JP2012225796A - X-ray diffraction apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an inexpensive x-ray diffraction apparatus capable of quickly and accurately detecting a shape of a diffraction ring.SOLUTION: The x-ray diffraction apparatus includes: an x-ray emitter 13 for applying an x-ray to a measuring object OB; a table 27 for receiving the x-ray diffracted by the measuring object OB and fixing an imaging plate 28 for recording a diffraction ring; and a laser detection device PUH for applying a laser beam to the imaging plate 28 and reading out a shape of the diffraction ring. A through hole for passing the x-ray is formed on the center of the table 27. In a state that the table 27 is rotated by a spindle motor 24 and a feed motor 18 after imaging the diffraction ring and the table 27 is moved in parallel with a light receiving surface of the imaging plate 28, the laser detection device PUH applies the laser beam to the imaging plate 28 and acquires a laser irradiation position when the intensity of light emitted from the imaging plate 28 becomes maximum.

Description

  The present invention irradiates a measurement object with X-rays and evaluates the characteristics of the measurement object based on the shape of a diffraction ring formed on the surface of an imaging plate by X-rays diffracted by the measurement object. The present invention relates to a diffraction device.

  Conventionally, as shown in Patent Document 1 below, for example, an X-ray diffractometer that measures a residual stress of a measurement object is known. In this X-ray diffractometer, a measurement object is irradiated with X-rays at a predetermined angle, and X-rays diffracted by the measurement object (hereinafter referred to as diffracted X-rays) are detected with a photosensitive imaging plate. The residual stress of the measurement object is calculated by the cos α method that receives the light and analyzes the shape of an annular X-ray diffraction image (hereinafter referred to as a diffraction ring) formed on the imaging plate.

JP-A-2005-241308

  The conventional X-ray diffractometer includes an irradiation device that irradiates a measurement object with X-rays to form a diffraction ring on the imaging plate, and a reading device that reads the shape of the diffraction ring formed on the imaging plate. . That is, after forming a diffraction ring on the imaging plate by the irradiation device, it is necessary to remove the imaging plate and set it in the reading device. Further, since the mounting position of the imaging plate is slightly shifted for each measurement, it is necessary to obtain the center of the diffraction ring by the diffracted X-rays from the measurement object for each measurement. Specifically, X-rays are irradiated with the iron powder attached to the measurement object, and a diffraction ring by the diffraction X-ray diffracted by the iron powder is formed on the imaging plate, and the center of the diffraction ring is formed. There was a need to ask. As described above, it took time to measure.

  Patent Document 1 also describes an X-ray diffractometer using an X-ray CCD instead of an imaging plate. In this case, the trouble of setting the imaging plate to the reading device can be saved. In this case, once the iron powder is attached to the measurement object and the center of the diffraction ring by diffraction X-rays from the iron powder is acquired, in the subsequent measurement, the acquired center is taken from the measurement object. It can be used as the center of a diffraction ring by diffracted X-rays. That is, it is not necessary to acquire the center of the diffraction ring for each measurement. However, since the range in which the diffracted X-rays can be received is wide, an X-ray CCD having a large light receiving area is required, and there is a problem that the cost of the apparatus increases. In addition, since the dynamic range of the X-ray CCD is smaller than the dynamic range of the imaging plate, it is difficult to detect the peak position of the intensity of the diffracted X-ray along the radial direction of the diffraction ring when the X-ray CCD is used. There was a problem of being.

  The present invention has been made to cope with the above problems, and an object of the present invention is to provide an inexpensive X-ray diffraction apparatus capable of accurately detecting the shape of a diffraction ring in a short time. In the description of each constituent element of the present invention below, in order to facilitate understanding of the present invention, reference numerals of corresponding portions of the embodiments described later are shown in parentheses, but each constituent element of the present invention is described. Should not be construed as being limited to the configurations of the corresponding portions indicated by the reference numerals of the embodiments.

  In order to achieve the above object, the present invention is characterized in that an X-ray emitter (13) that emits X-rays toward a measurement object (OB) and a through-hole that allows X-rays to pass through in the center are formed. A table (27) and a diffracted light receiver (which is fixed to the table and has a light receiving surface for receiving X-ray diffracted light diffracted by the measurement object, and records a diffraction ring as an image of the diffracted light) 28), a laser detector (PUH) for irradiating the light receiving surface of the diffracted light receiver with laser light and detecting the intensity of the light emitted from the diffracted light receiver by irradiation of the laser light, and the table, A rotating means (24) for rotating around the central axis of the through hole; and a moving means (18) for moving the table relative to the laser detection device in a direction parallel to the light receiving surface of the diffracted light receiver; The table is rotated and moved by the rotating means. While the table is moved by the stage, a plurality of light intensities repeatedly detected by the laser detection device are associated with the rotation angle of the table at the time of detecting the intensity of each light and the relative position of the table with respect to the laser detection device. Data reading means (S208, S216, S226) for storing the read data as the reading data, and diffraction ring shape detecting means (S414) for detecting the shape of the diffraction ring using the plurality of stored reading data. .

  In this case, a rotation angle detection means (24a) for detecting the rotation angle of the table and a position detection means (18a) for detecting the relative position of the table with respect to the laser detection device are provided. Each time the detected rotation angle of the table reaches a predetermined angle, the light intensity detected by the laser detection device and the relative position of the table with respect to the laser detection device detected by the position detection means may be stored as a set of read data.

  Further, in this case, a rotation angle detection means for detecting the rotation angle of the table, and a position detection means for detecting the relative position of the table with respect to the laser detection device, the data reading means is the laser detection device detected by the position detection means. Each time the relative position of the table to the predetermined position, the light intensity detected by the laser detector and the rotation angle of the table detected by the rotation angle detection means may be stored as a set of read data.

  Further, in this case, the apparatus includes a rotation angle detection means for detecting the rotation angle of the table and a position detection means for detecting the relative position of the table with respect to the laser detection device, and the data reading means is provided by the laser detection device at regular time intervals. The detected light intensity, the rotation angle of the table detected by the rotation angle detection means, and the relative position of the table with respect to the laser detection device detected by the position detection means may be stored as a set of read data.

  Further, in this case, the laser detection apparatus includes a laser emitter (33) that emits laser light to be irradiated onto the light receiving surface of the diffracted light receiver, and an objective lens (39) that condenses the laser light emitted from the laser emitting means. ), An actuator (40) for moving the objective lens in the optical axis direction of the laser light, a photodetector (43) for outputting a light reception signal corresponding to the intensity and shape of the received light, and a light receiving surface of the diffracted light receiver. The light incident from the laser light irradiation position is guided to the photodetector, and the shape of the received light formed on the light receiving surface of the photodetector is made different according to the deviation between the focal point of the laser light and the light receiving surface of the diffracted light receiver. And an optical component (42), and the data reading means focuses the laser light focused by the objective lens based on the received light signal output from the photodetector. Driving means for generating an error signal corresponding to a deviation between the diffracted light receiver and the light receiving surface of the diffracted light receiver, and driving the actuator based on the error signal so that the focal point of the laser light coincides with the light receiving surface of the diffracted light receiver (45, 46, 47) may be provided.

  According to the X-ray diffractometer configured as described above, a film coated with a phosphor can be employed as the diffracted light receiver. Accordingly, the cost can be reduced as compared with a device that receives diffracted light using an X-ray CCD, and the peak position of the intensity of diffracted X-rays can be detected with high accuracy. Further, it is not necessary to remove the diffracted light receiver that images the diffraction ring from the table and attach it to a separately prepared reader. Further, since the diffracted light receiver is not removed, once the center of the diffraction ring is detected, it is not necessary to detect the center of the diffraction ring in the subsequent measurement. Therefore, the shape of the diffraction ring can be accurately detected in a short time.

  Another feature of the present invention is that the reflected X-ray emitted from the X-ray emitter and reflected by the measurement object is received, and a received light signal related to the distance from the diffracted light receiver to the measurement object is received. The apparatus further comprises a reflected X-ray receiver (31, 32) for outputting, and the data reading means starts to store the intensity of the light detected by the laser detecting device as the read data based on the received light signal. The relative position of the table with respect to is to be set.

  In the X-ray diffractometer configured as described above, the radius of the diffraction ring formed on the light receiving surface of the diffracted light receiver is calculated using a signal related to the distance between the measurement object and the diffracted light receiver. Can be predicted. That is, since the X-ray diffraction angle on the surface of the measurement object is determined by the material of the measurement object, the radius of the diffraction ring formed on the light receiving surface of the diffracted light receiver is determined by the measurement object and the diffracted light receiver. Is proportional to the distance between. Therefore, the residual stress of the measurement object is calculated using a signal related to the diffraction angle when the residual stress of the measurement object stored in advance is “0” and the distance from the diffracted light receiver to the measurement object. The radius of the diffraction ring in the case of “0” can be calculated. Then, only in a predetermined region where the radius of the imaged diffraction ring may deviate from the diffraction ring reference radius R, the light intensity can be detected by the laser detection device and stored as read data. Thereby, measurement time can be shortened.

  Another feature of the present invention is that the diffractive ring shape detecting means calculates the radial position of the light receiving surface of the diffracted light receiver and the intensity of light detected by the laser detecting device for each predetermined rotation angle of the table. The presence or absence of a peak of the detected light intensity in the light receiving curve representing the relationship is detected, and when there are a predetermined number or more of light receiving curves having peaks, the data reading means serves as read data of the detected light intensity. There is to end the memory.

  According to the X-ray diffractometer configured as described above, the operation of the data reading means can be stopped when data sufficient to detect the shape of the diffraction ring is stored, thereby shortening the measurement time. be able to.

  Another feature of the present invention is that the diffractive ring shape detecting means converts the read data corresponding to the light intensity to the shape of the diffractive ring when the light intensity detected by the laser detection device is larger than a predetermined reference value. Adopted as data for detection, when the intensity of light detected by the laser detector is below a predetermined reference value, read data corresponding to the intensity of light is adopted as data for detecting the shape of the diffraction ring There is to not.

  According to the X-ray diffractometer configured as described above, reading data that is considered unnecessary as data representing the shape of the diffraction ring is not adopted, so the number of data during data processing can be reduced and the measurement time can be shortened. .

1 is an overall schematic diagram of an X-ray diffraction apparatus according to an embodiment of the present invention. It is the enlarged view to which the main-body part of the X-ray-diffraction apparatus of FIG. 1 was expanded. It is explanatory drawing explaining the relationship between the distance from an imaging plate to a measuring object, and the light reception position in a light reception sensor. It is a flowchart of the diffraction ring imaging process which the controller of FIG. 1 performs. It is explanatory drawing explaining the locus | trajectory of a reading point. 3 is a flowchart of the first half of a diffraction ring reading process executed by the controller of FIG. 1. 4 is a flowchart of the latter half of the diffraction ring reading process executed by the controller of FIG. 1. It is explanatory drawing explaining a reading start position. It is a flowchart of the diffraction ring elimination process which the controller of FIG. 1 performs. It is explanatory drawing explaining the erase start position. It is explanatory drawing explaining the erasure | elimination end position. It is a flowchart which shows the diffraction ring shape detection process which the controller of FIG. 1 performs. It is the graph which showed an example of the light reception curve, in order to explain the peak of signal intensity.

  A configuration of an X-ray diffraction apparatus according to an embodiment of the present invention will be described with reference to FIGS. 1 and 2. This X-ray diffractometer irradiates the measurement object OB with X-rays, reads the shape of the diffraction ring by the diffraction X-rays from the measurement object OB by the irradiation, and measures based on the read shape of the diffraction ring The characteristics of the object OB are evaluated. This X-ray diffractometer has a frame FR formed in a box shape, and support legs 11 are extended downward from corners of the bottom surface of the frame FR. That is, the bottom surface of the frame FR is located above the installation surface FL of the X-ray diffractometer. A lift 12 is provided below the frame FR. The elevator 12 has an elevator stage 12a for fixing the measurement object OB. The elevating stage 12a can be moved up and down. An opening is provided in the bottom surface of the frame FR, which is located above the elevator 12, and the fixed measurement object OB is carried into the frame FR by raising the elevating stage 12 a. Can do.

  An X-ray emitter 13 that emits X-rays, which is controlled by the X-ray control circuit 14, is fixed to the upper part of the frame FR. The direction of the exit of the X-ray emitter 13 so that the optical axis of the X-ray emitted from the X-ray emitter 13 and the normal line of the measurement object OB form a predetermined angle θ (for example, 30 °). Is set.

  The X-ray control circuit 14 is controlled by a controller CT, which will be described later, and controls the drive current and drive voltage supplied to the X-ray emitter 13 so that X-rays with a certain intensity are emitted from the X-ray emitter 13. . In addition, the X-ray emitter 13 includes a cooling device (not shown), and the X-ray control circuit 14 also controls a drive signal supplied to the cooling device. Thereby, the temperature of the X-ray emitter 13 is kept constant.

  A moving stage 15 is provided below the X-ray emitter 13. The moving stage 15 can be moved in a direction perpendicular to the optical axis of the X-rays emitted from the X-ray emitter 13 by the stage feeder 16. The stage feeding device 16 includes a screw rod 17 that is screwed into a nut (not shown) fixed to the moving stage 15, and a feed motor 18 that rotates the screw rod 17. The screw rod 17 extends in a direction perpendicular to the optical axis of the X-ray emitted from the X-ray emitter 13. One end portion of the screw rod 17 is connected to the output shaft of the feed motor 18 fixed to the frame FR, and the other end portion is rotatably supported by the bearing portion 19 fixed to the frame FR. The moving stage 15 is sandwiched between a pair of opposing plate-like guides 20 and 20 fixed to the frame FR, and is movable along the axial direction of the screw rod 17. That is, when the feed motor 18 is driven forward or backward, the rotational motion of the feed motor 18 is converted into the linear motion of the moving stage 15. An encoder 18 a is incorporated in the feed motor 18. The encoder 18 a outputs a pulse train signal that alternately switches between a high level and a low level to the position detection circuit 21 and the feed motor control circuit 22 every time the feed motor 18 rotates by a predetermined minute rotation angle.

  The position detection circuit 21 and the feed motor control circuit 22 start to operate in response to a command from the controller CT. Immediately after the start of measurement, the feed motor control circuit 22 drives the feed motor 18 to move the moving stage 15 to the feed motor 18 side. When the pulse signal output from the encoder 18a is not input, the position detection circuit 21 outputs a signal indicating that the movement stage 15 has reached the movement limit position to the feed motor control circuit 22, and sets the count value to “0”. Set. When the feed motor control circuit 22 receives a signal indicating that the movement limit position has been reached from the position detection circuit 21, the feed motor control circuit 22 stops outputting the drive signal to the feed motor 18. The above movement limit position is set as the origin position of the moving stage 15.

  When the feed motor control circuit 22 receives a set value indicating the position of the moving stage 15 from the controller CT, the feed motor control circuit 22 drives the feed motor 18 in a forward or reverse direction according to the set value. The position detection circuit 21 counts the number of pulses of the pulse signal output from the encoder 18a. Then, the current position of the moving stage 15 is calculated using the counted number of pulses, and is output to the controller CT and the feed motor control circuit 22. The feed motor control circuit 22 drives the feed motor 18 until the current position of the moving stage 15 input from the position detection circuit 21 matches the position of the moving destination input from the controller CT.

  Further, the feed motor control circuit 22 inputs a set value indicating the moving speed of the moving stage 15 from the controller CT. Then, the moving speed of the moving stage 15 is calculated using the number of pulses per unit time of the pulse signal input from the encoder 18a, and the calculated moving speed of the moving stage 15 becomes the moving speed input from the controller CT. The feed motor 18 is driven.

  The upper ends of the pair of guides 20 are connected by a plate-like upper wall 23. A through hole 23 a is provided in the upper wall 23, and a distal end portion of the emission port of the X-ray emitter 13 is inserted into the through hole 23 a. The positions of the X-ray emitter 13 and the moving stage 15 are set so that the tip of the emission port of the X-ray emitter 13 does not contact the moving stage 15.

  A spindle motor 24 is assembled to the moving stage 15. In the spindle motor 24, an encoder 24a similar to the encoder 18a is incorporated. That is, the encoder 24 a outputs a pulse train signal that alternately switches between a high level and a low level to the spindle motor control circuit 25 and the rotation angle detection circuit 26 every time the spindle motor 24 rotates by a predetermined minute rotation angle. Furthermore, the encoder 24a outputs an index signal that switches from a low level to a high level for a predetermined short period each time the spindle motor 24 makes one rotation to the controller CT and the rotation angle detection circuit 26.

  The spindle motor control circuit 25 and the rotation angle detection circuit 26 start to operate in response to a command from the controller CT. The spindle motor control circuit 25 inputs a set value representing the rotational speed of the spindle motor 24 from the controller CT. Then, the rotational speed of the spindle motor 24 is calculated using the number of pulses per unit time of the pulse signal input from the encoder 24a, and the drive signal is converted to the spindle so that the calculated rotational speed becomes the rotational speed input from the controller CT. Supply to the motor 24. The rotation angle detection circuit 26 counts the number of pulses of the pulse train signal output from the encoder 24a, calculates the rotation angle of the spindle motor 24 using the count value, and outputs it to the controller CT. When the rotation angle detection circuit 26 receives the index signal output from the encoder 24a, the rotation angle detection circuit 26 sets the count value to “0”. That is, the position where the index signal is input is the position where the rotation angle is 0 °.

  A disk-shaped table 27 is fixed to the tip of the output shaft of the spindle motor 24. The center axis of the table 27 coincides with the center axis of the output shaft of the spindle motor 24. The table 27 has a protruding portion 27a that protrudes downward from the central portion of the lower surface, and a screw thread is formed on the outer peripheral surface of the protruding portion 27a. The central axis of the protrusion 27 a coincides with the central axis of the output shaft of the spindle motor 24. An imaging plate 28 is assembled on the lower surface of the table 27. The imaging plate 28 is a circular plastic film whose surface is coated with a phosphor. A through hole 28a is provided at the center of the imaging plate 28. The projection 27a is passed through the through hole 28a, and a nut-like fixture 29 is screwed into the projection 27a, whereby the imaging plate 28 is fixed. It is sandwiched between the tool 29 and the table 27 and fixed. The fixing tool 29 is a cylindrical member, and a thread corresponding to the thread of the protruding portion 27a is formed on the inner peripheral surface. The imaging plate 28 is driven by the feed motor 18 and moves together with the moving stage 15, the spindle motor 24 and the table 27 from the origin position to the diffraction ring imaging position for imaging the diffraction ring. The imaging plate 28 is driven and rotated by the spindle motor 24 while being driven by the feed motor 18 to read the diffracting ring imaged together with the moving stage 15, the spindle motor 24 and the table 27. Move within the diffractive ring erase region that erases the ring.

  Further, the moving stage 15, the output shaft of the spindle motor 24, the table 27, and the fixture 29 are provided with through holes through which the X-rays emitted from the X-ray emitter 13 pass. The center axis of these through holes and the rotation axis of the table 27 coincide. That is, when the central axis of these through holes and the optical axis of the X-ray emitted from the X-ray emitter 13 coincide with each other, the X-ray is irradiated onto the measurement object OB. Thus, the position of the imaging plate 28 when irradiating the measurement object OB with X-rays is the diffraction ring imaging position.

  A light receiving sensor 31 (for example, an X-ray CCD) including a plurality of light receiving elements that receive X-rays reflected by the measurement object OB is assembled below the feed motor 18. The light receiving sensor 31 is sufficiently separated from the measurement object OB and the imaging plate 28 toward the feed motor 18. Thus, when the imaging plate 28 is at the diffraction ring imaging position, the light receiving sensor 31 can directly receive the X-ray reflected by the measurement object OB. The light receiving surface of the light receiving sensor 31 is parallel to the upper surface of the measurement object OB. The light receiving position of the X-ray on the light receiving surface of the light receiving sensor 31 corresponds to the height of the measurement object OB as shown in FIG. In other words, this corresponds to the distance L between the imaging plate 28 and the measurement object OB. The light receiving sensor 31 outputs a light receiving signal received by each light receiving element to the sensor signal extracting circuit 32.

  The sensor signal extraction circuit 32 starts to operate in response to a command from the controller CT, calculates a peak position of the light receiving signal on the light receiving surface of the light receiving sensor 31 using the light receiving signal input from the light receiving sensor 31, and represents a light receiving position representing the light receiving position. The signal is output to the controller CT.

  A laser detection device PUH is assembled below the light receiving sensor 31. The laser detection device PUH irradiates the imaging plate 28 that images the diffraction ring with laser light, and detects the intensity of the light incident from the imaging plate 28. The laser detection device PUH is sufficiently separated from the measurement object OB and the imaging plate 28 toward the feed motor 18. That is, when the imaging plate 28 is at the diffraction ring imaging position, the X-ray diffracted by the measurement object OB is not blocked by the laser detection device PUH. The laser detection device PUH includes a laser light source 33, a collimating lens 35, a reflecting mirror 36, a polarizing beam splitter 37, a ¼ wavelength plate 38, and an objective lens 39.

  The laser light source 33 is controlled by the laser drive circuit 34 and emits laser light that irradiates the imaging plate 28.

  The laser drive circuit 34 is controlled by the controller CT and controls and supplies a drive signal so that laser light with a predetermined intensity is emitted from the laser light source 33. The laser drive circuit 34 receives the light reception signal output from the photodetector 51 described later, and controls the drive signal output to the laser light source 33 so that the intensity of the light reception signal becomes a predetermined intensity. Thereby, the intensity of the laser light applied to the imaging plate 28 is kept constant.

The collimating lens 35 converts the laser light emitted from the laser light source 33 into parallel light. The reflecting mirror 36 reflects the laser light converted into parallel light by the collimating lens 35 toward the polarization beam splitter 37. The polarization beam splitter 37 transmits most (for example, 95%) of the laser light incident from the reflecting mirror 36 as it is. The quarter wave plate 38 converts the laser light incident from the polarization beam splitter 37 from linearly polarized light to circularly polarized light. The objective lens 39 focuses the laser light incident from the quarter wavelength plate 38 on the surface of the imaging plate 28.

  A focus actuator 40 is assembled to the objective lens 39. The focus actuator 40 is an actuator that moves the objective lens 39 in the optical axis direction of the laser light. The objective lens 39 is located at the center of the movable range when the focus actuator 40 is not energized.

  When the laser beam condensed by the objective lens 39 is irradiated onto the surface of the imaging plate 28 where the diffraction ring is imaged, a photo-stimulated luminescence phenomenon occurs. That is, after imaging the diffraction ring and irradiating the imaging plate 28 with laser light, the phosphor of the imaging plate 28 is light corresponding to the intensity of the diffracted X-ray, and light having a wavelength shorter than the wavelength of the laser light. To emit. The reflected light of the laser beam irradiated and reflected on the imaging plate 28 and the light emitted from the phosphor pass through the objective lens 39 and the quarter wavelength plate 38 and are reflected by the polarization beam splitter 37. In the reflection direction of the polarization beam splitter 37, a condenser lens 41, a cylindrical lens 42, and a photodetector 43 are provided. The condensing lens 41 condenses the light incident from the polarization beam splitter 37 on the cylindrical lens 42. The cylindrical lens 42 causes astigmatism in the transmitted light. The photodetector 43 is composed of four divided light receiving elements composed of four light receiving elements of the same square shape divided by dividing lines, and the light incident on the light receiving areas A, B, C, and D arranged clockwise A detection signal having a magnitude proportional to the intensity is output to the amplifier circuit 44 as a light reception signal (a, b, c, d).

  The amplifying circuit 44 amplifies the received light signals (a, b, c, d) output from the photodetector 43 with the same amplification factor to generate received light signals (a ′, b ′, c ′, d ′). And output to the focus error signal generation circuit 45 and the SUM signal generation circuit 48.

  In this embodiment, focus servo control based on the astigmatism method is used. The focus error signal generation circuit 45 generates a focus error signal by calculation using the amplified light reception signals (a ′, b ′, c ′, d ′). That is, the focus error signal generation circuit 45 performs a calculation of (a ′ + c ′) − (b ′ + d ′), and outputs the calculation result to the focus servo circuit 46 as a focus error signal. The focus error signal (a ′ + c ′) − (b ′ + d ′) represents the amount of deviation of the focal position of the laser beam from the surface of the imaging plate 28.

  The focus servo circuit 46 is controlled by the controller CT, generates a focus servo signal based on the focus error signal, and outputs the focus servo signal to the drive circuit 47. The drive circuit 47 drives the focus actuator 40 in accordance with the focus servo signal to displace the objective lens 39 in the optical axis direction of the laser light. In this case, by generating a focus servo signal so that the value of the focus error signal (a ′ + c ′) − (b ′ + d ′) is always a constant value (for example, zero), a laser is applied to the surface of the imaging plate 28. The light can be continuously collected.

  The SUM signal generation circuit 48 adds the received light signals (a ′, b ′, c ′, d ′) to generate a SUM signal (a ′ + b ′ + c ′ + d ′) and outputs it to the A / D conversion circuit 49. To do. The intensity of the SUM signal corresponds to the intensity of the laser light reflected by the imaging plate 28 and the intensity of the light generated by the stimulated light emission, but the intensity of the laser light reflected by the imaging plate 28 is substantially constant. Therefore, the intensity of the SUM signal corresponds to the intensity of light generated by the stimulated light emission. That is, the intensity of the SUM signal corresponds to the intensity of the diffracted X-ray incident on the imaging plate 28.

  The A / D conversion circuit 49 is controlled by the controller CT, receives the SUM signal from the SUM signal generation circuit 48, converts the instantaneous value of the input SUM signal into digital data, and outputs the digital data to the controller CT.

  Further, the laser detection device PUH includes a condenser lens 50 and a photodetector 51. The condensing lens 50 condenses the laser light that is a part of the laser light emitted from the laser light source 33 and reflected without passing through the polarization beam splitter 37 on the light receiving surface of the photodetector 51. The photodetector 51 is a light receiving element that outputs a light reception signal corresponding to the intensity of light collected on the light receiving surface. Therefore, the photodetector 51 outputs a light reception signal corresponding to the intensity of the laser light emitted from the laser light source 33 to the laser driving circuit 34.

  Further, an LED 52 is provided adjacent to the objective lens 39. The LED 52 is controlled by the LED driving circuit 53 to emit visible light and erase the diffraction ring imaged on the imaging plate 28.

  The LED drive circuit 53 is controlled by the controller CT, and supplies a drive signal for generating visible light having a predetermined intensity to the LED 52.

  The controller CT is an electronic control unit having a microcomputer including a CPU, a ROM, and a RAM as main parts. The controller CT has an input device 54 for an operator to input various parameters, work instructions, and the like, and a display device 55 for visually informing the operator of various setting conditions, operating conditions, measurement results, and the like. And are connected. The controller CT processes the digital data of the SUM signal output from the A / D conversion circuit 49 to detect the intensity of the light emitted from the phosphor of the imaging plate 28.

  Next, a procedure for measuring the residual stress of the measurement object OB using the X-ray diffractometer configured as described above will be described. First, the operator attaches the measurement object OB to the elevating stage 12a of the elevator 12, raises the elevating stage 12a, and sets the measurement object OB in the frame FR. Then, when the operator inputs the material of the measurement object OB using the input device 55 and instructs the start of measurement, the controller CT executes the diffraction ring imaging program. As shown in FIG. 4, when starting the diffraction ring imaging process in step S100, the controller CT rotates the imaging plate 28 at a low speed in step S102, and inputs the index signal from the encoder 24a, thereby rotating the imaging plate 28. Stop. Thereby, at the start of measurement, the rotation angle of the imaging plate 28 is set to 0 °. In the subsequent steps of the diffraction ring imaging process, the imaging plate 28 is not rotated. Next, in step S104, the imaging plate 28 is moved to the diffraction ring imaging position.

  Next, the controller CT starts the operation of the sensor signal extraction circuit 32 in step S106. Next, in step S108, X-ray emission is started. Thereby, X-rays are irradiated onto the measurement object OB, and the X-rays reflected on the surface of the measurement object OB are received by the light receiving sensor 31. Next, in step S110, a light reception position signal is input from the sensor signal extraction circuit 32, and a distance L between the imaging plate 28 and the measurement object OB is calculated using the input light reception position signal. In step S112, it is determined whether or not the calculated distance L is within a predetermined reference range. If the distance L is outside the reference range, it is determined as “No”, and X-ray irradiation to the measurement object OB is stopped in step S114.

  In step S116, the display device 54 displays that the position of the measuring object OB in the height direction is inappropriate, and also displays information related to the height adjustment of the lifting stage 12a of the elevator 12. That is, it displays how much the lifting stage 12a should be raised or lowered. Then, in step S126 described later, the diffraction ring imaging process ends. In this case, the operator instructs the start of measurement again using the input device 55 after adjusting the height of the lifting stage 12a. Since the time required from the above steps S108 to S114 is very short, the diffractive ring is not imaged on the imaging plate 28. Further, when the light receiving sensor 31 does not receive the X-ray reflected by the measurement object OB, only an indication that the position of the measurement object OB in the height direction is inappropriate is made in step S116. Thus, information relating to the height adjustment of the elevating stage 12a is not displayed. In this case, the position of the measurement object OB is considered to be in an extremely inappropriate position, and the height adjustment direction of the elevating stage 12a can be visually determined.

  On the other hand, if the distance L is within the predetermined reference range in step S112, the controller CT proceeds to step S118 to stop the operation of the sensor signal extraction circuit 32. In step S120, time measurement is started, and in step S122, it is determined whether a predetermined set time has elapsed. If the predetermined set time has not elapsed since the start of time measurement, it is determined as “No” and step S122 is executed again. That is, the controller CT stands by until a predetermined set time elapses from the start of time measurement. Then, when a predetermined set time has elapsed from the start of time measurement, it is determined as “Yes”, the X-ray irradiation is stopped in step S124, and the diffraction ring imaging process is ended in step S126.

  When the controller CT images the diffraction ring on the imaging plate 28, the controller CT executes a diffraction ring reading program. In the present embodiment, the controller CT moves the imaging plate 28 toward the bearing unit 19 at a constant speed in the diffraction ring reading region while rotating the table 27. Each time the rotation angle of the table 27 (that is, the rotation angle of the imaging plate 28) becomes a predetermined rotation angle, the SUM signal indicating the intensity of the diffracted X-rays from the A / D conversion circuit 49 and the position detection circuit 21 and A position signal representing the position of the moving stage 15 (that is, the position of the imaging plate 28) is acquired and stored. Therefore, as shown in FIG. 5, the locus of the reading point P for acquiring the SUM signal and the position signal on the light receiving surface of the imaging plate 28 is spiral.

  The acquired position signal corresponds to the distance (that is, the radius) from the center O of the light receiving surface of the imaging plate 28. Further, each reading point P is given a circumferential direction number n representing a circumferential position and a radial direction number m representing a radial position, and is represented as a reading point P (n, m). Identify. That is, the controller CT increments the circumferential direction number n every time the imaging plate 28 rotates by the minute angle Δθ, and initializes the circumferential direction number n every time the imaging plate 28 rotates once. In this embodiment, Δθ = (360 / N) °, and the predetermined rotation angle θ (n) (n = 1, 2,... N) increases as the circumferential direction number increases (360 / N). Increasing by °. The radial direction number m is incremented every time the imaging plate 28 rotates once. In other words, the radial direction number m corresponds to the number of rounds of the imaging plate 28.

  When the controller CT starts the diffraction ring reading process in step S200 as shown in FIGS. 6A and 6B, the controller CT calculates a diffraction ring reference radius R in step S202. The diffraction ring reference radius R is the radius of the diffraction ring when the residual stress of the measurement object OB is “0”. The diffraction ring reference radius R depends on the material of the measurement object OB and the distance L from the imaging plate 28 to the measurement object OB. That is, since the residual stress is “0”, the diffraction angle θa is determined by the material. Since the distance L and the diffraction ring reference radius R are in a proportional relationship, if the diffraction angle θa is stored in advance for each material, the diffraction ring reference radius R is calculated by the calculation of R = L · tan (θa). it can. When the diffraction angle θa of the measurement object OB is unknown, the powder of the measurement object OB is uniformly attached to the measurement object OB, and the above diffraction ring imaging process is performed, so that the diffraction ring May be imaged. The diffraction angle θa may be obtained from the relationship between the radius of the diffraction ring and the distance L.

  Next, the controller CT starts the operation of the position detection circuit 21 in step S204. In step S206, the imaging plate 28 is moved to the reading start position PR1 in the diffraction ring reading region. As shown in FIG. 7, when the imaging plate 28 is at the reading start position PR1, the distance from the center O to the center of the objective lens 39 is smaller than the diffraction ring reference radius R by a distance α. That is, the reading start position PR1 is PR1 = R−RR, where the distance from the center O (position indicated by a broken line in FIG. 7) when the moving stage 15 is at the drive limit position to the center of the objective lens 39 is a distance RR. It is calculated by the calculation of −α. Here, the distance α is a distance that is slightly larger than the distance at which the radius of the captured diffraction ring may deviate from the diffraction ring reference radius R.

  Next, the controller CT starts rotation of the imaging plate 28 in step S208. In step S210, laser beam irradiation is started. Next, in step S212, the operations of the amplifier circuit 44, the focus error signal generation circuit 45, the focus servo circuit 46, and the drive circuit 47 are started, the focus is pulled in, and the focus servo control is started. Next, in step S214, the rotation angle detection circuit 26 and the A / D conversion circuit 49 are started to operate. In step S216, the movement of the imaging plate 28 is started. That is, a movement start command and a movement speed are output to the feed motor control circuit 22, and the imaging plate 28 is moved from the reading start position PR1 to the bearing portion 19 side at a constant speed.

  In step S218, the controller CT initializes the values of the circumferential direction number n and the radial direction number m to “1”. The reading point P (1, 1) is a reading point when the imaging plate 28 is at the reading start position PR1. Next, controller CT determines whether the index signal of the encoder 24a was input in step S220. If no index signal is input, it is determined as “No”, and Step S220 is executed again. That is, the controller CT stands by until an index signal is input. When the index signal is input, the controller CT determines “Yes”, and captures the current rotation angle θp of the imaging plate 28 from the rotation angle detection circuit 26 in step S222. In step S224, it is determined whether the difference between the current rotation angle θp and the predetermined rotation angle θ (n) is less than a predetermined allowable value. If the difference between the current rotation angle θp and the predetermined rotation angle θ (n) is greater than or equal to a predetermined allowable value, it is determined as “No” and Steps S222 and S224 are executed again. That is, the controller CT stands by until the difference between the current rotation angle θp and the predetermined rotation angle θ (n) is less than a predetermined allowable value. When the difference between the current rotation angle θp and the predetermined rotation angle θ (n) becomes less than a predetermined allowable value, the SUM signal is acquired from the A / D conversion circuit 49 and the position detection circuit 21 in step S226. The position signal is taken in and stored in the memory as the signal intensity S (n, m) and radius value r (n, m) of the reading point P (n, m).

  Next, in step S228, the controller CT determines whether or not the stored signal strength S (n, m) is equal to or greater than a predetermined reference value. When the signal strength S (n, m) is equal to or greater than a predetermined reference value, it is determined as “Yes”, and the process proceeds to step S232 described later. On the other hand, when the signal strength S (n, m) is smaller than the predetermined reference value, it is determined as “No”, and in step S230, the stored signal strength S (n, m) and radius value r ( n, m) are deleted. In step S232, the value of the circumferential direction number n is incremented, and in step S234, it is determined whether or not the imaging plate 28 has made one rotation. That is, it is determined whether or not the circumferential direction number n is larger than the maximum value N. When the circumferential direction number n is less than or equal to the maximum value N, it is determined as “No” and the process returns to step S222.

  On the other hand, when the circumferential direction number n is larger than the maximum value N, it is determined as “Yes”, and in step S236, it is determined whether or not there is an end command by a diffraction ring detection program described later. If there is no termination command yet, it is determined as “No”, the radial direction number m is incremented in step S238, the circumferential direction number n is set to “1” in step S240, and the process proceeds to step S220. Return. By repeating the processes of steps S220 to S240, the data of the signal intensity S (n, m) and the radius value r (n, m) are stored in association with the rotation angle θ (n). That is, the intensity of the diffracted X-ray at the position represented by the rotation angle θ (n) and the radius value r (n, m) of the imaging plate 28 is stored. On the other hand, when an end command is issued by the diffraction ring measurement program, focus servo control is stopped in step S242 (FIG. 6B), and laser light irradiation is stopped in step S244. Next, in step S246, the operations of the A / D conversion circuit 49 and the rotation angle detection circuit 26 are stopped. In step S248, the movement of the imaging plate 28 is stopped, and in step S250, the diffraction ring reading process is terminated.

  When the controller CT finishes the diffraction ring reading process, the controller CT executes a diffraction ring deletion program that deletes the diffraction ring imaged on the imaging plate 28. As shown in FIG. 8, when starting the diffraction ring erasing process in step S300, the controller CT moves the imaging plate 28 to the erasing start position PE1 in the diffraction ring erasing area in step S302. As shown in FIG. 9A, when the imaging plate 28 is at the erasing start position PE1, the distance from the center O to the LED 52 is smaller than the diffraction ring reference radius R by the distance γ. That is, the erasing start position PE1 is calculated by a calculation of PE1 = R−RE−γ, where the distance RE between the center O and the LED 52 when the moving stage 15 is at the drive limit position is the distance RE. Here, the distance γ is set larger than the distance α so that the diffraction ring can be surely erased.

  Next, the controller CT starts light emission of the LED 52 in step S304, and starts moving the imaging plate 28 in step S306. In step S308, a position signal is input from the position detection circuit 21. In step S310, it is determined whether or not the current position of the imaging plate 28 exceeds the erasure end position PE2. As shown in FIG. 9B, when the imaging plate 28 is at the erasing end position PE2, the distance from the center O to the LED 52 is larger than the diffraction ring reference radius R by the distance γ. That is, the erasing end position PE2 is calculated by the calculation of PE2 = R−RE + γ. If the imaging plate 28 does not exceed the erase end position PE2, the process returns to step S308. That is, the controller CT waits until the imaging plate 28 exceeds the erasing end position PE2. When the imaging plate 28 exceeds the erasure end position PE2, “Yes” is determined in step S310, and the rotation and movement of the imaging plate 28 are stopped in step S312. Next, in step S314, the light emission of the LED 52 is stopped, and in step S316, the diffraction ring erasing process is ended.

  Further, in parallel with the diffraction ring reading program, the controller CT detects the peak radius rp (n) at which the value of the SUM signal reaches a peak (maximum) for each rotation angle θ (n), and the shape of the diffraction ring. Executes a diffraction ring shape detection program for detecting. As shown in FIG. 10, when starting the diffraction ring shape detection process in step S400, the controller CT initializes the circumferential direction number n to “1” in step S402. Next, in step S404, it is determined whether or not the peak radius rp (n) at the rotation angle θ (n) has been detected. When the peak radius rp (n) at the rotation angle θ (n) has been detected, it is determined as “Yes”, the circumferential direction number n is incremented in step S406, and the circumferential direction number n is determined in step S408. Is greater than the maximum value N. If the circumferential direction number n is less than or equal to the maximum value N, it is determined as “No” and the process returns to step S404. If the circumferential direction number n is greater than the maximum value N, it is determined as “Yes” and the process returns to step S402.

  On the other hand, if the peak radius rp (n) at the rotation angle θ (n) is not detected, “No” is determined, and the rotation angle of the imaging plate 28 is the rotation angle θ (n) in step S410. It is determined whether or not the number of signal strengths S (n, m) stored sometimes is greater than or equal to a predetermined reference number. However, the signal intensity S (n, m) erased in step S230 is not counted as the signal intensity S (n, m) stored when the rotation angle of the imaging plate 28 is the rotation angle θ (n). When the number of the stored signal strengths S (n, m) is less than the predetermined reference number, it is determined as “No”, and the controller CT advances the process to step S406.

  On the other hand, when the number of the stored signal intensities S (n, m) is equal to or larger than the predetermined reference number, it is determined as “Yes”, and is associated with the rotation angle θ (n) in step S412. Using all the stored radius values r (n, m) and signal intensity S (n, m), the presence or absence of a peak of the value of the SUM signal is determined. That is, as shown in FIG. 11, if there is no peak in the light receiving curve representing the relationship between the radius value r (n, m) and the signal intensity S (n, m), it is determined as “No”. Return to step S406. As described above, while the steps S402 to S412 are repeatedly executed, the radius value r (n, m) and the signal intensity S (n, m) are further captured by the diffraction ring reading process executed in parallel. And stored in memory. When a peak is detected in step S412, “Yes” is determined, and in step S414, the peak radius value is stored in the memory as a peak radius rp (n). Next, in step S416, it is determined whether or not the number of acquired peak radii is equal to or greater than a predetermined reference number. If the number of acquired peak radii is less than the predetermined reference number, it is determined as “No” and the process returns to step S406. By repeating steps S402 to S416 in this way, the number of acquired peak radii increases, and when the reference number is reached, “Yes” is determined in step S416, and diffraction ring reading processing is performed in step S418. Is output, and the diffraction ring shape detection process ends in step S420. Note that the predetermined reference number is the maximum value N of the circumferential direction number n, and determining “Yes” in step S416 means that the peak radii have been acquired at all points in the circumferential direction. .

  After completing the diffraction ring shape detection process, the controller CT calculates the residual stress by the cos α method using the peak radius rp (n), creates image data of the diffraction ring and calculated residual stress data, Output to the display device 54. The display device 54 displays an image of the diffraction ring and a numerical value of residual stress according to the input data.

  In the X-ray diffractometer configured as described above, the diffracted X-ray diffracted by the measurement object OB is received by the imaging plate 28, the diffraction ring is imaged, and the imaging plate 28 is rotated while moving in the radial direction. In addition, the intensity of the diffracted X-rays in the diffraction ring is detected by irradiating the laser from the laser detection device PUH and detecting the intensity of light generated from the irradiation position together with the rotation angle and the radial position. Therefore, the cost can be reduced as compared with an apparatus that receives diffracted light using an X-ray CCD, and the peak position of the intensity of the diffracted X-ray can be detected with high accuracy. In the conventional X-ray diffractometer described above, it is necessary to remove the imaging plate 28 imaging the diffraction ring from the X-ray irradiator and set it in the reader. According to this, such trouble can be saved. Further, once the center of the diffraction ring is detected, the center of the detected diffraction ring can be used in the subsequent measurement. Therefore, the shape of the diffraction ring can be detected in a short time.

  Further, the distance L is measured by the light receiving sensor 31, and the diffraction ring reference radius R is calculated. Then, only the region in which the radius of the diffraction ring of the measurement object OB may deviate from the diffraction ring reference radius R is irradiated with laser light, and includes light emitted from the imaging plate 28 due to the stimulated emission phenomenon. The intensity of light incident on the photodetector 43 is detected. Therefore, the shape of the diffraction ring can be detected in a short time.

  Further, in the diffraction ring shape detection process, the diffraction ring reading process is stopped when sufficient read data is stored to detect the shape of the diffraction ring. Therefore, the shape of the diffraction ring can be detected in a short time.

  Further, in the diffraction ring reading process, data that is considered unnecessary as data representing the shape of the diffraction ring is deleted (that is, the intensity slightly higher than the intensity of the SUM signal corresponding to the intensity of the reflected light of the irradiated laser beam). The reference value is used, and only the SUM signal intensity equal to or higher than this reference value is acquired). According to this, since the number of data processed in the diffraction ring shape detection process can be reduced, the shape of the diffraction ring can be detected in a short time.

  Furthermore, in carrying out the present invention, the present invention is not limited to the above embodiment, and various modifications can be made without departing from the object of the present invention.

  In the above embodiment, every time the rotation angle of the imaging plate 28 reaches a predetermined rotation angle, the signal intensity S (n, m) and the radius value r (n, m) are stored. However, instead of this, the signal intensity S (n, m) and the rotation angle θ (n, m) of the imaging plate 28 may be stored every time the radius value r becomes a predetermined value. In this case, in the diffraction ring shape detection process, a change in the signal strength S in the radial direction at a predetermined rotation angle may be calculated by an interpolation method. Also by this, the same effect as the above embodiment can be obtained.

  Further, the rotation angle θ (n, m), the signal intensity S (n, m), and the radius value r (n, m) of the imaging plate 28 may be acquired and stored at predetermined time intervals. Also in this case, in the diffraction ring shape detection process, the change in the signal intensity S in the radial direction at a predetermined rotation angle may be calculated by an interpolation method. Also by this, the same effect as the above embodiment can be obtained.

  Moreover, in the said embodiment, it determines whether the position of the height direction of the measuring object OB is in a predetermined range using the light receiving position of the reflected light received by the light receiving sensor 31, If it was not within the range, the operator adjusted the height of the elevating stage 12a. However, the height of the elevating stage 12a may be automatically adjusted so that the position in the height direction of the measurement object OB represented by the light receiving position of the light receiving sensor 31 is within a predetermined range. . According to this, as long as the position in the height direction of the measurement object OB set by the operator is within a range in which the light receiving sensor 31 can receive the reflected light, the operator adjusts the height of the elevating stage 12a. Since there is no need, work efficiency can be improved. For example, the light receiving sensor 31 is not required if the distance between the imaging plate and the measurement object is always constant as in the conventional X-ray detection apparatus.

  In the above embodiment, the diffraction ring reference radius R is calculated using the light receiving position of the light receiving sensor 31, and an area in which the radius of the imaged diffraction ring may deviate from the diffraction ring reference radius R is assumed. The reading start position PR1 is determined. However, the laser beam may always be irradiated to a certain region without calculating the diffraction ring reference radius R. For example, the entire region of the imaging plate 28 may be irradiated with laser light. Similarly, visible light emitted from the LED 53 may be always irradiated with visible light emitted from the LED 53 in a certain region. For example, the entire area of the imaging plate 28 may be irradiated with visible light from the LED 53. However, in this case, the measurement time is longer than in the above embodiment.

  In the above embodiment, the laser detection device PUH is controlled by the focus servo. However, when the imaging plate 28 is rotated, the variation in the distance between the light receiving surface of the imaging plate 28 and the objective lens 39 is very small. If so, focus servo control is unnecessary.

  In the above embodiment, the laser light applied to the imaging plate 28 is a laser beam having a constant intensity. Instead of this, a preset high level intensity and a preset low level laser beam are used. A pulsed laser beam having repeated intensities may be used, and an instantaneous value of the SUM signal may be acquired at a timing when the intensity reaches a high level. According to this, it is possible to irradiate a laser beam having a high level of intensity instantaneously to a point where the instantaneous value of the SUM signal of the imaging plate 28 is acquired. That is, in a state where the laser beam is approaching the point at which the instantaneous value of the SUM signal is acquired, the intensity of the laser beam is at a low level, and almost no light is generated by the stimulated light emission. And when the point which acquires the instantaneous value of a SUM signal and the irradiation point of a laser beam correspond, the intensity | strength of a laser beam will become a high level and the light by stimulated light emission will generate | occur | produce. When always irradiating laser light with a high level of intensity, the light intensity decreases due to the continued generation of light due to the stimulated emission. The instantaneous value of the SUM signal can be acquired at substantially the same timing. Therefore, the intensity of the light generated by the stimulated emission at the timing of acquiring the instantaneous value of the SUM signal can be more approximated to the intensity of the diffracted X-ray.

DESCRIPTION OF SYMBOLS 13 ... X-ray irradiator, 15 ... Moving stage, 18 ... Feed motor, 21 ... Position detection circuit, 24 ... Spindle motor, 26 ... Rotation angle detection circuit, 27 ... Table, 28 ... Imaging plate, 31 ... Light receiving sensor, 45 ... focus error signal generation circuit, 46 ... focus servo circuit, 47 ... drive circuit, 48 ... SUM signal generation circuit, PUH ... laser detection device, CT ... controller, OB ... measurement Object

Claims (8)

An X-ray emitter that emits X-rays toward the measurement object;
A table in which a through hole for allowing the X-rays to pass through is formed in the center;
A diffracted light receiver that is fixed to the table and has a light receiving surface that receives the diffracted light of the X-ray diffracted by the measurement object, and that records a diffraction ring that is an image of the diffracted light;
A laser detection device that irradiates a light receiving surface of the diffracted light receiver with laser light and detects an intensity of light emitted from the diffracted light receiver by the irradiation of the laser light;
Rotating means for rotating the table around the central axis of the through hole;
Moving means for moving the table relative to the laser detection device in a direction parallel to a light receiving surface of the diffracted light receiver;
In the state where the table is rotated by the rotating means and the table is moved by the moving means, the intensity of light repeatedly detected by the laser detecting device is used when the intensity of each light is detected. Data reading means for storing each of them as a plurality of read data in association with the rotation angle of the table and the relative position of the table with respect to the laser detection device;
An X-ray diffraction apparatus, comprising: a diffraction ring shape detection means for detecting the shape of the diffraction ring using the plurality of stored read data. The X-ray diffraction apparatus according to claim 1,
Reflected X-ray reception that receives reflected X-rays emitted from the X-ray emitter and reflected by the measurement object and outputs a received light signal related to the distance from the diffracted light receiver to the measurement object Further equipped with
The data reading means sets a relative position of the table with respect to the laser detection device when starting to store the intensity of light detected by the laser detection device as the read data based on the light reception signal. X-ray diffractometer. The X-ray diffraction apparatus according to claim 1 or 2,
The diffraction ring shape detection means is a light reception curve representing a relationship between a radial position of a light receiving surface of the diffracted light receiver and an intensity of light detected by the laser detection device for each predetermined rotation angle of the table. , The presence or absence of a peak of the detected light intensity is detected, and when there are a predetermined number or more of light receiving curves having the peak, the storage of the detected light intensity by the data reading means as the read data is terminated. An X-ray diffractometer characterized in that: In the X-ray diffraction apparatus according to any one of claims 1 to 3,
The diffraction ring shape detection means uses the read data corresponding to the light intensity as data for detecting the shape of the diffraction ring when the intensity of the light detected by the laser detection device is greater than a predetermined reference value. When the intensity of light detected by the laser detection device is equal to or less than a predetermined reference value, reading data corresponding to the intensity of the light is not adopted as data for detecting the shape of the diffraction ring. X-ray diffractometer characterized. In the X-ray diffractometer according to any one of claims 1 to 4,
Rotation angle detection means for detecting the rotation angle of the table;
A position detecting means for detecting a relative position of the table with respect to the laser detecting device;
The data reading means detects the intensity of light detected by the laser detection apparatus and the laser detection apparatus detected by the position detection means each time the rotation angle of the table detected by the rotation angle detection means reaches a predetermined angle. An X-ray diffractometer that stores the relative position of the table with respect to a set of read data. In the X-ray diffractometer according to any one of claims 1 to 4,
Rotation angle detection means for detecting the rotation angle of the table;
A position detecting means for detecting a relative position of the table with respect to the laser detecting device;
The data reading means is detected by the light intensity detected by the laser detecting device and the rotation angle detecting means every time the relative position of the table to the laser detecting device detected by the position detecting means becomes a predetermined position. An X-ray diffractometer that stores the rotation angle of the table as a set of read data. In the X-ray diffractometer according to any one of claims 1 to 4,
Rotation angle detection means for detecting the rotation angle of the table;
A position detecting means for detecting a relative position of the table with respect to the laser detecting device;
The data reading means includes the light intensity detected by the laser detection device at regular time intervals, the rotation angle of the table detected by the rotation angle detection means, and the laser detection device detected by the position detection means. An X-ray diffractometer which stores a relative position of a table as a set of read data. The X-ray diffraction apparatus according to any one of claims 1 to 7,
The laser detector is
A laser emitter that emits a laser beam that irradiates the light receiving surface of the diffracted light receiver;
An objective lens for condensing the laser light emitted from the laser emitting means;
An actuator for moving the objective lens in the optical axis direction of the laser beam;
A photodetector that outputs a received light signal according to the intensity and shape of the received light;
The light incident from the laser light irradiation position on the light receiving surface of the diffracted light receiver is guided to the photo detector, and the light receiving surface of the photo detector according to the deviation between the focal point of the laser light and the light receiving surface of the diffracted light receiver. An optical component that changes the shape of the received light formed on the
The data reading means includes
Based on the light reception signal output from the photodetector, an error signal corresponding to a deviation between the focal point of the laser beam condensed by the objective lens and the light receiving surface of the diffracted light receiver is generated, and the error signal is generated. An X-ray diffractometer comprising: drive means for driving the actuator so that the focal point of the laser beam and the light receiving surface of the diffracted light receiver coincide with each other.

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