JP2013029496A - ３次元シーンの要素の奥行きを評価する装置 - Google Patents

３次元シーンの要素の奥行きを評価する装置 Download PDF

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Publication number
JP2013029496A
JP2013029496A JP2012134226A JP2012134226A JP2013029496A JP 2013029496 A JP2013029496 A JP 2013029496A JP 2012134226 A JP2012134226 A JP 2012134226A JP 2012134226 A JP2012134226 A JP 2012134226A JP 2013029496 A JP2013029496 A JP 2013029496A
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pixels
depth
pixel
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group
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JP2012134226A
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English (en)
Japanese (ja)
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JP2013029496A5 (enExample
Inventor
Drazic Valter
ドラジ ヴァルテル
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Thomson Licensing SAS
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Thomson Licensing SAS
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B13/00—Optical objectives specially designed for the purposes specified below
    • G02B13/22—Telecentric objectives or lens systems
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T15/00—3D [Three Dimensional] image rendering
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20—Image signal generators
    • H04N13/271—Image signal generators wherein the generated image signals comprise depth maps or disparity maps

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Graphics (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Signal Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Studio Devices (AREA)
  • Measurement Of Optical Distance (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP2012134226A 2011-06-17 2012-06-13 ３次元シーンの要素の奥行きを評価する装置 Ceased JP2013029496A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1155330 2011-06-17
FR1155330 2011-06-17

Publications (2)

Publication Number Publication Date
JP2013029496A true JP2013029496A (ja) 2013-02-07
JP2013029496A5 JP2013029496A5 (enExample) 2015-07-16

Family

ID=46172747

Family Applications (1)

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JP2012134226A Ceased JP2013029496A (ja) 2011-06-17 2012-06-13 ３次元シーンの要素の奥行きを評価する装置

Country Status (5)

Country Link
US (1) US20120320160A1 (enExample)
EP (1) EP2535681B1 (enExample)
JP (1) JP2013029496A (enExample)
KR (1) KR20120139587A (enExample)
CN (1) CN102833569B (enExample)

Cited By (1)

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JP2016537638A (ja) * 2013-08-19 2016-12-01 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ 光学検出器

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AU2014280332B2 (en) 2013-06-13 2017-09-07 Basf Se Detector for optically detecting at least one object
WO2015137635A1 (en) * 2014-03-13 2015-09-17 Samsung Electronics Co., Ltd. Image pickup apparatus and method for generating image having depth information
JP6660931B2 (ja) 2014-07-08 2020-03-11 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ 少なくとも１つの物体の位置を決定するための検出器
WO2016092452A1 (en) * 2014-12-09 2016-06-16 Basf Se Optical detector
EP3230841B1 (en) 2014-12-09 2019-07-03 Basf Se Optical detector
US10775505B2 (en) 2015-01-30 2020-09-15 Trinamix Gmbh Detector for an optical detection of at least one object
KR102311688B1 (ko) 2015-06-17 2021-10-12 엘지전자 주식회사 이동단말기 및 그 제어방법
CN108027239B (zh) 2015-07-17 2020-07-24 特里纳米克斯股份有限公司 用于光学检测至少一个对象的检测器
KR102492134B1 (ko) 2016-07-29 2023-01-27 트리나미엑스 게엠베하 광학 센서 및 광학적 검출용 검출기
KR102431355B1 (ko) 2016-10-25 2022-08-10 트리나미엑스 게엠베하 적어도 하나의 대상체의 광학적 검출을 위한 검출기
WO2018077870A1 (en) 2016-10-25 2018-05-03 Trinamix Gmbh Nfrared optical detector with integrated filter
US11860292B2 (en) 2016-11-17 2024-01-02 Trinamix Gmbh Detector and methods for authenticating at least one object
CN109964144B (zh) 2016-11-17 2023-07-18 特里纳米克斯股份有限公司 用于光学探测至少一个对象的检测器
CN106454318B (zh) * 2016-11-18 2020-03-13 成都微晶景泰科技有限公司 立体成像方法及立体成像装置
JP7204667B2 (ja) 2017-04-20 2023-01-16 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 光検出器
JP7237024B2 (ja) 2017-06-26 2023-03-10 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１つの物体の位置を決定するための検出器

Citations (2)

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JPH09257440A (ja) * 1996-03-26 1997-10-03 Takaoka Electric Mfg Co Ltd ２次元配列型共焦点光学装置
JP2009250685A (ja) * 2008-04-02 2009-10-29 Sharp Corp 距離測定装置および距離測定方法

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ATE408368T1 (de) * 2001-03-15 2008-10-15 Amo Wavefront Sciences Llc Tomographisches wellenfrontanalysesystem und verfahren zur abbildung eines optischen systems
JP2006208407A (ja) * 2005-01-24 2006-08-10 Olympus Medical Systems Corp 立体画像観察用顕微鏡システム
WO2007044725A2 (en) * 2005-10-07 2007-04-19 The Board Of Trustees Of The Leland Stanford Junior University Microscopy arrangements and approaches
US7932993B2 (en) * 2006-09-16 2011-04-26 Wenhui Mei Divided sub-image array scanning and exposing system
US7792423B2 (en) * 2007-02-06 2010-09-07 Mitsubishi Electric Research Laboratories, Inc. 4D light field cameras
US20090262182A1 (en) * 2007-10-15 2009-10-22 The University Of Connecticut Three-dimensional imaging apparatus
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KR101483714B1 (ko) * 2008-06-18 2015-01-16 삼성전자 주식회사 디지털 촬상 장치 및 방법
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US8400555B1 (en) * 2009-12-01 2013-03-19 Adobe Systems Incorporated Focused plenoptic camera employing microlenses with different focal lengths
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Patent Citations (2)

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Publication number Priority date Publication date Assignee Title
JPH09257440A (ja) * 1996-03-26 1997-10-03 Takaoka Electric Mfg Co Ltd ２次元配列型共焦点光学装置
JP2009250685A (ja) * 2008-04-02 2009-10-29 Sharp Corp 距離測定装置および距離測定方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016537638A (ja) * 2013-08-19 2016-12-01 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ 光学検出器

Also Published As

Publication number Publication date
CN102833569A (zh) 2012-12-19
KR20120139587A (ko) 2012-12-27
CN102833569B (zh) 2016-05-11
EP2535681A1 (en) 2012-12-19
EP2535681B1 (en) 2016-01-06
US20120320160A1 (en) 2012-12-20

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