JP2012202801A5 - - Google Patents

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Publication number
JP2012202801A5
JP2012202801A5 JP2011067260A JP2011067260A JP2012202801A5 JP 2012202801 A5 JP2012202801 A5 JP 2012202801A5 JP 2011067260 A JP2011067260 A JP 2011067260A JP 2011067260 A JP2011067260 A JP 2011067260A JP 2012202801 A5 JP2012202801 A5 JP 2012202801A5
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JP
Japan
Prior art keywords
semiconductor device
life
life curve
lifetime
estimating
Prior art date
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Application number
JP2011067260A
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English (en)
Japanese (ja)
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JP2012202801A (ja
JP5641998B2 (ja
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Priority to JP2011067260A priority Critical patent/JP5641998B2/ja
Priority claimed from JP2011067260A external-priority patent/JP5641998B2/ja
Priority to DE102011088728.8A priority patent/DE102011088728B4/de
Publication of JP2012202801A publication Critical patent/JP2012202801A/ja
Publication of JP2012202801A5 publication Critical patent/JP2012202801A5/ja
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Publication of JP5641998B2 publication Critical patent/JP5641998B2/ja
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JP2011067260A 2011-03-25 2011-03-25 半導体装置の寿命推定方法 Active JP5641998B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2011067260A JP5641998B2 (ja) 2011-03-25 2011-03-25 半導体装置の寿命推定方法
DE102011088728.8A DE102011088728B4 (de) 2011-03-25 2011-12-15 Lebensdauerschätzverfahren für eine Halbleitervorrichtung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011067260A JP5641998B2 (ja) 2011-03-25 2011-03-25 半導体装置の寿命推定方法

Publications (3)

Publication Number Publication Date
JP2012202801A JP2012202801A (ja) 2012-10-22
JP2012202801A5 true JP2012202801A5 (OSRAM) 2013-07-04
JP5641998B2 JP5641998B2 (ja) 2014-12-17

Family

ID=46831742

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011067260A Active JP5641998B2 (ja) 2011-03-25 2011-03-25 半導体装置の寿命推定方法

Country Status (2)

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JP (1) JP5641998B2 (OSRAM)
DE (1) DE102011088728B4 (OSRAM)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103884927B (zh) * 2012-12-21 2016-05-25 中国科学院金属研究所 一种力电热多场耦合下微电子产品可靠性测试方法
CN108445371B (zh) * 2018-01-18 2021-02-19 国网浙江省电力公司舟山供电公司 绝缘栅双极型晶体管使用寿命预分拣方法
AT522383A1 (de) 2019-03-12 2020-10-15 Schneider Electric Power Drives Gmbh Verfahren zur bewertung der thermischen belastung eines umrichters
CN111060798B (zh) * 2019-12-18 2021-10-15 中国测试技术研究院流量研究所 一种mos管自动功率老化测试系统及测试方法
JP2022077373A (ja) * 2020-11-11 2022-05-23 富士電機株式会社 寿命診断装置、半導体装置、寿命診断方法、
CN118676460B (zh) * 2024-07-04 2025-02-11 深圳永泰数能科技有限公司 一种具有防爆裂和寿命预测的电池模组及控制方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69029530T2 (de) * 1989-04-10 1997-08-07 Hitachi Ltd Verfahren zur Bestimmung der Lebensdauer einer Verbindung
JP4591246B2 (ja) 2005-07-14 2010-12-01 株式会社日立製作所 電力変換器

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