JP2013238488A - Solar battery cell characteristics evaluation device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a solar battery cell characteristics evaluation device that can stably perform accurate measurement of solar battery cell characteristics by suppressing use of a degraded probe pin.SOLUTION: A solar battery cell characteristics evaluation device includes: a cell characteristics measurement circuit for pressing and contacting, in one-to-one relationship, a plurality of probe pins provided in a measurement probe unit with emitter electrodes and base electrodes of a plurality of solar battery cells set in the measurement probe unit to measure characteristics of the plurality of solar battery cells; a contact resistance measurement circuit for contacting the plurality of probe pins provided in the measurement probe unit with a contact resistance measurement substrate set in the measurement probe unit, a resistance value of the contact resistance measurement substrate being known, in order to measure a total contact resistance value of the plurality of probe pins; and a measurement switching circuit for switching between the cell characteristics measurement circuit and the contact resistance measurement circuit for operation.

Description

  The present invention relates to a solar cell characteristic evaluation apparatus that measures the characteristics of a solar cell using a plurality of probe pins.

  The measurement of solar cell characteristics with the solar cell characteristic evaluation apparatus is performed by using artificial sunlight simulating natural sunlight from the emitter electrode side in a state where the probe pin is pressed against and contacted with each of the emitter electrode and the base electrode. It is configured to measure the voltage and current of the solar cell generated by irradiation.

  In such measurement of solar cell characteristics, the probe pin pressed against each electrode is subject to wear on the tip of the probe pin, adhesion of foreign matter to the tip of the probe pin, probe pin due to an increase in the number of measurements and measurement of defective solar cells. Deteriorated due to internal wear and other reasons. As the probe pin deteriorates, the contact resistance between the probe pin and each electrode fluctuates, which increases the measurement variation of the solar cell characteristics, and the measurement of the solar cell characteristics may not be performed accurately. Occur.

  For example, as disclosed in Patent Document 1, in a circuit board inspection apparatus having a plurality of probe pins, the circuit board may be replaced with a different probe pin. If the inspection results are different from “defective” and “good”, and the probe pin determined to be “defective” is judged to be deteriorated, and the probe pin is replaced. Yes.

JP 2008-241568 A

  However, in the multiple inspections by the circuit board inspection apparatus having a plurality of probe pins, it is conceivable that the number of probe pins used is increased, the apparatus is enlarged, and the tact time is increased. Further, in the measurement using a plurality of probe pins as in the measurement of solar cell characteristics, it is not immediately known which probe pin is deteriorated, and the problem cannot be solved.

  The present invention has been made in view of the above, and by making it possible to suppress the use of a deteriorated probe pin, it is possible to stably perform accurate measurement of solar cell characteristics. The purpose is to obtain an evaluation device.

  In order to solve the above-described problems and achieve the object, the present invention provides a plurality of probe pins provided in a measurement probe unit on a one-to-one basis on an emitter electrode and a base electrode of a solar cell set in the measurement probe unit. A cell characteristic measurement circuit for measuring the characteristics of the solar battery cell that is pressed against and in contact with each other, and a plurality of probe pins included in the measurement probe unit, and a contact resistance measurement with a known resistance value set in the measurement probe unit A contact resistance measurement circuit that contacts a circuit board and measures a total contact resistance value of the plurality of probe pins; and a measurement switching circuit that switches between the cell characteristic measurement circuit and the contact resistance measurement circuit to operate. Features.

  According to the present invention, the deterioration of the probe pin can be detected. Therefore, when the measured value deviates from the standard value, it is possible to take measures such as prompting the user to replace or increasing the probe pin stroke amount to ensure contact. It is possible to suppress the use, and there is an effect that it is possible to obtain a solar cell characteristic evaluation apparatus that enables accurate measurement of the solar cell characteristics stably.

FIG. 1 is a circuit diagram showing a configuration of a solar cell characteristic evaluation apparatus according to Embodiment 1 of the present invention. FIG. 2 is a circuit diagram at the time of measuring the solar cell characteristics that are switched in the solar cell characteristic evaluation apparatus shown in FIG. FIG. 3 is a circuit diagram at the time of measuring the probe pin contact resistance that is switched in the solar cell characteristic evaluation apparatus shown in FIG. FIG. 4 is a circuit diagram showing a configuration at the time of contact resistance measurement in the solar cell characteristic evaluation apparatus according to Embodiment 2 of the present invention. FIG. 5 is a cross-sectional view showing the configuration of the contact resistance measuring substrate unit shown in FIG. FIG. 6 is a circuit diagram when measuring the contact resistance of the probe pin pressed against the emitter electrode of the solar battery cell. FIG. 7 is a circuit diagram when measuring the contact resistance of the probe pin pressed against the base electrode of the solar battery cell. FIG. 8 is a circuit diagram showing a configuration at the time of contact resistance measurement in the solar cell characteristic evaluation apparatus according to Embodiment 3 of the present invention. FIG. 9 is a cross-sectional view showing the configuration of the contact resistance measuring substrate unit shown in FIG. FIG. 10 is a circuit diagram when measuring the contact resistance of one probe pin.

  Embodiments of a solar cell characteristic evaluation apparatus according to the present invention will be described below in detail with reference to the drawings. Note that the present invention is not limited to the embodiments.

Embodiment 1 FIG.
FIG. 1 is a circuit diagram showing a configuration of a solar cell characteristic evaluation apparatus according to Embodiment 1 of the present invention. FIG. 2 is a circuit diagram at the time of measuring the solar cell characteristics that are switched in the solar cell characteristic evaluation apparatus shown in FIG. FIG. 3 is a circuit diagram at the time of measuring the probe pin contact resistance that is switched in the solar cell characteristic evaluation apparatus shown in FIG.

  In FIG. 2, the structure in the case of measuring a photovoltaic cell characteristic is shown. As shown in FIG. 2, the measurement of solar cell characteristics is performed by measuring each other end of each of the four probe pins 2a with one end in contact with each emitter electrode 1a of the solar cell 1, and each end with each base electrode 1b. A common voltmeter 4 is connected between the other ends of the four probe pins 3a that are in contact with each other, and similarly, the other ends of the four probe pins 2b that are in contact with one end of the emitter electrode 1a. And a common ammeter 5 is connected between the other end of each of the four probe pins 3b whose one ends are in contact with the base electrode 1b.

  The above-described measurement of solar cell characteristics is performed using a solar cell measurement probe unit (not shown). This solar cell measurement probe unit is composed of an emitter electrode measurement probe unit and a base electrode measurement probe unit. In the example shown in FIG. 2, the measurement probe unit for emitter electrode contacts the eight probe pins 2 a and 2 b and the eight probe pins 2 a and 2 b with the corresponding emitter electrode 1 a of the solar battery cell 1. And a probe holder for holding it. The measurement probe unit for base electrode includes eight probe pins 3a and 3b, and a probe holder for holding each of the eight probe pins 3a and 3b in contact with the base electrode 1b of the corresponding solar battery cell 1. It has.

  As shown in FIG. 1, the solar cell characteristic evaluation apparatus according to the first embodiment of the solar cell measurement probe unit can be switched between measurement of solar cell characteristics and measurement of probe pin contact resistance. Between the probe pins 2a and 2b of the emitter electrode probe unit 6 and the probe pins 3a and 3b of the base electrode probe unit 7 and the voltmeter 4 and the ammeter 5, a power supply 8 for contact resistance measurement and a contact resistance Voltmeter changeover switches 9a, 9b, and 9c for measurement, voltmeter changeover switches 10a, 10b, and 10c for measuring solar cells, and a contact resistance measurement substrate 11 (see FIG. 3) were additionally provided.

  That is, when measuring the characteristics of the solar cell, the solar cell 1 is set in the solar cell measurement probe unit, the probe pins 2a and 2b of the probe unit 6 for emitter electrode are brought into contact with the emitter electrode, and the probe unit for base electrode 7 with the probe pins 3a and 3b in contact with the base electrode, the voltmeter changeover switches 9a to 9c are opened, and the voltmeter changeover switches 10a to 10c are closed. Then, the measurement circuit shown in FIG. 2 is formed.

  Further, when measuring the contact resistance of the probe pin, as shown in FIG. 3, in the solar cell measurement probe unit, instead of the solar cell 1, a contact resistance measurement substrate 11 is set, and the emitter electrode probe unit 6 With all the probe pins 2b and all the probe pins 3b of the base electrode probe unit 7 in contact with the contact resistance measurement substrate 11, the voltmeter changeover switches 9a to 9c are closed, and the voltmeter changeover switch is closed. Open 10a-10c.

  Then, as shown in FIG. 3, between the four probe pins 2b of the emitter electrode probe unit 6 and the four probe pins 3b of the base electrode probe unit 7, the power supply 8 for measuring the contact resistance and the current A series circuit with a total of 5 and a voltmeter 4 are connected in parallel. Since the resistance value of the contact resistance measuring substrate 11 is known in advance, the four probe pins 2b and the base electrode probe unit of the emitter electrode probe unit 6 are obtained by measuring and acquiring the voltage value V and the current value I. 7, the contact resistance value R of the entire four probe pins 3b is obtained as R = V / I. The contact resistance values of the four probe pins 2a of the emitter electrode probe unit 6 and the four probe pins 3a of the base electrode probe unit 7 are estimated from this measurement result.

  As described above, according to the first embodiment, the total contact resistance value of all the probe pins included in the probe unit for emitter electrode 6 and the probe unit for base electrode 7 is obtained collectively.

Embodiment 2. FIG.
FIG. 4 is a circuit diagram showing a configuration at the time of contact resistance measurement in the solar cell characteristic evaluation apparatus according to Embodiment 2 of the present invention. FIG. 5 is a cross-sectional view showing the configuration of the contact resistance measuring substrate unit shown in FIG. FIG. 6 is a circuit diagram when measuring the contact resistance of the probe pin pressed against the emitter electrode of the solar battery cell. FIG. 7 is a circuit diagram when measuring the contact resistance of the probe pin pressed against the base electrode of the solar battery cell.

  4, the configuration at the time of contact resistance measurement according to the second embodiment is the same as the configuration shown in FIG. 1 (Embodiment 1), but the contact between the contact resistance measuring substrate unit 12 and the emitter electrode probe unit 6 side. Resistance measurement changeover switches 13a and 13b and contact resistance measurement changeover switches 14a and 14b on the base electrode probe unit 7 side are added.

  As shown in FIG. 5, the contact resistance measuring substrate unit 12 includes a substrate 15 a having a known resistance value to be brought into contact with the probe pin of the emitter electrode probe unit 6 and a probe pin of the base electrode probe unit 7. Is formed of a substrate 15b having a known resistance value to be brought into contact with and an insulator 16 interposed between the substrates 15a and 15b, and wirings 17a and 17b are provided on one end side of the substrates 15a and 15b. . The wiring 17a is a wiring that connects one end of the substrate 15b and the contact resistance measurement changeover switch 14b. The wiring 17b is a wiring that connects one end of the substrate 15a and the contact resistance measurement changeover switch 13b.

  With this configuration, by setting the contact resistance measurement substrate unit 12 to the solar cell measurement probe unit, the total contact resistance value of all the probe pins 2b of the emitter electrode probe unit 6 and all of the base electrode probe unit 7 are set. The total contact resistance value of the probe pin 3b is individually measured and acquired.

  That is, when the contact resistance of the probe pin of the emitter electrode probe unit 6 is obtained, the probe pin 2b is brought into contact with the substrate 15a, the voltmeter changeover switches 9a to 9c and the contact resistance measurement changeover switches 13a and 13b are closed, The voltmeter changeover switches 10a to 10c and the contact resistance measurement changeover switches 14a and 14b are opened. Then, the measurement circuit shown in FIG. 6 is formed, and the total contact resistance value of all the probe pins 2b of the emitter electrode probe unit 6 is obtained by obtaining R = V / I from the measured values of the voltmeter 4 and the ammeter 5. Measure at once.

  When the contact resistance of the probe pin of the base electrode probe unit 7 is obtained, the probe pin 3b is brought into contact with the substrate 15b, and the voltmeter changeover switches 10a to 10c and the contact resistance measurement changeover switches 14a and 14b are closed, The voltmeter changeover switches 9a to 9c and the contact resistance measurement changeover switches 13a and 13b are opened. Then, the measurement circuit shown in FIG. 7 is formed, and by obtaining R = V / I from the measured values of the voltmeter 4 and the ammeter 5, the total contact resistance value of all the probe pins 3b of the base electrode probe unit 6 is obtained. Collectively measure.

  And the total contact resistance value of all the probe pins 2a with which the probe unit 6 for emitter electrodes is provided is estimated from the calculated total contact resistance value of the probe pin 2b. Further, the total contact resistance value of all the probe pins 3a included in the base electrode probe unit 7 is estimated from the calculated total contact resistance value of the probe pins 3b.

  Thus, according to the second embodiment, the total contact resistance value of all the probe pins included in the emitter electrode probe unit 6 and the total contact resistance value of all the probe pins included in the base electrode probe unit 7 are: Requested individually and collectively.

Embodiment 3 FIG.
FIG. 8 is a circuit diagram showing a configuration at the time of contact resistance measurement in the solar cell characteristic evaluation apparatus according to Embodiment 3 of the present invention. FIG. 9 is a cross-sectional view showing the configuration of the contact resistance measuring substrate unit shown in FIG. FIG. 10 is a circuit diagram when measuring the contact resistance of one probe pin.

  8, the configuration at the time of contact resistance measurement according to the third embodiment is the same as the configuration shown in FIG. 4 (Embodiment 2) except that a contact resistance measurement unit 18 is provided instead of the contact resistance measurement substrate unit 12. It has been. The contact resistance measurement unit 18 includes a contact resistance measurement board unit 19 and a measurement changeover switch group 20.

  As shown in FIG. 9, the contact resistance measurement substrate unit 19 is provided in a one-to-one correspondence with the entire probe pins (four probe pins (2a, 2b) in the illustrated example) of the emitter electrode probe unit 6. And four substrates 21b provided in a one-to-one correspondence with the entire set of probe pins of the base electrode probe unit 7 (four sets of probe pins (3a, 3b) in the illustrated example). It is configured to be fitted to the opposite side of the U-shaped insulator frame 22, and the measurement is switched to the side edges of the substrates 21a and 21b facing the opposite side from the opposite side of the U-shaped insulator frame 22. Wirings 23a and 23b for connecting to one end of the corresponding measurement changeover switch of the switch group 20 are prepared.

  As shown in FIG. 8, the measurement changeover switch group 20 includes the same number of measurement changeover switches as the substrates 21a and 21b. In the illustrated example, four measurement change-over switches 24a, 24b, 24c, and 24d whose one ends are connected to four substrates 21a on the emitter electrode probe unit 6 side, and four substrates on the base electrode probe unit 7 side. It consists of four measurement change-over switches 25a, 25b, 25c, and 25d, one end of which is connected to 21b. The other ends of the four measurement changeover switches 24a, 24b, 24c, and 24d are commonly connected. Similarly, the other ends of the four measurement changeover switches 25a, 25b, 25c, and 25d are commonly connected, and contact resistances are respectively provided. It is connected to one end of the measurement switch 13b, 14b.

  In the above configuration, for example, when the contact resistance of the leftmost probe pin 2b of the emitter electrode probe unit 6 is measured, the voltmeter changeover switches 9a, 9b, 9c and the contact resistance measurement changeover switches 13a, 13b are closed, If the measurement changeover switch 24a is closed with the contact resistance measurement changeover switches 14a and 14b open, the measurement circuit shown in FIG. 10 is formed.

  In the measurement circuit shown in FIG. 10, a voltage value V and a current value I are measured using a voltmeter 4 and an ammeter 5. By dividing the measured voltage value V by the current value I, the contact resistance value R of the leftmost probe pin 2b1 of the emitter electrode probe unit 6 is obtained. The contact resistance value of the leftmost probe pin 2a is estimated from the measured value of the corresponding leftmost probe pin 2b.

  At this time, the probe pins other than the leftmost probe pin 2b of the emitter electrode probe unit 6 and the probe pins of the base electrode probe unit 7 may be in contact with the corresponding substrates.

  Thus, when measuring each one of the probe pins 2b of the probe unit 6 for emitter electrodes, the voltmeter changeover switches 6a, 6b, 6c and the contact resistance measurement changeover switches 13a, 13b are closed. As it is, the measurement changeover switch 24a of the measurement changeover switch group 19 is switched in order from the measurement changeover switch 24d and measured. The contact resistance value of each probe pin 2a is estimated from the measured value of each corresponding probe pin 2b.

  When measuring each of the probe pins 3b of the probe unit 7 for the base electrode, the voltmeter changeover switches 6a, 6b, 6c and the contact resistance measurement changeover switches 14a, 14b are kept closed. The contact resistance is measured by sequentially switching from the measurement changeover switch 25a to the measurement changeover switch 25d of the measurement changeover switch group 19. The contact resistance value of each probe pin 3a is estimated from the measured value of each corresponding probe pin 3b.

  Thus, according to the third embodiment, the individual contact resistance values of all the probe pins included in the emitter electrode probe unit 6 and the individual contact resistance values of all the probe pins included in the base electrode probe unit 7 Are required individually.

  Next, there are two methods for dealing with the case where the contact resistance value obtained by the above-described three contact resistance measurement methods deviates from the contact resistance value determined in advance in each method.

  The first method is a method of prompting the user to replace the probe pin by displaying a message or an alarm prompting the replacement of the probe pin to the user. When the user notices a message or an alarm and replaces the probe pin and restarts the measurement of the solar cell characteristics, the measurement of the stable solar cell characteristics can be performed while suppressing the fluctuation of the contact resistance value. .

  The second method is to increase the contact pressure of the probe pin by first increasing the stroke amount of the probe pin. As the probe pin increases the contact pressure, the contact with each electrode of the solar battery cell is improved, so the contact resistance value is measured again with the contact pressure increased, and it is within the determined contact resistance value. For example, the solar cell characteristics are measured with the contact pressure increased. Even if the contact pressure is increased, if the predetermined contact resistance value is not met, a message or an alarm for prompting replacement of the probe pin is output. By exchanging the probe pins, stable solar cell characteristics can be measured. In order to increase the contact pressure of the probe pin, a structure that uses a servo motor or the like to control the stroke amount of the probe pin is used.

  As described above, the solar cell characteristic evaluation device according to the present invention is capable of suppressing the use of a deteriorated probe pin, thereby enabling the solar cell characteristics to be accurately measured stably. It is useful as a battery cell characteristic evaluation apparatus.

DESCRIPTION OF SYMBOLS 1 Solar cell 1a Emitter electrode 1b Base electrode 2a, 2b Probe pin (for emitter electrodes)
3a, 3b Probe pin (for base electrode)
4 Voltmeter 5 Ammeter 6 Probe unit for emitter electrode of solar cell measurement probe unit 7 Probe unit for base electrode of solar cell measurement probe unit 8 Power supply for contact resistance measurement 9a, 9b, 9c Voltage for contact resistance measurement Meter changeover switch 10a, 10b, 10c Voltmeter changeover switch for solar cell measurement 11 Contact resistance measurement board 12 Contact resistance measurement board unit 13a, 13b Contact resistance measurement changeover switch 14a, 14b on the probe unit side for emitter electrode Base Electrode probe unit side contact resistance measurement changeover switch 15a, 15b Substrate 16 Insulator 17a, 17b Wiring 18 Contact resistance measurement unit 19 Contact resistance measurement substrate unit 20 Measurement changeover switch group 21a, 21b Substrate 22 U-shaped insulator Frame 23a 23b wiring 24a~24d, 25a~25d measurement change-over switch

Claims (4)

A cell in which a plurality of probe pins provided in a measurement probe unit are pressed against and contacted with an emitter electrode and a base electrode of a solar battery cell set in the measurement probe unit in a one-to-one relationship. A characteristic measurement circuit;
A contact resistance measurement circuit for measuring a total contact resistance value of the plurality of probe pins by contacting a plurality of probe pins provided in the measurement probe unit with a contact resistance measurement substrate having a known resistance value set in the measurement probe unit; ,
A solar cell characteristic evaluation apparatus comprising: a measurement switching circuit that switches between the cell characteristic measurement circuit and the contact resistance measurement circuit to operate. A cell in which a plurality of probe pins provided in a measurement probe unit are pressed against and contacted with an emitter electrode and a base electrode of a solar battery cell set in the measurement probe unit in a one-to-one relationship. A characteristic measurement circuit;
A plurality of probe pins included in the emitter electrode probe unit of the measurement probe unit are brought into contact with a first contact resistance measurement substrate having a known resistance value set in the emitter electrode probe unit. A first contact resistance measurement circuit for measuring a total contact resistance value of a plurality of probe pins provided;
A plurality of probe pins provided in the base electrode probe unit of the measurement probe unit are brought into contact with a second contact resistance measurement substrate having a known resistance value set in the base electrode probe unit. A second contact resistance measurement circuit for measuring a total contact resistance value of a plurality of probe pins provided;
A solar cell characteristic evaluation device, comprising: a measurement switching circuit that operates by switching between the cell characteristic measurement circuit and the first and second contact resistance measurement circuits. A cell in which a plurality of probe pins provided in a measurement probe unit are pressed against and contacted with an emitter electrode and a base electrode of a solar battery cell set in the measurement probe unit in a one-to-one relationship. A characteristic measurement circuit;
A plurality of probe pins provided in the measurement probe unit, a plurality of resistance values known single contact resistances set in a one-to-one relationship with the plurality of probe pins provided in the measurement probe unit in the measurement probe unit. An individual contact resistance measurement circuit that contacts a measurement substrate and measures individual contact resistance values of a plurality of probe pins included in the measurement probe unit;
A solar cell characteristic evaluation apparatus, comprising: a measurement switching circuit that operates by switching between the cell characteristic measurement circuit and the individual contact resistance measurement circuit.   In the measurement of the contact resistance value, when the measured contact resistance value deviates from a specified value, there is provided means for increasing the stroke amount of the probe pin according to the deviation amount and suppressing fluctuation of the contact resistance value. The solar cell characteristic evaluation apparatus according to any one of claims 1 to 3.

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