JP2012202801A5 -

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Publication number: JP2012202801A5
Authority: JP; Japan
Prior art keywords: semiconductor device; life; life curve; lifetime; estimating
Prior art date: 2011-03-25
Legal status : Granted

Application number

JP2011067260A

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Filing date

2011-03-25

Publication date

2013-07-04

2011-03-25 Application filed filed Critical

2011-03-25 Priority to JP2011067260A priority Critical patent/JP5641998B2/ja

2011-03-25 Priority claimed from JP2011067260A external-priority patent/JP5641998B2/ja

2011-12-15 Priority to DE102011088728.8A priority patent/DE102011088728B4/de

2012-10-22 Publication of JP2012202801A publication Critical patent/JP2012202801A/ja

2013-07-04 Publication of JP2012202801A5 publication Critical patent/JP2012202801A5/ja

2014-12-17 Application granted granted Critical

2014-12-17 Publication of JP5641998B2 publication Critical patent/JP5641998B2/ja

Status Active legal-status Critical Current

2031-03-25 Anticipated expiration legal-status Critical

JP2011067260A 2011-03-25 2011-03-25 半導体装置の寿命推定方法 Active JP5641998B2 (ja)