JP2012513023A - 材料の特性評価のための装置及び方法 - Google Patents

材料の特性評価のための装置及び方法 Download PDF

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Publication number
JP2012513023A
JP2012513023A JP2011541594A JP2011541594A JP2012513023A JP 2012513023 A JP2012513023 A JP 2012513023A JP 2011541594 A JP2011541594 A JP 2011541594A JP 2011541594 A JP2011541594 A JP 2011541594A JP 2012513023 A JP2012513023 A JP 2012513023A
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radiation
detector
source
data set
intensity
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JP2011541594A
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Japanese (ja)
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JP2012513023A5 (enExample
Inventor
マックス ロビンソン
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Durham Scientific Crystals Ltd
Kromek Ltd
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Durham Scientific Crystals Ltd
Kromek Ltd
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Publication of JP2012513023A publication Critical patent/JP2012513023A/ja
Publication of JP2012513023A5 publication Critical patent/JP2012513023A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Geophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Toxicology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
JP2011541594A 2008-12-19 2009-12-14 材料の特性評価のための装置及び方法 Pending JP2012513023A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0823093.0 2008-12-19
GBGB0823093.0A GB0823093D0 (en) 2008-12-19 2008-12-19 Apparatus and method for characterisation of materials
PCT/GB2009/051705 WO2010070327A1 (en) 2008-12-19 2009-12-14 Apparatus and method for characterisation of materials

Publications (2)

Publication Number Publication Date
JP2012513023A true JP2012513023A (ja) 2012-06-07
JP2012513023A5 JP2012513023A5 (enExample) 2014-10-09

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JP2011541594A Pending JP2012513023A (ja) 2008-12-19 2009-12-14 材料の特性評価のための装置及び方法

Country Status (6)

Country Link
US (1) US8781072B2 (enExample)
EP (1) EP2373982A1 (enExample)
JP (1) JP2012513023A (enExample)
CN (1) CN102257380A (enExample)
GB (1) GB0823093D0 (enExample)
WO (1) WO2010070327A1 (enExample)

Cited By (3)

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Publication number Priority date Publication date Assignee Title
JP2017520771A (ja) * 2014-06-30 2017-07-27 コミサリヤ・ア・レネルジ・アトミク・エ・オ・エネルジ・アルテルナテイブ 散乱スペクトルおよび透過スペクトルを使用して回折法によって物体を解析するための方法およびシステム
JP2017524926A (ja) * 2014-06-30 2017-08-31 コミサリヤ・ア・レネルジ・アトミク・エ・オ・エネルジ・アルテルナテイブ 透過スペクトル次いで散乱スペクトルを使用して２つのステージで物体を解析する方法
JP2018523117A (ja) * 2015-12-04 2018-08-16 同方威視技術股▲分▼有限公司 セキュリティ検査機器及び放射線検出方法

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US7963695B2 (en) 2002-07-23 2011-06-21 Rapiscan Systems, Inc. Rotatable boom cargo scanning system
US9310323B2 (en) 2009-05-16 2016-04-12 Rapiscan Systems, Inc. Systems and methods for high-Z threat alarm resolution
BR112012021520B1 (pt) * 2010-02-25 2021-06-22 Rapiscan Systems, Inc. Sistema de varredura de raios x
US9224573B2 (en) 2011-06-09 2015-12-29 Rapiscan Systems, Inc. System and method for X-ray source weight reduction
US9218933B2 (en) 2011-06-09 2015-12-22 Rapidscan Systems, Inc. Low-dose radiographic imaging system
US9521336B1 (en) 2012-05-10 2016-12-13 Lockheed Martin Corporation Multi-spectral photon converting imaging apparatus
US9432587B1 (en) 2012-05-10 2016-08-30 Lockheed Martin Corporation Near-field enhanced photon conversion
KR101378757B1 (ko) * 2012-08-30 2014-03-27 한국원자력연구원 물질 원소 정보 획득 및 영상 차원의 선택이 가능한 방사선 영상화 장치
DE102012017872A1 (de) * 2012-09-06 2014-05-15 Technische Universität Dresden Verfahren und Vorrichtung zur bildgebenden Prüfung von Objekten mit Röntgenstrahlung
GB201220418D0 (en) * 2012-11-13 2012-12-26 Kromek Ltd Identification of materials
GB201220419D0 (en) * 2012-11-13 2012-12-26 Kromek Ltd Identification of materials
US9535016B2 (en) * 2013-02-28 2017-01-03 William Beaumont Hospital Compton coincident volumetric imaging
US20150109431A1 (en) * 2013-10-18 2015-04-23 Edax, Materials Analysis Division Of Ametek Inc. Systems and Methods for Material Texture Analysis
US9557427B2 (en) 2014-01-08 2017-01-31 Rapiscan Systems, Inc. Thin gap chamber neutron detectors
JP6394513B2 (ja) * 2015-06-18 2018-09-26 新東工業株式会社 残留応力測定装置及び残留応力測定方法
EP3745442A1 (en) * 2019-05-29 2020-12-02 FEI Company Method of examining a sample using a charged particle microscope
GB2586487B (en) * 2019-08-21 2024-03-06 Bae Systems Plc Materials Classifier
CN114563428B (zh) * 2022-03-09 2025-08-01 河南省科学院同位素研究所有限责任公司 高空封闭空间内钢结构锈蚀定位非接触评价系统
US12385854B2 (en) 2022-07-26 2025-08-12 Rapiscan Holdings, Inc. Methods and systems for performing on-the-fly automatic calibration adjustments of X-ray inspection systems

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JPH04258784A (ja) * 1991-02-12 1992-09-14 Toshiba Corp Ｘ線検査装置
JPH04319654A (ja) * 1991-04-19 1992-11-10 Toshiba Corp 散乱ｘ線検査装置
JP2641208B2 (ja) * 1986-06-20 1997-08-13 アメリカン サイエンス アンドエンジニアリング，インコーポレーテッド Ｘ線作像装置
JPH1114336A (ja) * 1997-06-18 1999-01-22 Futec Inc 厚さ及び厚さ換算単重測定方法
JP2004045247A (ja) * 2002-07-12 2004-02-12 Toshiba Corp Ｘ線画像検査装置
WO2008127385A2 (en) * 2006-10-24 2008-10-23 Thermo Niton Analyzers Llc Apparatus for inspecting objects using coded beam

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US8024A (en) * 1851-04-08 Bbick-pbess
JP2641208B2 (ja) * 1986-06-20 1997-08-13 アメリカン サイエンス アンドエンジニアリング，インコーポレーテッド Ｘ線作像装置
JPS63214241A (ja) * 1987-03-04 1988-09-06 株式会社　日立メデイコ 散乱ｘ線画像装置
JPH01172739A (ja) * 1987-12-28 1989-07-07 Matsushita Electric Ind Co Ltd 放射線測定器
JPH04258784A (ja) * 1991-02-12 1992-09-14 Toshiba Corp Ｘ線検査装置
JPH04319654A (ja) * 1991-04-19 1992-11-10 Toshiba Corp 散乱ｘ線検査装置
JPH1114336A (ja) * 1997-06-18 1999-01-22 Futec Inc 厚さ及び厚さ換算単重測定方法
JP2004045247A (ja) * 2002-07-12 2004-02-12 Toshiba Corp Ｘ線画像検査装置
WO2008127385A2 (en) * 2006-10-24 2008-10-23 Thermo Niton Analyzers Llc Apparatus for inspecting objects using coded beam

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017520771A (ja) * 2014-06-30 2017-07-27 コミサリヤ・ア・レネルジ・アトミク・エ・オ・エネルジ・アルテルナテイブ 散乱スペクトルおよび透過スペクトルを使用して回折法によって物体を解析するための方法およびシステム
JP2017524926A (ja) * 2014-06-30 2017-08-31 コミサリヤ・ア・レネルジ・アトミク・エ・オ・エネルジ・アルテルナテイブ 透過スペクトル次いで散乱スペクトルを使用して２つのステージで物体を解析する方法
JP2018523117A (ja) * 2015-12-04 2018-08-16 同方威視技術股▲分▼有限公司 セキュリティ検査機器及び放射線検出方法

Also Published As

Publication number Publication date
WO2010070327A1 (en) 2010-06-24
GB0823093D0 (en) 2009-01-28
US8781072B2 (en) 2014-07-15
CN102257380A (zh) 2011-11-23
US20110305318A1 (en) 2011-12-15
EP2373982A1 (en) 2011-10-12

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