JP2013524506A5 - - Google Patents

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Publication number
JP2013524506A5
JP2013524506A5 JP2013502561A JP2013502561A JP2013524506A5 JP 2013524506 A5 JP2013524506 A5 JP 2013524506A5 JP 2013502561 A JP2013502561 A JP 2013502561A JP 2013502561 A JP2013502561 A JP 2013502561A JP 2013524506 A5 JP2013524506 A5 JP 2013524506A5
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JP
Japan
Prior art keywords
layer
conductive
conductive layer
interconnect
dielectric layer
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JP2013502561A
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English (en)
Japanese (ja)
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JP2013524506A (ja
JP6038771B2 (ja
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Priority claimed from US12/750,408 external-priority patent/US8304851B2/en
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Publication of JP2013524506A publication Critical patent/JP2013524506A/ja
Publication of JP2013524506A5 publication Critical patent/JP2013524506A5/ja
Application granted granted Critical
Publication of JP6038771B2 publication Critical patent/JP6038771B2/ja
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JP2013502561A 2010-03-30 2010-12-23 半導体熱電対及びセンサ Active JP6038771B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/750,408 2010-03-30
US12/750,408 US8304851B2 (en) 2010-03-30 2010-03-30 Semiconductor thermocouple and sensor
PCT/US2010/062055 WO2011126530A1 (en) 2010-03-30 2010-12-23 Semiconductor thermocouple and sensor

Publications (3)

Publication Number Publication Date
JP2013524506A JP2013524506A (ja) 2013-06-17
JP2013524506A5 true JP2013524506A5 (https=) 2014-02-06
JP6038771B2 JP6038771B2 (ja) 2016-12-07

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013502561A Active JP6038771B2 (ja) 2010-03-30 2010-12-23 半導体熱電対及びセンサ

Country Status (4)

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US (2) US8304851B2 (https=)
JP (1) JP6038771B2 (https=)
CN (2) CN102823005A (https=)
WO (1) WO2011126530A1 (https=)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2973164B1 (fr) * 2011-03-25 2013-04-26 Commissariat Energie Atomique Capteur differentiel de temperature et ses capacites en technologie cmos/bicmos
US10529641B2 (en) * 2016-11-26 2020-01-07 Texas Instruments Incorporated Integrated circuit nanoparticle thermal routing structure over interconnect region
US10672969B2 (en) 2017-06-29 2020-06-02 Taiwan Semiconductor Manufacturing Co., Ltd. Thermocouple device
US11312621B2 (en) 2018-08-06 2022-04-26 Invensense, Inc. Sensing thermal gradients within a microelectromechanical device
US12298188B2 (en) * 2018-11-21 2025-05-13 Gold Standard Radiation Detection, Inc. Radiation powered high dose rate and high dose radiation sensor
US11635334B2 (en) * 2020-06-30 2023-04-25 Apple Inc. Miniature external temperature sensing device for estimating subsurface tissue temperatures
US11408778B2 (en) 2020-07-21 2022-08-09 Apple Inc. Temperature gradient sensing in portable electronic devices
US11771329B2 (en) 2020-09-24 2023-10-03 Apple Inc. Flexible temperature sensing devices for body temperature sensing
US12575739B2 (en) 2021-09-21 2026-03-17 Apple Inc. Distributed sensor network for measurement of biometric parameter
US12460976B2 (en) * 2022-06-06 2025-11-04 Microchip Technology Incorporated Integrated thermocouple

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US3393328A (en) 1964-09-04 1968-07-16 Texas Instruments Inc Thermal coupling elements
JPS6140523A (ja) * 1984-08-01 1986-02-26 Matsushita Electric Ind Co Ltd 熱電堆型赤外検出素子
US5343064A (en) 1988-03-18 1994-08-30 Spangler Leland J Fully integrated single-crystal silicon-on-insulator process, sensors and circuits
US5059543A (en) 1990-09-21 1991-10-22 The Board Of Regents Acting For And On Behalf Of The University Of Michigan Method of manufacturing thermopile infrared detector
US5689087A (en) 1994-10-04 1997-11-18 Santa Barbara Research Center Integrated thermopile sensor for automotive, spectroscopic and imaging applications, and methods of fabricating same
US5909004A (en) 1996-04-17 1999-06-01 General Electric Company Thermocouple array and method of fabrication
JP2001208606A (ja) * 2000-01-27 2001-08-03 Alps Electric Co Ltd 赤外線センサ
JP2001349787A (ja) 2000-06-06 2001-12-21 Seiko Epson Corp 赤外線検出素子および測温計
JP4009046B2 (ja) 2001-04-10 2007-11-14 浜松ホトニクス株式会社 赤外線センサ
US6531899B1 (en) 2001-12-27 2003-03-11 Texas Instruments Incorporated Integrated differential current comparator with input to output electrical isolation
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CN1221213C (zh) * 2002-06-25 2005-10-05 祥群科技股份有限公司 温度传感器及其运用该温度传感器的指纹辨识晶片
JP2004033610A (ja) * 2002-07-05 2004-02-05 Lightuning Technology Inc 温度差検出セル及びそれを応用した指紋サーモグラフ読み取り装置
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