JP2013169500A - Spin cup washing method - Google Patents

Spin cup washing method Download PDF

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JP2013169500A
JP2013169500A JP2012034091A JP2012034091A JP2013169500A JP 2013169500 A JP2013169500 A JP 2013169500A JP 2012034091 A JP2012034091 A JP 2012034091A JP 2012034091 A JP2012034091 A JP 2012034091A JP 2013169500 A JP2013169500 A JP 2013169500A
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cleaning
substrate
spin cup
spin
wall surface
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Keiji Ueda
恵司 上田
Yukitoshi Tajima
行利 田嶋
Jun Takeuchi
惇 竹内
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Ricoh Co Ltd
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Ricoh Co Ltd
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  • Application Of Or Painting With Fluid Materials (AREA)
  • Coating Apparatus (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
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  • Cleaning By Liquid Or Steam (AREA)

Abstract

PROBLEM TO BE SOLVED: To attain washing with a small amount of washing liquid in a short time even in the case of using a main solvent of particularly high viscosity as a coating liquid when washing the internal wall of a spin cup using the washing liquid.SOLUTION: A spin cup washing method for a rotary coating apparatus 1 including a rotating part rotated with a substrate S fixed, a nozzle N for supplying a coating liquid to the substrate, and a spin cup 5 surrounding the substrate fixed to the rotating part, includes processes for supplying a first washing liquid with the same solvent as a main solvent used for the coating liquid, to at least a part of an internal wall surface of the spin cup to form a film on the internal wall surface, and supplying a second washing liquid with a solvent different from the main solvent used for the coating liquid, to at least a part of the internal wall surface of the spin cup to wash the internal wall surface. The process for forming the film, and the process for washing the internal wall surface are switched according to the film forming process of the substrate.

Description

本発明は、例えば半導体ウェハー等の被処理基板(以下、単に「基板」と記載する。)上にフォトレジストや現像液をスピンコートし、あるいは化学溶液法にて基板上に機能性薄膜となる塗布液をスピンコートするための回転塗布装置に関し、更に詳しくは、スピンコートプロセス中に基板から飛散する塗布液並びに塗布液の乾燥固化物にて汚染されたスピンカップ内壁面を洗浄するカップ洗浄方法に関する。   In the present invention, for example, a photoresist or a developer is spin-coated on a substrate to be processed (hereinafter simply referred to as “substrate”) such as a semiconductor wafer, or a functional thin film is formed on the substrate by a chemical solution method. More particularly, the present invention relates to a spin coater for spin coating a coating solution, and more particularly, a cup cleaning method for cleaning a spin cup inner wall surface contaminated with a coating solution scattered from a substrate and a dried solidified product of the coating solution during a spin coating process. About.

例えばフォトレジストや現像液、あるいは化学溶液法にて機能性薄膜となる前駆体液等の塗布液を基板上に滴下して基板を高速回転させ、その遠心力により塗布液を基板の外周部まで広げた後、余分の塗布液を振り切ることによって均一な薄膜を形成する方法は、スピンコート法として良く知られている。
またスピンコート法にて薄膜の成膜を行う装置は、一般にスピナーあるいはスピンコーターと呼ばれる回転塗布装置であり、鉛直方向に配置される回転軸上端にチャック機構を設けたスピンテーブル上に基板を水平に保持し、これを回転させることで均一な薄膜を形成する。
さらに回転塗布装置には、基板の周囲を囲むように円筒形のスピンカップを設けることが一般的であり、スピンコートプロセス中に振り切られて基板周囲から飛散する余分な塗布液の飛沫をスピンカップ内壁に付着させることによって、装置周辺の汚染を防止している。
For example, a coating solution such as a photoresist, a developing solution, or a precursor solution that becomes a functional thin film by a chemical solution method is dropped on the substrate to rotate the substrate at a high speed, and the centrifugal force causes the coating solution to spread to the outer periphery of the substrate. After that, a method of forming a uniform thin film by shaking off excess coating solution is well known as a spin coating method.
An apparatus for forming a thin film by a spin coating method is a spin coating apparatus generally called a spinner or a spin coater, and a substrate is horizontally placed on a spin table provided with a chuck mechanism at the upper end of a rotary shaft arranged in a vertical direction. The film is held and rotated to form a uniform thin film.
Furthermore, a spin coater is generally provided with a cylindrical spin cup so as to surround the periphery of the substrate, and the spin cup spatters excess coating liquid splashed from the periphery of the substrate by being shaken off during the spin coating process. By adhering to the inner wall, contamination around the device is prevented.

しかし、従来のスピンコート法では、余分な塗布液が振り切られた後、振り切られた塗布液はカップ内壁に付着して乾燥・固化する。そして塗布液が乾燥・固化した結晶片、あるいは粉末が堆積すると振動などの影響で内壁から剥がれやすくなり、場合によっては結晶片あるいは粉末が基板に再付着して製品不良となる問題があった。そのため、塗布液が乾燥・固化した結晶片あるいは粉末が堆積するのを防ぐために、カップ内壁の洗浄を頻繁に行う必要がある。この洗浄作業は塗布液が乾燥する前に行うのが効率良いが、特に乾燥が早い塗布液の場合は乾燥前の洗浄が難しかった。
そこで特許文献1には、カップ内壁を洗浄する目的でカップ内壁上部に環状の内周面洗浄管を設け、その内周面洗浄管に多数の洗浄液吐出孔を内壁の上部内面に向けて開口させ、内壁に沿ってその開口から洗浄液を流す構成が開示されている。また、基板の下に位置する整流傾斜板に環状の傾斜板洗浄管を設け、傾斜面洗浄管に多数の洗浄液吐出孔を整流傾斜面の上方寄りに臨ませて開口させる構成も開示されている。
しかし、洗浄管の吐出孔から洗浄液を流す構成では、洗浄液は一度通った経路を通りやすく、内壁全面を洗浄することが難しいという問題点がある。
However, in the conventional spin coating method, after the excess coating solution is shaken off, the applied coating solution adheres to the inner wall of the cup and is dried and solidified. Then, when a crystal piece or a powder deposited from the coating solution is dried or solidified, it easily peels off from the inner wall due to the influence of vibration or the like, and in some cases, the crystal piece or the powder reattaches to the substrate, resulting in a product defect. For this reason, it is necessary to frequently clean the inner wall of the cup in order to prevent deposition of crystal pieces or powder that is dried and solidified in the coating solution. It is efficient to perform this cleaning operation before the coating solution is dried. However, in the case of a coating solution that dries quickly, cleaning before drying is difficult.
Therefore, in Patent Document 1, an annular inner peripheral surface cleaning pipe is provided at the upper part of the cup inner wall for the purpose of cleaning the cup inner wall, and a number of cleaning liquid discharge holes are opened toward the upper inner surface of the inner wall in the inner peripheral surface cleaning pipe. A configuration is disclosed in which a cleaning liquid is caused to flow from the opening along the inner wall. In addition, a configuration is also disclosed in which an annular inclined plate cleaning pipe is provided on the rectifying inclined plate located under the substrate, and a large number of cleaning liquid discharge holes are opened toward the upper side of the rectifying inclined surface in the inclined surface cleaning pipe. .
However, in the configuration in which the cleaning liquid is caused to flow from the discharge hole of the cleaning tube, there is a problem that the cleaning liquid easily passes through the path once passed and it is difficult to clean the entire inner wall.

また特許文献2では、スピンカップに回転機構を付与すると同時にスピンカップ内壁面を洗浄するスプレーノズルを具備し、スピンカップを回転させながら内壁面に洗浄液を吹き付けて洗浄する構成を開示している。
しかし、前記の様なスプレー洗浄を行う構成では、スピンカップの最内周部に洗浄液を吹き付けると、吹き付けられた洗浄液がスピンテーブル上に跳ね返り、基板のチャック不良の原因となる為、またスピンカップ最内周部内壁面に付着した洗浄液が基板上に滴り落ちて製品不良の原因となる為、スピンカップの最内周部まで洗浄液を吹き付けて内壁面を洗浄する操作を行うことができない。
その結果、基板に最も近いスピンカップ最内周部分に塗布液が付着、乾燥・固化した結晶片あるいは粉末が堆積し、それが基板上に落下することによって不良の原因となる。またこの手法は、使用する洗浄液また同時に排出される洗浄廃液の量が大きくなる問題を有している。
Further, Patent Document 2 discloses a configuration in which a spin nozzle is provided with a spray nozzle that cleans the inner wall surface of the spin cup and at the same time, the cleaning liquid is sprayed on the inner wall surface while rotating the spin cup.
However, in the configuration in which the spray cleaning is performed as described above, if the cleaning liquid is sprayed on the innermost peripheral portion of the spin cup, the sprayed cleaning liquid splashes on the spin table, causing a chuck failure of the substrate. Since the cleaning liquid adhering to the innermost inner wall surface drops on the substrate and causes a product defect, the cleaning operation cannot be performed by spraying the cleaning liquid to the innermost peripheral portion of the spin cup.
As a result, the coating liquid adheres to the innermost peripheral portion of the spin cup closest to the substrate, and the crystal pieces or powder that has been dried and solidified accumulates, and drops on the substrate to cause defects. In addition, this method has a problem that the amount of the cleaning liquid to be used or the cleaning waste liquid discharged at the same time becomes large.

また、特許文献3では、基板の塗布膜形成面と水平な位置並びにこれと平行な面に複数配置した飛散防止板によってミストの発生を防止しようとしているが、これら飛散防止板に付着し、乾燥・固化・堆積した塗布液の結晶片あるいは粉末と振りきりによって飛散した塗布液滴との衝突により発生するミストの対策がなされていないため、不良の発生を抑えきることができない。   Further, in Patent Document 3, an attempt is made to prevent the occurrence of mist by a plurality of scattering prevention plates arranged on a plane parallel to the coating film forming surface of the substrate and a surface parallel thereto, but the mist adheres to these scattering prevention plates and is dried. -Since the countermeasure against the mist generated by the collision between the solidified / deposited crystal pieces or powder of the coating liquid and the coating droplets scattered by shaking is not taken, the occurrence of defects cannot be suppressed.

ところで、前記のような従来例においては、スピンカップ内壁を洗浄する洗浄液として、塗布液に使用されている主溶媒と同じ溶媒を使用することが通例である。その理由は、スピンカップ内壁に付着した塗布液が乾燥・固化する、言い換えると塗布液の濃度が上昇して溶質が析出するのを防ぐ為には、その溶媒を追加してスピンカップ内壁に付着した塗布液の濃度を希釈すると同時に希釈された塗布液を追加した溶媒共々洗浄廃液としてスピンカップ外へ流し去る手法が、最も単純かつ確実な手法であるためである。
しかし、塗布液の主溶媒として粘度の高い溶媒が使用されている場合、付着した塗布液と加えられた洗浄液が相溶状態となった洗浄廃液の流動性が悪い為、これをスピンカップ外へ流し去る操作に、長い時間を要してしまい、塗布作業のスループットが悪化すること、またこれを無理に短時間で処理させようとすると、多量の洗浄液を消費してしまうことが明らかになった。
By the way, in the conventional examples as described above, it is usual to use the same solvent as the main solvent used in the coating solution as the cleaning solution for cleaning the inner wall of the spin cup. The reason is that in order to prevent the coating solution adhering to the inner wall of the spin cup from drying and solidifying, in other words, preventing the solute from precipitating due to an increase in the concentration of the coating solution, the solvent is added to the inner surface of the spin cup. This is because the method of diluting the concentration of the applied coating solution and flushing the diluted coating solution out of the spin cup as a cleaning waste solution together with the added solvent is the simplest and most reliable method.
However, when a high-viscosity solvent is used as the main solvent of the coating solution, the flow of the cleaning waste solution in which the attached coating solution and the added cleaning solution are compatible is poor. It became clear that the flow-off operation took a long time, the throughput of the coating work was deteriorated, and that a large amount of cleaning liquid was consumed when trying to process this in a short time. .

本発明は前記のような問題に鑑みてなされたものであり、洗浄液を使用してスピンカップ内壁を洗浄するに際し、塗布液として特に粘度が高い主溶媒を使用している場合であっても、短い時間でかつ少量の洗浄液で洗浄することを可能にすることを目的とする。   The present invention has been made in view of the above problems, and when cleaning the inner wall of the spin cup using a cleaning liquid, even when a main solvent having a particularly high viscosity is used as a coating liquid, It is intended to enable cleaning in a short time and with a small amount of cleaning liquid.

上記問題を解決する為に、請求項1に記載の発明は、基板を固定して回転させる回転部と、前記基板に塗布液を供給するノズルと、前記回転部に固定された前記基板を包囲するスピンカップと、を有する回転塗布装置のスピンカップ洗浄方法であって、前記塗布液に使用されている主溶媒と同一溶媒の第一の洗浄液を前記スピンカップ内壁面の少なくとも一部に供給して該内壁面に皮膜を形成する工程と、前記塗布液に使用されている主溶媒とは異なる溶媒の第二の洗浄液を前記スピンカップ内壁面の少なくとも前記一部に供給して該内壁面を洗浄する工程と、を有し、前記皮膜を形成する工程と前記内壁面を洗浄する工程とを前記基板の成膜プロセスに応じて切り替えることを特徴とする。   In order to solve the above problem, the invention according to claim 1 surrounds a rotating part that fixes and rotates a substrate, a nozzle that supplies a coating liquid to the substrate, and the substrate that is fixed to the rotating part. A spin cup cleaning method for a spin coater comprising: a first cleaning liquid of the same solvent as a main solvent used in the coating liquid supplied to at least a part of the inner wall surface of the spin cup. Forming a film on the inner wall surface, and supplying a second cleaning liquid of a solvent different from the main solvent used in the coating solution to at least a part of the inner wall surface of the spin cup, A step of cleaning, wherein the step of forming the film and the step of cleaning the inner wall surface are switched according to a film forming process of the substrate.

本発明によれば、異なる溶媒の複数種類の洗浄液を成膜プロセスに合わせて切り替えながら洗浄操作を行うので、より短い時間で、また排出される洗浄廃液をより少なくすることができる。   According to the present invention, the cleaning operation is performed while switching a plurality of types of cleaning liquids of different solvents in accordance with the film forming process, so that the cleaning waste liquid to be discharged can be reduced in a shorter time.

本発明の一実施形態に係る回転塗布装置の断面図である。It is sectional drawing of the spin coater which concerns on one Embodiment of this invention.

以下に本発明を実施形体に基づいて説明する。なお、以下に示す実施形態は、本発明の一例を示したものであり、基本構成が異なるスピンカップ洗浄機構に対して本発明によるスピンカップ洗浄方法を適用した場合においても、同様の効果が得られる。   The present invention will be described below based on the embodiment. The following embodiment shows an example of the present invention, and the same effect can be obtained even when the spin cup cleaning method according to the present invention is applied to a spin cup cleaning mechanism having a different basic configuration. It is done.

図1は本発明の一実施形態に係る回転塗布装置の断面図である。この回転塗布装置1は、成膜対象物である基板Sを吸着させるスピンテーブル3と、スピンテーブル3を回転させる回転軸2と、基板Sに塗布液を供給するノズルNと、スピンテーブル3に吸着された基板Sの周囲(少なくとも基板Sの外周部分)を包囲するスピンカップ5と、スピンテーブル3に吸着された基板Sの下方に配置されて基板Sから流れ落ちた余剰の塗布液等を受け止めるスピンカップ下面プレート6と、スピンカップ5とスピンカップ下面プレート6の内壁面を滴下した余剰の塗布液や洗浄液の廃液等を回転塗布装置1外に排出する開口部4と、を備えている。なお、内壁面とは、基板Sが配置された空間側に位置する壁面を指す。
スピンテーブル3と回転軸2は、回転塗布装置1の回転部を構成する。
スピンカップ5は、略鉛直方向に配置された回転軸2の回転により高速回転する基板Sに対してノズルNから滴下された塗布液のうち、遠心力によって基板Sから飛散した余剰分の塗布液(微小液滴:ミスト)を受け止めて、開口部4に向けて流下させる。すなわち、スピンカップ5は余剰の塗布液が回転塗布装置1の外部に飛散することを防止する。
FIG. 1 is a cross-sectional view of a spin coater according to an embodiment of the present invention. The spin coater 1 includes a spin table 3 that adsorbs a substrate S that is a film formation target, a rotary shaft 2 that rotates the spin table 3, a nozzle N that supplies a coating liquid to the substrate S, and a spin table 3. The spin cup 5 that surrounds the periphery of the adsorbed substrate S (at least the outer peripheral portion of the substrate S), and the excess coating liquid or the like that is disposed below the substrate S adsorbed on the spin table 3 and flows down from the substrate S is received. The spin cup lower surface plate 6, and the opening 4 through which the excess coating liquid dropped on the inner wall surface of the spin cup 5 and the spin cup lower surface plate 6, the waste liquid of the cleaning liquid, and the like are discharged out of the spin coater 1. In addition, an inner wall surface refers to the wall surface located in the space side where the board | substrate S is arrange | positioned.
The spin table 3 and the rotating shaft 2 constitute a rotating unit of the spin coating device 1.
The spin cup 5 is a coating liquid dropped from the substrate S by centrifugal force among the coating liquid dropped from the nozzle N on the substrate S rotating at a high speed by the rotation of the rotating shaft 2 arranged in a substantially vertical direction. (Microdroplet: Mist) is received and flows down toward the opening 4. That is, the spin cup 5 prevents excess coating liquid from splashing outside the spin coating apparatus 1.

スピンカップ下面プレート6は、基板Sから流れ落ちた余剰の塗布液や基板Sの裏面を洗浄したバックリンス液を受け止めて開口部4に向けて流下させる。
また、開口部4からは、高速回転させた基板Sに塗布液を滴下したときに飛散する余分な塗布液の微小液滴(ミスト)を吸引する際に発生する排気も排出される。
さらに本発明による構成では、スピンカップ5とスピンカップ下面プレート6は、それぞれの内壁面の少なくとも一部が、多孔質層5a、6aと、スピンカップ5又はスピンカップ下面プレート6のそれぞれの構造体である殻5b、6bと、を有する多層構造となっている。さらに多孔質層5a、6aと殻5b、6bとの間には、洗浄液が流れる洗浄液流路5c、6cが形成されている。
殻5b、6bは、洗浄液を通過させない素材から構成されており、洗浄液を注入する際の圧力に耐える強度を有している。
図1中、洗浄液は、夫々スピンカップ5とスピンカップ下面プレート6の下方から注入される構成であるが、洗浄液の注入箇所に特に限定はない。例えば、洗浄液を夫々スピンカップ5とスピンカップ下面プレート6の上方から注入しても良いし、殻5b、6bの適所に設けた穴から注入するようにしても良い。
The spin cup lower surface plate 6 receives an excess coating liquid that has flowed down from the substrate S and a back rinse liquid that has cleaned the back surface of the substrate S, and flows down toward the opening 4.
Further, the exhaust generated when suctioning the extra small droplets (mist) of the coating solution that is scattered when the coating solution is dropped onto the substrate S rotated at high speed is also discharged from the opening 4.
Further, in the configuration according to the present invention, the spin cup 5 and the spin cup lower surface plate 6 are structured such that at least a part of the inner wall surface of each of the porous layers 5a and 6a and the spin cup 5 or the spin cup lower surface plate 6 is formed. It has a multilayer structure having shells 5b and 6b. Further, cleaning liquid channels 5c and 6c through which the cleaning liquid flows are formed between the porous layers 5a and 6a and the shells 5b and 6b.
The shells 5b and 6b are made of a material that does not allow the cleaning liquid to pass therethrough, and have strength to withstand the pressure when the cleaning liquid is injected.
In FIG. 1, the cleaning liquid is injected from below the spin cup 5 and the spin cup lower surface plate 6, but the injection position of the cleaning liquid is not particularly limited. For example, the cleaning liquid may be injected from above the spin cup 5 and the spin cup lower surface plate 6, or may be injected from holes provided at appropriate positions in the shells 5b and 6b.

なお、多孔質層5a、6aは、平均気孔径が1〜3μm、より好ましくは気孔径およそ1μmで、平均気孔率が40〜60%、より好ましくは平均気孔率40%程度の多孔質セラミックを用いて形成されている。セラミックの材質は、使用する塗布液との反応性及び濡れ性を考慮して選択されるが、アルミナ系のセラミックが好ましい。
さらに洗浄液流路5c、6cには、図示しないポートを介して洗浄液配管7(7a、7b)が接続され、その先には切替バルブ8を介してそれぞれ異なる溶媒(洗浄液)を収納した洗浄液タンク9(9a、9b)が接続されている。洗浄液は、成膜に使用される塗布液を希釈し、又は乾燥した塗布液(又は塗布液の固化物)を溶解可能な液体(溶媒)である。洗浄液タンク9aには塗布液に使用されている主溶媒と同一の溶媒(第一の洗浄液)が洗浄液として収容され、洗浄液タンク9bには主溶媒とは異なる溶媒であって、主溶媒と良好な相溶性を有し、かつ主溶媒と比較して低い粘度の溶媒(第二の洗浄液)が洗浄液として収納されている。
The porous layers 5a and 6a are made of a porous ceramic having an average pore diameter of 1 to 3 μm, more preferably about 1 μm, and an average porosity of 40 to 60%, more preferably an average porosity of about 40%. It is formed using. The material of the ceramic is selected in consideration of the reactivity with the coating liquid to be used and the wettability, but an alumina-based ceramic is preferable.
Further, a cleaning liquid pipe 7 (7a, 7b) is connected to the cleaning liquid flow paths 5c, 6c via a port (not shown), and a cleaning liquid tank 9 storing different solvents (cleaning liquids) via the switching valve 8 at the end thereof. (9a, 9b) are connected. The cleaning liquid is a liquid (solvent) capable of diluting a coating liquid used for film formation or dissolving a dried coating liquid (or a solidified product of the coating liquid). In the cleaning liquid tank 9a, the same solvent (first cleaning liquid) as the main solvent used in the coating liquid is stored as the cleaning liquid, and the cleaning liquid tank 9b is a solvent different from the main solvent. A solvent (second cleaning liquid) having compatibility and lower viscosity than the main solvent is stored as a cleaning liquid.

また、洗浄液は、供給量(注入量)及び供給圧(注入圧力)を変更可能なポンプPによって、洗浄液タンク9a、9bから、それぞれ洗浄液配管7a、7b、洗浄液流路5c、6cを介して多孔質層5a、6aに供給される。なお、ポンプPの代わりに、洗浄液を加圧タンクに収容し、この加圧タンクから圧送して供給する方式を用いてもよい。
なお、洗浄液配管7、洗浄液タンク9、及びポンプPは、洗浄液供給手段を構成する。また、ポンプPは、注入量可変機構を構成する。
The cleaning liquid is perforated from the cleaning liquid tanks 9a and 9b through the cleaning liquid pipes 7a and 7b and the cleaning liquid flow paths 5c and 6c, respectively, by a pump P that can change the supply amount (injection amount) and the supply pressure (injection pressure). It is supplied to the quality layers 5a and 6a. Instead of the pump P, a method may be used in which the cleaning liquid is accommodated in a pressurized tank and is fed by pressure from the pressurized tank.
The cleaning liquid pipe 7, the cleaning liquid tank 9, and the pump P constitute cleaning liquid supply means. The pump P constitutes an injection amount variable mechanism.

回転塗布装置1の動作は、制御部10にて制御される。制御部10は、CPU(Central Processing Unit)、処理を実行するプログラム等を記憶したROM(Read Only Memory)、データ等を記憶するRAM(Random Access Memory)等から構成されている。制御部10は、回転塗布装置1の各部と電気的に接続されており、回転軸2を回転させるモータ(不図示)の駆動制御、ノズルNからの塗布液の滴下制御、多孔質層5a、6aへの洗浄液の供給量等の制御等を成膜プロセスに応じて行う。   The operation of the spin coater 1 is controlled by the control unit 10. The control unit 10 includes a CPU (Central Processing Unit), a ROM (Read Only Memory) that stores programs for executing processing, a RAM (Random Access Memory) that stores data, and the like. The control unit 10 is electrically connected to each part of the spin coating apparatus 1, and controls the drive of a motor (not shown) that rotates the rotary shaft 2, the dripping control of the coating liquid from the nozzle N, the porous layer 5a, Control of the supply amount of the cleaning liquid to 6a, etc. is performed according to the film forming process.

前記のような本発明の構成による回転塗布装置1を使用した成膜プロセス並びにスピンカップの洗浄方法について以下に記載する。
まず成膜プロセス開始前にスピンカップ5とスピンカップ下面プレート6それぞれの洗浄液流路5c、6cに、洗浄液配管7と切替バルブ8を介して洗浄液タンク9aから塗布液に使用されている主溶媒と同一の溶媒を洗浄液として注入し、ポンプPによって所定の圧力にて洗浄液を加圧する。すると、洗浄液は圧力と毛細管現象により多孔質層5a、6a全体に広がり、多孔質層5a、6aの表面上の多数の孔から表面に染み出し、スピンカップ5とスピンカップ下面プレート6の内壁面に洗浄液の皮膜を形成する(皮膜を形成する工程)。
A film forming process using the spin coater 1 having the above-described configuration of the present invention and a spin cup cleaning method will be described below.
First, before starting the film forming process, the main solvent used for the coating liquid from the cleaning liquid tank 9a to the cleaning liquid flow paths 5c and 6c of the spin cup 5 and the spin cup lower surface plate 6 through the cleaning liquid pipe 7 and the switching valve 8 respectively. The same solvent is injected as a cleaning liquid, and the cleaning liquid is pressurized by a pump P at a predetermined pressure. Then, the cleaning liquid spreads over the entire porous layers 5a and 6a due to pressure and capillary action, oozes out from a large number of holes on the surfaces of the porous layers 5a and 6a, and the inner wall surfaces of the spin cup 5 and the spin cup lower surface plate 6 A film of the cleaning solution is formed on the surface (step of forming a film).

この状態でスピンテーブル3にセットされた基板S上に塗布液を滴下して基板Sを高速回転させ、その遠心力により塗布液を基板Sの外周部まで広げた後、余分の塗布液を振り切ることによって均一な薄膜を形成する。その際、高速回転によって周囲に飛散した塗布液の一部は、微小な液滴(ミスト)となり、図示しないブロアーによって開口部4から空気と共に吸引、装置外部に排気される。
また周囲に飛散した塗布液の別の一部は、スピンカップ5並びにスピンカップ下面プレート6それぞれの内壁面、つまり多孔質層5a、6a表面に付着する。これら表面には、前記のように主溶媒と同一の溶媒である洗浄液が皮膜された状態にあるため、付着した塗布液はただちに皮膜と馴染んで同一化すると共に、乾燥・固化することなく、時間と共に徐々に開口部4へ向かって流動を開始する。
In this state, the coating solution is dropped onto the substrate S set on the spin table 3 to rotate the substrate S at a high speed, and the coating solution is spread to the outer periphery of the substrate S by the centrifugal force, and then the excess coating solution is shaken off. Thus, a uniform thin film is formed. At that time, a part of the coating liquid scattered around by high-speed rotation becomes minute droplets (mist), and is sucked together with air from the opening 4 by a blower (not shown) and exhausted outside the apparatus.
Further, another part of the coating solution scattered around the surface adheres to the inner wall surfaces of the spin cup 5 and the spin cup lower surface plate 6, that is, the surfaces of the porous layers 5a and 6a. Since these surfaces are coated with a cleaning solution that is the same solvent as the main solvent as described above, the applied coating solution immediately becomes familiar with the coating and becomes the same, and without drying and solidifying, the time is increased. At the same time, the flow gradually starts toward the opening 4.

続いて成膜プロセス完了直後のタイミングにて切替バルブ8が切り替えられ、洗浄液タンク9bから塗布液に使用されている主溶媒とは異なる溶媒が洗浄液として注入されると、洗浄液は内壁面の多孔質層5a、6a全面に広がる。この洗浄液は主溶媒と良好な相溶性を有する溶媒が採用されているため、既に皮膜されている塗布液の主溶媒と同一の溶媒と、皮膜に付着した塗布液と、主溶媒とは異なる溶媒とが、一体になって開口部4へ向かって流動し、最終的に装置外の図示しない廃液タンクに回収される(内壁面を洗浄する工程)。
この際、成膜プロセス完了直後に供給される洗浄液は、主溶媒と比較して低い粘度の溶媒を採用している為、全てのスピンカップ洗浄プロセスを塗布液の主溶媒と同一溶媒の洗浄液を用いる場合と比較して短時間で洗浄廃液を装置外の廃液タンクに排出させることが可能になり、洗浄プロセスを含めた全成膜プロセス時間を短縮し、スループットを高めることができる。なお、ポンプPによる洗浄液の加圧力に関し、内壁面を洗浄する工程における加圧力を、皮膜を形成する工程における加圧力よりも高めて、洗浄プロセスにかかる時間をさらに短縮するようにしてもよい。
その結果、基板Sから振り切られた余分の塗布液が乾燥・固化して結晶片あるいは粉末が装置内に堆積し、堆積した結晶片あるいは粉末が何らかのきっかけによって塗布プロセス中の基板S上に付着し、製品不良となる不具合を回避できる。
Subsequently, when the switching valve 8 is switched at a timing immediately after the completion of the film forming process and a solvent different from the main solvent used for the coating liquid is injected from the cleaning liquid tank 9b as the cleaning liquid, the cleaning liquid is porous on the inner wall surface. The layers 5a and 6a are spread over the entire surface. Since this cleaning liquid employs a solvent having good compatibility with the main solvent, the same solvent as the main solvent of the coating liquid already coated, the coating liquid adhering to the film, and a solvent different from the main solvent Are integrated and flow toward the opening 4 and are finally collected in a waste liquid tank (not shown) outside the apparatus (step of cleaning the inner wall surface).
At this time, since the cleaning liquid supplied immediately after the completion of the film forming process employs a solvent having a lower viscosity than the main solvent, all the spin cup cleaning processes are performed using the same solvent cleaning liquid as the main solvent of the coating liquid. Compared to the case of using, the cleaning waste liquid can be discharged to the waste liquid tank outside the apparatus, and the entire film forming process time including the cleaning process can be shortened and the throughput can be increased. Regarding the pressure applied to the cleaning liquid by the pump P, the time required for the cleaning process may be further shortened by increasing the pressure applied in the step of cleaning the inner wall surface to the pressure applied in the step of forming the film.
As a result, the excess coating liquid shaken off from the substrate S is dried and solidified to deposit crystal pieces or powder in the apparatus, and the deposited crystal pieces or powder adhere to the substrate S during the coating process due to some trigger. , It is possible to avoid defects that cause product defects.

またこの方法は、スピンカップ5内壁面に塗布液の主溶媒と同じ溶媒の洗浄液の皮膜を成膜プロセス開始前に形成することにより、内壁面に付着した塗布液を直ちに皮膜と馴染ませて希釈し、その乾燥・固化を防いだ上で、成膜プロセス完了直後には、主溶媒と比較して粘度が低く、より流動性が高い溶媒の洗浄液により、皮膜と皮膜に付着した塗布液とを流下させ、洗浄廃液として装置外の廃液タンクに排出させる操作であり、前記の公知技術に述べられているような全てのスピンカップ洗浄プロセスを塗布液の主溶媒と同一溶媒の洗浄液を用いる場合と比較すると、使用する洗浄液の全体量を少なく、言い換えると排出される廃液量を少なくすることが可能となる。
なお、主溶媒と同じ溶媒の洗浄液と、主溶媒と異なる溶媒の洗浄液の組み合わせであるが、使用する塗布液とその主溶媒の種類によって多種多様な組み合わせが生じることは言うまでもない。例えば塗布液の主溶媒が乳酸エチル(粘度:2.6cP)であるレジスト液に対しては、主溶媒と異なる溶媒の洗浄液としてはアセトン(粘度:0.3cP)が良好な溶解性も合わせて好ましい組み合わせになる。
In this method, a coating film of a cleaning liquid of the same solvent as the main solvent of the coating liquid is formed on the inner wall surface of the spin cup 5 before the start of the film forming process, so that the coating liquid adhering to the inner wall surface is immediately adapted to the coating and diluted. However, immediately after completion of the film formation process, the film and the coating liquid adhering to the film are removed by a solvent cleaning liquid having a lower viscosity and higher fluidity than the main solvent. It is an operation of flowing down and discharging as a cleaning waste liquid to a waste liquid tank outside the apparatus, and all spin cup cleaning processes as described in the above-mentioned known technology use a cleaning liquid of the same solvent as the main solvent of the coating liquid In comparison, the total amount of cleaning liquid used can be reduced, in other words, the amount of waste liquid discharged can be reduced.
In addition, although it is a combination of a cleaning liquid of the same solvent as the main solvent and a cleaning liquid of a solvent different from the main solvent, it goes without saying that various combinations occur depending on the coating liquid used and the type of the main solvent. For example, for a resist solution in which the main solvent of the coating solution is ethyl lactate (viscosity: 2.6 cP), acetone (viscosity: 0.3 cP) is also used as a cleaning solution for a solvent different from the main solvent. A preferred combination.

さらに図1に示した本発明の回転塗布装置1の構成では、スピンカップ5内壁面の最も内周側、言い換えると最も基板Sと近い部分にまで多孔質層5aを張り巡らしている。つまり前記の公知技術に述べられた洗浄方法では洗浄操作を行い難い最内周部分、つまり言い換えると最も基板Sと近く、付着した洗浄液の乾燥・固化した結晶片あるいは粉末が不良の原因になり易い部分にまで洗浄液の皮膜を形成させ、同部分に付着した塗布液の乾燥・固化とそれに起因する基板上への不良発生を回避できる。
なお、本発明の効果は、多孔質層5aを図1の様にスピンカップ5内壁面全面に張り巡らせるのでなく、塗布プロセス時の振り切り動作で飛散した塗布液が最も付着しやすい内壁面の部位、より具体的には基板Sの薄膜塗布面とほぼ等しい高さ位置にある内壁面近傍にのみ多孔質層5aを巡らし、同部分に洗浄液皮膜を形成させるだけでも大きな効果が得られる。しかし、図1の様にスピンカップ5内壁面全面に張り巡らせる方がより好ましい効果が得られることは言うまでも無い。
Further, in the configuration of the spin coater 1 of the present invention shown in FIG. 1, the porous layer 5a is stretched to the innermost peripheral side of the inner wall surface of the spin cup 5, in other words, the portion closest to the substrate S. That is, in the cleaning method described in the above-mentioned known technique, the innermost peripheral portion where it is difficult to perform the cleaning operation, that is, the closest to the substrate S, the dried and solidified crystal pieces or powder of the attached cleaning liquid is likely to cause defects. A coating film of the cleaning liquid is formed even on the portion, and drying and solidification of the coating liquid adhering to the portion and occurrence of defects on the substrate due to the drying and solidification can be avoided.
The effect of the present invention is that the porous layer 5a is not stretched over the entire inner wall surface of the spin cup 5 as shown in FIG. 1, but the portion of the inner wall surface to which the coating liquid scattered by the swing-off operation during the coating process is most likely to adhere. More specifically, it is possible to obtain a great effect only by circulating the porous layer 5a only in the vicinity of the inner wall surface at a height position substantially equal to the thin film application surface of the substrate S and forming a cleaning liquid film on the same portion. However, it goes without saying that a more preferable effect can be obtained by stretching the entire inner wall surface of the spin cup 5 as shown in FIG.

本発明による回転塗布装置1を用いてシリコンウェハ基板上に塗布液を塗布した後、このシリコンウェハ基板を焼成することにより、(PZT膜等の)強誘電薄膜が成膜されたウェハー基板を作成することができる。また、この強誘電薄膜が成膜されたシリコンウェハ基板を半導体プロセスにより加工することでMEMS、インクジェットヘッド等のアクチュエータ機能を持った電子素子、或いは焦電センサ等のセンサ機能を有する電子素子(機能性素子)を形成することができる。さらに、これらの素子を使用することにより、インクジェットプリンタや、MEMSミラー素子を使用して製造されたプロジェクタ、或いは、焦電センサを使用した光スイッチ等の装置を製造することができる。
上述のように、本発明による回転塗布装置1においては基板上への不良発生を回避することができるので、スピンコートプロセス中に生じる不良が抑えられたウェハー基板を作成することができる。そして、このウェハー基板を用いて上記各種の機能性素子、さらにこの機能性素子を使用して様々な装置を製造すると、不良の少ない素子及び装置を高い歩留まりで製造することが可能となる。
After applying the coating liquid onto the silicon wafer substrate using the spin coater 1 according to the present invention, the silicon wafer substrate is baked to produce a wafer substrate on which a ferroelectric thin film (such as a PZT film) is formed. can do. Moreover, by processing the silicon wafer substrate on which the ferroelectric thin film is formed by a semiconductor process, an electronic element having an actuator function such as a MEMS or an inkjet head, or an electronic element having a sensor function such as a pyroelectric sensor (function) ) Can be formed. Furthermore, by using these elements, devices such as an inkjet printer, a projector manufactured using a MEMS mirror element, or an optical switch using a pyroelectric sensor can be manufactured.
As described above, since the occurrence of defects on the substrate can be avoided in the spin coating apparatus 1 according to the present invention, a wafer substrate in which defects occurring during the spin coating process are suppressed can be produced. When various functional devices are manufactured using the wafer substrate, and various devices are manufactured using the functional devices, it is possible to manufacture devices and devices with few defects at a high yield.

1…回転塗布装置、2…回転軸、3…スピンテーブル、4…開口部、5…スピンカップ、5a…多孔質層、5b…殻、5c…洗浄液流路、6…スピンカップ下面プレート、6a…多孔質層、6b…殻、6c…洗浄液流路、7…洗浄液配管、8…切替バルブ、9…洗浄液タンク、10…制御部、N…ノズル、S…基板、P…ポンプ   DESCRIPTION OF SYMBOLS 1 ... Spin coating apparatus, 2 ... Rotating shaft, 3 ... Spin table, 4 ... Opening part, 5 ... Spin cup, 5a ... Porous layer, 5b ... Shell, 5c ... Cleaning-liquid flow path, 6 ... Spin cup lower surface plate, 6a ... Porous layer, 6b ... Shell, 6c ... Cleaning liquid flow path, 7 ... Cleaning liquid piping, 8 ... Switching valve, 9 ... Cleaning liquid tank, 10 ... Control part, N ... Nozzle, S ... Substrate, P ... Pump

実公平06−028223号公報Japanese Utility Model Publication No. 06-028223 特開2002−143749号公報JP 2002-143749 A 特開2004−330073号公報JP 2004-330073 A

Claims (4)

基板を固定して回転させる回転部と、前記基板に塗布液を供給するノズルと、前記回転部に固定された前記基板を包囲するスピンカップと、を有する回転塗布装置のスピンカップ洗浄方法であって、
前記塗布液に使用されている主溶媒と同一溶媒の第一の洗浄液を前記スピンカップ内壁面の少なくとも一部に供給して該内壁面に皮膜を形成する工程と、
前記塗布液に使用されている主溶媒とは異なる溶媒の第二の洗浄液を前記スピンカップ内壁面の少なくとも前記一部に供給して該内壁面を洗浄する工程と、を有し、
前記皮膜を形成する工程と前記内壁面を洗浄する工程とを前記基板の成膜プロセスに応じて切り替えることを特徴とするスピンカップ洗浄方法。
A spin cup cleaning method for a spin coating apparatus, comprising: a rotating unit that fixes and rotates a substrate; a nozzle that supplies a coating liquid to the substrate; and a spin cup that surrounds the substrate fixed to the rotating unit. And
Supplying a first cleaning liquid of the same solvent as the main solvent used in the coating liquid to at least a part of the inner wall surface of the spin cup to form a film on the inner wall surface;
Supplying a second cleaning liquid of a solvent different from the main solvent used in the coating liquid to at least a part of the inner wall surface of the spin cup, and cleaning the inner wall surface,
A spin cup cleaning method, wherein the step of forming the film and the step of cleaning the inner wall surface are switched according to a film forming process of the substrate.
前記第二の洗浄液が、前記塗布液の主溶媒と相溶性を有し、且つ、粘度が塗布液の主溶媒よりも低いことを特徴とする請求項1に記載のスピンカップ洗浄方法。   The spin cup cleaning method according to claim 1, wherein the second cleaning liquid is compatible with a main solvent of the coating liquid and has a viscosity lower than that of the main solvent of the coating liquid. 前記皮膜を形成する工程は、前記基板への成膜前に行われる工程であり、
前記内壁面を洗浄する工程は、前記基板への成膜完了直後に行われる工程であることを特徴とする請求項1又は2に記載のスピンカップ洗浄方法。
The step of forming the film is a step performed before film formation on the substrate,
The spin cup cleaning method according to claim 1, wherein the step of cleaning the inner wall surface is a step performed immediately after completion of film formation on the substrate.
前記スピンカップの内壁面の少なくとも前記一部が多孔質層から構成されており、
前記皮膜を形成する工程と前記内壁面を洗浄する工程において、夫々前記第一の洗浄液又は前記第二の洗浄液を前記多孔室層から前記スピンカップの内壁面に染み出させることを特徴とする請求項1乃至3の何れか一項に記載のスピンカップ洗浄方法。
At least a part of the inner wall surface of the spin cup is composed of a porous layer;
The step of forming the film and the step of cleaning the inner wall surface cause the first cleaning liquid or the second cleaning liquid to ooze out from the porous chamber layer to the inner wall surface of the spin cup, respectively. Item 4. The spin cup cleaning method according to any one of Items 1 to 3.
JP2012034091A 2012-02-20 2012-02-20 Spin cup washing method Pending JP2013169500A (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110164793A (en) * 2018-02-16 2019-08-23 东京毅力科创株式会社 Liquid handling device
KR20200029248A (en) * 2018-09-10 2020-03-18 (주)신우에이엔티 Temperature-humidity control structure of bowl for wafer handling device

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110164793A (en) * 2018-02-16 2019-08-23 东京毅力科创株式会社 Liquid handling device
CN110164793B (en) * 2018-02-16 2024-04-30 东京毅力科创株式会社 Liquid treatment device
KR20200029248A (en) * 2018-09-10 2020-03-18 (주)신우에이엔티 Temperature-humidity control structure of bowl for wafer handling device
KR102101724B1 (en) 2018-09-10 2020-04-17 (주)신우에이엔티 Temperature-humidity control structure of bowl for wafer handling device

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