JP2012148354A - Method of manufacturing fixed abrasive grain wire - Google Patents

Method of manufacturing fixed abrasive grain wire Download PDF

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JP2012148354A
JP2012148354A JP2011006852A JP2011006852A JP2012148354A JP 2012148354 A JP2012148354 A JP 2012148354A JP 2011006852 A JP2011006852 A JP 2011006852A JP 2011006852 A JP2011006852 A JP 2011006852A JP 2012148354 A JP2012148354 A JP 2012148354A
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pulse voltage
abrasive
wire body
wire
plating
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JP5665558B2 (en
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Shigenobu Tsubokura
重信 坪倉
Atsushi Uchiyama
敦司 内山
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Suncall Corp
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Abstract

PROBLEM TO BE SOLVED: To provide a method of manufacturing a fixed abrasive grain wire, while improving bonding strength between an abrasive grain and a wire body as well as machining and cutting performances using the abrasive grain, without adding a leveling agent in plating solution.SOLUTION: In the plating solution, an electrode member and the wire body are arranged opposite to each other. Application of reverse pulse voltage is repeated by applying a positive electrolytic pulse voltage so that the electrode member is an anode and the wire body is a cathode, and applying a reversed electrolytic pulse voltage so that the electrode member is a cathode and the wire body is an anode thereafter, as one cycle, to electro-deposit a plating layer including an abrasive grain group to the wire body, while exposing apexes of at least some of the abrasive grains of the abrasive grain group.

Description

本発明は、電解メッキによって砥粒をワイヤに固着させる固定砥粒ワイヤの製造方法に関する。   The present invention relates to a method for manufacturing a fixed abrasive wire in which abrasive grains are fixed to a wire by electrolytic plating.

シリコンやセラミック等の硬質材料の切断等に用いられる固定砥粒ワイヤの製造方法として、ワイヤ本体の表面に電解メッキによって砥粒を固着させる方法が提案されている(例えば下記特許文献1参照)。   As a method for manufacturing a fixed abrasive wire used for cutting hard materials such as silicon and ceramic, a method has been proposed in which abrasive particles are fixed to the surface of a wire body by electrolytic plating (see, for example, Patent Document 1 below).

詳しくは、前記特許文献1には、砥粒を含有するメッキ液が収容されたメッキ槽内において電極板及びワイヤ本体を対向配置させる工程と、前記電極板が陽極となり且つ前記ワイヤ本体が陰極となるように電圧を印可させて、前記ワイヤ本体の表面に前記砥粒を含んだ状態のメッキ層を析出させる工程とを含む固定砥粒ワイヤの製造方法において、前記メッキ液中にレベリング剤を含有させることが開示されている。   Specifically, in Patent Document 1, the electrode plate and the wire body face each other in a plating tank containing a plating solution containing abrasive grains, the electrode plate serves as an anode, and the wire body serves as a cathode. And applying a voltage so as to deposit a plating layer containing the abrasive grains on the surface of the wire body, and including a leveling agent in the plating solution. Is disclosed.

前記特許文献1に記載の製造方法は、砥粒を含有するメッキ液にレベリング剤を含めることにより、砥粒の固着強度を向上させつつ砥粒による切削性能又は切断性能を向上させ得る固定砥粒ワイヤを製造できるとされている。   The manufacturing method described in Patent Document 1 includes a fixed abrasive that can improve the cutting performance or cutting performance of the abrasive while improving the fixing strength of the abrasive by including a leveling agent in the plating solution containing the abrasive. It is said that wires can be manufactured.

即ち、前記メッキ液中の前記レベリング剤は、陽極として作用する前記電極板に近接する部分、即ち、前記砥粒の頂点近傍に優先的に吸着される。その結果、前記砥粒の頂点近傍におけるメッキ層の成長速度が前記砥粒のうち前記電極板から離間された基端側部分(前記砥粒のうち前記ワイヤ本体に近接する部分)におけるメッキ層の成長速度よりも遅くなる。従って、前記砥粒の基端側部分に比較的厚く析出されるメッキ層によって前記砥粒の固着強度を向上させつつ前記砥粒の頂点近傍のメッキ層を薄くして前記砥粒による切削性能又は切断性能を向上させ得るとされている。   That is, the leveling agent in the plating solution is preferentially adsorbed on a portion adjacent to the electrode plate that acts as an anode, that is, near the apex of the abrasive grains. As a result, the growth rate of the plating layer in the vicinity of the apex of the abrasive grains is that of the plating layer in the base end side portion (the portion of the abrasive grains close to the wire body) that is separated from the electrode plate. Slower than the growth rate. Accordingly, the plating layer deposited relatively thick on the base end side portion of the abrasive grains improves the adhesive strength of the abrasive grains while thinning the plating layer near the apex of the abrasive grains, or the cutting performance by the abrasive grains or It is said that cutting performance can be improved.

しかしながら、前記メッキ液中に前記レベリング剤を加えることで前記砥粒の頂点近傍に析出されるメッキ層の層厚を薄くできる反面、前記砥粒の頂点近傍には前記レベリング剤が吸着されることになるからこのレベリング剤によって前記砥粒による切削性能又は切断性能が悪化するという問題が生じ得る。   However, by adding the leveling agent to the plating solution, the thickness of the plating layer deposited near the top of the abrasive grains can be reduced, but the leveling agent is adsorbed near the top of the abrasive grains. Therefore, this leveling agent may cause a problem that the cutting performance or cutting performance by the abrasive grains deteriorates.

又、前記特許文献1にも記載されているように、前記レベリング剤は、種類によって機能に差異が存在する。従って、ある特定の大きさ及び形状の砥粒に対して適切なレベリング効果を奏するレベリング剤であっても、これとは異なる大きさ及び形状の砥粒に対して有効にレベリング効果を奏するとは限らない。   In addition, as described in Patent Document 1, the leveling agent has a difference in function depending on the type. Therefore, even with a leveling agent that exhibits an appropriate leveling effect on abrasive grains of a specific size and shape, the leveling effect is effective on abrasive grains of a different size and shape. Not exclusively.

前記メッキ液中に含有される砥粒群は、それぞれ、固有の大きさ及び形状を有する複数の砥粒を含んでいる。従って、この砥粒群に対してレベリング剤によって効果的なレベリング効果を得ることは困難である。   The abrasive grain group contained in the plating solution includes a plurality of abrasive grains each having a specific size and shape. Therefore, it is difficult to obtain an effective leveling effect with the leveling agent for this abrasive grain group.

特許第4538049号公報Japanese Patent No. 4538049

本発明は、前記従来技術に鑑みなされたものであり、砥粒群を含有するメッキ液を用いた電解メッキによって砥粒がワイヤ本体に固着されてなる固定砥粒ワイヤを製造する方法であって、前記メッキ液中にレベリング剤を添加することなく、前記砥粒の前記ワイヤ本体への固着強度の向上及び前記砥粒による切削性能又は切断性能の向上を同時に図り得る固定砥粒ワイヤの製造方法の提供を、目的とする。   The present invention has been made in view of the above prior art, and is a method for producing a fixed abrasive wire in which abrasive grains are fixed to a wire body by electrolytic plating using a plating solution containing abrasive grains. A method for producing a fixed-abrasive wire capable of simultaneously improving the fixing strength of the abrasive grains to the wire body and improving the cutting performance or cutting performance of the abrasive grains without adding a leveling agent to the plating solution The purpose is to provide

本発明は、前記目的を達成する為に、砥粒群を含むメッキ液を用いてワイヤ本体にメッキ層を電着させることで前記ワイヤ本体に砥粒が固着されてなる固定砥流ワイヤを製造する方法であって、前記メッキ液中において電極部材及び前記ワイヤ本体を対向配置させた状態で前記電極部材が陽極となり且つ前記ワイヤ本体が陰極となるような正電解パルス電圧を印可し、その後に、前記電極部材が陰極となり且つ前記ワイヤ本体が陽極となるような逆電解パルス電圧を印可する処理を一周期とする反転パルス電圧の印可を繰り返すことで、前記砥粒群の少なくとも一部の砥粒の頂部が露出した状態で前記砥粒群を含む前記メッキ層を前記ワイヤ本体に電着させる固定砥粒ワイヤの製造方法を提供する。   In order to achieve the above object, the present invention produces a fixed abrasive flow wire in which abrasive particles are fixed to the wire body by electrodepositing a plating layer on the wire body using a plating solution containing a group of abrasive grains. A positive electrolysis pulse voltage is applied so that the electrode member serves as an anode and the wire body serves as a cathode with the electrode member and the wire body facing each other in the plating solution; By repeating the application of the reverse pulse voltage with one cycle of applying the reverse electrolysis pulse voltage so that the electrode member serves as a cathode and the wire body serves as an anode, at least a part of the abrasive grains in the abrasive grain group is applied. Provided is a method for producing a fixed abrasive wire in which the plating layer including the abrasive grain group is electrodeposited on the wire body in a state where the top of the grain is exposed.

好ましくは、前記正電解パルス電圧の電位差をV(N)とした場合に、前記逆電解パルス電圧の電位差V(R)はV(R)=2〜8×V(N)とされ、前記反転パルス電圧の周期をTとした場合に、前記正電解パルス電圧のパルス幅T(N)はT(N)=0.7〜0.9×Tで且つ前記逆電解パルス電圧のパルス幅T(R)はT(R)=0.05〜0.2×Tとされる。   Preferably, when the potential difference of the positive electrolysis pulse voltage is V (N), the potential difference V (R) of the reverse electrolysis pulse voltage is V (R) = 2 to 8 × V (N), and the inversion When the period of the pulse voltage is T, the pulse width T (N) of the positive electrolysis pulse voltage is T (N) = 0.7 to 0.9 × T and the pulse width T ( R) is T (R) = 0.05 to 0.2 × T.

好ましくは、前記反転パルス電圧の周波数は10Hz〜3KHzとされる。   Preferably, the frequency of the inversion pulse voltage is 10 Hz to 3 KHz.

前記種々の形態において、前記砥粒は、前記メッキ液に包含されている段階においては前記メッキ液に包含されている金属の一部又は全部と同一金属によってコーティングされているものとされる。   In the various embodiments, the abrasive grains are coated with the same metal as a part or all of the metals contained in the plating solution at the stage of being contained in the plating solution.

本発明に係る固定砥粒ワイヤの製造方法によれば、砥粒群を含むメッキ液中においてワイヤ本体と対向配置された電極部材が陽極となり且つ前記ワイヤ本体が陰極となるような正電解パルス電圧を印可し、その後に、前記電極部材が陰極となり且つ前記ワイヤ本体が陽極となるような逆電解パルス電圧を印可する処理を一周期とする反転パルス電圧の印可を繰り返すことで、前記砥粒群の少なくとも一部の砥粒の頂部が露出した状態で前記砥粒群を含むメッキ層を前記ワイヤ本体に電着させるように構成したので、前記砥粒の前記ワイヤ本体への固着強度の向上を図りつつ、前記砥粒による切削性能又は切断性能の向上を図ることができる。   According to the method for producing a fixed abrasive wire according to the present invention, a positive electrolysis pulse voltage in which an electrode member disposed opposite to a wire body in a plating solution including an abrasive grain group serves as an anode and the wire body serves as a cathode. And then applying the reversal pulse voltage with one cycle of applying a reverse electrolysis pulse voltage such that the electrode member becomes a cathode and the wire body becomes an anode. Since the plating layer including the abrasive grain group is electrodeposited on the wire body in a state where the tops of at least some of the abrasive grains are exposed, the strength of fixing the abrasive grains to the wire body can be improved. The cutting performance or cutting performance by the abrasive grains can be improved while being planned.

特に、前記メッキ液中にレベリング剤を添加すること無く前記効果を得ることができるので、前記レベリング剤に起因する砥粒の切削性能又は切断性能の悪化を招くことが無く、さらに、種々の粒径及び形状の砥粒を含む砥粒群に対して有効に前記効果を奏することができる。
又、ドレッシング処理又は研磨処理によって前記砥粒群の少なくとも一部の砥粒を露出させる場合に比して、砥粒の脱落を有効に防止しつつより多くの砥粒を前記メッキ層から露出させることができる。
In particular, since the effect can be obtained without adding a leveling agent to the plating solution, the cutting performance or cutting performance of abrasive grains caused by the leveling agent is not deteriorated, and various grains The said effect can be effectively show | played with respect to the abrasive grain group containing an abrasive grain of a diameter and a shape.
In addition, more abrasive grains are exposed from the plated layer while effectively preventing the abrasive grains from dropping than when at least a part of the abrasive grains of the abrasive grains group is exposed by dressing treatment or polishing treatment. be able to.

図1は、本発明の一実施の形態に係る固定砥粒ワイヤの製造方法に用いられるメッキ槽の模式図である。FIG. 1 is a schematic view of a plating tank used in a method for manufacturing a fixed abrasive wire according to an embodiment of the present invention. 図2(a)は、従来のメッキ処理によって製造された固定砥粒ワイヤの部分模式断面図である。 図2(b)は、本発明の一実施の形態に係る固定砥粒ワイヤの製造方法によって製造された固定砥粒ワイヤの部分模式断面図である。FIG. 2 (a) is a partial schematic cross-sectional view of a fixed abrasive wire manufactured by a conventional plating process. FIG. 2B is a partial schematic cross-sectional view of a fixed abrasive wire manufactured by the method for manufacturing a fixed abrasive wire according to an embodiment of the present invention. 図3は、本発明の一実施の形態に係る固定砥粒ワイヤの製造方法において使用される砥粒群の一例の粒径分布図である。FIG. 3 is a particle size distribution diagram of an example of an abrasive grain group used in the method of manufacturing a fixed abrasive wire according to an embodiment of the present invention. 図4は、本発明の一実施の形態に係る固定砥粒ワイヤの製造方法における工程模式図である。FIG. 4 is a process schematic diagram in the method of manufacturing a fixed abrasive wire according to one embodiment of the present invention. 図5は、本発明の一実施の形態に係る固定砥粒ワイヤの製造方法におけるメッキ工程で用いられる反転パルス電圧の波形図である。FIG. 5 is a waveform diagram of the inversion pulse voltage used in the plating step in the method of manufacturing the fixed abrasive wire according to the embodiment of the present invention.

以下、本発明に係る固定砥粒ワイヤの製造方法の好ましい実施の形態について、添付図面を参照しつつ説明する。   Hereinafter, preferred embodiments of a method for producing a fixed abrasive wire according to the present invention will be described with reference to the accompanying drawings.

前記固定砥粒ワイヤは、ダイヤモンド等の砥粒が銅メッキされた炭素鋼等のワイヤ本体に固着されてなるものであり、シリコンやセラミック等の硬質材料の切断又は切削に好適に使用される。
本実施の形態に係る固定砥粒ワイヤの製造方法は、砥粒群を含むメッキ液からなるメッキ層をワイヤ本体に電着させることで前記砥粒群を前記ワイヤ本体に固着させるものである。
The fixed abrasive wire is fixed to a wire body such as carbon steel coated with copper such as diamond and is suitably used for cutting or cutting a hard material such as silicon or ceramic.
In the method for manufacturing a fixed abrasive wire according to the present embodiment, the abrasive grains are fixed to the wire body by electrodepositing a plating layer made of a plating solution containing the abrasive grains on the wire body.

図1に、本実施の形態に係る製造方法に用いられるメッキ装置の模式図を示す。
前記製造方法は、図1に示すように、砥粒群が含有されたメッキ液10中において電極部材20及びワイヤ本体5を対向配置させた状態で前記電極部材20が陽極となり且つ前記ワイヤ本体5が陰極となるような正電解パルス電圧を印可し、その後に、前記電極部材20が陰極となり且つ前記ワイヤ本体5が陽極となるような逆電解パルス電圧を印可する処理を一周期とする反転パルス電圧の印可を繰り返すことによって、前記砥粒群を形成する砥粒15(下記図2(b)参照)を含んだ状態でメッキ層11(下記図2(b)参照)を前記ワイヤ本体5の表面に析出させるように構成されている。
なお、図1中の符号30は、前記メッキ液10を収容した状態で前記電極部材20及び前記ワイヤ本体5が対向配置されるメッキ槽である。
又、符号35はメッキ液10のリザーブタンクであり、ポンプ40を介して前記メッキ槽30及び前記リザーブタンク35の間で前記メッキ液10が循環されるようになっている。
In FIG. 1, the schematic diagram of the plating apparatus used for the manufacturing method which concerns on this Embodiment is shown.
As shown in FIG. 1, in the manufacturing method, the electrode member 20 becomes an anode and the wire body 5 is in a state where the electrode member 20 and the wire body 5 are opposed to each other in a plating solution 10 containing abrasive grains. Is applied with a positive electrolysis pulse voltage so that the electrode member 20 becomes a cathode, and then a reverse pulse with a process of applying a reverse electrolysis pulse voltage so that the electrode member 20 becomes a cathode and the wire body 5 becomes an anode. By repeatedly applying the voltage, the plating layer 11 (see FIG. 2B) is applied to the wire body 5 in a state including the abrasive grains 15 (see FIG. 2B below) forming the abrasive grain group. It is comprised so that it may precipitate on the surface.
In addition, the code | symbol 30 in FIG. 1 is a plating tank by which the said electrode member 20 and the said wire main body 5 are opposingly arranged in the state which accommodated the said plating solution 10. As shown in FIG.
Reference numeral 35 denotes a reserve tank for the plating solution 10, and the plating solution 10 is circulated between the plating tank 30 and the reserve tank 35 via a pump 40.

このように、本実施の形態に係る製造方法によれば、反転パルス電圧の印可を繰り返すことで前記砥粒15を含む前記メッキ層11を前記ワイヤ本体5の表面に析出させており、従って、前記砥粒15の前記ワイヤ本体5への固着強度を向上させつつ、前記砥粒15による切削性能又は切断性能を向上させることができる。
この点に関し、詳述する。
Thus, according to the manufacturing method according to the present embodiment, the plating layer 11 containing the abrasive grains 15 is deposited on the surface of the wire body 5 by repeatedly applying a reverse pulse voltage. The cutting performance or cutting performance of the abrasive grains 15 can be improved while improving the adhesion strength of the abrasive grains 15 to the wire body 5.
This point will be described in detail.

通常のメッキ処理においては、前記電極部材20が必ず陽極となり且つ前記ワイヤ本体5が必ず陰極となるように電圧を印可して、前記ワイヤ本体5の表面にメッキ層11を析出させる。
この場合、前記メッキ層11の析出速度は、陽極として作用する前記電極部材20に近い領域ほど速くなる。
In a normal plating process, a voltage is applied so that the electrode member 20 is necessarily an anode and the wire body 5 is necessarily a cathode, and the plating layer 11 is deposited on the surface of the wire body 5.
In this case, the deposition rate of the plating layer 11 becomes faster in the region closer to the electrode member 20 acting as the anode.

従って、前記砥粒15の前記ワイヤ本体5への固着強度を十分に得るような層厚のメッキ層を形成すると、図2(a)に示すように、前記砥粒群における各砥粒15の頂上部分のメッキ層11の層厚が厚くなる。
前記固定砥粒ワイヤにおける切削作用又は切断作用は前記複数の砥粒15によって奏される為、前記複数の砥粒15の頂上部分に層厚の前記メッキ層11が積層されていると、前記砥粒15による切削能力又は切断能力が悪化する。
Therefore, when a plating layer having a layer thickness sufficient to obtain a sufficient bonding strength of the abrasive grains 15 to the wire body 5 is formed, as shown in FIG. The layer thickness of the plating layer 11 at the top portion is increased.
Since the cutting action or the cutting action in the fixed abrasive wire is performed by the plurality of abrasive grains 15, when the plating layer 11 having a layer thickness is laminated on the top portion of the plurality of abrasive grains 15, the abrasive The cutting ability or cutting ability by the grains 15 deteriorates.

これに対し、本実施の形態に係る前記製造方法においては、反転パルス電圧の印可を繰り返すことで、前記砥粒15を含んだ前記メッキ層11を前記ワイヤ本体5の表面に析出させている。
ここで、前記反転パルス電圧は、前述の通り、前記電極部材20が陽極となり且つ前記ワイヤ本体5が陰極となるような正電解パルス電圧と、前記電極部材20が陰極となり且つ前記ワイヤ本体5が陽極となるような逆電解パルス電圧とを含んでいる。
On the other hand, in the manufacturing method according to the present embodiment, the plating layer 11 including the abrasive grains 15 is deposited on the surface of the wire body 5 by repeatedly applying an inversion pulse voltage.
Here, as described above, the inversion pulse voltage includes a positive electrolysis pulse voltage in which the electrode member 20 serves as an anode and the wire body 5 serves as a cathode, and the electrode member 20 serves as a cathode and the wire body 5 serves as a cathode. And a reverse electrolysis pulse voltage that serves as an anode.

即ち、正電解パルス電圧の印可によって前記ワイヤ本体5に表面に前記砥粒15を含む前記メッキ層11を析出させる一方で、前記逆電解パルス電圧の印可によって前記メッキ層11の剥離を行うようになっている。この際、前記メッキ層11のうち前記電極部材20に近接する部分、即ち、前記複数の砥粒15の頂上部分に積層された部分が優先的に剥離される。
従って、図2(b)に示すように、前記砥粒群を形成する複数の砥粒15の基端側部分は前記メッキ層11によって前記ワイヤ本体5に強固に固着されつつ、前記砥粒群における少なくとも一部の砥粒15の頂上部分を露出させて前記砥粒15による切削能力又は切断能力を向上させることができる。
That is, the plating layer 11 including the abrasive grains 15 is deposited on the surface of the wire body 5 by applying a positive electrolysis pulse voltage, while the plating layer 11 is peeled off by applying the reverse electrolysis pulse voltage. It has become. At this time, a portion of the plated layer 11 that is close to the electrode member 20, that is, a portion that is stacked on the top portions of the plurality of abrasive grains 15 is peeled off preferentially.
Accordingly, as shown in FIG. 2 (b), the base end side portions of the plurality of abrasive grains 15 forming the abrasive grain group are firmly fixed to the wire body 5 by the plating layer 11, while the abrasive grain group is It is possible to improve the cutting ability or cutting ability of the abrasive grains 15 by exposing at least the top portions of the abrasive grains 15.

特に、本実施の形態においては、前述の通り、逆電解パルス電圧の印可によって前記砥粒群のうちの少なくとも一部の砥粒15の頂上部分のメッキ層11を剥離させており、前記メッキ液10中にレベリング剤を添加する必要がない。
従って、前記レベリング剤が前記砥粒15に付着することに起因する切削能力又は切断能力の低下を招くことがない。
In particular, in the present embodiment, as described above, the plating layer 11 at the top of at least some of the abrasive grains 15 in the abrasive grain group is peeled off by applying a reverse electrolysis pulse voltage, and the plating solution There is no need to add a leveling agent in 10.
Therefore, the cutting ability or cutting ability due to the leveling agent adhering to the abrasive grains 15 is not reduced.

さらに、前記レベリング剤は、種類によって機能に差異が存在する。つまり、ある特定の大きさ及び形状の砥粒に対して適切なレベリング効果を得る為には、それ専用のレベリング剤を用いる必要がある。
しかしながら、前記メッキ液中に含有される砥粒群は、それぞれ固有の大きさ及び形状を有する複数の砥粒15を含んでいる。従って、ある特定のレベリング剤によって、異なる大きさ及び形状の複数の砥粒15を含む砥粒群に対して有効にレベリング効果を得ることは困難である。
Furthermore, the leveling agent has a difference in function depending on the type. That is, in order to obtain an appropriate leveling effect with respect to an abrasive having a specific size and shape, it is necessary to use a dedicated leveling agent.
However, the abrasive grain group contained in the plating solution includes a plurality of abrasive grains 15 each having a specific size and shape. Therefore, it is difficult to effectively obtain a leveling effect for an abrasive grain group including a plurality of abrasive grains 15 having different sizes and shapes with a specific leveling agent.

これに対し、本実施の形態においては、前述の通り、逆電解パルス電圧の印可によって前記砥粒群のうちの少なくとも一部の砥粒15の頂上部分のメッキ層11を剥離させている。従って、大きさ及び形状の異なる複数の砥粒15の固着強度を向上させつつ、これらによる切削性能の向上を有効に図ることができる。   On the other hand, in the present embodiment, as described above, the plating layer 11 at the top of at least some of the abrasive grains 15 in the abrasive grain group is peeled off by applying a reverse electrolysis pulse voltage. Therefore, it is possible to effectively improve the cutting performance by improving the fixing strength of the plurality of abrasive grains 15 having different sizes and shapes.

又、通常のメッキ処理によって砥粒群を含むメッキ層をワイヤ本体の表面に析出させた後に、ドレッシング処理又は研磨処理によって前記砥粒群の少なくとも一部を露出させることも可能であるが、この方法では、前記砥粒群における20%程度の砥粒しか露出させることができない。   In addition, it is possible to expose at least a part of the abrasive grain group by dressing treatment or polishing process after depositing a plating layer containing the abrasive grain group on the surface of the wire body by a normal plating process. In the method, only about 20% of the abrasive grains in the group of abrasive grains can be exposed.

この点に関し、前記砥粒群として、レーザー回析散乱法による平均粒子径15μmのダイヤモンド粒子群を用いる場合を例に説明する。
図3に、前記ダイヤモンド粒子群の粒径分布図を示す。
In this regard, a case where a diamond particle group having an average particle diameter of 15 μm by a laser diffraction scattering method is used as the abrasive grain group will be described as an example.
FIG. 3 shows a particle size distribution diagram of the diamond particle group.

図3に示すように、平均粒子径15μmのダイヤモンド粒子群は、粒子径15μmのダイヤモンド粒子を最も多く含むものの、粒子径10μm以下の粒子から粒子径20μm以上の粒子を含んでいる。   As shown in FIG. 3, the diamond particle group having an average particle diameter of 15 μm contains the largest number of diamond particles having a particle diameter of 15 μm, but includes particles having a particle diameter of 10 μm or less to particles having a particle diameter of 20 μm or more.

このような種々の粒子径の粒子を含むダイヤモンド粒子群に対して例えば粒子径15μmの粒子が露出する程度に研磨処理を行ったとすると、粒子径が15μmより大きな粒子にとっては過研磨状態となる。   If a polishing process is performed to such a degree that, for example, particles having a particle diameter of 15 μm are exposed to a group of diamond particles including particles having such various particle diameters, particles having a particle diameter larger than 15 μm are over-polished.

つまり、研磨処理によってダイヤモンド粒子を露出させる場合には、比較的粒子径の大きな粒子が脱落しないように研磨量を設定する必要があり、例えば、粒子群全体の約20%に相当する粒子径17.5μm以上のダイヤモンド粒子しか露出させることができないことになる。   That is, when diamond particles are exposed by polishing, it is necessary to set the polishing amount so that particles having a relatively large particle size do not fall off. For example, a particle size of 17 corresponding to about 20% of the entire particle group. Only diamond particles of 5 μm or more can be exposed.

これに対し、本実施の形態においては、逆電解パルス電圧の印可によってダイヤモンド粒子の頂上部分のメッキ層を優先的に剥離させるので、ダイヤモンド粒子群のワイヤ本体への固着強度を十分に維持しつつ、平均粒子径15μmのダイヤモンド粒子群のうちの半分以上の粒子、例えば、粒子径約13μm以上のダイヤモンド粒子を露出させることができる。これは粒子群全体の約70%に相当する。   In contrast, in the present embodiment, the plating layer at the top of the diamond particles is preferentially peeled off by applying a reverse electrolysis pulse voltage, so that the adhesion strength of the diamond particles to the wire body is sufficiently maintained. More than half of the diamond particle group having an average particle diameter of 15 μm, for example, diamond particles having a particle diameter of about 13 μm or more can be exposed. This corresponds to about 70% of the entire particle group.

ここで、本実施の形態に係る製造方法の具体的な工程について説明する。
図4に、前記製造方法における工程模式図を示す。
Here, specific steps of the manufacturing method according to the present embodiment will be described.
In FIG. 4, the process schematic diagram in the said manufacturing method is shown.

図4に示すように、サプライ機100から供給される長尺のワイヤ本体は下記各処理槽を通過して巻取り機200によって巻き取られる。
前記ワイヤ本体は、例えば、銅メッキされた炭素鋼とされ、直径は0.1〜0.3mmとされる。
As shown in FIG. 4, the long wire main body supplied from the supply machine 100 passes through the following treatment tanks and is wound up by the winder 200.
The wire body is, for example, copper-plated carbon steel and has a diameter of 0.1 to 0.3 mm.

前記製造方法は、前述の通り、反転パルス電圧の印可を繰り返すことで前記ワイヤ本体5に複数の砥粒15を含むメッキ層11を析出させるパルスメッキ工程を含むが、このパルスメッキ工程に先だって、好ましくは、前処理工程を含むことができる。   As described above, the manufacturing method includes a pulse plating step of depositing a plating layer 11 including a plurality of abrasive grains 15 on the wire body 5 by repeatedly applying a reverse pulse voltage. Prior to the pulse plating step, Preferably, a pretreatment step can be included.

前記前処理工程には、図4に示すように、脱脂槽110を用いた脱脂工程及び水洗槽120を用いた水洗工程が含まれる。
又、前記ワイヤ本体5が予めメッキ等によってコーティングされている場合には、前記前処理工程には、さらに、コーティング剥離槽130を用いたコーティング剥離工程が含まれる。
As shown in FIG. 4, the pretreatment process includes a degreasing process using a degreasing tank 110 and a water washing process using a water washing tank 120.
When the wire body 5 is previously coated by plating or the like, the pretreatment process further includes a coating peeling process using a coating peeling tank 130.

さらに、前記前処理工程は、ストライクメッキ槽140におけるストライクメッキ工程を含むことができる。
前記ストライクメッキ工程は、前記メッキ層11の析出に先立って前記ワイヤ本体5の表面に薄いメッキ層を形成するものであり、この薄いメッキ層によって前記砥粒15を含む前記メッキ層11の前記ワイヤ本体への密着性を向上させることができる。
Further, the pretreatment process may include a strike plating process in the strike plating tank 140.
In the strike plating step, a thin plating layer is formed on the surface of the wire body 5 prior to the deposition of the plating layer 11, and the wire of the plating layer 11 including the abrasive grains 15 is formed by the thin plating layer. Adhesion to the main body can be improved.

前記パルスメッキ工程は、前述の通り、前記砥粒群を含む前記メッキ液10中で前記電極部材20及び前記ワイヤ本体5を対向配置させた状態で、前記正電解パルス電圧の印可及び前記逆電解パルス電圧の印可を一周期とする反転パルス電圧の印可を繰り返すように構成されている。   As described above, in the pulse plating step, the application of the positive electrolysis pulse voltage and the reverse electrolysis are performed in a state where the electrode member 20 and the wire body 5 are arranged to face each other in the plating solution 10 including the abrasive grain group. The inversion pulse voltage is applied repeatedly with the application of the pulse voltage as one cycle.

前記砥粒15としては、例えば、ダイヤモンド粒子を用いることができ、前記メッキ液10には、例えば、スルファミン酸ニッケルを用いることができる。
又、前記電極部材20にはニッケルを用いることができる。
For example, diamond particles can be used as the abrasive grains 15, and nickel sulfamate can be used as the plating solution 10, for example.
The electrode member 20 can be made of nickel.

好ましくは、前記砥粒群の砥粒15は、前記メッキ液10に包含されている段階においては前記メッキ液10に含まれる金属の一部又は全部と同一金属によってコーティングされているものとされる。
斯かる構成によれば、前記砥粒15と前記メッキ層11との固着強度を向上させることができる。
Preferably, the abrasive grains 15 of the group of abrasive grains are coated with the same metal as a part or all of the metals contained in the plating solution 10 when included in the plating solution 10. .
According to such a configuration, the fixing strength between the abrasive grains 15 and the plating layer 11 can be improved.

図5に前記反転パルス電圧の波形図を示す。
図5に示すように、好ましくは、正電解パルス電圧の電位差をV(N)とした場合に、逆電解パルス電圧の電位差V(R)はV(R)=2〜8×V(N)とされ、反転パルス電圧の周期をTとした場合に、正電解パルス電圧のパルス幅T(N)はT(N)=0.7〜0.9×Tで且つ逆電解パルス電圧のパルス幅T(R)はT(R)=0.05〜0.2×Tとされる。
FIG. 5 shows a waveform diagram of the inversion pulse voltage.
As shown in FIG. 5, preferably, when the potential difference of the positive electrolysis pulse voltage is V (N), the potential difference V (R) of the reverse electrolysis pulse voltage is V (R) = 2 to 8 × V (N). When the period of the inversion pulse voltage is T, the pulse width T (N) of the positive electrolysis pulse voltage is T (N) = 0.7 to 0.9 × T and the pulse width of the reverse electrolysis pulse voltage T (R) is set to T (R) = 0.05 to 0.2 × T.

図示の形態においては、正電解パルス電圧のパルス幅T(N)はT(N)=0.8×Tとされ且つ逆電解パルス電圧のパルス幅T(R)はT(R)=0.1×Tとされており、正電解パルス電圧の印可及び逆電解パルス電圧の印可の間に0.1×Tのインターバルが設けられている。   In the illustrated form, the pulse width T (N) of the positive electrolysis pulse voltage is T (N) = 0.8 × T, and the pulse width T (R) of the reverse electrolysis pulse voltage is T (R) = 0. 1 × T, and an interval of 0.1 × T is provided between the application of the positive electrolysis pulse voltage and the application of the reverse electrolysis pulse voltage.

反転パルス電圧の周波数は、好ましくは、10Hz〜3KHzとされる。   The frequency of the inversion pulse voltage is preferably 10 Hz to 3 KHz.

図4に示すように、前記製造方法は、前記メッキ工程の後に、後処理を含むことができる。
前記後処理には、後メッキ槽150における後メッキ工程と、水洗槽160における水洗工程と、防錆槽170における防錆処理工程とが含まれる。
前記後メッキ工程は、前記砥粒15の固着強度を向上させる為の工程であり、前記メッキ液10が収容された前記後メッキ槽150内において前記電極部材20及び前記ワイヤ本体5を対向させた状態で、前記電極部材20が陽極となり且つ前記ワイヤ本体5が陰極となるように正電解電圧を印可することによってメッキ層を析出させるように構成される。
なお、前記パルスメッキ工程の後の状態においては、前記砥粒15の頂部が露出されている為(即ち、前記砥粒15の頂部のメッキ層11やコーティングは剥離されている為)、前記後メッキ工程によっては前記砥粒15の露出頂部にメッキ層は析出されない。
As shown in FIG. 4, the manufacturing method may include a post-treatment after the plating process.
The post-treatment includes a post-plating process in the post-plating tank 150, a water-washing process in the water-washing tank 160, and a rust-proofing process process in the rust-proofing tank 170.
The post-plating step is a step for improving the adhesion strength of the abrasive grains 15, and the electrode member 20 and the wire body 5 are opposed to each other in the post-plating tank 150 in which the plating solution 10 is accommodated. In this state, a plating layer is deposited by applying a positive electrolysis voltage so that the electrode member 20 becomes an anode and the wire body 5 becomes a cathode.
In the state after the pulse plating step, the top of the abrasive grains 15 is exposed (that is, the plating layer 11 and the coating on the top of the abrasive grains 15 are peeled off), and the post-plating process. Depending on the plating process, the plating layer is not deposited on the exposed tops of the abrasive grains 15.

又、本実施の形態においては、前記ストライクメッキ工程の後に、直ちに前記パルスメッキ工程が行われているが、本発明は斯かる形態に限定されるものではない。
例えば、前記パルスメッキ工程における正電解パルス電圧及び逆電解パルス電圧の電圧値やパルス幅の設定に応じて、前記ストライクメッキ工程及び前記パルスメッキ工程の間に正電解メッキ工程を含めることも可能である。
即ち、前記パルスメッキ工程の終了段階において前記砥粒群における少なくとも一部の砥粒15の頂部が露出されている限り、前記ストライクメッキ工程及び前記パルスメッキ工程の間に正電解メッキ工程を含めることも可能である。
In the present embodiment, the pulse plating process is performed immediately after the strike plating process, but the present invention is not limited to such a form.
For example, it is possible to include a positive electroplating step between the strike plating step and the pulse plating step according to the voltage value and pulse width setting of the positive electrolysis pulse voltage and the reverse electrolysis pulse voltage in the pulse plating step. is there.
That is, a positive electrolytic plating process is included between the strike plating process and the pulse plating process as long as the tops of at least some of the abrasive grains 15 in the abrasive grain group are exposed at the end of the pulse plating process. Is also possible.

5 ワイヤ本体
10 メッキ液
11 メッキ層
15 砥粒
20 電極部材
5 Wire body 10 Plating solution 11 Plating layer 15 Abrasive grain 20 Electrode member

Claims (4)

砥粒群を含むメッキ液を用いてワイヤ本体にメッキ層を電着させることで前記ワイヤ本体に砥粒が固着されてなる固定砥流ワイヤを製造する方法であって、
前記メッキ液中において電極部材及び前記ワイヤ本体を対向配置させた状態で前記電極部材が陽極となり且つ前記ワイヤ本体が陰極となるような正電解パルス電圧を印可し、その後に、前記電極部材が陰極となり且つ前記ワイヤ本体が陽極となるような逆電解パルス電圧を印可する処理を一周期とする反転パルス電圧の印可を繰り返すことで、前記砥粒群の少なくとも一部の砥粒の頂部が露出した状態で前記砥粒群を含む前記メッキ層を前記ワイヤ本体に電着させることを特徴とする固定砥粒ワイヤの製造方法。
A method of manufacturing a fixed abrasive flow wire in which abrasive particles are fixed to the wire body by electrodepositing a plating layer on the wire body using a plating solution containing a group of abrasive grains,
A positive electrolysis pulse voltage is applied so that the electrode member serves as an anode and the wire body serves as a cathode in a state where the electrode member and the wire body are opposed to each other in the plating solution. And by repeating the application of the reverse pulse voltage with one cycle of the process of applying the reverse electrolysis pulse voltage so that the wire body becomes the anode, the top part of at least a part of the abrasive grains of the abrasive grain group is exposed. A method for producing a fixed abrasive wire, comprising electrodepositing the plating layer including the abrasive grain group on the wire body in a state.
前記正電解パルス電圧の電位差をV(N)とした場合に、前記逆電解パルス電圧の電位差V(R)はV(R)=2〜8×V(N)とされ、
前記反転パルス電圧の周期をTとした場合に、前記正電解パルス電圧のパルス幅T(N)はT(N)=0.7〜0.9×Tで且つ前記逆電解パルス電圧のパルス幅T(R)はT(R)=0.05〜0.2×Tとされていることを特徴とする請求項1に記載の固定砥粒ワイヤの製造方法。
When the potential difference of the positive electrolysis pulse voltage is V (N), the potential difference V (R) of the reverse electrolysis pulse voltage is V (R) = 2-8 × V (N),
When the period of the inversion pulse voltage is T, the pulse width T (N) of the positive electrolysis pulse voltage is T (N) = 0.7 to 0.9 × T and the pulse width of the reverse electrolysis pulse voltage T (R) is made into T (R) = 0.05-0.2 * T, The manufacturing method of the fixed abrasive wire of Claim 1 characterized by the above-mentioned.
前記反転パルス電圧の周波数は10Hz〜3KHzであることを特徴とする請求項1又は2に記載の固定砥粒ワイヤの製造方法。   The method of manufacturing a fixed abrasive wire according to claim 1 or 2, wherein the frequency of the inversion pulse voltage is 10 Hz to 3 KHz. 前記砥粒は、前記メッキ液に包含されている段階においては前記メッキ液に包含されている金属の一部又は全部と同一金属によってコーティングされていることを特徴とする請求項1から3の何れかに記載の固定砥粒ワイヤの製造方法。   The abrasive grain is coated with the same metal as a part or all of the metal contained in the plating solution in the stage of being contained in the plating solution. The manufacturing method of the fixed abrasive wire of crab.
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