JP2013131278A5 - - Google Patents

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JP2013131278A5
JP2013131278A5 JP2011281929A JP2011281929A JP2013131278A5 JP 2013131278 A5 JP2013131278 A5 JP 2013131278A5 JP 2011281929 A JP2011281929 A JP 2011281929A JP 2011281929 A JP2011281929 A JP 2011281929A JP 2013131278 A5 JP2013131278 A5 JP 2013131278A5
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JP2011281929A
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JP5988574B2 (ja
JP2013131278A (ja
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Priority to JP2011281929A priority Critical patent/JP5988574B2/ja
Priority claimed from JP2011281929A external-priority patent/JP5988574B2/ja
Priority to US13/712,434 priority patent/US8861299B2/en
Publication of JP2013131278A publication Critical patent/JP2013131278A/ja
Priority to US14/487,379 priority patent/US9208831B2/en
Publication of JP2013131278A5 publication Critical patent/JP2013131278A5/ja
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JP2011281929A 2011-12-22 2011-12-22 半導体記憶装置 Active JP5988574B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2011281929A JP5988574B2 (ja) 2011-12-22 2011-12-22 半導体記憶装置
US13/712,434 US8861299B2 (en) 2011-12-22 2012-12-12 Semiconductor memory device
US14/487,379 US9208831B2 (en) 2011-12-22 2014-09-16 Semiconductor memory device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011281929A JP5988574B2 (ja) 2011-12-22 2011-12-22 半導体記憶装置

Publications (3)

Publication Number Publication Date
JP2013131278A JP2013131278A (ja) 2013-07-04
JP2013131278A5 true JP2013131278A5 (https=) 2014-12-18
JP5988574B2 JP5988574B2 (ja) 2016-09-07

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JP2011281929A Active JP5988574B2 (ja) 2011-12-22 2011-12-22 半導体記憶装置

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US (2) US8861299B2 (https=)
JP (1) JP5988574B2 (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5988574B2 (ja) * 2011-12-22 2016-09-07 ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. 半導体記憶装置
US9350324B2 (en) * 2012-12-27 2016-05-24 Taiwan Semiconductor Manufacturing Co., Ltd. MCML retention flip-flop/latch for low power applications
JP2014149884A (ja) 2013-01-31 2014-08-21 Micron Technology Inc 半導体装置
US10665282B2 (en) * 2015-05-15 2020-05-26 Tohoku University Memory circuit provided with variable-resistance element
KR102620562B1 (ko) 2016-08-04 2024-01-03 삼성전자주식회사 비휘발성 메모리 장치
US11017838B2 (en) 2016-08-04 2021-05-25 Samsung Electronics Co., Ltd. Nonvolatile memory devices
JP7677611B2 (ja) 2021-03-03 2025-05-15 国立大学法人東北大学 抵抗変化型素子を備えた記憶回路

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5940785A (en) * 1996-04-29 1999-08-17 International Business Machines Corporation Performance-temperature optimization by cooperatively varying the voltage and frequency of a circuit
US5991221A (en) * 1998-01-30 1999-11-23 Hitachi, Ltd. Microcomputer and microprocessor having flash memory operable from single external power supply
JP2002117673A (ja) 2000-10-03 2002-04-19 Hitachi Ltd 半導体記憶装置
JP4827298B2 (ja) * 2001-01-22 2011-11-30 ルネサスエレクトロニクス株式会社 半導体記憶装置
JP4392740B2 (ja) * 2001-08-30 2010-01-06 株式会社ルネサステクノロジ 半導体記憶回路
US6646942B2 (en) * 2001-10-09 2003-11-11 Micron Technology, Inc. Method and circuit for adjusting a self-refresh rate to maintain dynamic data at low supply voltages
KR100426443B1 (ko) * 2002-06-29 2004-04-13 주식회사 하이닉스반도체 딥 파워다운 제어 회로
US7031219B2 (en) * 2004-06-04 2006-04-18 Etron Technology, Inc. Internal power management scheme for a memory chip in deep power down mode
KR100753048B1 (ko) * 2005-09-05 2007-08-30 주식회사 하이닉스반도체 반도체 메모리 장치의 주변영역 전압 발생 장치
JP2009009680A (ja) * 2007-05-25 2009-01-15 Nec Electronics Corp 半導体装置
KR101090469B1 (ko) * 2009-07-31 2011-12-06 주식회사 하이닉스반도체 데이터제어회로
JP2012038389A (ja) * 2010-08-09 2012-02-23 Elpida Memory Inc 半導体装置
JP5988574B2 (ja) * 2011-12-22 2016-09-07 ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. 半導体記憶装置

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