JP2013519180A5 - - Google Patents
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- JP2013519180A5 JP2013519180A5 JP2012551964A JP2012551964A JP2013519180A5 JP 2013519180 A5 JP2013519180 A5 JP 2013519180A5 JP 2012551964 A JP2012551964 A JP 2012551964A JP 2012551964 A JP2012551964 A JP 2012551964A JP 2013519180 A5 JP2013519180 A5 JP 2013519180A5
- Authority
- JP
- Japan
- Prior art keywords
- nmos
- drain
- bulk region
- source
- transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/698,318 | 2010-02-02 | ||
US12/698,318 US8363469B1 (en) | 2010-02-02 | 2010-02-02 | All-NMOS 4-transistor non-volatile memory cell |
PCT/US2010/058203 WO2011096977A2 (en) | 2010-02-02 | 2010-11-29 | All-nmos 4-transistor non-volatile memory cell |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2013519180A JP2013519180A (ja) | 2013-05-23 |
JP2013519180A5 true JP2013519180A5 (zh) | 2014-01-16 |
JP5649664B2 JP5649664B2 (ja) | 2015-01-07 |
Family
ID=44356028
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012551964A Active JP5649664B2 (ja) | 2010-02-02 | 2010-11-29 | 全nmos−4トランジスタ不揮発性メモリセルのプログラム方法 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8363469B1 (zh) |
JP (1) | JP5649664B2 (zh) |
CN (1) | CN102741825B (zh) |
TW (1) | TWI449047B (zh) |
WO (1) | WO2011096977A2 (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5556873B2 (ja) * | 2012-10-19 | 2014-07-23 | 株式会社フローディア | 不揮発性半導体記憶装置 |
CN103137201A (zh) * | 2013-03-21 | 2013-06-05 | 苏州宽温电子科技有限公司 | 一种标准逻辑工艺兼容的差分架构nvm存储器单元 |
US8953380B1 (en) | 2013-12-02 | 2015-02-10 | Cypress Semiconductor Corporation | Systems, methods, and apparatus for memory cells with common source lines |
US9558804B2 (en) * | 2014-07-23 | 2017-01-31 | Namlab Ggmbh | Charge storage ferroelectric memory hybrid and erase scheme |
US9524785B2 (en) * | 2015-04-01 | 2016-12-20 | Ememory Technology Inc. | Memory unit with voltage passing device |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7007A (en) * | 1850-01-08 | Improvement in machinery for making cotton cordage | ||
US9026A (en) * | 1852-06-15 | Improvement in imitation stone | ||
US6137723A (en) | 1998-04-01 | 2000-10-24 | National Semiconductor Corporation | Memory device having erasable Frohmann-Bentchkowsky EPROM cells that use a well-to-floating gate coupled voltage during erasure |
US6188594B1 (en) | 1999-06-09 | 2001-02-13 | Neomagic Corp. | Reduced-pitch 6-transistor NMOS content-addressable-memory cell |
US6434040B1 (en) | 2001-02-23 | 2002-08-13 | Silicon Access Networks | Loadless NMOS four transistor SRAM cell |
CN1292484C (zh) * | 2002-07-31 | 2006-12-27 | 连邦科技股份有限公司 | 非易失性静态随机存取存储器存储单元 |
US6920061B2 (en) | 2003-08-27 | 2005-07-19 | International Business Machines Corporation | Loadless NMOS four transistor dynamic dual Vt SRAM cell |
US6903978B1 (en) | 2003-09-17 | 2005-06-07 | National Semiconductor Corporation | Method of PMOS stacked-gate memory cell programming enhancement utilizing stair-like pulses of control gate voltage |
US6992927B1 (en) | 2004-07-08 | 2006-01-31 | National Semiconductor Corporation | Nonvolatile memory cell |
US6985386B1 (en) * | 2004-07-08 | 2006-01-10 | National Semiconductor Corporation | Programming method for nonvolatile memory cell |
US7164606B1 (en) | 2005-07-15 | 2007-01-16 | National Semiconductor Corporation | Reverse fowler-nordheim tunneling programming for non-volatile memory cell |
CN1941203A (zh) * | 2005-09-29 | 2007-04-04 | 松下电器产业株式会社 | 非易失性半导体存储装置 |
JP2007123830A (ja) * | 2005-09-29 | 2007-05-17 | Matsushita Electric Ind Co Ltd | 不揮発性半導体記憶装置 |
US7483310B1 (en) * | 2006-11-02 | 2009-01-27 | National Semiconductor Corporation | System and method for providing high endurance low cost CMOS compatible EEPROM devices |
US7453726B1 (en) | 2007-01-23 | 2008-11-18 | National Semiconductor Corporation | Non-volatile memory cell with improved programming technique and density |
JP5228195B2 (ja) * | 2007-04-20 | 2013-07-03 | インターチップ株式会社 | 不揮発性メモリ内蔵シフトレジスタ |
JP5266443B2 (ja) * | 2008-04-18 | 2013-08-21 | インターチップ株式会社 | 不揮発性メモリセル及び不揮発性メモリセル内蔵データラッチ |
-
2010
- 2010-02-02 US US12/698,318 patent/US8363469B1/en active Active
- 2010-11-29 WO PCT/US2010/058203 patent/WO2011096977A2/en active Application Filing
- 2010-11-29 CN CN201080062922.5A patent/CN102741825B/zh active Active
- 2010-11-29 JP JP2012551964A patent/JP5649664B2/ja active Active
- 2010-12-22 TW TW099145116A patent/TWI449047B/zh active
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