JP2013527831A - 新規な前駆体から生成されたナノワイヤおよびその製造方法 - Google Patents
新規な前駆体から生成されたナノワイヤおよびその製造方法 Download PDFInfo
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- JP2013527831A JP2013527831A JP2013508511A JP2013508511A JP2013527831A JP 2013527831 A JP2013527831 A JP 2013527831A JP 2013508511 A JP2013508511 A JP 2013508511A JP 2013508511 A JP2013508511 A JP 2013508511A JP 2013527831 A JP2013527831 A JP 2013527831A
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- precursor
- nanowire
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- nanowires
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- 239000002070 nanowire Substances 0.000 title claims abstract description 86
- 239000002243 precursor Substances 0.000 title claims abstract description 85
- 238000000034 method Methods 0.000 title claims abstract description 28
- 239000000203 mixture Substances 0.000 claims abstract description 26
- 150000001875 compounds Chemical class 0.000 claims abstract description 23
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract description 21
- 239000001257 hydrogen Substances 0.000 claims abstract description 21
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract description 17
- 229910052736 halogen Inorganic materials 0.000 claims abstract description 11
- 150000002367 halogens Chemical class 0.000 claims abstract description 11
- 238000004519 manufacturing process Methods 0.000 claims abstract description 11
- 239000004065 semiconductor Substances 0.000 claims abstract description 8
- 150000002738 metalloids Chemical group 0.000 claims abstract description 5
- 229910008045 Si-Si Inorganic materials 0.000 claims abstract description 4
- 229910006411 Si—Si Inorganic materials 0.000 claims abstract description 4
- 239000000463 material Substances 0.000 claims abstract description 4
- 229920000548 poly(silane) polymer Polymers 0.000 claims description 21
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- 239000002184 metal Substances 0.000 claims description 19
- 239000000460 chlorine Substances 0.000 claims description 17
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- 125000001424 substituent group Chemical group 0.000 claims description 15
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- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
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- VEDJZFSRVVQBIL-UHFFFAOYSA-N trisilane Chemical compound [SiH3][SiH2][SiH3] VEDJZFSRVVQBIL-UHFFFAOYSA-N 0.000 description 3
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- 229910008310 Si—Ge Inorganic materials 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 229910052797 bismuth Inorganic materials 0.000 description 2
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- 229910003811 SiGeC Inorganic materials 0.000 description 1
- 150000001335 aliphatic alkanes Chemical class 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
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- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000012433 hydrogen halide Substances 0.000 description 1
- 229910000039 hydrogen halide Inorganic materials 0.000 description 1
- 238000010348 incorporation Methods 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 229910052740 iodine Inorganic materials 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 1
- 229910001338 liquidmetal Inorganic materials 0.000 description 1
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- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- TVMXDCGIABBOFY-UHFFFAOYSA-N octane Chemical compound CCCCCCCC TVMXDCGIABBOFY-UHFFFAOYSA-N 0.000 description 1
- GHBKQPVRPCGRAQ-UHFFFAOYSA-N octylsilicon Chemical compound CCCCCCCC[Si] GHBKQPVRPCGRAQ-UHFFFAOYSA-N 0.000 description 1
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- 239000008096 xylene Substances 0.000 description 1
Classifications
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Abstract
Description
ナノワイヤの成長のための前駆体は、処理条件下でシリコンおよび/またはゲルマニウム元素に変換されるシリコンおよび/またはゲルマニウム含有化合物である。
SinXaHb
式中、a+bは2n以上、かつ2n+2以下であり、aおよびbはそれぞれ0以上であり、Xは、ハロゲン、アミン置換基、またはアルキル基、たとえばより特定すればメチル基等の有機基である。さらにSiCナノワイヤを作成するためには有機置換基を有するポリシラン、またはSiNナノワイヤを作成するためにはアミン置換基を有するポリシランを用いることもできる。さらに(遷移)金属置換基を有するポリシランを用いることもできる。
GenXaHb
式中、a+bは2n以上、かつ2n+2以下であり、aおよびbはそれぞれ0以上であり、Xは、ハロゲン、アミン置換基、またはアルキル基、たとえばより特定すればメチル基等の有機基である。さらにGeCナノワイヤを作成するためには有機置換基を有するポリゲルマン、またはGeNナノワイヤを作成するためにはアミン置換基を有するポリゲルマンを用いることもできる。さらに(遷移)金属置換基を有するポリゲルマンを用いることもできる。
Sin−zGezXaHbまたはSizGen−zXaHb
式中、a+bは2n以上、かつ2n+2以下であり、aおよびbはそれぞれ0以上であり、nはzより大きく、Xはハロゲン、アミン置換基またはアルキル基、たとえばより特定すればメチル基等の有機基である。さらにSiGeCナノワイヤを作成するためには有機置換基を有するポリゲルマシラン、またはSiGeNナノワイヤを作成するためにはアミン置換基を有するポリゲルマシランを用いることもできる。さらに(遷移)金属置換基を有するポリゲルマシランを用いることもできる。
Claims (29)
- 半導体材料からなる、または半導体材料を含み、光発電および電子工学における応用に用いられるナノワイヤであって、
化合物または化合物の混合物からなる前駆体から生成され、
前記化合物は各々、少なくとも1つのSi−Si直接結合および/またはGe−Si直接結合および/またはGe−Ge直接結合を有し、
前記前駆体は、ハロゲンおよび/または水素からなる置換基を有し、前記置換基とメタロイド原子との原子比が少なくとも1:1である
ことを特徴とするナノワイヤ。 - 蒸着のために遊離型または結合型の水素を必要としない前記前駆体から得られることを特徴とする、請求項1に記載のナノワイヤ。
- 実質的に環を含まず、前記環の量が生成混合物の全量に対して2質量%未満である前記前駆体から得られることを特徴とする、請求項1または2に記載のナノワイヤ。
- 実質的に分枝鎖を含まず、分枝部位の量が生成混合物の全量に対して5質量%未満、好ましくは2質量%未満である前記前駆体から得られることを特徴とする、請求項1から3のいずれかに記載のナノワイヤ。
- 大部分が分枝鎖からなる前記前駆体から得られることを特徴とする、請求項1から3のいずれかに記載のナノワイヤ。
- 前記置換基は、ハロゲン、より特定すれば塩素のみからなる前記前駆体から得られることを特徴とする、請求項1から5のいずれかに記載のナノワイヤ。
- 前記置換基は、水素のみからなる前記前駆体から得られることを特徴とする、請求項1から5のいずれかに記載のナノワイヤ。
- 大部分は直鎖からなる前記前駆体から得られることを特徴とする、請求項1から4、6、及び7のいずれかに記載のナノワイヤ。
- 平均鎖長が、n=2〜6、好ましくはn=2〜5を有する前記前駆体から得られることを特徴とする、請求項1から8のいずれかに記載のナノワイヤ。
- 不活性溶媒に容易に溶解する前記前駆体から得られることを特徴とする、請求項1から9のいずれかに記載のナノワイヤ。
- たとえば高度にハロゲン化されたポリシランであり、より特定すれば前記ハロゲンはClおよび/またはBrであるポリシランなどの自然発火性でない前記前駆体から得られることを特徴とする、請求項1から10のいずれかに記載のナノワイヤ。
- 1atom%未満の水素を含むことを特徴とする、請求項1から11のいずれかに記載のナノワイヤ。
- 10ppb〜50000ppm、好ましくは10ppb〜100ppmの前記ハロゲン、好ましくは塩素を含むことを特徴とする、請求項1から12のいずれかに記載のナノワイヤ。
- 5atom%未満、好ましくは2atom%未満のH含量を有する前記前駆体から得られることを特徴とする、請求項1から13のいずれかに記載のナノワイヤ。
- 前記前駆体の分子と結合したp型ドーピング原子を含む前記前駆体から得られることを特徴とする、請求項1から14のいずれかに記載のナノワイヤ。
- 前記前駆体の分子と結合したn型ドーピング原子を含む前記前駆体から得られることを特徴とする、請求項1から15のいずれかに記載のナノワイヤ。
- 前記混合物中の別の添加物としてp型ドーピング添加物を含む前記前駆体から得られることを特徴とする、請求項1から16のいずれかに記載のナノワイヤ。
- 前記混合物中の別の添加物としてn型ドーピング添加物を含む前記前駆体から得られることを特徴とする、請求項1から17のいずれかに記載のナノワイヤ。
- 元素の周期表の主族4(第14族)の左右にある族、好ましくは第13族および第15族からのドーピング添加物を含む前記前駆体から得られることを特徴とする、請求項1から18のいずれかに記載のナノワイヤ。
- さらに添加されたモノシランおよび/またはモノゲルマンの群からの混合剤を有する前記前駆体から得られることを特徴とする、請求項1から19のいずれかに記載のナノワイヤ。
- 前記ナノワイヤの蒸着のための触媒上で分解する前記前駆体から得られ、前記触媒は、金属、好ましくは遷移金属、またはその混合物であることを特徴とする、請求項1から20のいずれかに記載のナノワイヤ。
- 気相/液相/固相成長プロセスおよび気相/固相/固相成長プロセスの両方に適した前記前駆体から得られることを特徴とする、請求項1から21のいずれかに記載のナノワイヤ。
- 前駆体、または前記前駆体と水素とを反応させて請求項1から22のいずれかに記載のナノワイヤを製造する方法であって、
前記前駆体と水素との混合比1:0〜1:1,000,000で処理されることを特徴とする、ナノワイヤを製造する方法。 - 蒸着が水素元素または結合型の水素の存在なしに起こることを特徴とする、請求項23に記載の方法。
- 前記蒸着では、粉末状副生成物の生成が10%未満であることを特徴とする、請求項23または24に記載の方法。
- 0.1〜2200hPaの圧力範囲、好ましくは1〜1200hPaの圧力範囲で処理されることを特徴とする、請求項23から25のいずれかに記載の方法。
- 前記蒸着は、250℃〜1100℃、好ましくは300℃〜950℃、より好ましくは特に350℃〜900℃の温度で起こることを特徴とする、請求項23から26のいずれかに記載の方法。
- 前駆体、または前記前駆体と水素とを反応させることによって請求項1から22のいずれかに記載のナノワイヤを製造する方法であって、
成長のための異なる前記前駆体が一時的に交互に用いられ、
前記前駆体は、プロセスの間に少なくとも1回切り替えられることを特徴とするナノワイヤを生成する方法。 - 前駆体、または前記前駆体と水素とを反応させることによって請求項1から22のいずれかに記載のナノワイヤを製造する方法であって、
成長方向に互い違いになる組成を有するナノワイヤが得られることを特徴とするナノワイヤを生成する方法。
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DE102010019565.0 | 2010-05-05 | ||
DE201010019565 DE102010019565A1 (de) | 2010-05-05 | 2010-05-05 | Nanodrähte aus neuartigen Precursoren und Verfahren zu deren Herstellung |
DE102010019874.9 | 2010-05-07 | ||
DE201010019874 DE102010019874A1 (de) | 2010-05-07 | 2010-05-07 | Nanodrähte aus neuartigen Precursoren und Verfahren zu deren Herstellung |
PCT/EP2011/057253 WO2011138418A1 (de) | 2010-05-05 | 2011-05-05 | Nanodrähte aus neuartigen precursoren und verfahren zu deren herstellung |
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DE102012108250A1 (de) | 2012-09-05 | 2014-03-06 | Spawnt Private S.À.R.L. | Verfahren zur Abscheidung von Siliciumschichten |
US10312081B2 (en) | 2016-07-15 | 2019-06-04 | University Of Kentucky Research Foundation | Synthesis of metal oxide surfaces and interfaces with crystallographic control using solid-liquid-vapor etching and vapor-liquid-solid growth |
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