CN106153630A - Chip-R detection device - Google Patents
Chip-R detection device Download PDFInfo
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- CN106153630A CN106153630A CN201510203384.1A CN201510203384A CN106153630A CN 106153630 A CN106153630 A CN 106153630A CN 201510203384 A CN201510203384 A CN 201510203384A CN 106153630 A CN106153630 A CN 106153630A
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Abstract
The invention discloses a kind of automatization, high efficiency, high-precision Chip-R detection device, including high accuracy industrial camera, positive light source and transparent locating platform it is sequentially provided with below described high accuracy industrial camera, the described transparent locating platform back side is provided with backlight, described Chip-R detection device is also associated with automaton, and described automaton is provided with guidance panel.This device uses high accuracy industrial camera, and full wafer Chip-R is taken pictures and disposably completed tow sides defects detection.This device detection Chip-R efficiency is high, precision is high, unfailing performance is good, automaticity is high, that avoids workman uses eyestrain, and its function is also manually cannot be comparable, being reasonably separately mounted to above and below Chip-R by positive light source, backlight, the positive and negative completing Chip-R within 0.5 second is taken pictures.
Description
Technical field
The invention belongs to detect device field, particularly relate to Chip-R detection device.
Background technology
Along with electronic market quickly grows, electronics passive device such as Chip-R has evolved into high-quality, miniaturization, a part of defect of Chip-R is that logical positive light source could detect, another part needs back printing opacity to detect, traditional mode is that artificial microscope detects outward appearance and the defect of Chip-R by naked eyes, but manual detection has the lower fatigue that can produce of the most long-time detection of many shortcomings, such as human eye to cause the quality instability of Chip-R, production efficiency outward appearance precision low, tested inadequate；On the other hand cause product waste, such as a bad product in Chip-R, can together with ought a permutation all abandon not.Product appearance and defects detection unusual crux in whole processing procedure, open defect detection cannot ensure, can directly affect quality and the function of finished product product.
Summary of the invention
In order to solve the problems referred to above, the invention provides a kind of automatization, high efficiency, high-precision Chip-R detection device.
According to an aspect of the present invention, a kind of Chip-R detection device is provided, including high accuracy industrial camera, positive light source and transparent locating platform it is sequentially provided with below described high accuracy industrial camera, the described transparent locating platform back side is provided with backlight, described Chip-R detection device is also associated with automaton, and described automaton is provided with guidance panel.This device uses high accuracy industrial camera, and full wafer Chip-R is taken pictures and disposably completed tow sides defects detection.It provides the benefit that: this device detection Chip-R efficiency is high, precision is high, unfailing performance is good, automaticity is high, that avoids workman uses eyestrain, and its function is also manually cannot be comparable, being reasonably separately mounted to above and below Chip-R by positive light source, backlight, the positive and negative completing Chip-R within 0.5 second is taken pictures.
In some embodiments, described transparent locating platform is also associated with photoelectric sensor, and described photoelectric sensor connects automaton.It provides the benefit that: achieve the full automation of Chip-R detection.
Accompanying drawing explanation
Fig. 1 is the structural representation of the present invention.
In figure: 1-high accuracy industrial camera, the positive light source of 2-, the transparent locating platform of 3-, 4-backlight, 5-automaton, 6-photoelectric sensor, 7-guidance panel, 8-Chip-R.
Detailed description of the invention
1 the present invention is further illustrated below in conjunction with the accompanying drawings.Accompanying drawing 1 schematically shows Chip-R of the present invention detection device, as shown in Figure 1, including high accuracy industrial camera 1, positive light source 2 and transparent locating platform 3 it is sequentially provided with below described high accuracy industrial camera 1, described transparent locating platform 3 back side is provided with backlight 4, described Chip-R detection device is also associated with automaton 5, and described automaton is provided with guidance panel 7.Desired parameters is set in the guidance panel 7 of automaton 5, after Chip-R 8 is fixed on transparent locating platform 3, positive light source 2 is lighted, industrial camera 1 is taken pictures in high precision, after having taken pictures in front, positive light source 2 extinguishes, and backlight 4 is lighted, industrial camera is taken pictures again in high precision, and the reverse side completing Chip-R 8 takes phase.
In order to realize the full automation of Chip-R detection, described transparent locating platform 3 is also associated with photoelectric sensor 6, described photoelectric sensor connects automaton 5, and when photoelectric sensor 6 senses Chip-R 8, positive light source 2 is lighted, trigger high accuracy industrial camera 1, Chip-R 8 front takes after completing mutually, and positive light source 2 extinguishes, and backlight 4 is lighted, industrial camera 1 again triggers and takes pictures in high precision, completes Chip-R 8 back side and takes pictures.
Above-described is only some embodiments of the present invention, it is noted that for the person of ordinary skill of the art, on the premise of the creation without departing from the present invention is conceived, it is also possible to making other deformation and improve, these broadly fall into protection scope of the present invention.
Claims (2)
1. Chip-R detection device, it is characterized in that, including high accuracy industrial camera (1), described high accuracy industrial camera (1) lower section is sequentially provided with positive light source (2) and transparent locating platform (3), described transparent locating platform (3) back side is provided with backlight (4), described Chip-R detection device is also associated with automaton (5), and described automaton is provided with guidance panel (7).
2. Chip-R detection device as claimed in claim 1, it is characterised in that described transparent locating platform (3) is also associated with photoelectric sensor (6), and described photoelectric sensor connects automaton (5).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510203384.1A CN106153630A (en) | 2015-04-27 | 2015-04-27 | Chip-R detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510203384.1A CN106153630A (en) | 2015-04-27 | 2015-04-27 | Chip-R detection device |
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| CN106153630A true CN106153630A (en) | 2016-11-23 |
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| CN201510203384.1A Pending CN106153630A (en) | 2015-04-27 | 2015-04-27 | Chip-R detection device |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107486412A (en) * | 2017-04-27 | 2017-12-19 | 安徽华脉科技发展有限公司 | A kind of target surface Defect Detection system based on machine vision |
| CN108528958A (en) * | 2018-04-14 | 2018-09-14 | 安徽工程大学 | A kind of radome ground transport case |
| CN109406542A (en) * | 2017-08-16 | 2019-03-01 | 旺矽科技股份有限公司 | Optical detection system |
| CN111982931A (en) * | 2020-08-27 | 2020-11-24 | 惠州高视科技有限公司 | High-precision wafer surface defect detection device and detection method thereof |
| CN111998888A (en) * | 2020-08-27 | 2020-11-27 | 无锡和博永新科技有限公司 | Camera device for detecting appearance of resistor |
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| JP3189500B2 (en) * | 1993-06-25 | 2001-07-16 | 松下電器産業株式会社 | Apparatus and method for inspecting appearance of electronic components |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107486412A (en) * | 2017-04-27 | 2017-12-19 | 安徽华脉科技发展有限公司 | A kind of target surface Defect Detection system based on machine vision |
| CN109406542A (en) * | 2017-08-16 | 2019-03-01 | 旺矽科技股份有限公司 | Optical detection system |
| CN108528958A (en) * | 2018-04-14 | 2018-09-14 | 安徽工程大学 | A kind of radome ground transport case |
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| CN111982931A (en) * | 2020-08-27 | 2020-11-24 | 惠州高视科技有限公司 | High-precision wafer surface defect detection device and detection method thereof |
| CN111998888A (en) * | 2020-08-27 | 2020-11-27 | 无锡和博永新科技有限公司 | Camera device for detecting appearance of resistor |
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Application publication date: 20161123 |
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