JP2012201944A - Plating apparatus for metal-coated resin substrate - Google Patents
Plating apparatus for metal-coated resin substrate Download PDFInfo
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本発明は、金属被覆樹脂基板、特に金属被覆ポリイミド基板のめっき装置に係り、より詳しくは縦型懸垂めっき装置による金属被覆においてめっき厚のさらなる均一化をはかるための金属被覆樹脂基板のめっき装置に関する。 The present invention relates to a plating apparatus for a metal-coated resin substrate, particularly a metal-coated polyimide substrate, and more particularly to a plating apparatus for a metal-coated resin substrate for further uniforming the plating thickness in metal coating by a vertical suspension plating apparatus. .
近年電子機器の小型化に伴い使用される電子部品も小型化が要求されるようになり、そのような電子部品の製造に用いられる配線材料として、例えば特許文献1に示すように、ポリイミドフィルム等の有機樹脂フィルム上に薄い金属層を形成し、該金属層上に数μm〜数十μmの厚みで銅を電気めっきした2層めっき基板が知られている。電気めっき法により製造された2層めっき基板は、フォトリソグラフィー技術によって表面に微細な配線パターンが形成され、携帯電話やテレビ等において液晶パネルとドライバICとの接続用配線材等に用いられる。この2層めっき基板において、基板表面に形成させる配線パターンは微細であるほど単位面積当たりの情報伝達量が増すため、液晶機器の小型・高速伝達・低価格化に対応して基板表面の配線パターンも狭小化の一途を辿っており、最近では配線ピッチ20μm以下という超微細な配線パターンも形成されるようになった。
このような配線ピッチの狭小化に伴い、めっき厚のバラツキが小さい2層めっき基板が求められるようになったのである。これはめっき厚のバラツキが大きければ微細配線が形成できずに断線やショート等の不良の原因となるためである。このため最近では、めっき厚のバラツキが10%以下であることが求められている。
In recent years, electronic components used with the miniaturization of electronic devices have been required to be miniaturized, and as a wiring material used for manufacturing such electronic components, for example, as shown in Patent Document 1, polyimide film or the like There is known a two-layer plating substrate in which a thin metal layer is formed on an organic resin film, and copper is electroplated on the metal layer with a thickness of several μm to several tens of μm. A two-layer plated substrate manufactured by electroplating has a fine wiring pattern formed on the surface by a photolithography technique, and is used as a wiring material for connecting a liquid crystal panel and a driver IC in a mobile phone or a television. In this two-layer plated substrate, the finer the wiring pattern formed on the substrate surface, the greater the amount of information transmitted per unit area. Therefore, the wiring pattern on the substrate surface can be used to reduce the size, speed and cost of liquid crystal equipment. However, ultra-fine wiring patterns with a wiring pitch of 20 μm or less have recently been formed.
With such a narrowing of the wiring pitch, a two-layer plating substrate with a small variation in plating thickness has been demanded. This is because if the variation in the plating thickness is large, fine wiring cannot be formed, causing defects such as disconnection or short circuit. For this reason, recently, it is required that the variation in plating thickness is 10% or less.
一般的にめっき厚分布を均一にする方法としては、電極(アノード:陽極)と被めっき材料との間に遮蔽板を設置してめっき槽内の電流分布を均一化する手法が用いられている。図6は、ポリイミドフィルム等の有機樹脂フィルム上に薄い金属層を形成し、該金属層上に数μm〜数十μmの厚みで銅を電気めっきした2層めっき基板の製造に用いられる従来のめっき装置、即ち、縦型懸垂めっき装置を例示したものである(特許文献1参照)。この縦型懸垂めっき装置は、被めっき面としての下地金属層を表面に備える樹脂基板(ポリイミドフィルム等の有機樹脂フィルム)を、被めっき面が略鉛直面となる電気めっき法を採用したもので、めっき槽1内に電極(アノード:陽極)2、めっき液噴流ノズル3が配設され、前記電極2と反対側に対向して樹脂基板(ワーク:被めっき材料)4が、被めっき面が略鉛直面となるようにワーク保持板5により懸垂され、前記樹脂基板4の被めっき面4aに対向する側に設置された電極2と前記被めっき面4aとの間に、長方形の板状部材からなる遮蔽板6が配置された構成となしたものである。図中、7は樹脂基板4を保持して陰極(カソード)とするクランパー、8は搬送レールである。 In general, as a method for uniforming the plating thickness distribution, a method is used in which a shielding plate is installed between the electrode (anode: anode) and the material to be plated to make the current distribution in the plating tank uniform. . FIG. 6 shows a conventional method used for manufacturing a two-layer plating substrate in which a thin metal layer is formed on an organic resin film such as a polyimide film and copper is electroplated on the metal layer with a thickness of several μm to several tens of μm. A plating apparatus, that is, a vertical suspension plating apparatus is illustrated (see Patent Document 1). This vertical suspension plating apparatus employs an electroplating method in which a substrate to be plated (an organic resin film such as a polyimide film) provided with a base metal layer on the surface is a substantially vertical surface. An electrode (anode: anode) 2 and a plating solution jet nozzle 3 are disposed in the plating tank 1, and a resin substrate (work: material to be plated) 4 is opposed to the side opposite to the electrode 2 and the surface to be plated is present. A rectangular plate-like member is suspended between the electrode 2 and the surface 4a to be plated, which is suspended by the work holding plate 5 so as to be a substantially vertical surface and is disposed on the side of the resin substrate 4 facing the surface 4a to be plated. The shielding plate 6 made of is arranged. In the figure, 7 is a clamper that holds the resin substrate 4 and serves as a cathode (cathode), and 8 is a transport rail.
しかしながら、前記した構成を有する従来の金属被覆樹脂基板のめっき装置には、以下に記載する問題がある。
即ち、前記した構成を有する従来の金属被覆樹脂基板のめっき装置においては、図7に示すように遮蔽板6は被めっき材料である樹脂基板4の上辺及び下辺と当該遮蔽板6の上辺及び下辺が平行となる長方形の板状部材を採用しているため、該遮蔽板6の端部にあたる樹脂基板4部に電流が集中し、被めっき面4aのめっき厚みが局所的に厚くなるという現象が生じる。そのため、従来はこうした電流集中部に新たな遮蔽板を設置しながら、樹脂基板4全体のめっき厚みを均一化するように調整する必要があるが、この手法では遮蔽板設置数の増加と遮蔽板の設置位置調整の複雑化を余儀なくされるのみならず、遮蔽板の位置調整が精度よく行われない場合には、めっき電圧が上昇してしまい製品製造コストが高くなる等の問題があった。
However, the conventional metal-coated resin substrate plating apparatus having the above-described configuration has the following problems.
That is, in the conventional metal-coated resin substrate plating apparatus having the above-described configuration, as shown in FIG. 7, the shielding plate 6 includes the upper and lower sides of the resin substrate 4 that is the material to be plated, and the upper and lower sides of the shielding plate 6. Since a rectangular plate-like member is used, the current concentrates on the resin substrate 4 corresponding to the end of the shielding plate 6 and the plating thickness of the surface to be plated 4a is locally increased. Arise. Therefore, conventionally, it is necessary to adjust the plating thickness of the entire resin substrate 4 to be uniform while installing a new shielding plate in such a current concentration portion. In addition to complicating the installation position adjustment, there is a problem in that, when the position adjustment of the shielding plate is not performed with high accuracy, the plating voltage increases and the product manufacturing cost increases.
本発明は、前記した従来技術の問題を解決するためになされたもので、遮蔽板の位置調整を簡易迅速にかつ精度よく行うことができると共に、めっき電圧の上昇を伴わずにめっき厚分布をより均一化させることが可能な金属被覆樹脂基板のめっき装置を提供しようとするものである。 The present invention has been made to solve the above-described problems of the prior art, and can easily and quickly adjust the position of the shielding plate, and can increase the plating thickness distribution without increasing the plating voltage. It is an object of the present invention to provide a metal-coated resin substrate plating apparatus that can be made more uniform.
本発明に係る金属被覆樹脂基板のめっき装置は、被めっき面としての下地金属層を表面に備える樹脂基板を、前記被めっき面が略鉛直面となるように配置し、かつ前記被めっき面に対向する側に設置される電極と前記被めっき面との間に遮蔽板が配置される金属被覆樹脂基板のめっき装置において、前記遮蔽板として、当該板状部材の上辺及び下辺が先端側から後端側へ向けて、前記樹脂基板の上辺及び下辺に対して一定の傾斜角度でテーパー状に縮幅する形状を有する板状部材を用いることを特徴とするものである。 In the plating apparatus for a metal-coated resin substrate according to the present invention, a resin substrate having a base metal layer on the surface as a surface to be plated is disposed so that the surface to be plated is a substantially vertical surface, and the surface to be plated is provided. In the metal-coated resin substrate plating apparatus in which a shielding plate is disposed between the electrode disposed on the opposite side and the surface to be plated, the upper side and the lower side of the plate-like member are rearward from the front end side as the shielding plate. A plate-like member having a shape that is tapered toward the end side in a tapered shape with a certain inclination angle with respect to the upper side and the lower side of the resin substrate is used.
又、本発明のめっき装置は、前記遮蔽板の上辺及び下辺の傾斜角度が、前記樹脂基板の上辺及び下辺に対し5〜20度であることを好ましい態様とするものである。 Moreover, the plating apparatus of this invention makes it a preferable aspect that the inclination angles of the upper side and the lower side of the shielding plate are 5 to 20 degrees with respect to the upper side and the lower side of the resin substrate.
本発明に係る金属被覆樹脂基板のめっき装置は、樹脂基板のめっき厚分布を均一にするために用いる遮蔽板を、当該板状部材の上辺及び下辺が先端側から後端側へ向けて、前記樹脂基板の上辺及び下辺に対して一定の傾斜角度でテーパー状に縮幅する形状を有する板状部材で構成することにより、遮蔽板端部における電流集中が解消され、少ない遮蔽板数で電圧上昇を伴わずにめっき厚分布をより均一化することができる。従って、本発明装置によれば、めっき厚のバラツキの小さい高品質の2層めっき基板を低コストで製造することが可能となり、配線ピッチの狭小化にも十分に対応することができるという優れた効果を奏する。 In the plating apparatus for metal-coated resin substrates according to the present invention, the shielding plate used to make the plating thickness distribution of the resin substrate uniform is arranged such that the upper side and the lower side of the plate-shaped member are directed from the front end side to the rear end side. Consists of a plate-like member with a taper shape with a fixed inclination angle with respect to the upper and lower sides of the resin substrate, eliminating current concentration at the edge of the shielding plate and increasing the voltage with a small number of shielding plates It is possible to make the plating thickness distribution more uniform without accompanying. Therefore, according to the apparatus of the present invention, it is possible to manufacture a high-quality two-layer plating substrate with small variations in plating thickness at low cost, and it is possible to sufficiently cope with narrowing of the wiring pitch. There is an effect.
図1〜図2に本発明の一実施例装置として示す金属被覆樹脂基板のめっき装置は、図6に示す縦型懸垂めっき装置と同様、被めっき面としての下地金属層を表面に備える樹脂基板(ポリイミドフィルム等の有機樹脂フィルム)を、被めっき面が略鉛直面となる電気めっき法を採用したもので、めっき槽1内に電極(アノード:陽極)2、めっき液噴流ノズル3が配設され、前記電極2と反対側に対向して樹脂基板(ワーク:被めっき材料)4が、被めっき面が略鉛直面となるようにワーク保持板5により懸垂され、前記樹脂基板4の被めっき面4aに対向する側に設置された電極2と前記被めっき面4aとの間に、遮蔽板6が配置された構成となしたものである。 The metal-coated resin substrate plating apparatus shown as an embodiment of the present invention in FIGS. 1 to 2 is a resin substrate having a base metal layer as a surface to be plated on the surface, similar to the vertical suspension plating apparatus shown in FIG. (Organic resin film such as polyimide film) adopts an electroplating method in which the surface to be plated becomes a substantially vertical surface, and an electrode (anode: anode) 2 and a plating solution jet nozzle 3 are disposed in the plating tank 1. A resin substrate (workpiece: material to be plated) 4 is suspended by a workpiece holding plate 5 so that the surface to be plated is a substantially vertical surface so as to face the opposite side of the electrode 2, and the resin substrate 4 is plated. A shielding plate 6 is disposed between the electrode 2 disposed on the side facing the surface 4a and the surface to be plated 4a.
本発明装置は、上記構成のめっき装置において、めっき槽1内の電流分布を均一化する手法に用いられる遮蔽板の形状を改善したもので、図1及び図2に示すように本発明の遮蔽板16は、被めっき材料である樹脂基板4の上辺及び下辺と当該遮蔽板の上辺及び下辺が平行となる長方形の板状部材を用いた従来の遮蔽板6に替えて、板状部材の上辺及び下辺が先端側から後端側へ向けて、前記樹脂基板4の上辺及び下辺に対して一定の傾斜角度でテーパー状に縮幅する形状を有する板状部材を採用したものである。 The apparatus of the present invention is an improvement of the shape of the shielding plate used in the method for uniformizing the current distribution in the plating tank 1 in the plating apparatus having the above-described configuration. As shown in FIGS. The plate 16 replaces the conventional shielding plate 6 using a rectangular plate-like member in which the upper and lower sides of the resin substrate 4 that is the material to be plated and the upper and lower sides of the shielding plate are parallel to each other. In addition, a plate-like member having a shape in which the lower side is tapered toward the rear end side from the front end side to the upper side and the lower side of the resin substrate 4 at a fixed inclination angle is employed.
ここで、めっき槽1内の電流分布を均一化するための遮蔽板を、板状部材の上辺及び下辺が先端側から後端側へ向けて、前記樹脂基板4の上辺及び下辺に対して一定の傾斜角度でテーパー状に縮幅する形状を有する板状部材で構成するのは、以下に記載する理由による。
遮蔽板により遮られた電流は、遮蔽板に沿うように流れたあと遮蔽板端部から前記樹脂基板4に向かって流れる。そのため遮蔽板がテーパー形状を有しない場合、常に前記樹脂基板4の幅方向の同じラインに電流が集中してしまい、遮蔽板の上辺及び下辺にあたる部分の樹脂基板のめっき厚が厚くなってしまう。従来の遮蔽板では、このような遮蔽板端部でのめっき厚増大を解消するために、めっき厚の厚くなった部分にさらに遮蔽板を追加し、多くの遮蔽板を複雑に組み合わせてめっき厚均一化を図る必要があった。これに対し、本発明の遮蔽板は、テーパー形状を有するため、前記樹脂基板4の幅方向で少しずつ電流集中部がずれ局所的なめっき厚の増大を解消する事ができる。
Here, the shielding plate for equalizing the current distribution in the plating tank 1 is fixed with respect to the upper side and the lower side of the resin substrate 4 with the upper side and the lower side of the plate-like member directed from the front side to the rear side. The reason why the plate-like member is formed to have a taper shape with the inclination angle is as follows.
The current blocked by the shielding plate flows along the shielding plate and then flows from the end of the shielding plate toward the resin substrate 4. Therefore, when the shielding plate does not have a taper shape, the current always concentrates on the same line in the width direction of the resin substrate 4, and the plating thickness of the resin substrate corresponding to the upper side and the lower side of the shielding plate is increased. In the conventional shielding plate, in order to eliminate the increase in plating thickness at the end of the shielding plate, a shielding plate is added to the thickened portion of the plating thickness, and many shielding plates are combined in a complex manner to reduce the plating thickness. It was necessary to make it uniform. On the other hand, since the shielding plate of the present invention has a tapered shape, the current concentration portion is shifted little by little in the width direction of the resin substrate 4, and the local increase in plating thickness can be eliminated.
又、この遮蔽板16の上辺及び下辺の傾斜角度θを樹脂基板4の上辺及び下辺に対し5〜20度と規定したのは、傾斜角度θが5度未満では、前記樹脂基板4の幅方向での電流集中部のずれが小さいため遮蔽板の上下辺に沿ってめっき厚の厚いラインが生じてしまうためである。
他方、20度を超えると、遮蔽によりめっき厚を低減したい部分以外の遮蔽しろが大きくなってしまうため、結果としてめっき厚分布が悪化してしまうためである。
Further, the inclination angle θ of the upper side and the lower side of the shielding plate 16 is defined as 5 to 20 degrees with respect to the upper side and the lower side of the resin substrate 4 when the inclination angle θ is less than 5 degrees. This is because the deviation of the current concentrating portion is small so that a thick plating line is formed along the upper and lower sides of the shielding plate.
On the other hand, when the angle exceeds 20 degrees, the shielding margin other than the portion where the plating thickness is desired to be reduced due to shielding increases, and as a result, the plating thickness distribution deteriorates.
図6に示す金属被覆樹脂基板めっき装置を使用し、本発明の遮蔽板16として、図2に示す先端側の幅W=80mm、長さL=500mm×10本、上辺及び下辺の傾斜角度θ=15度とした厚さ3mmの板状部材を使用した。本実施例では、この遮蔽板16を同一垂直面上に上下2枚間隔をおいて設置した。
樹脂基板(ワーク)4は、厚み38ミクロンのポリイミドフィルム(Kapton NF:東レ・デュポン製)表面にスパッタリング法により厚み20nmのニッケル層を設け、その上に厚み100nmの銅層を設けたものである。
使用しためっき液は、硫酸銅120g/l、硫酸210g/l、塩素50mg/lの液に、HL(アトテック製カパラシドHL(レベラー成分))を20ml/l、GS(アトテック製カパラシドGS(プライトナー成分))を5ml/lの割合で添加したものである。めっき液の温度は24℃、ワークの搬送速度は0.4m/分、めっき槽への給液量はめっき液噴流ノズル1本当たり28l/minで行い、めっきに要する電流密度と通電時間は、めっき槽1内を4つの区分に分割し、第1区分では0.5A/dm2と1分、第2区分では1.0A/dm2と1分、第3区分では2.0A/dm2と1分、第4区分では3.0A/dm2と12分とした。
本実施例におけるめっき厚分布を図3に示す。
Using the metal-coated resin substrate plating apparatus shown in FIG. 6, as the shielding plate 16 of the present invention, the tip side width W = 80 mm, the length L = 500 mm × 10 pieces, the upper side and the lower side inclination angles θ shown in FIG. A plate-like member having a thickness of 3 mm and 15 degrees was used. In this embodiment, the shielding plates 16 are installed on the same vertical plane with an interval of two sheets above and below.
The resin substrate (work) 4 is obtained by providing a nickel layer having a thickness of 20 nm on the surface of a polyimide film (Kapton NF: manufactured by Toray DuPont) having a thickness of 38 microns by a sputtering method, and providing a copper layer having a thickness of 100 nm thereon. .
The plating solution used was copper sulfate 120 g / l, sulfuric acid 210 g / l, chlorine 50 mg / l, HL (Atotech Kaparaside HL (leveler component)) 20 ml / l, GS (Atotech Kaparaside GS (Prytner). Component)) is added at a rate of 5 ml / l. The temperature of the plating solution is 24 ° C., the workpiece conveyance speed is 0.4 m / min, the amount of liquid supplied to the plating tank is 28 l / min per plating solution jet nozzle, and the current density and energization time required for plating are as follows: The inside of the plating tank 1 is divided into four sections, 0.5 A / dm 2 and 1 minute in the first section, 1.0 A / dm 2 and 1 minute in the second section, and 2.0 A / dm 2 in the third section. 1 minute, and in the fourth division, 3.0 A / dm 2 and 12 minutes.
The plating thickness distribution in this example is shown in FIG.
図3に示すめっき厚分布より、本発明の遮蔽板によれば、遮蔽板端部での電流集中が解消されることによりめっき厚分布が略均一化されていることがわかる。又、そのめっき厚のバラツキは8%程度と低く、目標である10%以下を達成することができた。更に本実施例では、遮蔽板を2枚で構成したのでめっき電圧の上昇はほとんど確認されなかった。 From the plating thickness distribution shown in FIG. 3, it can be seen that according to the shielding plate of the present invention, the plating thickness distribution is substantially uniformed by eliminating the current concentration at the end of the shielding plate. Moreover, the variation of the plating thickness was as low as about 8%, and the target of 10% or less could be achieved. Furthermore, in this example, since the shielding plate was composed of two sheets, almost no increase in plating voltage was confirmed.
上辺および下辺の傾斜角度θ=5度とした以外は実施例1と同様にして樹脂基板(ワーク)4にめっきを形成した。めっき形成後のめっき厚のバラツキは10%と低く目標の10%以下を達成できた。 Plating was formed on the resin substrate (workpiece) 4 in the same manner as in Example 1 except that the inclination angle θ of the upper side and the lower side was set to 5 degrees. The variation in plating thickness after plating formation was as low as 10%, and the target of 10% or less could be achieved.
上辺および下辺の傾斜角度θ=20度とした以外は実施例1と同様にして樹脂基板(ワーク)4にめっきを形成した。めっき形成後のめっき厚のバラツキは10%と低く目標の10%以下を達成できた。 The resin substrate (workpiece) 4 was plated in the same manner as in Example 1 except that the inclination angle θ of the upper side and the lower side was set to 20 °. The variation in plating thickness after plating formation was as low as 10%, and the target of 10% or less could be achieved.
(比較例1)
上辺および下辺の傾斜角度θ=3度とした以外は実施例1と同様にして樹脂基板(ワーク)4にめっきを形成した。めっき形成後のめっき厚のバラツキは13%であり、目標の10%以下に到達できなかった。
(Comparative Example 1)
Plating was formed on the resin substrate (workpiece) 4 in the same manner as in Example 1 except that the inclination angle θ of the upper side and the lower side was set to 3 degrees. The variation in plating thickness after plating formation was 13%, and the target of 10% or less could not be reached.
(比較例2)
上辺および下辺の傾斜角度θ=25度とした以外は実施例1と同様にして樹脂基板(ワーク)4にめっきを形成した。めっき形成後のめっき厚のバラツキは12%であり、目標の10%以下に到達できなかった。
(Comparative Example 2)
Plating was formed on the resin substrate (workpiece) 4 in the same manner as in Example 1 except that the inclination angle θ of the upper side and the lower side was set to 25 °. The variation in plating thickness after plating formation was 12%, and the target of 10% or less could not be reached.
(従来例1)
遮蔽板として、幅W=50〜100mm、長さL=500mm×10本、厚さ3mmの長方形の板状部材からなる遮蔽板を2枚用いた以外は、実施例1と同じ条件でめっき処理を行った結果、図4に示すようにめっき厚分布は、遮蔽板で隠された部分のめっき厚が低減し遮蔽板端部に電流が集中するため局所的にめっき厚の厚い箇所が生じ、そのめっき厚のバラツキは15%程度と、目標の10%を超えた。
(Conventional example 1)
Plating treatment was performed under the same conditions as in Example 1 except that two shielding plates made of rectangular plate members having a width W = 50 to 100 mm, a length L = 500 mm × 10 and a thickness of 3 mm were used as the shielding plate. As a result, as shown in FIG. 4, the plating thickness distribution is such that the plating thickness of the portion hidden by the shielding plate is reduced and the current concentrates on the edge of the shielding plate, so that a portion with a thick plating thickness is generated locally, The variation of the plating thickness was about 15%, exceeding the target of 10%.
(従来例2)
遮蔽板として、幅W=50〜100mm、長さL=500mm×10本、厚さ3mmの長方形の板状部材からなる遮蔽板を6枚用いた以外は、実施例1と同じ条件でめっき処理を行った。その結果を図5に示す。この従来例2では、前記従来例1において2枚の遮蔽板に起因して局所的にめっき厚が厚くなった箇所に順次新たな遮蔽板を設置しめっき厚分布の均一化処理を施した。その結果、この従来例2においても図5に示すようにめっき厚はほぼ12%のバラツキとなり、目標である10%以下に到達しなかった。さらに遮蔽板を多く設置したため電圧が1.5V程度上昇してしまった。
(Conventional example 2)
Plating treatment was performed under the same conditions as in Example 1 except that six shielding plates made of rectangular plate members having a width W = 50 to 100 mm, a length L = 500 mm × 10 and a thickness of 3 mm were used as the shielding plates. Went. The result is shown in FIG. In Conventional Example 2, a new shielding plate was sequentially installed at locations where the plating thickness locally increased due to the two shielding plates in Conventional Example 1, and the plating thickness distribution was uniformized. As a result, also in this conventional example 2, as shown in FIG. 5, the plating thickness varied by about 12%, and did not reach the target of 10% or less. Furthermore, since many shielding plates were installed, the voltage rose about 1.5V.
本発明に係る金属被覆樹脂基板のめっき装置は、樹脂基板のめっき厚分布を均一にするために用いる遮蔽板を、当該板状部材の上辺及び下辺が先端側から後端側へ向けて、前記樹脂基板の上辺及び下辺に対して一定の傾斜角度でテーパー状に縮幅する形状を有する板状部材で構成することにより、遮蔽板端部における電流集中が解消され、少ない遮蔽板数で電圧上昇を伴わずにめっき厚分布をより均一化することができる結果、めっき厚のバラツキの小さい高品質の2層めっき基板を低コストで製造することが可能となり、配線ピッチの狭小化にも十分に対応することができ、特にエレクトロニクス分野における配線材料の品質の向上と低コスト化に大きく寄与する。 In the plating apparatus for metal-coated resin substrates according to the present invention, the shielding plate used to make the plating thickness distribution of the resin substrate uniform is arranged such that the upper side and the lower side of the plate-shaped member are directed from the front end side to the rear end side. Consists of a plate-like member with a taper shape with a fixed inclination angle with respect to the upper and lower sides of the resin substrate, eliminating current concentration at the edge of the shielding plate and increasing the voltage with a small number of shielding plates As a result, the plating thickness distribution can be made more uniform without the need for high-quality two-layer plating substrates with small plating thickness variations, which can be produced at low cost, and the wiring pitch can be narrowed sufficiently. In particular, it greatly contributes to improving the quality and cost of wiring materials in the electronics field.
1 めっき槽
2 電極(アノード:陽極)
3 めっき液噴流ノズル
4 樹脂基板
4a 被めっき面
5 ワーク保持板
6、16 遮蔽板
7 クランパー
8 搬送レール
1 Plating tank 2 Electrode (Anode: Anode)
3 Plating solution jet nozzle 4 Resin substrate 4a Surface to be plated 5 Work holding plate 6, 16 Shield plate 7 Clamper 8 Transport rail
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JPS5976566U (en) * | 1982-11-16 | 1984-05-24 | 三菱電機株式会社 | Strip continuous electroplating equipment |
JPS60245799A (en) * | 1984-05-18 | 1985-12-05 | Sumitomo Metal Ind Ltd | Method for controlling amount of plating deposited |
JPS6286193A (en) * | 1985-10-12 | 1987-04-20 | Nippon Kokan Kk <Nkk> | Edge masking device for electroplating |
JPS6288757U (en) * | 1985-11-22 | 1987-06-06 | ||
JPH06280091A (en) * | 1993-03-26 | 1994-10-04 | Fuji Photo Film Co Ltd | Continuous electrolitic processing device |
JPH1161495A (en) * | 1997-08-21 | 1999-03-05 | Marunaka Kogyo Kk | Electric plating treatment system which enables uniform plating treatment |
JP2003119589A (en) * | 2001-10-15 | 2003-04-23 | Marunaka Kogyo Kk | Plating equipment of in-liquid transportation type with pipe for spouting plating liquid |
JP2004346391A (en) * | 2003-05-23 | 2004-12-09 | Kemitoron:Kk | Plating apparatus |
JP2010031316A (en) * | 2008-07-28 | 2010-02-12 | Sumitomo Metal Mining Co Ltd | Method for manufacturing metal-coated resin substrate, plating apparatus, and plating method |
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JPS5976566U (en) * | 1982-11-16 | 1984-05-24 | 三菱電機株式会社 | Strip continuous electroplating equipment |
JPS60245799A (en) * | 1984-05-18 | 1985-12-05 | Sumitomo Metal Ind Ltd | Method for controlling amount of plating deposited |
JPS6286193A (en) * | 1985-10-12 | 1987-04-20 | Nippon Kokan Kk <Nkk> | Edge masking device for electroplating |
JPS6288757U (en) * | 1985-11-22 | 1987-06-06 | ||
JPH06280091A (en) * | 1993-03-26 | 1994-10-04 | Fuji Photo Film Co Ltd | Continuous electrolitic processing device |
JPH1161495A (en) * | 1997-08-21 | 1999-03-05 | Marunaka Kogyo Kk | Electric plating treatment system which enables uniform plating treatment |
JP2003119589A (en) * | 2001-10-15 | 2003-04-23 | Marunaka Kogyo Kk | Plating equipment of in-liquid transportation type with pipe for spouting plating liquid |
JP2004346391A (en) * | 2003-05-23 | 2004-12-09 | Kemitoron:Kk | Plating apparatus |
JP2010031316A (en) * | 2008-07-28 | 2010-02-12 | Sumitomo Metal Mining Co Ltd | Method for manufacturing metal-coated resin substrate, plating apparatus, and plating method |
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