SG185123A1 - Nano-wires made of novel precursors and method for the production thereof - Google Patents
Nano-wires made of novel precursors and method for the production thereof Download PDFInfo
- Publication number
- SG185123A1 SG185123A1 SG2012081030A SG2012081030A SG185123A1 SG 185123 A1 SG185123 A1 SG 185123A1 SG 2012081030 A SG2012081030 A SG 2012081030A SG 2012081030 A SG2012081030 A SG 2012081030A SG 185123 A1 SG185123 A1 SG 185123A1
- Authority
- SG
- Singapore
- Prior art keywords
- precursors
- nanowires
- nanowires according
- hydrogen
- deposition
- Prior art date
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- 239000002243 precursor Substances 0.000 title claims abstract description 81
- 239000002070 nanowire Substances 0.000 title claims abstract description 76
- 238000000034 method Methods 0.000 title claims abstract description 28
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 10
- 239000000203 mixture Substances 0.000 claims abstract description 23
- 150000001875 compounds Chemical class 0.000 claims abstract description 21
- 239000001257 hydrogen Substances 0.000 claims abstract description 19
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract description 19
- 125000001424 substituent group Chemical group 0.000 claims abstract description 15
- 229910052736 halogen Inorganic materials 0.000 claims abstract description 11
- 150000002367 halogens Chemical class 0.000 claims abstract description 11
- 239000004065 semiconductor Substances 0.000 claims abstract description 7
- 239000000463 material Substances 0.000 claims abstract description 4
- 150000002738 metalloids Chemical group 0.000 claims abstract 2
- 229920000548 poly(silane) polymer Polymers 0.000 claims description 17
- 230000008021 deposition Effects 0.000 claims description 14
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 13
- 239000007789 gas Substances 0.000 claims description 13
- 229910052751 metal Inorganic materials 0.000 claims description 12
- 239000002184 metal Substances 0.000 claims description 12
- 125000004429 atom Chemical group 0.000 claims description 11
- 239000003054 catalyst Substances 0.000 claims description 7
- 239000000047 product Substances 0.000 claims description 7
- 239000007787 solid Substances 0.000 claims description 7
- 239000007790 solid phase Substances 0.000 claims description 6
- 239000000460 chlorine Substances 0.000 claims description 5
- 150000002431 hydrogen Chemical class 0.000 claims description 5
- 150000002739 metals Chemical class 0.000 claims description 5
- 239000000654 additive Substances 0.000 claims description 4
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical class [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 claims description 3
- 239000007791 liquid phase Substances 0.000 claims description 3
- 239000006227 byproduct Substances 0.000 claims description 2
- QUZPNFFHZPRKJD-UHFFFAOYSA-N germane Chemical class [GeH4] QUZPNFFHZPRKJD-UHFFFAOYSA-N 0.000 claims description 2
- 230000000737 periodic effect Effects 0.000 claims description 2
- 230000002123 temporal effect Effects 0.000 claims description 2
- 229910052723 transition metal Inorganic materials 0.000 claims description 2
- 150000003624 transition metals Chemical class 0.000 claims description 2
- 238000007792 addition Methods 0.000 claims 3
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 claims 2
- 229910052801 chlorine Inorganic materials 0.000 claims 2
- 239000012442 inert solvent Substances 0.000 claims 1
- 229910008045 Si-Si Inorganic materials 0.000 abstract description 3
- 229910006411 Si—Si Inorganic materials 0.000 abstract description 3
- 125000004435 hydrogen atom Chemical class [H]* 0.000 abstract 1
- 229910052710 silicon Inorganic materials 0.000 description 17
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 14
- 239000010703 silicon Substances 0.000 description 13
- 238000000151 deposition Methods 0.000 description 9
- 238000006243 chemical reaction Methods 0.000 description 7
- 229910052732 germanium Inorganic materials 0.000 description 7
- 229910045601 alloy Inorganic materials 0.000 description 6
- 239000000956 alloy Substances 0.000 description 6
- 150000001412 amines Chemical group 0.000 description 6
- 238000000354 decomposition reaction Methods 0.000 description 6
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 4
- 229910052734 helium Inorganic materials 0.000 description 4
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 239000000470 constituent Substances 0.000 description 3
- -1 galiium Chemical compound 0.000 description 3
- 239000010931 gold Substances 0.000 description 3
- 239000011261 inert gas Substances 0.000 description 3
- 239000003863 metallic catalyst Substances 0.000 description 3
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 3
- 229910052759 nickel Inorganic materials 0.000 description 3
- 229910052697 platinum Inorganic materials 0.000 description 3
- 230000007704 transition Effects 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 2
- IMNFDUFMRHMDMM-UHFFFAOYSA-N N-Heptane Chemical compound CCCCCCC IMNFDUFMRHMDMM-UHFFFAOYSA-N 0.000 description 2
- OFBQJSOFQDEBGM-UHFFFAOYSA-N Pentane Chemical compound CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 2
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 2
- 229910008310 Si—Ge Inorganic materials 0.000 description 2
- 229910052797 bismuth Inorganic materials 0.000 description 2
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 2
- 238000009835 boiling Methods 0.000 description 2
- 229910052794 bromium Inorganic materials 0.000 description 2
- 239000000374 eutectic mixture Substances 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 150000003377 silicon compounds Chemical class 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 238000003786 synthesis reaction Methods 0.000 description 2
- SICLLPHPVFCNTJ-UHFFFAOYSA-N 1,1,1',1'-tetramethyl-3,3'-spirobi[2h-indene]-5,5'-diol Chemical compound C12=CC(O)=CC=C2C(C)(C)CC11C2=CC(O)=CC=C2C(C)(C)C1 SICLLPHPVFCNTJ-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 150000001335 aliphatic alkanes Chemical class 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 150000001639 boron compounds Chemical class 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- KOPOQZFJUQMUML-UHFFFAOYSA-N chlorosilane Chemical class Cl[SiH3] KOPOQZFJUQMUML-UHFFFAOYSA-N 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 125000004122 cyclic group Chemical group 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 239000002019 doping agent Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000005496 eutectics Effects 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 231100001261 hazardous Toxicity 0.000 description 1
- 239000012433 hydrogen halide Substances 0.000 description 1
- 229910000039 hydrogen halide Inorganic materials 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 1
- 229910001338 liquidmetal Inorganic materials 0.000 description 1
- 229910052752 metalloid Inorganic materials 0.000 description 1
- 229910052754 neon Inorganic materials 0.000 description 1
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- TVMXDCGIABBOFY-UHFFFAOYSA-N octane Chemical compound CCCCCCCC TVMXDCGIABBOFY-UHFFFAOYSA-N 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 125000004437 phosphorous atom Chemical group 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 150000003018 phosphorus compounds Chemical class 0.000 description 1
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 1
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 1
- VMXUWOKSQNHOCA-UKTHLTGXSA-N ranitidine Chemical compound [O-][N+](=O)\C=C(/NC)NCCSCC1=CC=C(CN(C)C)O1 VMXUWOKSQNHOCA-UKTHLTGXSA-N 0.000 description 1
- 150000004756 silanes Chemical class 0.000 description 1
- 239000012686 silicon precursor Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 231100000331 toxic Toxicity 0.000 description 1
- 230000002588 toxic effect Effects 0.000 description 1
- VEDJZFSRVVQBIL-UHFFFAOYSA-N trisilane Chemical compound [SiH3][SiH2][SiH3] VEDJZFSRVVQBIL-UHFFFAOYSA-N 0.000 description 1
- SYOKIDBDQMKNDQ-XWTIBIIYSA-N vildagliptin Chemical compound C1C(O)(C2)CC(C3)CC1CC32NCC(=O)N1CCC[C@H]1C#N SYOKIDBDQMKNDQ-XWTIBIIYSA-N 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
Classifications
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- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
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- C01B33/027—Preparation by decomposition or reduction of gaseous or vaporised silicon compounds other than silica or silica-containing material
- C01B33/03—Preparation by decomposition or reduction of gaseous or vaporised silicon compounds other than silica or silica-containing material by decomposition of silicon halides or halosilanes or reduction thereof with hydrogen as the only reducing agent
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- C01B33/00—Silicon; Compounds thereof
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- C01B33/1071—Tetrachloride, trichlorosilane or silicochloroform, dichlorosilane, monochlorosilane or mixtures thereof
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- C01B33/107—Halogenated silanes
- C01B33/10773—Halogenated silanes obtained by disproportionation and molecular rearrangement of halogenated silanes
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- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
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- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
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- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/12—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
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Abstract
AbstractThe invention relates to nano-wires which consist of or comprise semiconductor materials and are used forapplications in photovoltaics and electronics and to a method for the production thereof. The nano-wires are characterized in that they are obtained by a novel method using novel precursors. The precursors represent compounds, or mixtures of compounds, each having atleast one direct Si-Si and/or Ge-Si and/or Ge-Ge bond, the substituents of which consist of halogen and/or hydrogen, and in the composition of which the atomic ratio of substituent:metalloid atoms is at least 1:1.
Description
! : : - -
NUMMIMEIW
*159159* ; - 1 - oo
Nano-wires made of novel precursors and method for the production thereof ’ i . } : The present invention relates to nanowires which consist of or comprise semiconductor materials and which serve for applications in photovoltaics and electronics, and also to a method for production thereof. BA feature of the nanowires 1s that they are obtained by an innovative method using innovative precursors. The precursors constitute compounds or mixtures of compounds each having at least one direct
Si-Si and/o» Ge-Si and/or Ge-Ge bond, with substituents which consist of halogen and/or hydrogen and with a composition in which the atomic ratic of substituents to metallioid atoms is at least 1:1. ’
Prior art:
Described in the prior art, for the production of silicon nanowires, is the thermal decomposition of gaseous silicon precursor compounds. Here, besides various silicon compounds, catalytically active metals are employed. Generally speaking, catalyst metal agglomerates of a few nanometers in diameter are } produced first of all, and then act catalytically on the decomposition of the silicon compounds and contribute to the ordered deposition of the elemental silicon formed. Depending on the reaction conditions, the resulting nanowires are crystalline or wholly or partly amorphous. It 1s preferred to use metals which exhibit eutectic mixtures with a low melting temperature with silicon. The model conception says 3E that, under the reaction conditions, a liquid metal/Si mixture 1s formed, from which, finally, solid Si .depcsits as a result of further uptake of Si from the
NUIT
. <
7 a . . - 2 - precursor compounds as they decompose. However, a comparable growth behavior is also observed even at temperatures below the eutectic melting point. Silicon nanowires are deposited predominantly on substrates such as silicon or such as metal oxides, an example being Al,0s5. )
For example, E.C. Garnett, W. Liang, and P. Yang,
Advanced Materials 2007, 79, 2946, describe the production of silicon nanowires by CVD deposition from
SiCl,/H», with Pt as catalyst metal, under atmospheric pressure and at 805°C. Y. Zhang, ©. Zhang, N. Wang,
Y. Yan, H. Zhou, and J. Zhu, Journal of Crystal Growth 2006, 221, 183, use a similar method under atmospheric pressure with an optimized temperature of 800°C, with : Ni as catalyst metal.
It is found that for the epitaxial deposition of silicon nanowires on crystalline silicon it is necessary first of 2ll to remove the oxide layer of the substrate. . Where chlorosilanes are used as precursor compounds, there is formation, together with hydrogen additionally present, of HCl, which reacts with the oxide layer (S. Ge, K. Jiang, X. Lu, Y. Chen, R. Wang, and S. Fan, Advanced Materials 2005, 17, 56). When chlorine-free precursor silanes are used, the same effect can be achieved by admixing HCl (S. Sharma,
T.T. Kamins, and R.S. Williams, Journal of Crystal
Growth 2004, 261, 613). For example, WO 2001/136412, after the production of suitable catalyst metal agglomerates, ciaims the successive use of at least two different precursor gas mixtures, of which the. first mixture comprises either a chlorine-containing silane or, 1n addition to a silane, another chlorine source, and which ensures the start of growth, but requires comparatively high temperatures for the decomposition.
Thereafter the reaction temperature is lowered and a r <. - 3 - second precursor gas 1s used, which has a lower decomposition temperature. Suitable precursor compounds . cited are SiHg, Si,He, SiCl;, and SiH:Cl,. Examples of suitable catalyst metals are Au, Ai, Pt, Fe, Ti, Ga,
Ni, Sn, or In. In addition to the conventional CVD technique for producing silicon nanowires, there are also references to Plasma Enhanced Sputter Deposition and Plasma Enhanced CVD, which allow a reduction in the reaction temperature. 16
W.I. Park, G. Zheng, X- Jiang, B. Tian, and
C.M. Lieber, Nano Letters 2008, 8, 3004, describe how at 400°C and 10 torr pressure, the growth rate of silicon nanowires with Au as catalyst is 130 times greater for disilane, Si;He, than for SiH.,. Even with reaction temperatures optimized for SiH4, the growth rate lags behind that starting from disilane by a factor of 31. S. Akhtar, A. Tanaka, K. Usami,
Y. Tsuchiya, and S$. Oda, Thin Solid Films 2008, 517, 317, show that nanowires can be produced from Si;Hs/H; using Au catalyst even at a temperature of 350°C and under a pressure of 3 Torr. For example,
JP 2006117475 A and JP 2007055840 2A describe the production ‘of Si nanowires at temperatures as low as 250-300°C, using disilane and trisilane as silicon sources, employing the metals Au, Ag, Fe, and/or Ni as catalysts, and setting a pressure during the reaction of 1-5 torr.
E.-Y. Tuan, D.C. Lee, T. Hanrath, and B.A. Korgel, Nano
Letters 2005, 5, 681, show that the formation of Si nanowires takes place even without a substrate in supercritical organic solvents at 400-520°C and =z pressure of 14.3 - 23.4 MPa. The catalyst metal used is
Ni, and, in addition to trisilane, Si3Hg, the precursor compounds employed include octylsilane and phenylsilane. A.T. Heitsch, D.D. Fanfeir, H.-Y. Tuan,.
' i
Co. and B.A. Korgel, Journal of the American Chemical
Society 2008, 130, 5436, show that for trisilane as precursor molecule, this reaction leads To SS. nanowires even under atmospheric pressure and at boiling temperature (420-430°C) with high-boiling organic solvents.
A disadvantage of the use of silanes (SigHon+z) 1s their pyrophoric properties (self-ignitability in air), which hinder handling. . Objective:
The object on which the present invention is based is that of providing innovative nanowires by a new method from suitable precursors of the specified kind that are new for this purpese. The intention, moreover, 1s To provide a method for producing such nanowires. 2C Definitions:
Precursors for the growth of nanowires are silicon and/or germanium-containing compounds which are converted into elemental silicon and/or germanium under the process conditions.
Polysilanes in the sense of the invention are compounds having at least one Si-Si bond. According to one embodiment of the invention, polysilanes are halogenated and hydrogenated polysilanes and ‘also polysilanes having organic supstituents, and the corresponding partially halogenated and partially hydrogenated polysilanes, having the following general : : formula: SiyX.H,, where a+b 1s greater than or equal to 2n and less than or egual to 2r+2, a and kb are each greater than or equal to 0, and X = halogen, amine substituent or organic radical, such as alkyl radicals,
’ ‘ - 5 - for example, more particularly methyl. It is also possible, furthermore, to use polysilanes with organic substituents for SiC nanowires, or with amine substituents for SiN nanowires. It 1s also possible, furthermore, <tTo0 use polysilanes having (transition) metal substituents.
Polygermanes in the sense of the invention are compounds having at least one Ge-Ge bond. According to one embodiment of the invention, the polygermanes are halogenated and hydrogenated polygermanes and also the ' corresponding partially halogenated and partially hydrogenated polygermanes, having the following general formula: GepX.H,, where a+b 1s greater than or equal to 2n and less than or equa. to 2nt+2, & and b each being greater than or equal to 0, and X = halogen, amine substituent or organic radicai, such as alkyl radicals, for example, more particularly methyl. Furthermcre, polyogermanes with organic substituents can also be used for GeC nanowires, or, with amine substituents for GeN nanowires. Tt is also possible, furthermore, for polygermanes having {transition} metal substituents to be used.
Polygermasilanes in the sense of the invention are compounds having at least one Si-Ge bond. According to one embodiment of .the invention, -poliygermas:lanes are halogenated and hydrogenated polygermasilanes, and also the corresponding partially halogenated and partially hydrogenated polygermasilanes, having the following general formula: Si,-.Ge.X.Hg or Si,Ge..X:Hy, where a+b is greater than or equal to 2n and less than or equal to 2n+Z, a and b each being greater than or egual to C, n is greater than z, and X = halogen, amine substituent or organic radical, such as alikyi radicals, for example, more particularly methyi. Additionally it 1s also possible to use polygermasilanes having organic
-¢ — substituents for $1GeC nanowires, or having amine substituents for SiGeN nanowires. Additionally it is also possible to use - polygermasilanes having (transition) metal substituents. . | : | :
By p-doped precursors 1s meant that the respective . compound/the mixture comprises a fraction of p-doping atoms such as boron, aluminum, galiium, or indium, preferably boron atoms, that is useful for the desired semiconductor properties of the deposition product (e.g., Fermi level), it being possible for these atoms either to be incorporated into the precursor molecules or to be admixed as separate compounds to the " precursors.
By n-doped precursors is meant that the respective compound/the mixture comprises a fraction of n-doping atoms such as nitrogen, phosphorus, arsenic, antimony, or bismuth, preferably phosphorus atoms, that is useful for the desired semiconductor properties of the deposition product {e.qg., Fermi level), it being possible for these atoms either to be incorporated Into the precursor molecules or to be admixed as separate compounds to the precursors. : Further doping elements may be taken from the groups of the Periodic Table of the Elements to the leit and right of main group 4 (group 14), preferably from groups 13 and 13.
Monosilanes and monogermanes are all compounds having in each case only one silicon atom or one germanium atom. SiX,H, and GeX.Hp, where a+b is 4, and a and b are each greater than or equal to O. :
The term “metalloid atoms” refers to atoms of the semimetals silicon and germanium.
+ i . : : _ : The expressions “..consist of halogen..” or “.consist of hydrogen...” mean that apart from minor other constituents (< 1% by mass), the substituents consist exclusively of halogen or of hydrogen, respectively.
By “predominantly” is meant that the constituent in ' question is present in the mixture to an extent of more than 80% by mass. oo “Virtually nolne]” means that a secondary constituent is present at less than 5% by mass in a mixture.
I) : The nanowires produced in accordance with the invention are notable for the fact that the innovative precursors used are liquid under standard conditions (room temperature, atmospheric pressure) with one exception (Si,He) and are soluble in numerous solvents, meaning that they can be handled more easily and securely than many conventional precursors, such as monosilane, for example. Examples of solvents which are inert relative to the precursors are monochlorosilanes, such as SiCly, *iquid alkanes, such as hexane, heptane, pentane, and octane, and also aromatics, such as benzene, toluene, and xylene, for example.
In certain embodiments of the invention, particularly preferred precursors are the highly chlorinated polysilanes, polygermanes, polygermasilanes, more particularly SinHalons: with Hal = Cl, ¥, Br, or I, preference being given to using ‘SipClsp.z with n= 2 -10G, more preferably with n = 2 -5. Polygermanes which can be used are, generally, compounds of the general formula GepHalonez, with. Hal = C1, F, Br, or I, preferably GepCln:s. Polygermasilanes which car be used
+ . - 8 - ’ are compounds of the general formula Sip-.GesHalsno Or
SiyGep-yHalsns, with n > x, it being possible for the parameter n in the case of the polygermanes and polygermasilanes to be n= 2 -190, more preferably n=2 -5.
According to a further embodiment of the invention, the nanowires may be obtained from precursors which contain virtually no rings, the amount of rings, based on the overall product mixture, being below < 2% by mass.
According to a further embodiment of the invention, the nanowires may be obtained from precursors which contain virtually no branched chains, the amount of branching sites, based on the overall product mixture, being below < 5% by mass, preferably < 2% by mass. It is possible, for example, to use halogenated polysilanes having a low fraction of rings and having chains with low degrees of branching, these polysilanes being of +the kind described in PCT application W02009/143823 AZ, hereby incorporated in full by reference in relation to their properties and synthesis.
Furthermore, the nanowires may be obtained Irom precursors which consist predominantly c¢f JDbranched chains. It is possible, for example, to use halogenated polysilanes having a high fraction of rings and having branched chains, of the kind described in PCT application WO 2009/143824 Al, hereby incorporated in full by reference in relation to their properties and synthesis.
According to another embodiment of the invention it is possible to obtain nanowires from precursors whose substituents consist exclusively of hydrogen. In this case, for example, polysilanes, polygermanes or pclvgermasilanes of the general formulae SinEzp-2,
Co . GepHons» and/or Sip-xGeyHonsz Or SinGen-yHynez With n > x with n = 3 -1C, more preferably with n = 3 -5, can be used as precursors. It is also possible to use cyclic polysilanes, polygermanes and polygermasilanes having the general formulae SisHzn, GepHzn and/or Si, ;GeyHazn or
SiyxGep-xHon, with n > x with n = 3 -10, more preferably with n = 4-6.
The gas mixture (precursor and carrier gas and/or hydrogen) used in the context of the method of the invention may additionally be diluted with an inert gas, such as helium, neon, argon, krypton, xenon, Or : nitrogen, for example, and/or may comprise further admixtures (additives), such as doping additives, examples being liguid or solid boron compounds, metallic compounds or phosphorus compounds, for example. Examples are BBri, TiCls, or bPCl,, In the context of the method of the invention, the admixing of : inert gases is, however, not mandatory.
The deposition temperatures in the method of the invention lie between 250 - 1100°C, preferably between 330 to 950°C.
Some embodiments of the method of the invention are notable for the fact that nanowires can be obtained from the precursors of the invention without the presence of hydrogen in free or bonded form being necessary during the deposition, since there are other semiconductor-yielding reactions present, as for example: Si3Clg => 2 SiCig + Si, GezCle -> 2 GeCl, + Ge, 3 GeSi,Cle -> 4 SiClgq + 2 GeCl, + GeSi,. In the case of certain embodiments of the invention, this is possible through use of highly halogenated, more particularly highly chlorinated, polysilanes of the general formula
SinClapsz With n = 2 -1C, more preferably with n = 2 -5, or by using the corresponding highly halogenated, more particularly high chlorinated, polygermanes or polygermasilanes. :
The reaction pressures in the case of the method of the invention are situated in the range from 0.1 hPa to 2200 hPa, preferably at 1 hPa TO 1100 hPa, more preferably between 200 hPa and 1100 hPa.
The partial pressures of the precursors of the invention may be adjusted in a simple way by varying the temperatures of the reservoir vessel and also by admixing further gas components.
Metallic catalysts employed for the deposition of the nanowires of the invention include metals such as bismuth, preferably transition metals, such as Cu, Ag,
Ni, and Pt, for example, or else Au, or mixtures thereof. }
By using the precursors of .the invention it is possible to employ catalysts which do not affect the electronic properties of the nanowires. Ni and Pt particularly are compatible with typical metal oxide semiconductor technologies. ’ According to a further embodiment of the invention, the innovative precursors are able to be decomposed over the metallic catalysts to form the corresponding elements, as for example Si or Ge, and/or alloys, as for example Si-Ge alloys, and so Zorm the nanowires.
The particle sizes (diameters) oI the catalysts are 5 nr to 1000 nm, preferably 20 nm - 200 nm, and can be determined by means of an electron microscope, for 32 axample.
The nanowires of the invention possess diameters in the range from 50 to 1200 nm and lengths in the range from 100 to 100 000 nm, and other dimensions are obtainable as well by varying the growth times. - The growth rates are situated in the range from 5 nm to 5000 nm per minute. .
By using the precursors of the invention and/or at low process temperatures of below 600°C during the formation of the nanowires, the growth of the nanowires of the invention «can also be carried out without formation of hydrogen halide, thereby exerting .an influence also on the etching behavior and the epitaxiaily associated orientation of the nanowires. ~ The precursors of the invention are preferably suitable both for the gas/liquid/solid phase growth process and for the gas/solid/solid phase growth process. In the ) case of the gas/liquid/solid phase growth process, a liquid eutectic mixture is formed from the metal and the semimetal element (e.g., gold/silicon), from which silicon deposits on the solid wire and in which fresh silicon dissolves by decomposition of the precursors in : the gas phase. In the case of the gas/solid/solid phase growth process, a solid alloy of the semimetal element in the metal is formed by the dissolution of the element after decomposition of the precursor and also by the depositior Zrom the sclid alloy onto the nanowire as a result of diffusion processes in the sclid alloy.
In the case of certain embodiments of the invention, by using the precursors of the invention, such as the highly halogenated polysilanes, polygermanes or . 35 polygermasilanes, for example, it is pessible to obtain hydrogen-Zree nanowires, since the use of hydrogen is not necessary for producing the nanowires.
AL further feature of the nanowires produced in accordance with the invention is that the innovative precursors used may be designed preferably as single- source precursors for doped semiconductor regions. As a result of this it is possible to do away with the use of toxic or otherwise hazardous dopants, such as phosphine and diborane, for example, which in conventional doping processes necessitate the use of costly gas supply and safety systems. According to one embodiment of the invention, therefore, it is possible to produce the nanowires using exclusively the precursors, without additional reactive gases, such as hydrogen, for example. 1%
Moreover, a2 feature of the nanowires produced in : accordance with the invention is that the innovative precursors used can be used in temporal alternation, i.e., for example, p-doped and n-doped precursors alternately, for the growth, with the precursors being switched at least once during the process. In this way it is pcssibie to obtain, for example, differently doped regions preferably in alternation in the longitudinal direction, more particularly p/n junctions, which are important, for example, for the photovoltaic effect. In a corresponding way it 1s also possible, furthermore, to produce alternating regions having different Si:Ge ratios.
In addition it is possible to obtain nanowires having compositions which alternate in growth direction. For this purpose, different precursors/precursor mixtures can be provided in alternation during growth. As a result it is possible to obtain, for example, different dopings or alloys in a crystal of a nanowire.
A further feature of the method of the invention for
- 13 =- producing nanowires is that during the deposition of the nanowires, besides the nanowires, less than 10% of : pulverulent by-products, comprising, for example, the elemental semimetals Si or Ge, are deposited in the deposition region of the nanowires. These unwanted by- : products may" be formed as a result of unwanted, uncatalyzed decomposition of the precursors.
All of the precursors of the invention can also be used for the epitaxial growth of nanowires on crystalline Si substrates.
Working example:
Using highly chlorinated polysilanes of the formula
SinClznsz with n = 2 -10, such as SisCls, for example, as precursors, and with Au as metallic catalyst, nanowires can be produced with decomposition of the precursors at temperatures between 400°C to 900°C. Besides the precursors, only helium, as inert gas, was present, and " so the nanowires were produced in particular in the absence of hydrogen or other reactive gases. The nanowires had dimensions of 2 um to 20 um in length, "and a width of 50 nm to 500 nm.
Claims (22)
1. Nanowires which consist of or comprise semiconductor materials and serve for applications in photovoltaics and electronics, characterized in that they are produced from precursors which constitute compounds or mixtures of compounds each having at least one direct S$i-Si and/or Ge-Si Co and/or Ge-Ge bond, with substituents consisting of halogen and/or hydrogen and with a composition in which the atomic ratio of substituents to metalloid atoms is at least 1:1.
2. The nanowires according to claim 1, characterized in that they are obtained from precursors which for deposition do not require the presence of hydrogen in free or bonded form.
3. The nanowires according to either of the preceding claims, characterized in that they are obtained } from precursors which contain virtuaily no rings, the amount of rings, based on the overall product mixture, being below < 2% by mass.
4. The nanowlres according to any of the preceding claims, characterized in that they are obtained from precursors which contain virtually no branched chains, the amount of branching sites, based on the overall product mixture, being below
<.5% by mass, preferably < 2% by mass.
5. The nanowires according to any of claims 1 to 23, characterized in that they are obtained from precursors which consist predominantly of branched chains.
6. The nanowires according to anv of the preceding claims, characterized in that they are obtained from precursors whose substituents consist exclusively 0% halogen, more’ particularly chlorine.
7. The nanowires according to any of claims 1 to 3, characterized in that they are obtained from precursors whose substituents consist exclusively of hydrogen. Co
8. The nanowires according to any of claims 1 to 4 or . 6, 7, characterized in that they are obtained from precursors which consist predominantly of linear chains.
9. The nanowires according to any of the preceding claims, characterized in that they are obtained : from precursors which possess an average chain length of n = 2-6, preferably n = 2-5.
10. The nanowires according to any of the preceding claims, characterized in that they are obtained from precursors which are readily solubie in inert solvents.
11. The nanowires according to any of the preceding claims, characterized in that they are obtained from precursors which are not pyrophoric, such as, for example, highly halogenated polysilanes, the halogen being more particularly Cl and/or Br.
12. The nanowires according to any of the preceding claims, characterized in that they contain less than 1 atom% of hydrogen. 33
13. The nanowires according to any of the preceding claims, characterized in that they contain 10 ppb to 50 000 ppm, preferably 10.ppb to 100 ppm, of halogen, preferably chlorine.
14. The nanowires according to any of the preceding claims, characterized in that they are obtained from precursors which have an H content of less than 5 atom%, preferably less than 2 atom%.
15. The nanowires according to any of the preceding claims, characterized in that they are obtained - from precursors which comprise p-doping atoms incorporated in the precursor molecules.
le. The nanowires according to any of the preceding claims, characterized in that they are obtained from precursors which comprise n-doping atoms incorporated in the precursor molecules.
17. The nanowires according to any of the preceding claims, characterized in that they are obtained from precursors which comprise p-doping additions as separate additives in the mixture.
18. The nanowires according to any of the preceding ‘claims, characterized in that they are obtained from precursors which comprise n-doping additions as separate additives in the mixture. }
12. The nanowires according to any of the preceding claims, characterized in that they are obtained from precursors which comprise doping additions from the groups of the Periodic Table of =the Elements to the left and right of main group 4 (group 14), preferably from groups 13 and 15. oo
20. The nanowires according to any of the preceding claims, characterized in thet they are obtained
3 | = 17 = from the precursors, with admixtures from the group of the monosilanes and/or the monogermanes having been added additionally.
21. The nanowires according to any of the preceding : claims, characterized in that they are obtained from precursors which are decomposed over catalysts for the deposition of the nanowires of the invention, ~ with catalysts employed being metals, preferably transition metals, or mixtures thereof.
22. The nanowires according to any of the preceding claims, characterized in that they are obtained from precursors which are suitable both for the gas/liquid/solid phase growth process and for the gas/solid/solid phase growth process.
23. A method for producing nanowires according to any of the preceding claims by reacting precursors, Or precursors and hydrogen, characterized in that a precursor:hydrogen mixing ratio of 21:0 to 1:2 000 000 is operated.
24. The method according to preceding claim 23, characterized in that the deposition takes place without presence of hydrogen in elemental or bonded form. 0
25. The method according to any of the preceding claims, characterized in that less than 10% of pulverulent by-products occur in the deposition of the nanowires.
26. The method according to any of the preceding claims, characterized in that & pressure range of
0.1 - 2200 hPa, preferably 1 to 1200 hPa is
"operated.
"27. The method according to “any of the preceding : claims, characterized in that the deposition takes place at a temperature of 250°C to 1100°C, preferably 300°C to 950°C, more preferably, "in particular 350°C to 900°C.
28. A method for producing nanowires according to any of the preceding claims by reacting precursors, or : precursors and hydrogen, characterized in that different precursors for the growth are used in : temporal alternation, the precursors being switched at least once during the process.
22. A method for producing nanowires according to any of the preceding claims by reacting precursors, or : precursors and hydrogen, characterized ir that nanowires having compositions which a_ternate in growth direction are obtained.
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DE201010019565 DE102010019565A1 (en) | 2010-05-05 | 2010-05-05 | Nanowires of novel precursors and process for their preparation |
DE201010019874 DE102010019874A1 (en) | 2010-05-07 | 2010-05-07 | Nanowire useful in photovoltaics and electronics, comprises semiconductor materials and precursors of compounds or mixtures of compounds with a direct silicon-silicon-, germanium-silicon- and/or germanium-germanium-bond |
PCT/EP2011/057253 WO2011138418A1 (en) | 2010-05-05 | 2011-05-05 | Nano-wires made of novel precursors and method for the production thereof |
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EP (1) | EP2566813A1 (en) |
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US9263262B2 (en) * | 2010-05-05 | 2016-02-16 | Spawnt Private S.À.R.L. | Nanowires made of novel precursors and method for the production thereof |
DE102012108250A1 (en) | 2012-09-05 | 2014-03-06 | Spawnt Private S.À.R.L. | Method for depositing silicon layers |
KR101462025B1 (en) * | 2013-11-29 | 2014-11-19 | 한국화학연구원 | Inorganic-Orgaic Hybrid Light Harvesters of Perovskite Structure and Fabrication of Solar Cells Using Thereof |
US10312081B2 (en) | 2016-07-15 | 2019-06-04 | University Of Kentucky Research Foundation | Synthesis of metal oxide surfaces and interfaces with crystallographic control using solid-liquid-vapor etching and vapor-liquid-solid growth |
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US6518494B1 (en) | 1995-08-22 | 2003-02-11 | Matsushita Electric Industrial Co., Ltd. | Silicon structure, method for producing the same, and solar battery using the silicon structure |
JP3053183B1 (en) | 1999-08-27 | 2000-06-19 | 科学技術振興事業団 | Floating melting using pseudo-microgravity field by magnetic force |
JP4547519B2 (en) * | 2004-10-22 | 2010-09-22 | 独立行政法人物質・材料研究機構 | Method for producing silicon nanowire |
JP4811851B2 (en) | 2005-08-24 | 2011-11-09 | 独立行政法人物質・材料研究機構 | Method for cross-linking growth of silicon nanowires |
JP2009522197A (en) | 2005-12-29 | 2009-06-11 | ナノシス・インコーポレイテッド | Method for oriented growth of nanowires on patterned substrates |
CN101573778B (en) * | 2006-11-07 | 2013-01-02 | 奈米系统股份有限公司 | Systems and methods for nanowire growth |
JP2008305982A (en) * | 2007-06-07 | 2008-12-18 | Panasonic Corp | Field effect transistor and its manufacturing method |
WO2009043823A1 (en) | 2007-09-28 | 2009-04-09 | Advance Thun Ag | Paraglider |
DE102007046783A1 (en) | 2007-09-29 | 2009-04-23 | Carl Zeiss Nts Gmbh | Device for deflecting or deflecting a particle beam |
US7915146B2 (en) * | 2007-10-23 | 2011-03-29 | International Business Machines Corporation | Controlled doping of semiconductor nanowires |
DE102008025260B4 (en) | 2008-05-27 | 2010-03-18 | Rev Renewable Energy Ventures, Inc. | Halogenated polysilane and thermal process for its preparation |
DE102008025261B4 (en) | 2008-05-27 | 2010-03-18 | Rev Renewable Energy Ventures, Inc. | Halogenated polysilane and plasma-chemical process for its preparation |
FR2944783B1 (en) * | 2009-04-28 | 2011-06-03 | Commissariat Energie Atomique | PROCESS FOR THE PRODUCTION OF SILICON NANOWILS AND / OR GERMANIUM |
US20110309306A1 (en) * | 2010-04-30 | 2011-12-22 | University Of Southern California | Fabrication of Silicon Nanowires |
US9263262B2 (en) * | 2010-05-05 | 2016-02-16 | Spawnt Private S.À.R.L. | Nanowires made of novel precursors and method for the production thereof |
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JP2013527831A (en) | 2013-07-04 |
EP2566813A1 (en) | 2013-03-13 |
WO2011138418A1 (en) | 2011-11-10 |
US9263262B2 (en) | 2016-02-16 |
ZA201208193B (en) | 2014-06-25 |
CA2797834A1 (en) | 2011-11-10 |
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