JP2013195204A5 - - Google Patents
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- Publication number
- JP2013195204A5 JP2013195204A5 JP2012062012A JP2012062012A JP2013195204A5 JP 2013195204 A5 JP2013195204 A5 JP 2013195204A5 JP 2012062012 A JP2012062012 A JP 2012062012A JP 2012062012 A JP2012062012 A JP 2012062012A JP 2013195204 A5 JP2013195204 A5 JP 2013195204A5
- Authority
- JP
- Japan
- Prior art keywords
- metal
- sample analysis
- analysis substrate
- substrate according
- electron beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 239000002184 metal Substances 0.000 claims 18
- 229910052751 metal Inorganic materials 0.000 claims 18
- 239000000758 substrate Substances 0.000 claims 14
- 238000000034 method Methods 0.000 claims 7
- 238000010894 electron beam technology Methods 0.000 claims 4
- 239000000463 material Substances 0.000 claims 4
- 229910052782 aluminium Inorganic materials 0.000 claims 2
- 229910052802 copper Inorganic materials 0.000 claims 2
- 229910052737 gold Inorganic materials 0.000 claims 2
- 238000010884 ion-beam technique Methods 0.000 claims 2
- 230000008018 melting Effects 0.000 claims 2
- 238000002844 melting Methods 0.000 claims 2
- 230000003647 oxidation Effects 0.000 claims 2
- 238000007254 oxidation reaction Methods 0.000 claims 2
- 229910052697 platinum Inorganic materials 0.000 claims 2
- 229910052709 silver Inorganic materials 0.000 claims 2
- 238000007740 vapor deposition Methods 0.000 claims 2
- 229910052804 chromium Inorganic materials 0.000 claims 1
- 239000011248 coating agent Substances 0.000 claims 1
- 238000000576 coating method Methods 0.000 claims 1
- 238000001514 detection method Methods 0.000 claims 1
- 229910052707 ruthenium Inorganic materials 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012062012A JP2013195204A (ja) | 2012-03-19 | 2012-03-19 | 試料分析基板および検出装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012062012A JP2013195204A (ja) | 2012-03-19 | 2012-03-19 | 試料分析基板および検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013195204A JP2013195204A (ja) | 2013-09-30 |
| JP2013195204A5 true JP2013195204A5 (https=) | 2015-04-23 |
Family
ID=49394340
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012062012A Withdrawn JP2013195204A (ja) | 2012-03-19 | 2012-03-19 | 試料分析基板および検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2013195204A (https=) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2019221298A1 (ja) * | 2018-05-18 | 2019-11-21 | Ｓｃｉｖａｘ株式会社 | 電磁波増強素子およびその製造方法並びに電磁波増強素子を用いた検出方法およびアミノ酸配列決定方法 |
| CN109929905B (zh) * | 2019-04-01 | 2025-03-21 | 天津国科医工科技发展有限公司 | 用于细菌快速鉴定的三维拉曼增强膜及其方法和系统 |
| JP7310360B2 (ja) * | 2019-06-27 | 2023-07-19 | コニカミノルタ株式会社 | 薄膜の製造方法 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA2388252A1 (en) * | 1999-10-06 | 2001-04-12 | Surromed, Inc. | Surface enhanced raman scattering (sers)-active substrates for raman spectroscopy |
| FR2860872A1 (fr) * | 2003-10-09 | 2005-04-15 | Commissariat Energie Atomique | Micro-capteurs et nano-capteurs d'especes chimiques et biologiques a plasmons de surface |
| JP4395038B2 (ja) * | 2004-09-22 | 2010-01-06 | 富士フイルム株式会社 | 微細構造体およびその製造方法 |
| JP4899061B2 (ja) * | 2005-03-18 | 2012-03-21 | 国立大学法人北海道大学 | センシングデバイス、センシング装置およびセンシング方法 |
| JP2009109395A (ja) * | 2007-10-31 | 2009-05-21 | Fujifilm Corp | 微細構造体の作製方法、微細構造体、ラマン分光用デバイス、ラマン分光装置、分析装置、検出装置、および質量分析装置 |
| JPWO2012086586A1 (ja) * | 2010-12-22 | 2014-05-22 | 国立大学法人京都大学 | ラマン散乱光増強素子 |
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2012
- 2012-03-19 JP JP2012062012A patent/JP2013195204A/ja not_active Withdrawn