JP2013500505A - Isb遷移における吸収又は率の変化に基づく電気光学デバイス - Google Patents
Isb遷移における吸収又は率の変化に基づく電気光学デバイス Download PDFInfo
- Publication number
- JP2013500505A JP2013500505A JP2012522238A JP2012522238A JP2013500505A JP 2013500505 A JP2013500505 A JP 2013500505A JP 2012522238 A JP2012522238 A JP 2012522238A JP 2012522238 A JP2012522238 A JP 2012522238A JP 2013500505 A JP2013500505 A JP 2013500505A
- Authority
- JP
- Japan
- Prior art keywords
- quantum
- thickness
- electro
- active region
- layers
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/015—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on semiconductor elements having potential barriers, e.g. having a PN or PIN junction
- G02F1/017—Structures with periodic or quasi periodic potential variation, e.g. superlattices, quantum wells
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/127—The active layers comprising only Group III-V materials, e.g. GaAs or InP
- H10F71/1272—The active layers comprising only Group III-V materials, e.g. GaAs or InP comprising at least three elements, e.g. GaAlAs or InGaAsP
- H10F71/1274—The active layers comprising only Group III-V materials, e.g. GaAs or InP comprising at least three elements, e.g. GaAlAs or InGaAsP comprising nitrides, e.g. InGaN or InGaAlN
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
- H10F77/146—Superlattices; Multiple quantum well structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/305—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure
- H01S5/3086—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure doping of the active layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/3401—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having no PN junction, e.g. unipolar lasers, intersubband lasers, quantum cascade lasers
- H01S5/3402—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having no PN junction, e.g. unipolar lasers, intersubband lasers, quantum cascade lasers intersubband lasers, e.g. transitions within the conduction or valence bands
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34333—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on Ga(In)N or Ga(In)P, e.g. blue laser
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/544—Solar cells from Group III-V materials
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Nonlinear Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biophysics (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0955365 | 2009-07-30 | ||
| FR0955365A FR2948816B1 (fr) | 2009-07-30 | 2009-07-30 | Dispositifs electro-optiques bases sur la variation d'indice ou d'absorption dans des transitions isb. |
| PCT/FR2010/051636 WO2011012833A2 (fr) | 2009-07-30 | 2010-07-30 | Dispositifs electro-optiques bases sur la variation d'indice ou d'absorption dans des transitions isb |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013500505A true JP2013500505A (ja) | 2013-01-07 |
| JP2013500505A5 JP2013500505A5 (enExample) | 2013-09-12 |
Family
ID=41592108
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012522238A Pending JP2013500505A (ja) | 2009-07-30 | 2010-07-30 | Isb遷移における吸収又は率の変化に基づく電気光学デバイス |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20120120478A1 (enExample) |
| EP (1) | EP2460048A2 (enExample) |
| JP (1) | JP2013500505A (enExample) |
| CA (1) | CA2769478A1 (enExample) |
| FR (1) | FR2948816B1 (enExample) |
| WO (1) | WO2011012833A2 (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014186074A (ja) * | 2013-03-22 | 2014-10-02 | Nippon Telegr & Teleph Corp <Ntt> | 光変調導波路 |
| JP7220837B1 (ja) * | 2022-06-01 | 2023-02-10 | 三菱電機株式会社 | 半導体光変調器 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2014028468A2 (en) * | 2012-08-13 | 2014-02-20 | The Curators Of The University Of Missouri | An optically activated linear switch for radar limiters or high power switching applications |
| CN111950346A (zh) * | 2020-06-28 | 2020-11-17 | 中国电子科技网络信息安全有限公司 | 一种基于生成式对抗网络的行人检测数据扩充方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08297263A (ja) * | 1995-04-26 | 1996-11-12 | Toshiba Corp | 半導体光導波素子 |
| JPH1152439A (ja) * | 1997-07-31 | 1999-02-26 | Toshiba Corp | 光スイッチ |
| JP2005215395A (ja) * | 2004-01-30 | 2005-08-11 | Toshiba Corp | 半導体導波型光制御素子 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6215875A (ja) * | 1985-07-12 | 1987-01-24 | Matsushita Electric Ind Co Ltd | 半導体装置およびその製造方法 |
| US5300789A (en) * | 1991-12-24 | 1994-04-05 | At&T Bell Laboratories | Article comprising means for modulating the optical transparency of a semiconductor body, and method of operating the article |
| US6593589B1 (en) | 1998-01-30 | 2003-07-15 | The University Of New Mexico | Semiconductor nitride structures |
| JP2001108950A (ja) * | 1999-10-08 | 2001-04-20 | Toshiba Corp | 半導体光スイッチの製造方法 |
| US7180100B2 (en) * | 2001-03-27 | 2007-02-20 | Ricoh Company, Ltd. | Semiconductor light-emitting device, surface-emission laser diode, and production apparatus thereof, production method, optical module and optical telecommunication system |
| US7485902B2 (en) * | 2002-09-18 | 2009-02-03 | Sanyo Electric Co., Ltd. | Nitride-based semiconductor light-emitting device |
-
2009
- 2009-07-30 FR FR0955365A patent/FR2948816B1/fr not_active Expired - Fee Related
-
2010
- 2010-07-30 US US13/387,035 patent/US20120120478A1/en not_active Abandoned
- 2010-07-30 CA CA2769478A patent/CA2769478A1/fr not_active Abandoned
- 2010-07-30 JP JP2012522238A patent/JP2013500505A/ja active Pending
- 2010-07-30 EP EP10800972A patent/EP2460048A2/fr not_active Withdrawn
- 2010-07-30 WO PCT/FR2010/051636 patent/WO2011012833A2/fr not_active Ceased
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08297263A (ja) * | 1995-04-26 | 1996-11-12 | Toshiba Corp | 半導体光導波素子 |
| JPH1152439A (ja) * | 1997-07-31 | 1999-02-26 | Toshiba Corp | 光スイッチ |
| JP2005215395A (ja) * | 2004-01-30 | 2005-08-11 | Toshiba Corp | 半導体導波型光制御素子 |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014186074A (ja) * | 2013-03-22 | 2014-10-02 | Nippon Telegr & Teleph Corp <Ntt> | 光変調導波路 |
| JP7220837B1 (ja) * | 2022-06-01 | 2023-02-10 | 三菱電機株式会社 | 半導体光変調器 |
| JP7391254B1 (ja) | 2022-06-01 | 2023-12-04 | 三菱電機株式会社 | 半導体光変調器 |
| WO2023233584A1 (ja) * | 2022-06-01 | 2023-12-07 | 三菱電機株式会社 | 半導体光変調器 |
| JP2023177223A (ja) * | 2022-06-01 | 2023-12-13 | 三菱電機株式会社 | 半導体光変調器 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20120120478A1 (en) | 2012-05-17 |
| FR2948816B1 (fr) | 2011-08-12 |
| CA2769478A1 (fr) | 2011-02-03 |
| FR2948816A1 (fr) | 2011-02-04 |
| WO2011012833A2 (fr) | 2011-02-03 |
| EP2460048A2 (fr) | 2012-06-06 |
| WO2011012833A3 (fr) | 2011-04-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Fedeli et al. | Mid-infrared (Mid-IR) silicon-based photonics | |
| US8213751B1 (en) | Electronic-integration compatible photonic integrated circuit and method for fabricating electronic-integration compatible photonic integrated circuit | |
| US8175429B2 (en) | Microresonator systems and methods of fabricating the same | |
| EP0627798B1 (fr) | Composant intégré monolithique laser-modulateur à structure multi-puits quantiques | |
| US9494734B1 (en) | Article and method for implementing electronic devices on a substrate using quantum dot layers | |
| US8687269B2 (en) | Opto-electronic device | |
| JPH09318918A (ja) | 半導体光変調器 | |
| JP2013500505A (ja) | Isb遷移における吸収又は率の変化に基づく電気光学デバイス | |
| JPWO2008020621A1 (ja) | 結合量子井戸構造 | |
| US20050225828A1 (en) | Electro-optic modulators incorporating quantum dots | |
| Cheng et al. | 1.55 µm high speed low chirp electroabsorption modulated laser arrays based on SAG scheme | |
| US20210184421A1 (en) | Semiconductor Optical Element | |
| US20030142895A1 (en) | Method of fabricating a monolithic expanded beam mode electroabsorption modulator | |
| US7064881B2 (en) | InP-based phase modulators and methods for making and using same | |
| JPS6247620A (ja) | 導波型光スイツチ | |
| Zhang et al. | Widely tunable electro-absorption modulated V-cavity laser | |
| JPH06204549A (ja) | 導波路型受光素子並びにその製造方法及びその駆動方法 | |
| Atra | Design of ultra dense passive optical network to support high number of end users | |
| Deng et al. | AlGaInAs EML having high extinction ratios fabricated by identical epitaxial layer technique | |
| JP2005276969A (ja) | アバランシェフォトダイオード | |
| Guo et al. | 1.3-μm dual-wavelength DFB laser chip with modulation bandwidth enhancement by integrated passive optical feedback | |
| Dong et al. | Ge0. 9Sn0. 1 multiple-quantum-well pin photodiodes for optical communications at 2 μm | |
| Han et al. | 1.53 μ m EML Fabricated by Ion-Implantation Induced QWI with Etching Implant Buffer Layer | |
| Wang et al. | Investigation on integrated high speed DFB light source and narrow bandwidth RCE photodetector for WDM fiber communication network application | |
| Wang et al. | Integrated high-speed DFB light source and narrow-bandwidth RCE photodetector for WDM fiber communication network application |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20130729 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20130729 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20140227 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20140311 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20140805 |