JP2013046062A5 - - Google Patents
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- Publication number
- JP2013046062A5 JP2013046062A5 JP2012170932A JP2012170932A JP2013046062A5 JP 2013046062 A5 JP2013046062 A5 JP 2013046062A5 JP 2012170932 A JP2012170932 A JP 2012170932A JP 2012170932 A JP2012170932 A JP 2012170932A JP 2013046062 A5 JP2013046062 A5 JP 2013046062A5
- Authority
- JP
- Japan
- Prior art keywords
- light emitting
- heterostructure
- emitting device
- layer
- initial surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/217,844 US9064980B2 (en) | 2011-08-25 | 2011-08-25 | Devices having removed aluminum nitride sections |
| US13/217,844 | 2011-08-25 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013046062A JP2013046062A (ja) | 2013-03-04 |
| JP2013046062A5 true JP2013046062A5 (enExample) | 2015-09-17 |
| JP6069617B2 JP6069617B2 (ja) | 2017-02-01 |
Family
ID=47076081
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012170932A Expired - Fee Related JP6069617B2 (ja) | 2011-08-25 | 2012-08-01 | 窒化アルミニウム部分を除去した素子 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US9064980B2 (enExample) |
| EP (1) | EP2562826B1 (enExample) |
| JP (1) | JP6069617B2 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9444224B2 (en) * | 2014-12-08 | 2016-09-13 | Palo Alto Research Center Incorporated | Nitride laser diode with engineered non-uniform alloy composition in the n-cladding layer |
| KR102742153B1 (ko) * | 2016-10-21 | 2024-12-12 | 삼성전자주식회사 | 갈륨 질화물 기판의 제조 방법 |
| US10170312B2 (en) * | 2017-04-20 | 2019-01-01 | Taiwan Semiconductor Manufacturing Company Ltd. | Semiconductor substrate and manufacturing method of the same |
| WO2019079239A1 (en) * | 2017-10-16 | 2019-04-25 | Crystal Is, Inc. | ELECTROCHEMICAL REMOVAL OF ALUMINUM NITRIDE SUBSTRATES FOR ELECTRONIC AND OPTOELECTRONIC DEVICES |
| US10483430B1 (en) | 2018-05-01 | 2019-11-19 | Facebook Technologies, Llc | Micron-sized light emitting diode designs |
| US12419142B2 (en) * | 2020-09-17 | 2025-09-16 | Nikkiso Co., Ltd. | Nitride semiconductor ultraviolet light emitting element |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5739945A (en) | 1995-09-29 | 1998-04-14 | Tayebati; Parviz | Electrically tunable optical filter utilizing a deformable multi-layer mirror |
| FR2765347B1 (fr) | 1997-06-26 | 1999-09-24 | Alsthom Cge Alcatel | Reflecteur de bragg en semi-conducteur et procede de fabrication |
| US6841808B2 (en) * | 2000-06-23 | 2005-01-11 | Toyoda Gosei Co., Ltd. | Group III nitride compound semiconductor device and method for producing the same |
| US7638346B2 (en) * | 2001-12-24 | 2009-12-29 | Crystal Is, Inc. | Nitride semiconductor heterostructures and related methods |
| US6831302B2 (en) * | 2003-04-15 | 2004-12-14 | Luminus Devices, Inc. | Light emitting devices with improved extraction efficiency |
| FR2859312B1 (fr) | 2003-09-02 | 2006-02-17 | Soitec Silicon On Insulator | Scellement metallique multifonction |
| TW200610150A (en) * | 2004-08-30 | 2006-03-16 | Kyocera Corp | Sapphire baseplate, epitaxial substrate and semiconductor device |
| US20070045638A1 (en) * | 2005-08-24 | 2007-03-01 | Lumileds Lighting U.S., Llc | III-nitride light emitting device with double heterostructure light emitting region |
| TWI307175B (en) * | 2006-01-11 | 2009-03-01 | Ind Tech Res Inst | Non-substrate light emitting diode and fabrication method thereof |
| US7452739B2 (en) | 2006-03-09 | 2008-11-18 | Semi-Photonics Co., Ltd. | Method of separating semiconductor dies |
| US7560364B2 (en) * | 2006-05-05 | 2009-07-14 | Applied Materials, Inc. | Dislocation-specific lateral epitaxial overgrowth to reduce dislocation density of nitride films |
| US7872272B2 (en) * | 2006-09-06 | 2011-01-18 | Palo Alto Research Center Incorporated | Nitride semiconductor ultraviolet LEDs with tunnel junctions and reflective contact |
| US7700962B2 (en) * | 2006-11-28 | 2010-04-20 | Luxtaltek Corporation | Inverted-pyramidal photonic crystal light emitting device |
| TWI370555B (en) | 2006-12-29 | 2012-08-11 | Epistar Corp | Light-emitting diode and method for manufacturing the same |
| CN101652832B (zh) * | 2007-01-26 | 2011-06-22 | 晶体公司 | 厚的赝晶氮化物外延层 |
| US8110425B2 (en) * | 2007-03-20 | 2012-02-07 | Luminus Devices, Inc. | Laser liftoff structure and related methods |
| US20080303033A1 (en) | 2007-06-05 | 2008-12-11 | Cree, Inc. | Formation of nitride-based optoelectronic and electronic device structures on lattice-matched substrates |
| US20090278233A1 (en) * | 2007-07-26 | 2009-11-12 | Pinnington Thomas Henry | Bonded intermediate substrate and method of making same |
| EP2243866A1 (en) | 2008-01-16 | 2010-10-27 | National University Corporation Tokyo University of Agriculture and Technology | Process for producing laminate comprising al-based group iii nitride single crystal layer, laminate produced by the process, process for producing al-based group iii nitride single crystal substrate using the laminate, and aluminum nitride single crystal substrate |
| US7960743B2 (en) * | 2008-12-05 | 2011-06-14 | Jds Uniphase Corporation | Multi-electrode light emitting device |
| US7749782B1 (en) * | 2008-12-17 | 2010-07-06 | Palo Alto Research Center Incorporated | Laser roughening to improve LED emissions |
| US8124993B2 (en) * | 2008-12-17 | 2012-02-28 | Palo Alto Research Center Incorporated | Selective decomposition of nitride semiconductors to enhance LED light extraction |
| US8227791B2 (en) * | 2009-01-23 | 2012-07-24 | Invenlux Limited | Strain balanced light emitting devices |
| US8178427B2 (en) * | 2009-03-31 | 2012-05-15 | Commissariat A. L'energie Atomique | Epitaxial methods for reducing surface dislocation density in semiconductor materials |
| TW201118946A (en) * | 2009-11-24 | 2011-06-01 | Chun-Yen Chang | Method for manufacturing free-standing substrate and free-standing light-emitting device |
-
2011
- 2011-08-25 US US13/217,844 patent/US9064980B2/en active Active
-
2012
- 2012-08-01 JP JP2012170932A patent/JP6069617B2/ja not_active Expired - Fee Related
- 2012-08-24 EP EP12181790.2A patent/EP2562826B1/en not_active Not-in-force
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