JP2013164419A5 - - Google Patents

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Publication number
JP2013164419A5
JP2013164419A5 JP2013024533A JP2013024533A JP2013164419A5 JP 2013164419 A5 JP2013164419 A5 JP 2013164419A5 JP 2013024533 A JP2013024533 A JP 2013024533A JP 2013024533 A JP2013024533 A JP 2013024533A JP 2013164419 A5 JP2013164419 A5 JP 2013164419A5
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JP
Japan
Prior art keywords
sample
aqueous solution
vitrified
generating
image
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JP2013024533A
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English (en)
Japanese (ja)
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JP2013164419A (ja
JP6143487B2 (ja
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Priority claimed from EP12155112.1A external-priority patent/EP2626885A1/en
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Publication of JP2013164419A publication Critical patent/JP2013164419A/ja
Publication of JP2013164419A5 publication Critical patent/JP2013164419A5/ja
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Publication of JP6143487B2 publication Critical patent/JP6143487B2/ja
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JP2013024533A 2012-02-13 2013-02-12 電子顕微鏡用のガラス化された試料を作製する方法 Active JP6143487B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP12155112.1A EP2626885A1 (en) 2012-02-13 2012-02-13 Forming a vitrified sample for an electron microscopy
EP12155112.1 2012-02-13

Publications (3)

Publication Number Publication Date
JP2013164419A JP2013164419A (ja) 2013-08-22
JP2013164419A5 true JP2013164419A5 (enExample) 2016-02-12
JP6143487B2 JP6143487B2 (ja) 2017-06-07

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ID=47631379

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JP2013024533A Active JP6143487B2 (ja) 2012-02-13 2013-02-12 電子顕微鏡用のガラス化された試料を作製する方法

Country Status (3)

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EP (2) EP2626885A1 (enExample)
JP (1) JP6143487B2 (enExample)
CN (1) CN103247506B (enExample)

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EP2881970A1 (en) * 2013-12-04 2015-06-10 Fei Company Method of producing a freestanding thin film of nano-crystalline carbon
KR101729814B1 (ko) * 2014-07-16 2017-04-24 주식회사 엘지화학 Abs 수지 내의 그라프트된 스티렌-아크릴로니트릴 두께 측정 방법
EP3125271B1 (en) * 2015-07-29 2018-06-06 FEI Company Micro-chamber for inspecting sample material
KR101690670B1 (ko) * 2015-10-14 2016-12-28 강원대학교산학협력단 미스트 분사 및 급냉식 원자간력 현미경용 시편 처리장치
EP3179229B1 (en) * 2015-12-11 2019-01-30 FEI Company Preparation of cryogenic sample for charged-particle microscopy
CN110799824B (zh) 2017-07-07 2022-07-08 威斯康星校友研究基金会 用于冷冻电子显微镜的气相样品制备
EP3495798B1 (en) * 2017-12-08 2021-01-20 FEI Company Improved preparation of cryogenic sample, e.g. for charged particle microscopy
CN109030519B (zh) * 2018-06-15 2020-11-17 义乌市研创工业设计有限公司 一种冷冻电镜用的可操作观察记录装置
CN108801732B (zh) * 2018-06-15 2021-01-12 李建锋 一种低温样品碾碎装置
CN109142399A (zh) * 2018-07-26 2019-01-04 聚束科技(北京)有限公司 一种成像系统及样品探测方法
US11101104B2 (en) * 2019-08-30 2021-08-24 Fei Company Multi modal cryo compatible GUID grid
CN110632105B (zh) * 2019-09-17 2021-10-29 东南大学 一种用于透射电镜表征的液体样品腔及其制备方法
CN111413356A (zh) * 2020-04-07 2020-07-14 中国科学院生物物理研究所 一种冷冻超薄切片的制备方法
JP2022018555A (ja) * 2020-07-15 2022-01-27 学校法人 工学院大学 急速凍結装置、及び急速凍結方法
US11728146B2 (en) 2021-01-13 2023-08-15 Wisconsin Alumni Research Foundation Retractable ion guide, grid holder, and technology for removal of cryogenic sample from vacuum
CN115406914B (zh) * 2021-05-10 2025-04-11 中国科学院物理研究所 制备附着式冷冻样品的装置及方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3145505A1 (de) * 1981-11-17 1983-05-26 C. Reichert Optische Werke AG, 1170 Wien Transfereinrichtung zur entnahme von gefriergetrockneten schnitten aus der kuehlkammer eines gefriermikrotomes, insbesondere eines kryo-ultramikrotomes
JPS62156853U (enExample) * 1986-03-27 1987-10-05
CA2051092C (en) * 1990-09-12 2002-07-23 Stephen A. Livesey Method and apparatus for cryopreparation, dry stabilization and rehydration of biological suspensions
US5435850A (en) 1993-09-17 1995-07-25 Fei Company Gas injection system
JP3727532B2 (ja) * 2000-12-26 2005-12-14 シャープ株式会社 薄片試料処理装置及び薄片試料処理方法
JP2009008657A (ja) * 2007-05-25 2009-01-15 Canon Inc 固体試料、固体試料作製方法及び固体試料作製装置
JP4722969B2 (ja) * 2007-06-29 2011-07-13 エフ イー アイ カンパニ マニピュレータへのサンプル取付け方法
EP2009420A1 (en) * 2007-06-29 2008-12-31 FEI Company Method for attaching a sample to a manipulator
US8709269B2 (en) * 2007-08-22 2014-04-29 Applied Materials Israel, Ltd. Method and system for imaging a cross section of a specimen
JP2010008141A (ja) * 2008-06-25 2010-01-14 Canon Inc 固体試料の作製装置、固体試料の作製方法及び試料の観察方法
JP5202136B2 (ja) * 2008-07-02 2013-06-05 株式会社日立ハイテクノロジーズ 荷電粒子線装置
KR20130126684A (ko) * 2011-03-04 2013-11-20 가부시키가이샤 히다치 하이테크놀로지즈 전자 현미경용 시료 홀더 및 시료 관찰 방법

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