1の直径d以下に設定されている場合、粗研削および仕上げ研削の各工程で、他方側の研削ホイールに干渉せずに被加工面1aの全面を確実に研削することができる。   Further, since the grinding surface 362 of the finish grinding wheel 36 is formed vertically above the grinding surface 372 of the rough grinding wheel 37, the difference between the radii R1, R2 of the grinding wheels 36, 37 as in this embodiment. Is set to be not less than the radius r of the work piece 1 and not more than the diameter d of the work piece 1, the work surface without interfering with the grinding wheel on the other side in each step of rough grinding and finish grinding. The entire surface of 1a can be reliably ground.

(4)一実施形態の変形例
図5に示すように、仕上げ研削ホイール36の半径R1と粗研削ホイール37の半径R2との差が被加工物1の直径d以上あるように設定した場合には、仕上げ研削ホイール36の外周縁と粗研削ホイール37の内周縁との間に被加工物1が入り込むことができる。これにより、粗研削ホイール37の外周側から被加工物1を加工送りして粗研削する際に、仕上げ研削ホイール36に被加工物1は干渉することがない。このため、双方の研削ホイール36,37の研削面362,372を同一面内に形成することができる。
(4) Modification of One Embodiment As shown in FIG. 5, when the difference between the radius R1 of the finish grinding wheel 36 and the radius R2 of the rough grinding wheel 37 is set to be equal to or larger than the diameter d of the workpiece 1 The workpiece 1 can enter between the outer peripheral edge of the finish grinding wheel 36 and the inner peripheral edge of the rough grinding wheel 37. Thereby, when the workpiece 1 is processed and fed from the outer peripheral side of the rough grinding wheel 37 for rough grinding, the workpiece 1 does not interfere with the finish grinding wheel 36. For this reason, the grinding surfaces 362 and 372 of both grinding wheels 36 and 37 can be formed in the same plane.

なお、この場合にあっても、粗研削は被加工物1を回転停止状態として移動台14の移動により粗研削ホイール37に対し加工送りして行う。そして仕上げ研削は、被加工面1aの中心を仕上げ研削ホイール36の外周下方に位置付け、保持テーブル20を回転させて被加工物1を自転させ、研削手段30を下降させて仕上げ研削ホイール36を被加工面1aの中心を通過する状態で、仕上げ研削ホイール36により被加工面1aの全面を仕上げ研削する。   Even in this case, the rough grinding is performed by feeding the workpiece 1 to the rough grinding wheel 37 by the movement of the movable table 14 with the rotation of the workpiece 1 stopped. In the finish grinding, the center of the work surface 1a is positioned below the outer periphery of the finish grinding wheel 36, the holding table 20 is rotated to rotate the work 1 and the grinding means 30 is lowered so that the finish grinding wheel 36 is covered. In a state of passing through the center of the processing surface 1a, the entire surface of the processing surface 1a is finish-ground by the finish grinding wheel 36.

1…被加工物
10…研削装置
14…移動台(水平移動手段)
20…保持テーブル
30…研削手段
32…スピンドル
35…二重ホイール
36…仕上げ研削ホイール
361…仕上げ研削砥石
362…仕上げ研削ホイールの研削面
37…粗研削ホイール
371…粗研削砥石
372…粗研削ホイールの研削面
40…鉛直移動手段
DESCRIPTION OF SYMBOLS 1 ... Workpiece 10 ... Grinding device 14 ... Moving stand (horizontal moving means)
DESCRIPTION OF SYMBOLS 20 ... Holding table 30 ... Grinding means 32 ... Spindle 35 ... Double wheel 36 ... Finish grinding wheel 361 ... Finish grinding wheel 362 ... Grinding surface of finish grinding wheel 37 ... Coarse grinding wheel 371 ... Coarse grinding wheel 372 ... Coarse grinding wheel Grinding surface 40 ... Vertical movement means

Claims (2)

被加工物を回転可能に保持する保持テーブルと該保持テーブルで保持された被加工物を研削する研削手段とを備えた研削装置であって、
前記研削手段は、仕上げ研削砥石を含み被加工物の直径以上の直径を有した仕上げ研削ホイールと 該仕上げ研削ホイールの外周側に同心円状に配設された粗研削砥石を含む被加工物の直径の2倍以上の直径を有した粗研削ホイールと、を有し、該粗研削ホイールの半径と該仕上げ研削ホイールの半径との差が被加工物の半径以上である二重ホイールと、該二重ホイールが装着されて該二重ホイールを回転させるスピンドルと、を有し、
該研削手段を鉛直方向に移動させる鉛直移動手段と、
所定高さに位置付けられた前記粗研削ホイールの下方で被加工物を保持した前記保持テーブルを水平方向に移動させて被加工物に粗研削を施すとともに、該粗研削ホイールを通過した被加工物の中心に前記仕上げ研削ホイールの外周が位置付けられるように該保持テーブルを移動させる水平移動手段と、
を備えることを特徴とする研削装置。
A grinding apparatus comprising a holding table for rotatably holding a workpiece and a grinding means for grinding the workpiece held by the holding table,
The grinding means includes a finish grinding wheel including a finish grinding wheel having a diameter equal to or greater than the diameter of the workpiece, and a diameter of the work piece including a rough grinding wheel concentrically disposed on the outer peripheral side of the finish grinding wheel. A double grinding wheel having a diameter greater than or equal to twice the diameter of the rough grinding wheel, the difference between the radius of the rough grinding wheel and the radius of the finish grinding wheel being greater than or equal to the radius of the workpiece, A spindle mounted with a heavy wheel to rotate the double wheel,
Vertical movement means for moving the grinding means in the vertical direction;
The workpiece which has passed the rough grinding wheel while moving the holding table holding the workpiece under the rough grinding wheel positioned at a predetermined height in the horizontal direction to perform rough grinding on the workpiece. Horizontal moving means for moving the holding table so that the outer periphery of the finish grinding wheel is positioned at the center of
A grinding apparatus comprising:
前記仕上げ研削ホイールの研削面は、前記粗研削ホイールの研削面よりも鉛直方向上方に形成されることを特徴とする請求項1に記載の研削装置。   The grinding apparatus according to claim 1, wherein the grinding surface of the finish grinding wheel is formed vertically above the grinding surface of the rough grinding wheel.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016016485A (en) * 2014-07-09 2016-02-01 株式会社岡本工作機械製作所 Composite chamfering apparatus and chamfering method for ingot block

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JPH0732252A (en) * 1993-07-22 1995-02-03 Hitachi Ltd Work autorotation type grinding machining, work autorotation type grinding machine, silicon wafer and ceramic substrate
JPH0758068A (en) * 1993-08-10 1995-03-03 Fujitsu Ltd Apparatus and method for polishing wafer
JPH09174398A (en) * 1995-12-26 1997-07-08 Toshiba Corp Grinding device and grinding wheel
US20090191793A1 (en) * 2008-01-24 2009-07-30 Alex Cooper Method of and device for abrasive machining and abrasive tool provided therefor

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Publication number Priority date Publication date Assignee Title
JPH0732252A (en) * 1993-07-22 1995-02-03 Hitachi Ltd Work autorotation type grinding machining, work autorotation type grinding machine, silicon wafer and ceramic substrate
JPH0758068A (en) * 1993-08-10 1995-03-03 Fujitsu Ltd Apparatus and method for polishing wafer
JPH09174398A (en) * 1995-12-26 1997-07-08 Toshiba Corp Grinding device and grinding wheel
US20090191793A1 (en) * 2008-01-24 2009-07-30 Alex Cooper Method of and device for abrasive machining and abrasive tool provided therefor

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016016485A (en) * 2014-07-09 2016-02-01 株式会社岡本工作機械製作所 Composite chamfering apparatus and chamfering method for ingot block

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