JP2012532342A5 - - Google Patents

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Publication number
JP2012532342A5
JP2012532342A5 JP2012517867A JP2012517867A JP2012532342A5 JP 2012532342 A5 JP2012532342 A5 JP 2012532342A5 JP 2012517867 A JP2012517867 A JP 2012517867A JP 2012517867 A JP2012517867 A JP 2012517867A JP 2012532342 A5 JP2012532342 A5 JP 2012532342A5
Authority
JP
Japan
Prior art keywords
molybdenum
polar protic
protic solvent
precursor
solvent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2012517867A
Other languages
English (en)
Other versions
JP2012532342A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2010/040470 external-priority patent/WO2011002806A1/en
Publication of JP2012532342A publication Critical patent/JP2012532342A/ja
Publication of JP2012532342A5 publication Critical patent/JP2012532342A5/ja
Pending legal-status Critical Current

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Claims (1)

  1. 担体溶媒と、
    シルセスキオキサンを含む二酸化ケイ素前駆体と、
    極性プロトン性溶媒、および
    モリブデン(V)エトキシド、
    モリブデン(VI)オキシドビス(2,4-ペンタンジオナート)、または
    Lが有機分子またはリガンドを含む、MoxLy
    のうちの少なくとも一つを含む溶液から、該極性プロトン性溶媒を蒸発させることによって形成された、モリブデン前駆体と
    を混合することによって形成された、ゾルゲル組成物。
JP2012517867A 2009-06-30 2010-06-29 フォトマスクの修復方法 Pending JP2012532342A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US22209609P 2009-06-30 2009-06-30
US61/222,096 2009-06-30
PCT/US2010/040470 WO2011002806A1 (en) 2009-06-30 2010-06-29 Advanced photomask repair

Publications (2)

Publication Number Publication Date
JP2012532342A JP2012532342A (ja) 2012-12-13
JP2012532342A5 true JP2012532342A5 (ja) 2013-08-15

Family

ID=42799670

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012517867A Pending JP2012532342A (ja) 2009-06-30 2010-06-29 フォトマスクの修復方法

Country Status (7)

Country Link
US (1) US20120164564A1 (ja)
EP (1) EP2449427A1 (ja)
JP (1) JP2012532342A (ja)
KR (1) KR20120104966A (ja)
AU (1) AU2010266375A1 (ja)
CA (1) CA2766589A1 (ja)
WO (1) WO2011002806A1 (ja)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9665000B1 (en) 2015-11-16 2017-05-30 Taiwan Semiconductor Manufacturing Company, Ltd. Method and system for EUV mask cleaning with non-thermal solution
FR3061210B1 (fr) * 2016-12-22 2021-12-24 Electricite De France Procede sol-gel de fabrication d'un revetement anticorrosion sur substrat metallique
TWI799494B (zh) 2018-01-19 2023-04-21 荷蘭商Asm 智慧財產控股公司 沈積方法
KR102083308B1 (ko) 2018-05-23 2020-04-23 한국표준과학연구원 탐침형 원자 현미경을 이용한 리소그래피 방법
KR102092653B1 (ko) * 2019-06-28 2020-06-01 (주)네프코 방오코팅 포토마스크의 패턴 유실 결함 수리 방법
CN111165904A (zh) * 2020-01-07 2020-05-19 云南中烟工业有限责任公司 一种低表面能镍铬加热丝、其制备方法及用途
CN111812357B (zh) * 2020-07-10 2021-05-25 浙江大学 一种用于微纳米制造的自填料三臂式热扫描探针

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59213660A (ja) * 1983-05-13 1984-12-03 鐘淵化学工業株式会社 多孔性セラミツクス薄膜およびその製造法
US5320868A (en) * 1993-09-13 1994-06-14 Dow Corning Corporation Method of forming SI-O containing coatings
WO1997010282A1 (en) 1995-09-12 1997-03-20 Gelest, Inc. Beta-substituted organosilsesquioxanes and use thereof
JP3529953B2 (ja) * 1996-09-03 2004-05-24 株式会社東芝 絶縁膜パターンの形成方法および感光性組成物
JP3195265B2 (ja) * 1997-01-18 2001-08-06 東京応化工業株式会社 Bi系強誘電体薄膜形成用塗布液およびこれを用いて形成した強誘電体薄膜、強誘電体メモリ
JP2000010293A (ja) * 1998-06-17 2000-01-14 Jsr Corp 反射防止膜形成用組成物および反射防止膜
US6635311B1 (en) 1999-01-07 2003-10-21 Northwestern University Methods utilizing scanning probe microscope tips and products therefor or products thereby
EP1502154B1 (en) 2001-12-17 2009-02-18 Northwestern University Patterning of solid state features by direct write nanolithographic printing
US7011910B2 (en) 2002-04-26 2006-03-14 Hoya Corporation Halftone-type phase-shift mask blank, and halftone-type phase-shift mask
US7491422B2 (en) 2002-10-21 2009-02-17 Nanoink, Inc. Direct-write nanolithography method of transporting ink with an elastomeric polymer coated nanoscopic tip to form a structure having internal hollows on a substrate
JP2006504136A (ja) * 2002-10-21 2006-02-02 ナノインク インコーポレーティッド ナノメートル・スケール設計構造、その製造方法および装置、マスク修復、強化、および製造への適用

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