JP2013160637A5 - - Google Patents
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- Publication number
- JP2013160637A5 JP2013160637A5 JP2012022976A JP2012022976A JP2013160637A5 JP 2013160637 A5 JP2013160637 A5 JP 2013160637A5 JP 2012022976 A JP2012022976 A JP 2012022976A JP 2012022976 A JP2012022976 A JP 2012022976A JP 2013160637 A5 JP2013160637 A5 JP 2013160637A5
- Authority
- JP
- Japan
- Prior art keywords
- target layer
- diamond
- target
- mendea
- irradiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 229910003460 diamond Inorganic materials 0.000 claims description 4
- 239000010432 diamond Substances 0.000 claims description 4
- 239000000758 substrate Substances 0.000 claims description 4
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012022976A JP5911323B2 (ja) | 2012-02-06 | 2012-02-06 | ターゲット構造体及びそれを備える放射線発生装置並びに放射線撮影システム |
PCT/JP2013/051683 WO2013118593A1 (en) | 2012-02-06 | 2013-01-21 | Target structure and radiation generator |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012022976A JP5911323B2 (ja) | 2012-02-06 | 2012-02-06 | ターゲット構造体及びそれを備える放射線発生装置並びに放射線撮影システム |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2013160637A JP2013160637A (ja) | 2013-08-19 |
JP2013160637A5 true JP2013160637A5 (zh) | 2015-03-19 |
JP5911323B2 JP5911323B2 (ja) | 2016-04-27 |
Family
ID=47846104
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012022976A Active JP5911323B2 (ja) | 2012-02-06 | 2012-02-06 | ターゲット構造体及びそれを備える放射線発生装置並びに放射線撮影システム |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP5911323B2 (zh) |
WO (1) | WO2013118593A1 (zh) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
US9448190B2 (en) | 2014-06-06 | 2016-09-20 | Sigray, Inc. | High brightness X-ray absorption spectroscopy system |
US10297359B2 (en) | 2013-09-19 | 2019-05-21 | Sigray, Inc. | X-ray illumination system with multiple target microstructures |
US10269528B2 (en) | 2013-09-19 | 2019-04-23 | Sigray, Inc. | Diverging X-ray sources using linear accumulation |
US9570265B1 (en) | 2013-12-05 | 2017-02-14 | Sigray, Inc. | X-ray fluorescence system with high flux and high flux density |
FR3012663B1 (fr) * | 2013-10-25 | 2015-12-04 | Thales Sa | Generateur de rayons x a capteur de flux integre |
US10304580B2 (en) | 2013-10-31 | 2019-05-28 | Sigray, Inc. | Talbot X-ray microscope |
USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
JP6335729B2 (ja) * | 2013-12-06 | 2018-05-30 | キヤノン株式会社 | 透過型ターゲットおよび該透過型ターゲットを備えるx線発生管 |
JP6594479B2 (ja) * | 2013-12-06 | 2019-10-23 | キヤノン株式会社 | 透過型ターゲットおよび該透過型ターゲットを備えるx線発生管 |
US9594036B2 (en) | 2014-02-28 | 2017-03-14 | Sigray, Inc. | X-ray surface analysis and measurement apparatus |
US9823203B2 (en) | 2014-02-28 | 2017-11-21 | Sigray, Inc. | X-ray surface analysis and measurement apparatus |
JP6381269B2 (ja) * | 2014-04-21 | 2018-08-29 | キヤノン株式会社 | ターゲットおよび前記ターゲットを備えるx線発生管、x線発生装置、x線撮影システム |
US10401309B2 (en) | 2014-05-15 | 2019-09-03 | Sigray, Inc. | X-ray techniques using structured illumination |
US10352880B2 (en) | 2015-04-29 | 2019-07-16 | Sigray, Inc. | Method and apparatus for x-ray microscopy |
US10295486B2 (en) | 2015-08-18 | 2019-05-21 | Sigray, Inc. | Detector for X-rays with high spatial and high spectral resolution |
US10247683B2 (en) | 2016-12-03 | 2019-04-02 | Sigray, Inc. | Material measurement techniques using multiple X-ray micro-beams |
WO2018175570A1 (en) | 2017-03-22 | 2018-09-27 | Sigray, Inc. | Method of performing x-ray spectroscopy and x-ray absorption spectrometer system |
US10578566B2 (en) | 2018-04-03 | 2020-03-03 | Sigray, Inc. | X-ray emission spectrometer system |
US10845491B2 (en) | 2018-06-04 | 2020-11-24 | Sigray, Inc. | Energy-resolving x-ray detection system |
GB2591630B (en) | 2018-07-26 | 2023-05-24 | Sigray Inc | High brightness x-ray reflection source |
US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
CN112638261A (zh) | 2018-09-04 | 2021-04-09 | 斯格瑞公司 | 利用滤波的x射线荧光的系统和方法 |
US11056308B2 (en) | 2018-09-07 | 2021-07-06 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
WO2021011209A1 (en) | 2019-07-15 | 2021-01-21 | Sigray, Inc. | X-ray source with rotating anode at atmospheric pressure |
JP7097480B1 (ja) | 2021-06-24 | 2022-07-07 | 浜松ホトニクス株式会社 | X線管、x線発生装置、及び窓部材の製造方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997000756A2 (en) * | 1995-06-20 | 1997-01-09 | Valentinas Snitka | A diamond polishing method and apparatus |
JP2000306533A (ja) * | 1999-02-19 | 2000-11-02 | Toshiba Corp | 透過放射型x線管およびその製造方法 |
DE19934987B4 (de) * | 1999-07-26 | 2004-11-11 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Röntgenanode und ihre Verwendung |
US20080075229A1 (en) * | 2006-09-27 | 2008-03-27 | Nanometrics Incorporated | Generation of Monochromatic and Collimated X-Ray Beams |
JP5645449B2 (ja) * | 2010-04-14 | 2014-12-24 | キヤノン株式会社 | X線源及びx線撮影装置 |
-
2012
- 2012-02-06 JP JP2012022976A patent/JP5911323B2/ja active Active
-
2013
- 2013-01-21 WO PCT/JP2013/051683 patent/WO2013118593A1/en active Application Filing
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