JP2013224923A5 - - Google Patents

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JP2013224923A5
JP2013224923A5 JP2013007385A JP2013007385A JP2013224923A5 JP 2013224923 A5 JP2013224923 A5 JP 2013224923A5 JP 2013007385 A JP2013007385 A JP 2013007385A JP 2013007385 A JP2013007385 A JP 2013007385A JP 2013224923 A5 JP2013224923 A5 JP 2013224923A5
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JP6036321B2 (ja
JP2013224923A (ja
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JP2013007385A 2012-03-23 2013-01-18 Ｘ線複合装置 Active JP6036321B2 (ja)

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Application Number Priority Date Filing Date Title
JP2013007385A JP6036321B2 (ja) 2012-03-23 2013-01-18 Ｘ線複合装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2012068002 2012-03-23
JP2012068002 2012-03-23
JP2013007385A JP6036321B2 (ja) 2012-03-23 2013-01-18 Ｘ線複合装置

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JP2013224923A JP2013224923A (ja) 2013-10-31
JP2013224923A5 true JP2013224923A5 (https=) 2015-02-26
JP6036321B2 JP6036321B2 (ja) 2016-11-30

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JP (1) JP6036321B2 (https=)

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CN104634797A (zh) * 2015-02-12 2015-05-20 重庆大学 扇形平面/锥形束ct多转台同步扫描装置与方法
US10180404B2 (en) * 2015-04-30 2019-01-15 Shimadzu Corporation X-ray analysis device
US9939393B2 (en) * 2015-09-28 2018-04-10 United Technologies Corporation Detection of crystallographic properties in aerospace components
CN106896122B (zh) 2015-12-18 2019-07-30 清华大学 液体检测方法和系统
JP6861470B2 (ja) * 2016-03-04 2021-04-21 三星電子株式会社Ｓａｍｓｕｎｇ Ｅｌｅｃｔｒｏｎｉｃｓ Ｃｏ．，Ｌｔｄ． Ｘ線検査装置
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CN107315019A (zh) * 2017-07-25 2017-11-03 清华大学 射线透射和荧光ct成像系统和成像方法
US10845491B2 (en) 2018-06-04 2020-11-24 Sigray, Inc. Energy-resolving x-ray detection system
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DE112019004478T5 (de) 2018-09-07 2021-07-08 Sigray, Inc. System und verfahren zur röntgenanalyse mit wählbarer tiefe
CN110376226B (zh) * 2019-07-03 2021-01-08 浙江大学 一种涡轮发动机转子裂纹扩展特征确定方法
US11143605B2 (en) 2019-09-03 2021-10-12 Sigray, Inc. System and method for computed laminography x-ray fluorescence imaging
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
CN115667896B (zh) 2020-05-18 2024-06-21 斯格瑞公司 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法
JP7640682B2 (ja) 2020-09-17 2025-03-05 シグレイ、インコーポレイテッド Ｘ線を用いた深さ分解計測および分析のためのシステムおよび方法
KR102927910B1 (ko) 2020-12-07 2026-02-19 시그레이, 아이엔씨. 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
CN113390910A (zh) * 2021-06-23 2021-09-14 北京理工大学 一种基于劳厄衍射原理对全尺寸异型单晶无损检测的设备
US12040103B2 (en) 2021-08-16 2024-07-16 Carl Zeiss Smt Gmbh Imaging optical arrangement to image an object illuminated by X-rays
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JP7687689B2 (ja) * 2022-02-14 2025-06-03 株式会社リガク Ｘ線回折装置及び計測方法
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
DE112023001408T5 (de) 2022-03-15 2025-02-13 Sigray, Inc. System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung
CN114878614B (zh) * 2022-04-28 2025-10-21 度微检测技术(杭州)有限公司 X射线光片共聚焦三维荧光显微成像系统和方法
DE112023002079T5 (de) 2022-05-02 2025-02-27 Sigray, Inc. Sequenzielles wellenlängendispersives röntgenspektrometer
WO2024173256A1 (en) 2023-02-16 2024-08-22 Sigray, Inc. X-ray detector system with at least two stacked flat bragg diffractors
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