JP2012009618A5 - - Google Patents
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- Publication number
- JP2012009618A5 JP2012009618A5 JP2010144103A JP2010144103A JP2012009618A5 JP 2012009618 A5 JP2012009618 A5 JP 2012009618A5 JP 2010144103 A JP2010144103 A JP 2010144103A JP 2010144103 A JP2010144103 A JP 2010144103A JP 2012009618 A5 JP2012009618 A5 JP 2012009618A5
- Authority
- JP
- Japan
- Prior art keywords
- probe
- eccentric cam
- holder
- sample
- motor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims 10
- 238000005259 measurement Methods 0.000 claims 2
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010144103A JP2012009618A (ja) | 2010-06-24 | 2010-06-24 | 抵抗率測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010144103A JP2012009618A (ja) | 2010-06-24 | 2010-06-24 | 抵抗率測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2012009618A JP2012009618A (ja) | 2012-01-12 |
| JP2012009618A5 true JP2012009618A5 (enExample) | 2013-08-08 |
Family
ID=45539842
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010144103A Pending JP2012009618A (ja) | 2010-06-24 | 2010-06-24 | 抵抗率測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2012009618A (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN120280366B (zh) * | 2025-06-06 | 2025-09-19 | 浙江求是半导体设备有限公司 | 晶圆电阻率的检测方法、装置及电子设备和存储介质 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07151800A (ja) * | 1993-11-30 | 1995-06-16 | Kokusai Electric Co Ltd | 比抵抗測定装置 |
| JP3946072B2 (ja) * | 2002-03-29 | 2007-07-18 | 株式会社日立国際電気エンジニアリング | 半導体ウェーハ測定器 |
| JP2005311009A (ja) * | 2004-04-21 | 2005-11-04 | Kokusai Electric Alhpa Co Ltd | 半導体ウェーハ抵抗率測定装置 |
| JP2008241484A (ja) * | 2007-03-27 | 2008-10-09 | Fujitsu Ltd | 半導体素子の試験装置および半導体素子の試験方法 |
| JP2010122108A (ja) * | 2008-11-20 | 2010-06-03 | Oki Semiconductor Co Ltd | プローブカード及びそれを用いたテスト方法半導体試験装置 |
-
2010
- 2010-06-24 JP JP2010144103A patent/JP2012009618A/ja active Pending
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