KR20120139587A - 3차원 장면의 요소들의 깊이를 산정하는 디바이스 - Google Patents

3차원 장면의 요소들의 깊이를 산정하는 디바이스 Download PDF

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Publication number
KR20120139587A
KR20120139587A KR1020120064290A KR20120064290A KR20120139587A KR 20120139587 A KR20120139587 A KR 20120139587A KR 1020120064290 A KR1020120064290 A KR 1020120064290A KR 20120064290 A KR20120064290 A KR 20120064290A KR 20120139587 A KR20120139587 A KR 20120139587A
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South Korea
Prior art keywords
pixels
optical
depth
scene
pixel
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English (en)
Korean (ko)
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발터 드라직
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톰슨 라이센싱
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00Stereoscopic video systems; Multi-view video systems; Details thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B13/00Optical objectives specially designed for the purposes specified below
    • G02B13/22Telecentric objectives or lens systems
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T15/003D [Three Dimensional] image rendering
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N13/00Stereoscopic video systems; Multi-view video systems; Details thereof
    • H04N13/20Image signal generators
    • H04N13/271Image signal generators wherein the generated image signals comprise depth maps or disparity maps

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Graphics (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Optics & Photonics (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Studio Devices (AREA)
KR1020120064290A 2011-06-17 2012-06-15 3차원 장면의 요소들의 깊이를 산정하는 디바이스 Withdrawn KR20120139587A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1155330 2011-06-17
FR1155330 2011-06-17

Publications (1)

Publication Number Publication Date
KR20120139587A true KR20120139587A (ko) 2012-12-27

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020120064290A Withdrawn KR20120139587A (ko) 2011-06-17 2012-06-15 3차원 장면의 요소들의 깊이를 산정하는 디바이스

Country Status (5)

Country Link
US (1) US20120320160A1 (enExample)
EP (1) EP2535681B1 (enExample)
JP (1) JP2013029496A (enExample)
KR (1) KR20120139587A (enExample)
CN (1) CN102833569B (enExample)

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EP3036503B1 (en) * 2013-08-19 2019-08-07 Basf Se Optical detector
WO2015137635A1 (en) * 2014-03-13 2015-09-17 Samsung Electronics Co., Ltd. Image pickup apparatus and method for generating image having depth information
KR102397527B1 (ko) 2014-07-08 2022-05-13 바스프 에스이 하나 이상의 물체의 위치를 결정하기 위한 검출기
EP3230841B1 (en) 2014-12-09 2019-07-03 Basf Se Optical detector
EP3230690A4 (en) * 2014-12-09 2018-11-14 Basf Se Optical detector
CN107438775B (zh) 2015-01-30 2022-01-21 特里纳米克斯股份有限公司 用于至少一个对象的光学检测的检测器
KR102311688B1 (ko) * 2015-06-17 2021-10-12 엘지전자 주식회사 이동단말기 및 그 제어방법
WO2017012986A1 (en) 2015-07-17 2017-01-26 Trinamix Gmbh Detector for optically detecting at least one object
CN109564927B (zh) 2016-07-29 2023-06-20 特里纳米克斯股份有限公司 光学传感器和用于光学检测的检测器
JP2019532517A (ja) 2016-10-25 2019-11-07 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 光学的に検出するための光検出器
JP7241684B2 (ja) 2016-10-25 2023-03-17 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも1個の対象物の光学的な検出のための検出器
US11860292B2 (en) 2016-11-17 2024-01-02 Trinamix Gmbh Detector and methods for authenticating at least one object
EP3571522B1 (en) 2016-11-17 2023-05-10 trinamiX GmbH Detector for optically detecting at least one object
CN106454318B (zh) * 2016-11-18 2020-03-13 成都微晶景泰科技有限公司 立体成像方法及立体成像装置
US11060922B2 (en) 2017-04-20 2021-07-13 Trinamix Gmbh Optical detector
US11067692B2 (en) 2017-06-26 2021-07-20 Trinamix Gmbh Detector for determining a position of at least one object

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US5737084A (en) * 1995-09-29 1998-04-07 Takaoka Electric Mtg. Co., Ltd. Three-dimensional shape measuring apparatus
JP3350918B2 (ja) * 1996-03-26 2002-11-25 株式会社高岳製作所 2次元配列型共焦点光学装置
EP1207415B1 (en) * 1997-10-29 2006-08-30 MacAulay, Calum, E. Apparatus and methods relating to spatially light modulated microscopy
ATE508676T1 (de) * 2001-03-15 2011-05-15 Amo Wavefront Sciences Llc Topografisches wellenfrontanalysesystem und abbildungsverfahren für ein optisches system
JP2006208407A (ja) * 2005-01-24 2006-08-10 Olympus Medical Systems Corp 立体画像観察用顕微鏡システム
EP1941314A4 (en) * 2005-10-07 2010-04-14 Univ Leland Stanford Junior ARRANGEMENTS AND APPROACHES FOR MICROSCOPY
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US20090262182A1 (en) * 2007-10-15 2009-10-22 The University Of Connecticut Three-dimensional imaging apparatus
ES2372515B2 (es) * 2008-01-15 2012-10-16 Universidad De La Laguna Cámara para la adquisición en tiempo real de la información visual de escenas tridimensionales.
JP2009250685A (ja) * 2008-04-02 2009-10-29 Sharp Corp 距離測定装置および距離測定方法
KR101483714B1 (ko) * 2008-06-18 2015-01-16 삼성전자 주식회사 디지털 촬상 장치 및 방법
US8199248B2 (en) * 2009-01-30 2012-06-12 Sony Corporation Two-dimensional polynomial model for depth estimation based on two-picture matching
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Also Published As

Publication number Publication date
US20120320160A1 (en) 2012-12-20
EP2535681A1 (en) 2012-12-19
CN102833569A (zh) 2012-12-19
CN102833569B (zh) 2016-05-11
EP2535681B1 (en) 2016-01-06
JP2013029496A (ja) 2013-02-07

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PA0109 Patent application

Patent event code: PA01091R01D

Comment text: Patent Application

Patent event date: 20120615

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid