JP2012098282A5 - - Google Patents

Download PDF

Info

Publication number
JP2012098282A5
JP2012098282A5 JP2011237325A JP2011237325A JP2012098282A5 JP 2012098282 A5 JP2012098282 A5 JP 2012098282A5 JP 2011237325 A JP2011237325 A JP 2011237325A JP 2011237325 A JP2011237325 A JP 2011237325A JP 2012098282 A5 JP2012098282 A5 JP 2012098282A5
Authority
JP
Japan
Prior art keywords
optical
analysis
scattering
sample
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2011237325A
Other languages
English (en)
Japanese (ja)
Other versions
JP5824325B2 (ja
JP2012098282A (ja
Filing date
Publication date
Priority claimed from EP10189450.9A external-priority patent/EP2466292B1/en
Application filed filed Critical
Publication of JP2012098282A publication Critical patent/JP2012098282A/ja
Publication of JP2012098282A5 publication Critical patent/JP2012098282A5/ja
Application granted granted Critical
Publication of JP5824325B2 publication Critical patent/JP5824325B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2011237325A 2010-10-29 2011-10-28 散乱および吸光分析を行うシステム Active JP5824325B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP10189450.9 2010-10-29
EP10189450.9A EP2466292B1 (en) 2010-10-29 2010-10-29 System for performing scattering and absorbance assays

Publications (3)

Publication Number Publication Date
JP2012098282A JP2012098282A (ja) 2012-05-24
JP2012098282A5 true JP2012098282A5 (https=) 2014-03-20
JP5824325B2 JP5824325B2 (ja) 2015-11-25

Family

ID=43778403

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011237325A Active JP5824325B2 (ja) 2010-10-29 2011-10-28 散乱および吸光分析を行うシステム

Country Status (3)

Country Link
US (1) US9285311B2 (https=)
EP (1) EP2466292B1 (https=)
JP (1) JP5824325B2 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103278463A (zh) * 2013-05-17 2013-09-04 天津大学 水中乳化油含量检测装置及方法
JP6184292B2 (ja) * 2013-10-24 2017-08-23 公立大学法人首都大学東京 コンパクトディスク型マイクロチップを用いた分析装置
DE102015116386A1 (de) 2015-09-28 2017-03-30 Endress+Hauser Conducta Gmbh+Co. Kg Optisches System zum Analysieren eines Mediums
CN105353115B (zh) * 2015-10-21 2017-05-31 中国科学院上海光学精密机械研究所 免疫层析试纸条散射光场空间分布的测量装置及方法
EP3267181A1 (de) * 2016-07-07 2018-01-10 PerkinElmer Cellular Technologies Germany GmbH Vorrichtung zum messen biologischer und/oder chemischer proben
CN108323181B (zh) * 2017-01-26 2020-09-15 香港应用科技研究院有限公司 用于片上导数光谱学的方法和装置
CN109269998B (zh) * 2018-11-16 2024-08-23 宁波普瑞柏生物技术股份有限公司 一种特定蛋白分析仪的光路系统及检测装置
CN110455690B (zh) * 2019-08-21 2024-06-11 中国计量科学研究院 纳米颗粒粒径测量系统
TWI908758B (zh) * 2020-02-04 2025-12-21 荷蘭商Asm Ip私人控股有限公司 驗證一物品之方法、用於驗證一物品之設備、及用於驗證一反應室之系統
US12085495B2 (en) 2020-06-18 2024-09-10 Wyatt Technology, Llc Calculating molar mass values of components of and molar mass concentration values of conjugate molecules/particles

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58195140A (ja) * 1982-05-11 1983-11-14 Nippon Seimitsu Kogaku Kk 積分球による濁度、曇価、色度の測定法
JPS60159635A (ja) 1984-01-31 1985-08-21 Shimadzu Corp 濁り度測定方法
US5286452A (en) * 1991-05-20 1994-02-15 Sienna Biotech, Inc. Simultaneous multiple assays
US5575978A (en) * 1992-03-27 1996-11-19 Abbott Laboratories Sample container segment assembly
JPH06273330A (ja) * 1993-03-18 1994-09-30 Yokogawa Electric Corp 濁度測定装置
AT403412B (de) * 1996-04-02 1998-02-25 Avl Verbrennungskraft Messtech Vorrichtung und verfahren zur bestimmung der konzentration von hämoglobinderivaten in einer unverdünnten, unhämolysierten vollblutprobe
JPH10227738A (ja) 1997-02-12 1998-08-25 Nikon Corp ケージド試薬開裂用光照射装置
US6982431B2 (en) * 1998-08-31 2006-01-03 Molecular Devices Corporation Sample analysis systems
DE19948587A1 (de) * 1999-10-08 2001-04-12 Dade Behring Marburg Gmbh Spektralphotometrische und nephelometrische Detektionseinheit
JP2002048714A (ja) 2000-08-04 2002-02-15 Kurabo Ind Ltd 濁度測定装置
US6943353B2 (en) * 2001-10-01 2005-09-13 Ud Technology Corporation Simultaneous multi-beam planar array IR (pair) spectroscopy
US7787109B2 (en) * 2004-12-13 2010-08-31 Bayer Healthcare Llc Transmission spectroscopy system for use in the determination of analytes in body fluid
US7440659B2 (en) * 2006-02-27 2008-10-21 Wisconsin Alumni Research Foundation Depth-resolved reflectance instrument and method for its use
US7528951B2 (en) * 2006-03-23 2009-05-05 Hach Company Optical design of a measurement system having multiple sensor or multiple light source paths
US8908175B1 (en) * 2006-03-31 2014-12-09 Kla-Tencor Corporation Flexible scatterometry metrology system and method
EP2171430B1 (en) * 2007-07-19 2013-04-17 3M Innovative Properties Company Optical property sensor
JP5350810B2 (ja) * 2008-01-11 2013-11-27 株式会社東芝 自動分析装置及び自動分析方法
JP2009168748A (ja) * 2008-01-18 2009-07-30 Sumitomo Electric Ind Ltd 食品検査装置
US8094299B2 (en) * 2008-07-24 2012-01-10 Beckman Coulter, Inc. Transducer module

Similar Documents

Publication Publication Date Title
JP2012098282A5 (https=)
JP6336710B2 (ja) 試料内の不均質性を検知するための光学装置、特に偏光計
EP2860511B1 (en) Data correction method in fine particle measuring device and fine particle measuring device
US20120050737A1 (en) Fine particle measurement apparatus and optical axis calibration method
JP5824325B2 (ja) 散乱および吸光分析を行うシステム
JP2018503842A5 (https=)
JP2016522880A5 (https=)
JP2009204616A5 (https=)
JP6517193B2 (ja) アレイベースの試料特性評価
CN109444082B (zh) 漫反射光谱测量装置及测量方法
JP2021501657A5 (https=)
US20170227463A1 (en) Determining an absorption or turbidity coefficient of a liquid
US9651478B2 (en) Analyzer
CN105136743B (zh) 一种基于微流控芯片粒子捕获式的单粒子散射测量方法
FI127243B (fi) Menetelmä ja mittalaite Abben luvun jatkuvaksi mittaamiseksi
JP2018533014A5 (https=)
CN106680186A (zh) 一种流式细胞仪多类型散射光探测系统
US11686662B2 (en) Microparticle sorting device and method for sorting microparticles
US20120243567A1 (en) Laser irradiation device and microparticle measuring device
JP2005291900A (ja) レンズメータ
US9291556B2 (en) Objective optical system for ATR measurement, and ATR measurement device
CN105445231B (zh) 分析物的浊度测定方法
JP5882864B2 (ja) 拡散ヘーズ値測定方法及び測定装置
CN103528684B (zh) 微区变角度光谱测试系统
CN209745812U (zh) 漫反射光谱测量装置