JP2012013474A - Chip led inspection device - Google Patents

Chip led inspection device Download PDF

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JP2012013474A
JP2012013474A JP2010148551A JP2010148551A JP2012013474A JP 2012013474 A JP2012013474 A JP 2012013474A JP 2010148551 A JP2010148551 A JP 2010148551A JP 2010148551 A JP2010148551 A JP 2010148551A JP 2012013474 A JP2012013474 A JP 2012013474A
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light
chip led
support member
illumination
main body
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JP5615604B2 (en
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Shinya Matsuda
晋也 松田
Koichi Sasaki
浩一 佐々木
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Daiichi Jitsugyo Viswill Co Ltd
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Daiichi Jitsugyo Viswill Co Ltd
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Priority to KR1020110053452A priority patent/KR20120002429A/en
Priority to CN201110165533.1A priority patent/CN102313750B/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2632Circuits therefor for testing diodes
    • G01R31/2635Testing light-emitting diodes, laser diodes or photodiodes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/265Contactless testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/265Contactless testing
    • G01R31/2656Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation

Abstract

PROBLEM TO BE SOLVED: To provide an inspection device capable of accurately detecting a non-translucent foreign material in a sealing resin portion of a chip LED.SOLUTION: The inspection device includes: a support member 5 supporting a chip LED 50; an upper illumination mechanism 10 illuminating a surface of the chip LED 50; a camera 6 imaging an image on a surface side of the chip LED 50; and a determination section 8 which analyzes the imaged image and determines whether or not a foreign material exists. The upper illumination mechanism 10 includes: a first illumination part which has a domy main body and a plurality of light sources arranged in the domy main body, and indirectly illuminates a lower part by light irradiated from a lower surface opening of the domy main body to the lower part; and a second illumination part which has a ring-shaped main body and a plurality of light sources arranged on a lower surface of the ring-shaped main body, and directly illuminates a lower part by light irradiated from the light sources. The camera 6 is arranged above the first illumination part and images a surface image of the chip LED 50 through an opening for imaging.

Description

本発明は、チップLEDの封止樹脂部に混入又はその表面に付着した不透光性の異物を検出する検査装置に関する。   The present invention relates to an inspection apparatus that detects a light-impermeable foreign matter mixed in or adhering to a sealing resin portion of a chip LED.

従来から、チップLEDとしては各種形態のものが知られているが、その一つとして、図12に示すようなものが知られている。   Conventionally, various types of chip LEDs are known, and one of them is shown in FIG.

同図12に示すように、このチップLED50は、透光性を有する基板51と、該基板51の裏面に相互に分離した状態で形成された少なくとも2つの不透光性の電極部52,52と、前記基板51の表面中央部に配設された発光部53と、基板51の表面を被覆して前記発光部53を封止する透光性の封止樹脂54とから構成される。   As shown in FIG. 12, the chip LED 50 includes a light-transmitting substrate 51 and at least two light-impermeable electrode portions 52 and 52 formed on the back surface of the substrate 51 so as to be separated from each other. And a light emitting portion 53 disposed at the center of the surface of the substrate 51, and a translucent sealing resin 54 that covers the surface of the substrate 51 and seals the light emitting portion 53.

前記封止樹脂54は、発光部53を被覆する部分が凸曲面状(この例では、ほぼ半球状)に成形されており、上述した発光部53を封止する役割の他、凸曲面部54aは、発光部53から発せられた光を集光させるレンズとしての役割を担っている。   In the sealing resin 54, the portion covering the light emitting portion 53 is formed in a convex curved surface shape (in this example, substantially hemispherical), and in addition to the role of sealing the light emitting portion 53 described above, the convex curved surface portion 54a. Plays a role as a lens for condensing the light emitted from the light emitting portion 53.

したがって、かかる役割を担う凸曲面部54aに不透光性の異物が混入又はその表面に付着している場合には、発光部53から発せられた光がこの異物によって遮断され、当該チップLED50から照射される光が不均一なものとなるという不都合を生じる。   Therefore, when a light-impermeable foreign matter is mixed in or attached to the surface of the convex curved surface portion 54a that plays such a role, the light emitted from the light emitting portion 53 is blocked by the foreign matter, and the chip LED 50 There is a disadvantage that the irradiated light becomes non-uniform.

このため、従来、封止樹脂54(特に、凸曲面部54a)に混入又はその表面に付着した前記不透光性の異物を検出することのできる検査装置が求められていた。   For this reason, conventionally, there has been a demand for an inspection apparatus that can detect the light-impermeable foreign matter mixed in or adhering to the sealing resin 54 (particularly, the convex curved surface portion 54a).

他方、検査装置としては、従来、チップLEDを検査対象物としたものではないが、半導体パッケージの配線パターンを検査する装置として、特開2009−288050公報に開示された検査装置が知られている。   On the other hand, as an inspection apparatus, a chip LED is not conventionally used as an inspection object, but an inspection apparatus disclosed in JP 2009-288050 A is known as an apparatus for inspecting a wiring pattern of a semiconductor package. .

この検査装置は、間接照明手段により被検体を照明し、当該被検体をラインセンサカメラにより撮像してその画像を解析し、欠点を検出するというものであり、間接照明手段は、ドーム状をした凹曲面状の反射面を有する本体を備え、本体の開口部側の内面に形成された光出射口から、前記反射面に光を照射し、当該反射面により反射された光によって下方の被検体を照明する。尚、カメラは、前記本体に形成された観察窓から前記被検体を撮像する。   This inspection apparatus illuminates a subject with indirect illumination means, images the subject with a line sensor camera, analyzes the image, and detects defects. The indirect illumination means has a dome shape. A subject having a concave curved reflecting surface, irradiating the reflecting surface with light from a light emitting port formed on the inner surface on the opening side of the main body, and a subject below by the light reflected by the reflecting surface Illuminate. The camera images the subject from an observation window formed in the main body.

特開2009−288050公報JP 2009-288050 A

ところが、上記構成を有するチップLEDの場合、従来の検査装置をそのまま当該チップLEDの検査に適用しても、当該チップLEDの構成上、その封止樹脂部に存在する不透光性の異物を正確には検出することができなかった。   However, in the case of the chip LED having the above configuration, even if the conventional inspection apparatus is applied to the inspection of the chip LED as it is, the translucent foreign matter existing in the sealing resin portion is removed due to the configuration of the chip LED. It could not be detected accurately.

上記従来の間接照明手段を用いてチップLEDを照明した場合、これをカメラによって撮像した画像は、図13に示すように、平面から視て、前記凸曲面部の外周部分(基板からの立ち上がり部分)(符号55)、及び電極がない部分(表裏に透光する部分)(符号56)が暗部となり、その他の電極部及び発光部が明部となった明暗画像となる。尚、画像中のチップLED50に相当する部分以外も暗部となる。   When the chip LED is illuminated using the conventional indirect illumination means, an image obtained by photographing the chip LED with a camera is, as shown in FIG. 13, an outer peripheral portion of the convex curved surface portion (a rising portion from the substrate) as seen from the plane. ) (Reference numeral 55), and the part without the electrode (the part that transmits light on the front and back) (reference numeral 56) is a dark part, and the other electrode part and the light emitting part are bright and dark images. Note that portions other than the portion corresponding to the chip LED 50 in the image are dark portions.

電極部及び発光部は比較的良く光を反射するため、封止樹脂及び基板を透過した光は、当該電極部で反射され、再び基板及び封止樹脂を透過してカメラに入光するため、同部が明部となり、これに対し、電極が形成されていないところについては、封止樹脂及び基板を透過した光が反射されないため、暗部となるのである。   Since the electrode part and the light emitting part reflect light relatively well, the light transmitted through the sealing resin and the substrate is reflected by the electrode part, and again passes through the substrate and the sealing resin and enters the camera. On the other hand, the portion where the electrode is not formed is a dark portion because the light transmitted through the sealing resin and the substrate is not reflected.

また、前記凸曲面部の基板からの立ち上がり部分(外周部分)については、上記構造を備えた従来の間接照明手段では、照明に寄与する前記反射光(照明光)が下方に向けてある程度指向性を有するものとなっているため、この照明光と鋭角に交差する前記外周部では、当該外周部表面で正反射される照明光が多く、また、樹脂内部に入光する照明光が少ないことから、当該外周部からカメラに入光する反射光が少く、このため暗部になるものと思われる。   Further, with respect to the rising portion (outer peripheral portion) of the convex curved surface portion from the substrate, in the conventional indirect illumination means having the above-described structure, the reflected light (illumination light) contributing to illumination is directed to some extent downward. Therefore, in the outer periphery that intersects the illumination light at an acute angle, there is much illumination light that is regularly reflected on the surface of the outer periphery, and there is little illumination light that enters the resin. The reflected light that enters the camera from the outer peripheral portion is small, and it is considered that this is a dark portion.

一方、不透光性の異物は光を透さないため暗部となる。したがって、不透光性の異物が、凸曲面部の外周部(符号55)や、電極が形成されていない部分(符号56)に対応する位置にある場合には、いずれも暗部となるため、当該異物を検出することが極めて困難なのである(図13参照。図13において符号57が異物である。)   On the other hand, the light-impermeable foreign matter does not transmit light and thus becomes a dark part. Therefore, when the light-impermeable foreign matter is at a position corresponding to the outer peripheral portion (reference numeral 55) of the convex curved surface portion or the portion where the electrode is not formed (reference numeral 56), both become dark portions. It is extremely difficult to detect the foreign matter (see FIG. 13, reference numeral 57 in FIG. 13 is a foreign matter).

尚、チップLEDとしては、上述した形態のものの他、基板裏面の全面に不透光性の樹脂やその他の部材が設けられたものもあるが、前記封止樹脂の凸曲面外周部が暗部になるという点については異なるところがない。   As the chip LED, in addition to the above-described form, there is a chip LED provided with an opaque resin or other member on the entire back surface of the substrate, but the convex curved outer peripheral portion of the sealing resin is a dark portion. There is no difference in terms of becoming.

本発明は、以上の実情に鑑みなされたものであって、チップLEDの封止樹脂部に存在する不透光性の異物を、これが存在する位置に拘わらず正確に検出することができる検査装置の提供を、その目的とする。   The present invention has been made in view of the above circumstances, and is an inspection apparatus capable of accurately detecting a non-transparent foreign matter present in a sealing resin portion of a chip LED regardless of the position where the foreign matter exists. The purpose is to provide

上記課題を解決するための本発明は、
透光性を有する基板と、該基板の裏面に形成された不透光性の電極部と、前記基板の表面中央部に配設された発光部と、前記基板表面を被覆して前記発光部を封止する透光性の封止樹脂とから構成され、該封止樹脂の少なくとも前記発光部を覆う部分が凸曲面状に形成されたチップLEDの、前記封止樹脂に混入又はその表面に付着した不透光性の異物を検出する検査装置であって、
前記チップLEDを支持する板状又はシート状の支持部材と、
前記支持部材より上方に配設され、該支持部材上に載置されたチップLEDの表面側の画像を撮像するカメラと、
同じく前記支持部材より上方に配設され、該支持部材上に載置されたチップLEDの表面を照明する上部照明機構と、
前記カメラによって撮像された画像を解析して、前記異物の有無を判定する判定部とを備えてなり、
前記上部照明機構は、
下面中心部に円形の開口部を備え、且つ頂部に撮像用の開口部を備えたドーム状の本体と、該ドーム本体内に配設された複数の光源とからなり、前記ドーム本体は、その内部凹曲面が反射面をなし、前記光源は、前記ドーム本体の内部底面上にその周方向に等間隔に、且つ前記凹曲面に向けて光を照射するように配設されてなり、前記凹曲面によって反射された光が、前記ドーム本体の下面開口部から下方に向けて照射するように構成された第1照明部と、
リング状をした本体と、該リング本体の下面に、その周方向に等間隔に、且つ下方に向けて光を照射するように配設された複数の光源とを有する第2照明部とから構成され、
前記第2照明部は、そのリング本体が前記第1照明部のドーム本体と同軸となるように該第1照明部の下方に配設され、
更に、前記カメラは、前記第1照明部の上方に配設され、前記ドーム本体の撮像用開口部を通して前記チップLEDの表面画像を撮像するように構成されたチップLED検査装置に係る。
The present invention for solving the above problems is as follows.
A light-transmitting substrate; a light-impermeable electrode portion formed on the back surface of the substrate; a light-emitting portion disposed in a central portion of the surface of the substrate; and the light-emitting portion covering the substrate surface Of a chip LED that is formed of a translucent sealing resin that seals at least a portion that covers at least the light emitting portion of the sealing resin, or is mixed into the sealing resin or on the surface thereof An inspection device for detecting attached light-transmitting foreign matter,
A plate-like or sheet-like support member for supporting the chip LED;
A camera that is arranged above the support member and that captures an image of the surface side of the chip LED placed on the support member;
An upper illumination mechanism that is also disposed above the support member and illuminates the surface of the chip LED placed on the support member;
A determination unit that analyzes an image captured by the camera and determines the presence or absence of the foreign matter,
The upper illumination mechanism is
A dome-shaped main body having a circular opening at the center of the lower surface and an image pickup opening at the top, and a plurality of light sources disposed in the dome main body, The inner concave curved surface forms a reflecting surface, and the light source is arranged on the inner bottom surface of the dome body so as to emit light toward the concave curved surface at equal intervals in the circumferential direction. A first illumination unit configured to irradiate the light reflected by the curved surface downward from the lower surface opening of the dome body;
A second illuminating unit having a ring-shaped main body and a plurality of light sources arranged on the lower surface of the ring main body so as to irradiate light at equal intervals in the circumferential direction and downward. And
The second illumination unit is disposed below the first illumination unit such that the ring body is coaxial with the dome body of the first illumination unit,
Further, the camera relates to a chip LED inspection apparatus that is arranged above the first illumination unit and configured to capture a surface image of the chip LED through an imaging opening of the dome body.

本発明に係る検査装置では、まず、検査対象のチップLEDを支持部材上の検査領域(前記カメラの撮像視野領域)内に位置させる。尚、チップLEDを搬送する機構としては、例えば、適宜搬送手段によりチップLEDを搬送して、前記支持部材上の検査領域内に載置するといったものの他、支持部材上でチップLEDを適宜搬送手段により搬送して、適宜搬送速度で前記検査領域内を通過させるといったものでも良く、或いは、チップLEDが載置された状態の支持部材を移動させて、当該チップLEDを適宜搬送速度で前記検査領域内を通過させるといった機構のものでも良い。   In the inspection apparatus according to the present invention, first, the chip LED to be inspected is positioned in the inspection region (imaging field of view of the camera) on the support member. As a mechanism for transporting the chip LED, for example, the chip LED is appropriately transported by a transport means and placed in the inspection region on the support member, or the chip LED is appropriately transported on the support member. May be passed through the inspection area at an appropriate conveying speed, or the support member in a state where the chip LED is placed is moved so that the chip LED is appropriately transferred at the inspection area. It may be a mechanism that passes through the inside.

支持部材上の検査領域では、上部照明機構によってチップLEDの表面が照明され、第1照明部のドーム本体に形成された撮像用開口部を通して、チップLEDの表面側の画像がカメラによって撮像される。   In the inspection area on the support member, the surface of the chip LED is illuminated by the upper illumination mechanism, and an image on the surface side of the chip LED is captured by the camera through the imaging opening formed in the dome body of the first illumination unit. .

前記上部照明機構は、第1照明部と第2照明部とを有しており、チップLEDは、これら2つの照明部によってその表面が照明され、これにより、前記カメラによって撮像されるチップLEDの画像は、その電極部及び発光部に相当する部分、並びに凸曲面部に相当する部分が明部となった画像となる。   The upper illumination mechanism includes a first illumination unit and a second illumination unit. The surface of the chip LED is illuminated by the two illumination units, and thus the chip LED imaged by the camera is captured. The image is an image in which a portion corresponding to the electrode portion and the light emitting portion and a portion corresponding to the convex curved surface portion are bright portions.

第1照明部では、ドーム本体の内部底面上にその周方向に等間隔に配設された各光源からドーム本体内面の凹曲面に向けて光が照射され、この凹曲面によって反射された反射光が下面開口部から下方に向けて照射され、チップLED表面の全面がこの反射光によって照明される。即ち、チップLEDは第1照明部によってその表面全面が間接照明される。   In the first illumination unit, light is irradiated from the light sources arranged on the inner bottom surface of the dome body at equal intervals in the circumferential direction toward the concave curved surface of the inner surface of the dome main body, and the reflected light reflected by the concave curved surface. Is irradiated downward from the lower surface opening, and the entire surface of the chip LED is illuminated by the reflected light. That is, the entire surface of the chip LED is indirectly illuminated by the first illumination unit.

そして、第1照明部から照射された光は、封止樹脂及び基板を透過し、電極部及び発光部が比較的良く光を反射することから、透過光は当該電極部及び発光部によって反射され、再度、基板及び封止樹脂を透過してカメラに入光する。このため、電極部及び発光部に相当する部分が明部となる。   And the light irradiated from the 1st illumination part permeate | transmits sealing resin and a board | substrate, and since an electrode part and a light emission part reflect light comparatively well, the transmitted light is reflected by the said electrode part and light emission part. Again, the light passes through the substrate and the sealing resin and enters the camera. For this reason, the part equivalent to an electrode part and a light emission part turns into a bright part.

一方、第2照明部では、リング本体の下面に、その周方向に等間隔に配設された複数の各光源から、その直下位置を中心とした平面視円形領域内に光が照射され、複数の光源全体として、主に、下方の環状領域を高照度領域として照明する。   On the other hand, in the second illuminating unit, light is irradiated to the lower surface of the ring body from a plurality of light sources arranged at equal intervals in the circumferential direction in a circular area in plan view centered on the position immediately below the plurality of light sources. As a whole, the lower annular area is mainly illuminated as a high illuminance area.

チップLEDは、この第2照明部から照射される光の内、主に、内側斜め下方に向けて照射される光によって、その表面が照明される。前記第1照明部は、ドーム本体内面の凹曲面により反射された反射光を用いる間接照明であり、前述した従来の間接照明手段と同様、下方に向けてある程度の指向性を有するものとなっているため、この第1照明部のみでは、この照明光と鋭角に交差する前記凸曲面部の外周部(基板からの立ち上がり部分)が暗部になるが、前記第2照明部は、この凸曲面部を、その外方の斜め上方から照明するので、当該凸曲面部の外周部も十分な光量で照明され、このため、同部により反射され、或いは同部を透過した光の十分な光量がカメラに入光される。したがって、この第2照明部による照明により前記凸曲面部の外周部を明部にすることができる。   The surface of the chip LED is illuminated mainly by light emitted obliquely downward on the inside of the light emitted from the second illumination unit. The first illumination unit is indirect illumination using reflected light reflected by the concave curved surface of the inner surface of the dome body, and has a certain degree of directivity downward as in the conventional indirect illumination means described above. Therefore, only in the first illumination part, the outer peripheral part (the rising part from the substrate) of the convex curved part intersecting the illumination light at an acute angle becomes a dark part, but the second illumination part is provided with the convex curved part. , The outer peripheral portion of the convex curved surface portion is illuminated with a sufficient amount of light, and therefore, a sufficient amount of light reflected by or transmitted through the same portion is illuminated by the camera. Is incident. Therefore, the outer peripheral part of the convex curved surface part can be made bright by the illumination by the second illumination part.

斯くして、前記第1照明部及び第2照明部によって照明され、前記カメラによって撮像されたチップLEDの画像は、その全体が明部となった画像となる。   Thus, the image of the chip LED illuminated by the first illumination unit and the second illumination unit and imaged by the camera is an image in which the whole is a bright part.

したがって、不透光性の異物が封止樹脂中に混入又その表面に付着している場合には、前記カメラによって撮像される画像は、当該異物のみが暗部となった画像となるため、前記判定部において、当該画像を解析して異物の有無を判定する際には、これを容易にしかも正確に行うことができる。   Therefore, when the light-impermeable foreign matter is mixed in the sealing resin or adhered to the surface thereof, the image captured by the camera is an image in which only the foreign matter is a dark part. In the determination unit, when the image is analyzed to determine the presence or absence of foreign matter, this can be easily and accurately performed.

尚、本発明において、前記第2照明部は、その光源の下方に配設された環状の拡散透光膜を備えていても良い。   In the present invention, the second illuminating unit may include an annular diffuse translucent film disposed below the light source.

ところで、基板の裏面に相互に分離した状態で少なくとも2つの不透光性の電極部が形成されたチップLED等、表裏に透光する部分を備えたチップLEDの場合、これを前記上部照明機構のみによって照明すると、当該透光性を有する部分については、封止樹脂部及び基板を透過した光が反射されないため、これに相当する部分が暗部となった画像が得られる。したがって、この透光性を有する部分に対応する部分に異物が存在する場合には、これを正確に検出することができない。   By the way, in the case of a chip LED having a translucent portion on the front and back, such as a chip LED in which at least two opaque electrodes are formed on the back surface of the substrate, this is the upper illumination mechanism. When the light is illuminated only by the light, the light transmitted through the sealing resin portion and the substrate is not reflected in the portion having translucency, so that an image in which the corresponding portion is a dark portion is obtained. Therefore, when a foreign substance exists in the part corresponding to the part which has this translucency, this cannot be detected correctly.

このような問題を解決するために、本発明では、前記支持部材を透明な部材から構成し、更に、前記支持部材の下方に、該支持部材を透過してチップLEDの裏面を照明する下部照明機構を設けた態様を採ることができる。   In order to solve such a problem, in the present invention, the support member is formed of a transparent member, and further, a lower illumination that illuminates the back surface of the chip LED through the support member below the support member. A mode in which a mechanism is provided can be employed.

前述したように、上部照明機構のみによって照明したのでは、表裏に透光する部分については、封止樹脂部及び基板を透過した光が反射されず、暗部となるが、下部照明機構により、チップLEDの裏面を照明することで、支持部材を透過した光が、更に、前記透光部分を透過してカメラに入光するため、前記透光部分が明部となった画像が得られる。   As described above, when the illumination is performed only by the upper illumination mechanism, the light transmitted through the front and back surfaces is not reflected by the light transmitted through the sealing resin portion and the substrate, but becomes a dark portion. By illuminating the back surface of the LED, light that has passed through the support member further passes through the light-transmitting portion and enters the camera, so that an image in which the light-transmitting portion is a bright portion is obtained.

したがって、前記透光部分に異物が存在する場合でも、この下部照明機構によってチップLEDの裏面を照明することで、これを正確に検出することができる。   Therefore, even when a foreign substance is present in the translucent part, this can be accurately detected by illuminating the back surface of the chip LED with the lower illumination mechanism.

尚、前記下部照明機構は、特に光源を備えている必要はなく、前記支持部材の下方に該支持部材と平行に配設され、該支持部材との対向面が反射面になった反射板から、これを構成しても良い。   Note that the lower illumination mechanism does not need to have a light source in particular, and is provided from a reflecting plate that is disposed below the supporting member in parallel with the supporting member, and a surface facing the supporting member is a reflecting surface. This may be configured.

上述のように、チップLEDの表面側は、前記上部照明機構によって照明されている。このため、前記上部照明機構から発せられた光は、前記透光部を透過し、更に支持部材を透過して反射板の反射面に至り、この反射面により反射されて、再度、支持部材を透過し、前記透光部を透過してカメラに入光する。したがって、かかる反射板を用いても、前記透光部が明部となった画像が得られる。尚、この場合、反射板の反射面は白色を呈するものが好ましい。また、支持部材を、白色を呈する材料から構成しても良く、この場合には、前記下部照明機構は不要である。   As described above, the surface side of the chip LED is illuminated by the upper illumination mechanism. For this reason, the light emitted from the upper illumination mechanism passes through the translucent part, further passes through the support member, reaches the reflection surface of the reflection plate, is reflected by the reflection surface, and again supports the support member. The light passes through the light transmitting part and enters the camera. Therefore, even when such a reflector is used, an image in which the translucent part is a bright part can be obtained. In this case, the reflecting surface of the reflecting plate is preferably white. Further, the support member may be made of a white material, and in this case, the lower illumination mechanism is unnecessary.

尚、検査対象物としてのチップLEDは、透光性を有する基板と、該基板の裏面に形成された不透光性の電極部と、前記基板の表面中央部に配設された発光部と、前記基板表面を被覆して前記発光部を封止する透光性の封止樹脂とから構成され、該封止樹脂の少なくとも前記発光部を覆う部分が凸曲面状に形成されたものであり、凸曲面部の形状については何ら限定されない。   Note that a chip LED as an inspection object includes a light-transmitting substrate, a light-impermeable electrode portion formed on the back surface of the substrate, and a light-emitting portion disposed at the center of the surface of the substrate. And a translucent sealing resin that covers the substrate surface and seals the light emitting portion, and at least a portion of the sealing resin that covers the light emitting portion is formed in a convex curve shape. The shape of the convex curved surface portion is not limited at all.

以上のように、本発明によれば、カメラによって撮像されるチップLEDの画像を、その全体が明部となった画像とすることができ、この結果、前記封止樹脂部に異物が存在する場合には、当該異物のみが暗部となった画像を得ることができ、このため、得られた画像を解析して異物の有無を判定する際には、これを容易にしかも正確に行うことができる。   As described above, according to the present invention, the image of the chip LED imaged by the camera can be an image in which the whole is a bright portion, and as a result, foreign matter exists in the sealing resin portion. In this case, it is possible to obtain an image in which only the foreign matter is a dark part. Therefore, when the obtained image is analyzed to determine the presence or absence of the foreign matter, this can be easily and accurately performed. it can.

本発明の一実施形態に係る検査装置を示した正面図である。It is the front view which showed the inspection apparatus which concerns on one Embodiment of this invention. 本実施形態に係る上部照明機構を示した縦断面図である。It is the longitudinal cross-sectional view which showed the upper illumination mechanism which concerns on this embodiment. 本実施形態に係る上部照明機構の第1照明部と第2照明部とを分離して示した正面図である。It is the front view which isolate | separated and showed the 1st illumination part and the 2nd illumination part of the upper illumination mechanism which concern on this embodiment. 図3における矢視A−A方向の断面図である。It is sectional drawing of the arrow AA direction in FIG. 図3における矢視B方向の底面図である。It is a bottom view of the arrow B direction in FIG. 図3における矢視C−C方向の底面図である。It is a bottom view of the arrow CC direction in FIG. 図3における矢視D方向の底面図である。It is a bottom view of the arrow D direction in FIG. 本実施形態に係る第1照明部の照明領域と第2照明部の照明領域を示した説明図である。It is explanatory drawing which showed the illumination area of the 1st illumination part which concerns on this embodiment, and the illumination area of a 2nd illumination part. 本実施形態において上部照明機構を用いて照明したときのチップLEDの撮像画像を示した説明図である。It is explanatory drawing which showed the picked-up image of chip | tip LED when illuminated using an upper illumination mechanism in this embodiment. 本実施形態において下部照明機構を用いて照明したときのチップLEDの撮像画像を示した説明図である。It is explanatory drawing which showed the picked-up image of chip | tip LED when illuminated using a lower illumination mechanism in this embodiment. 本実施形態において上部照明機構及び下部照明機構を用いて照明したときのチップLEDの撮像画像を示した説明図である。It is explanatory drawing which showed the picked-up image of chip | tip LED when it illuminates using an upper illumination mechanism and a lower illumination mechanism in this embodiment. チップLEDの形態を説明するための説明図である。It is explanatory drawing for demonstrating the form of chip LED. 従来の検査装置によって得られる撮像画像を示した説明図である。It is explanatory drawing which showed the captured image obtained by the conventional inspection apparatus.

以下、本発明の一具体的な実施の態様につき、図面に基づいて説明する。   Hereinafter, a specific embodiment of the present invention will be described with reference to the drawings.

図1に示すように、本例の検査装置1は、検査対象のチップLED50が載置される透明な板状の支持部材5と、この支持部材5より上方に配設され、当該支持部材5上に載置されたチップLED50の表面側の画像を撮像するカメラ6と、支持部材5より上方であり、且つカメラ6の直下に配設された上部照明機構10と、支持部材5を挟んで上部照明機構10と対向するように、支持部材5の下方に配設された下部照明機構7と、カメラ6によって撮像された画像を解析して、撮像したチップLED50の良否を判定する判定部8とを備えている。   As shown in FIG. 1, the inspection apparatus 1 of this example is provided with a transparent plate-like support member 5 on which a chip LED 50 to be inspected is placed, and is disposed above the support member 5. The camera 6 that captures an image of the surface side of the chip LED 50 placed thereon, the upper illumination mechanism 10 that is located above the support member 5 and directly below the camera 6, and the support member 5 are sandwiched therebetween. A determination unit 8 that analyzes the image captured by the lower illumination mechanism 7 disposed below the support member 5 and the camera 6 so as to face the upper illumination mechanism 10 and determines the quality of the captured chip LED 50. And.

尚、本例の検査対象物たるチップLED50は、前述の図12に示した形態を有しているものとする。   It is assumed that the chip LED 50 that is the inspection object of this example has the form shown in FIG.

前記支持部材5は、ガラス等、歪みなく光を透過するものであればその材質に制限はなく、また、その形態も剛性の高い板材の他、可撓性のあるシート材であっても良い。   The supporting member 5 is not limited in its material as long as it transmits light without distortion, such as glass, and the form thereof may be a flexible sheet material in addition to a highly rigid plate material. .

前記上部照明機構10は、図1及び2に示すように、第1照明部11と、この下方に連設された第2照明部20とを備えている。   As shown in FIGS. 1 and 2, the upper illumination mechanism 10 includes a first illumination unit 11 and a second illumination unit 20 provided below the first illumination unit 11.

第1照明部11は、図2、図4及び5に示すように、椀状をした上本体13、及びこの上本体13の下面に、これと同軸に連設されたリング状の下本体15から構成されるドーム状の本体部12と、本体部12の内部に配設された光源たる複数のLEDランプ19とからなる。   As shown in FIGS. 2, 4, and 5, the first illumination unit 11 includes a bowl-shaped upper main body 13, and a ring-shaped lower main body 15 that is coaxially connected to the lower surface of the upper main body 13. And a plurality of LED lamps 19 serving as a light source disposed inside the main body 12.

前記上本体13は、その内面(凹曲面)13aが反射面となっており、頂部には撮像用の開口14が形成されている。また、前記下本体15の上面には、環状の凹溝16が形成されており、前記LEDランプ19が、その照射方向が上に向くように、前記凹溝16内の底面に、その周方向に沿って等間隔に配設されている。   The inner surface (concave surface) 13a of the upper main body 13 is a reflecting surface, and an imaging opening 14 is formed at the top. An annular groove 16 is formed on the upper surface of the lower main body 15, and the LED lamp 19 is formed on the bottom surface of the groove 16 in the circumferential direction so that the irradiation direction faces upward. Are arranged at equal intervals along the line.

斯くして、この第1照明部11によれば、各LEDランプ19から上方に向けて照射された光が、上本体13の凹曲面13aによって反射され、下本体15の開口部17を通って、その下方に配置されるチップLED50の表面全体を照明する。尚、この第1照明部11による照明は、下方に向けたある程度の指向性を有する間接照明であり、当該第1照明部11は、その下方の円形領域を照明する。   Thus, according to the first illumination unit 11, the light emitted upward from each LED lamp 19 is reflected by the concave curved surface 13 a of the upper body 13 and passes through the opening 17 of the lower body 15. The entire surface of the chip LED 50 disposed below is illuminated. Note that the illumination by the first illumination unit 11 is indirect illumination having a certain degree of directivity directed downward, and the first illumination unit 11 illuminates a circular area below the first illumination unit 11.

前記第2照明部20は、図2及び図6に示すように、上面及び下面に開口部を備え、前記下本体15の下面に、これと同軸に連設されたリング状の本体21と、この本体21に設けられた光源たる複数のLEDランプ23と、本体21の下面に設けられた環状の拡散透光膜24とからなる。   As shown in FIGS. 2 and 6, the second illumination unit 20 includes an opening on the upper surface and the lower surface, and a ring-shaped main body 21 provided coaxially with the lower surface of the lower main body 15. It comprises a plurality of LED lamps 23 as light sources provided on the main body 21 and an annular diffuse light-transmitting film 24 provided on the lower surface of the main body 21.

前記本体21の下面開口部の内径は、上面開口部の内径よりも大径となっており、その環状をした内部上面に、前記LEDランプ23が、その照射方向が下に向くように、周方向に沿って等間隔に配設されている。   The inner diameter of the lower surface opening of the main body 21 is larger than the inner diameter of the upper surface opening, and the LED lamp 23 is arranged on the annular inner upper surface so that the irradiation direction faces downward. It is arranged at equal intervals along the direction.

斯くして、この第2照明部20によれば、環状に配設された各LEDランプ23からその直下位置を中心とした平面視円形領域内に光が照射され、複数のLEDランプ23全体として、主に、下方の環状領域が高照度領域として照明される。そして、その下方に配置されたチップLED50は、照射される光の内、主に、内側斜め下方に向けて照射される光によって、その表面が照明され、少なくとも、凸曲面部54aの外周部及びこれより外側のチップLED50を含む環状領域が照明される。図8において灰色で示した環状領域が、当該第2照明部20の照明領域であり、上部照明機構10の高さ位置を調整することによって、前記凸曲面部54aの外周部が照明領域に含まれるようにしている。   Thus, according to the second illuminating unit 20, light is irradiated from the LED lamps 23 arranged in an annular shape into a circular area in a plan view centered on the position immediately below the LED lamps 23. Primarily, the lower annular area is illuminated as a high illuminance area. The chip LED 50 disposed below the surface is illuminated mainly by light irradiated obliquely downward on the inside, and at least the outer peripheral portion of the convex curved surface portion 54a and The annular area including the chip LED 50 outside is illuminated. The annular region shown in gray in FIG. 8 is the illumination region of the second illumination unit 20, and the outer peripheral portion of the convex curved surface portion 54a is included in the illumination region by adjusting the height position of the upper illumination mechanism 10. It is trying to be.

尚、前記拡散透光膜24は、LEDランプ23から照射される光を分散して透過させるもので、前記環状領域内をムラなくほぼ均等な照度で照明するためのものである。   The diffuse translucent film 24 disperses and transmits the light emitted from the LED lamp 23, and illuminates the inside of the annular region with almost uniform illuminance without unevenness.

また、本体21の上面開口部の内径及び拡散透光膜24の内径は、いずれも前記下本体15の開口部17の内径よりも大径となっており、前記第1照明部11の照明に支障をきたさないようになっている。   Also, the inner diameter of the upper surface opening of the main body 21 and the inner diameter of the diffusive transparent film 24 are both larger than the inner diameter of the opening 17 of the lower main body 15. It does not cause any trouble.

前記下部照明機構7は、前記支持部材5の下方に該支持部材5と平行に配設され、該支持部材5との対向面が白色の反射面となった板状の部材からなる。この下部照明機構7は、上部照明機構10から照射された光であって、そのまま支持部材5を透過した光、及び支持部材5上のチップLED50と支持部材5とを透過した光を前記反射面で反射して、前記チップLED50の裏面を照明する。   The lower illumination mechanism 7 is a plate-like member disposed below the support member 5 in parallel with the support member 5 and having a white reflecting surface as a surface facing the support member 5. The lower illumination mechanism 7 emits the light emitted from the upper illumination mechanism 10 and directly passes through the support member 5 and the light transmitted through the chip LED 50 and the support member 5 on the support member 5 as the reflection surface. And the back surface of the chip LED 50 is illuminated.

前記カメラ6は、前記上本体11の開口14から、その下方のチップLED50の画像を撮像するもので、画像を撮像できるものであればどのようなものでも良く、例えば、エリアセンサカメラやラインセンサカメラを適用することができる。但し、ラインセンサカメラを用いる場合には、チップLED50を所定速度で移動させる必要がある。   The camera 6 captures an image of the chip LED 50 below the opening 14 of the upper main body 11 and may be any device that can capture an image, such as an area sensor camera or a line sensor. Camera can be applied. However, when using a line sensor camera, it is necessary to move the chip LED 50 at a predetermined speed.

尚、前記下部照明機構7は、少なくとも前記チップLED50よりも大きい大きさを有している。   The lower illumination mechanism 7 has a size that is at least larger than the chip LED 50.

前記判定部8は、カメラ6によって撮像された画像を解析して、例えば、撮像画像を2値化処理して、チップLED50の封止樹脂54部に異物が存在するか否かを判別する。   The determination unit 8 analyzes an image captured by the camera 6 and binarizes the captured image, for example, and determines whether or not foreign matter exists in the sealing resin 54 part of the chip LED 50.

以上の構成を備えた本例の検査装置1によれば、以下のようにして、チップLED50が検査される。   According to the inspection apparatus 1 of the present example having the above configuration, the chip LED 50 is inspected as follows.

まず、検査対象たるチップLED50を適宜搬送手段により搬送して、前記支持部材5上の検査領域、即ち、前記カメラの撮像視野領域内に位置させる。   First, the chip LED 50 to be inspected is appropriately transported by a transport means and is positioned in the inspection area on the support member 5, that is, in the imaging field area of the camera.

前記支持部材5上の前記検査領域では、上部照明機構10によってチップLED50の表面側が照明されるとともに、下部照明機構7によって当該チップLED50の裏面側が照明され、この状態で、当該チップLED50の表面側の画像がカメラ6によって撮像される。   In the inspection area on the support member 5, the upper illumination mechanism 10 illuminates the front surface side of the chip LED 50, and the lower illumination mechanism 7 illuminates the rear surface side of the chip LED 50, and in this state, the front surface side of the chip LED 50 Are captured by the camera 6.

上述したように、上部照明機構10の第1照明部11はチップLED50の表面全体を照明し、第2照明部は、チップLED50の、凸曲面部54aの外周部を及びこれより外側のチップLED50を含む環状領域を照明しており、下部照明機構7を用いないで、この上部照明機構10のみを用いて照明した場合、チップLED50の撮像画像は図9に示すようになる。   As described above, the first illumination unit 11 of the upper illumination mechanism 10 illuminates the entire surface of the chip LED 50, and the second illumination unit covers the outer peripheral portion of the convex curved surface portion 54a of the chip LED 50 and the chip LED 50 outside this. 9 is illuminated, and when the illumination is performed using only the upper illumination mechanism 10 without using the lower illumination mechanism 7, a captured image of the chip LED 50 is as shown in FIG.

即ち、電極部52及び発光部53は比較的良く光を反射するため、第1照明部11から照射され、封止樹脂部54及び基板51を透過した光は、当該電極部52及び発光部53によって反射され、再度、基板51及び封止樹脂54を透過してカメラ6に入光するため、同部が明部となり、電極52の存在しない部分は、暗部となるのである。   That is, since the electrode part 52 and the light emitting part 53 reflect light relatively well, the light emitted from the first illumination part 11 and transmitted through the sealing resin part 54 and the substrate 51 is the electrode part 52 and the light emitting part 53. The light passes through the substrate 51 and the sealing resin 54 and enters the camera 6 again, so that the portion becomes a bright portion and the portion where the electrode 52 does not exist becomes a dark portion.

また、凸曲面部54aの外周部(基板51からの立ち上がり部分)については、第2照明部20によって、当該凸曲面部54aがその外方の斜め上方から照明されるので、当該凸曲面部54aの外周部も十分な光量で照明され、このため、同部によって反射され、或いは同部を透過した十分な光量がカメラ6に入光され、当該凸曲面部54aの外周部が明部となる。   In addition, for the outer peripheral portion (the rising portion from the substrate 51) of the convex curved surface portion 54a, the convex lighting portion 54a is illuminated by the second illumination unit 20 from obliquely upward on the outer side, and thus the convex curved surface portion 54a. A sufficient amount of light that is reflected by or transmitted through the same part is incident on the camera 6, and the outer peripheral part of the convex curved surface part 54a becomes a bright part. .

一方、前記上部照明機構10から照射され、前記チップLED50の電極部52,52間を通過した光は、下部照明機構7の反射面によって反射され、再度、基板51及び封止樹脂54を透過してカメラ6に入光する。したがって、図10に示すように、当該カメラ6によって撮像されるチップLED50の電極部52,52間の画像も明部となる。尚、図10では、この下部照明機構7の作用を強調して説明するために、上部照明機構10によるチップLED50表面への照明効果を無視して図示している。   On the other hand, the light irradiated from the upper illumination mechanism 10 and passed between the electrode portions 52 and 52 of the chip LED 50 is reflected by the reflection surface of the lower illumination mechanism 7 and again passes through the substrate 51 and the sealing resin 54. To enter the camera 6. Therefore, as shown in FIG. 10, the image between the electrode portions 52 and 52 of the chip LED 50 imaged by the camera 6 is also a bright portion. In FIG. 10, in order to emphasize and explain the operation of the lower illumination mechanism 7, the illumination effect on the surface of the chip LED 50 by the upper illumination mechanism 10 is ignored.

斯くして、前記上部照明機構10及び下部照明機構7により照明されたチップLED50の、カメラ6による撮像画像は、図9及び図10に示した画像を重畳した、チップLED50の表面全面が明部となった画像となる(図11参照)。   Thus, the image taken by the camera 6 of the chip LED 50 illuminated by the upper illumination mechanism 10 and the lower illumination mechanism 7 is a bright part over the entire surface of the chip LED 50 on which the images shown in FIGS. 9 and 10 are superimposed. (See FIG. 11).

したがって、チップLED50の封止樹脂54部に不透光性の異物が存在する場合、図11に示すように、前記カメラ6によって撮像される画像は、当該異物57のみが暗部となった画像となる。   Therefore, when there is an opaque substance in the sealing resin 54 part of the chip LED 50, as shown in FIG. 11, the image captured by the camera 6 is an image in which only the foreign substance 57 is a dark part. Become.

前記判定部8には、カメラ6によって撮像されたこのような画像が送信され、送信された画像が当該判定部8において解析され、前記異物57の有無が判定される。その際、カメラ6によって撮像される画像は異物57のみが暗部となるので、当該異物57の検出を容易且つ正確に行うことができる。   Such an image captured by the camera 6 is transmitted to the determination unit 8, and the transmitted image is analyzed by the determination unit 8 to determine the presence or absence of the foreign matter 57. At that time, since only the foreign object 57 is a dark part of the image captured by the camera 6, the foreign object 57 can be detected easily and accurately.

以後、支持部材5上に載置されたチップLEDを順次新たなものと交換して、上記一連の検査を行うことで、多数のチップLEDについて連続的に異物検査が行われる。   Thereafter, the chip LEDs placed on the support member 5 are sequentially replaced with new ones, and the above-described series of inspections are performed, whereby foreign matter inspection is continuously performed on a large number of chip LEDs.

以上、本発明の一実施形態について説明したが、本発明が採り得る具体的な態様は、何らこれに限定されるものではなく、本発明の趣旨を逸脱しない範囲で他の態様を採り得る。   As mentioned above, although one Embodiment of this invention was described, the specific aspect which this invention can take is not limited to this at all, Other aspects can be taken in the range which does not deviate from the meaning of this invention.

例えば、下部照明機構7は、これを反射面が白色の反射板から構成したが、これに限られるものではなく、LEDランプなどの光源を用いた照明機構としても良い。この場合、拡散透光膜などを介在させて、拡散光による照明とするのが好ましい。   For example, the lower illumination mechanism 7 is composed of a reflection plate having a white reflection surface, but is not limited thereto, and may be an illumination mechanism using a light source such as an LED lamp. In this case, it is preferable to use a diffused light transmissive film or the like for illumination with diffused light.

また、検査対象物としてのチップLEDの形態は、上例のものに限られるものではなく、凸曲面状をした封止樹脂を有するものについては、本発明に係る検査装置によって、異物の有無を良好に検査することができ、凸曲面部の形状についても何ら限定されない。   In addition, the form of the chip LED as the inspection object is not limited to the above example, and the inspection device according to the present invention is used to check for the presence or absence of foreign matter for those having a convex curved sealing resin. It is possible to inspect well, and the shape of the convex curved surface portion is not limited at all.

また、支持部材5を、白色を呈する材料から構成すれば、電極部52,52間など、表裏面に透光可能な部分も明部となるため、この場合には、前記下部照明機構7は不要である。また、基板51の全面に電極部52が形成されているなど、表裏面に透光可能な部分が存在しない場合にも、前記下部照明機構7は不要である。   In addition, if the support member 5 is made of a material exhibiting white, a portion that can transmit light on the front and back surfaces, such as between the electrode portions 52 and 52, is also a bright portion. In this case, the lower illumination mechanism 7 is It is unnecessary. Further, the lower illumination mechanism 7 is not necessary even when there is no translucent portion on the front and back surfaces, such as the electrode portion 52 formed on the entire surface of the substrate 51.

また、上例では、前記支持部材5を固定したものとしたが、チップLED50が載置された状態の支持部材5を移動させて、当該チップLED50を適宜搬送速度で前記検査領域内を通過させるようにしても良い。   In the above example, the support member 5 is fixed. However, the support member 5 in a state where the chip LED 50 is placed is moved, and the chip LED 50 is allowed to pass through the inspection region at an appropriate transport speed. You may do it.

1 検査装置
5 支持部材
6 カメラ
7 下部照明機構
8 判定部
10 上部照明機構
11 第1照明部
12 本体部
13 上本体
15 下本体
19 LEDランプ
20 第2照明部
21 本体
23 LEDランプ
24 拡散透光膜
50 チップLED
51 基板
52 電極
53 発光部
54 封止樹脂
56 異物
DESCRIPTION OF SYMBOLS 1 Inspection apparatus 5 Support member 6 Camera 7 Lower illumination mechanism 8 Judgment part 10 Upper illumination mechanism 11 1st illumination part 12 Main body part 13 Upper main body 15 Lower main body 19 LED lamp 20 2nd illumination part 21 Main body 23 LED lamp 24 Diffuse light transmission Membrane 50 chip LED
51 Substrate 52 Electrode 53 Light Emitting Unit 54 Sealing Resin 56 Foreign Material

Claims (5)

透光性を有する基板と、該基板の裏面に形成された不透光性の電極部と、前記基板の表面中央部に配設された発光部と、前記基板表面を被覆して前記発光部を封止する透光性の封止樹脂とから構成され、該封止樹脂の少なくとも前記発光部を覆う部分が凸曲面状に形成されたチップLEDの、前記封止樹脂に混入又はその表面に付着した不透光性の異物を検出する検査装置であって、
前記チップLEDを支持する板状又はシート状の支持部材と、
前記支持部材より上方に配設され、該支持部材上に載置されたチップLEDの表面側の画像を撮像するカメラと、
同じく前記支持部材より上方に配設され、該支持部材上に載置されたチップLEDの表面を照明する上部照明機構と、
前記カメラによって撮像された画像を解析して、前記異物の有無を判定する判定部とを備えてなり、
前記上部照明機構は、
下面中心部に円形の開口部を備え、且つ頂部に撮像用の開口部を備えたドーム状の本体と、該ドーム本体内に配設された複数の光源とからなり、前記ドーム本体は、その内部凹曲面が反射面をなし、前記光源は、前記ドーム本体の内部底面上にその周方向に等間隔に、且つ前記凹曲面に向けて光を照射するように配設されてなり、前記凹曲面によって反射された光が、前記ドーム本体の下面開口部から下方に向けて照射するように構成された第1照明部と、
リング状をした本体と、該リング本体の下面に、その周方向に等間隔に、且つ下方に向けて光を照射するように配設された複数の光源とを有する第2照明部とから構成され、
前記第2照明部は、そのリング本体が前記第1照明部のドーム本体と同軸となるように該第1照明部の下方に配設され、
更に、前記カメラは、前記第1照明部の上方に配設され、前記ドーム本体の撮像用開口部を通して前記チップLEDの表面画像を撮像するように構成されていることを特徴とするチップLED検査装置。
A light-transmitting substrate; a light-impermeable electrode portion formed on the back surface of the substrate; a light-emitting portion disposed in a central portion of the surface of the substrate; and the light-emitting portion covering the substrate surface Of a chip LED that is formed of a translucent sealing resin that seals at least a portion that covers at least the light emitting portion of the sealing resin, or is mixed into the sealing resin or on the surface thereof An inspection device for detecting attached light-transmitting foreign matter,
A plate-like or sheet-like support member for supporting the chip LED;
A camera that is arranged above the support member and that captures an image of the surface side of the chip LED placed on the support member;
An upper illumination mechanism that is also disposed above the support member and illuminates the surface of the chip LED placed on the support member;
A determination unit that analyzes an image captured by the camera and determines the presence or absence of the foreign matter,
The upper illumination mechanism is
A dome-shaped main body having a circular opening at the center of the lower surface and an image pickup opening at the top, and a plurality of light sources disposed in the dome main body, The inner concave curved surface forms a reflecting surface, and the light source is arranged on the inner bottom surface of the dome body so as to emit light toward the concave curved surface at equal intervals in the circumferential direction. A first illumination unit configured to irradiate the light reflected by the curved surface downward from the lower surface opening of the dome body;
A second illuminating unit having a ring-shaped main body and a plurality of light sources arranged on the lower surface of the ring main body so as to irradiate light at equal intervals in the circumferential direction and downward. And
The second illumination unit is disposed below the first illumination unit such that the ring body is coaxial with the dome body of the first illumination unit,
Further, the camera is disposed above the first illumination unit, and is configured to capture a surface image of the chip LED through an imaging opening of the dome body. apparatus.
前記第2照明部は、その光源の下方に配設された環状の拡散透光膜を備えていることを特徴とする請求項1記載のチップLED検査装置。   The chip LED inspection apparatus according to claim 1, wherein the second illuminating unit includes an annular diffusion light-transmitting film disposed below the light source. 前記支持部材が透明な部材から構成されてなり、
前記チップLED検査装置は、更に、前記支持部材より下方に配設され、該支持部材上に載置されたチップLEDの裏面を、該支持部材を透過して照明する下部照明機構を備えてなることを特徴とする請求項1又は2記載のチップLED検査装置。
The support member is made of a transparent member,
The chip LED inspection apparatus further includes a lower illumination mechanism that is disposed below the support member and that illuminates the back surface of the chip LED placed on the support member through the support member. The chip LED inspection apparatus according to claim 1 or 2, wherein
前記下部照明機構は、前記支持部材の下方に該支持部材と平行に配設され、該支持部材との対向面が反射面となった反射板から構成されることを特徴とする請求項3記載のチップLED検査装置。   The said lower illumination mechanism is arrange | positioned under the said supporting member in parallel with this supporting member, and is comprised from the reflecting plate by which the opposing surface with this supporting member became a reflective surface. Chip LED inspection device. 前記反射板の反射面は、白色を呈していることを特徴とする請求項4記載のチップLED検査装置。   The chip LED inspection apparatus according to claim 4, wherein a reflection surface of the reflection plate is white.
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