JP2011525237A5 - - Google Patents

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Publication number
JP2011525237A5
JP2011525237A5 JP2011512528A JP2011512528A JP2011525237A5 JP 2011525237 A5 JP2011525237 A5 JP 2011525237A5 JP 2011512528 A JP2011512528 A JP 2011512528A JP 2011512528 A JP2011512528 A JP 2011512528A JP 2011525237 A5 JP2011525237 A5 JP 2011525237A5
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JP
Japan
Prior art keywords
sample
particles
particle
magnetic field
distance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2011512528A
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English (en)
Japanese (ja)
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JP2011525237A (ja
JP5753080B2 (ja
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Priority claimed from PCT/US2008/065470 external-priority patent/WO2009014811A2/en
Application filed filed Critical
Priority claimed from PCT/US2009/045145 external-priority patent/WO2009148881A2/en
Publication of JP2011525237A publication Critical patent/JP2011525237A/ja
Publication of JP2011525237A5 publication Critical patent/JP2011525237A5/ja
Application granted granted Critical
Publication of JP5753080B2 publication Critical patent/JP5753080B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2011512528A 2008-06-02 2009-05-26 電子検出システム及び方法 Expired - Fee Related JP5753080B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
USPCT/US2008/065470 2008-06-02
PCT/US2008/065470 WO2009014811A2 (en) 2007-06-08 2008-06-02 Ice layers in charged particle systems and methods
US7425608P 2008-06-20 2008-06-20
US61/074,256 2008-06-20
PCT/US2009/045145 WO2009148881A2 (en) 2008-06-02 2009-05-26 Electron detection systems and methods

Publications (3)

Publication Number Publication Date
JP2011525237A JP2011525237A (ja) 2011-09-15
JP2011525237A5 true JP2011525237A5 (https=) 2012-07-12
JP5753080B2 JP5753080B2 (ja) 2015-07-22

Family

ID=40852005

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011512528A Expired - Fee Related JP5753080B2 (ja) 2008-06-02 2009-05-26 電子検出システム及び方法

Country Status (4)

Country Link
US (1) US20110127428A1 (https=)
EP (1) EP2288905A2 (https=)
JP (1) JP5753080B2 (https=)
WO (1) WO2009148881A2 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9767986B2 (en) * 2014-08-29 2017-09-19 Kla-Tencor Corporation Scanning electron microscope and methods of inspecting and reviewing samples
TWI573077B (zh) * 2015-03-27 2017-03-01 凌通科技股份有限公司 電子印刷品的自動頁面檢測方法以及使用其之電子印刷品

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58110956U (ja) * 1982-01-22 1983-07-28 株式会社日立製作所 荷電粒子照射装置
FR2584234B1 (fr) * 1985-06-28 1988-12-09 Cameca Testeur de circuit integre a faisceau d'electrons
JPH0616400B2 (ja) * 1986-11-28 1994-03-02 日本電信電話株式会社 荷電ビ−ム観察装置
JP3148353B2 (ja) * 1991-05-30 2001-03-19 ケーエルエー・インストルメンツ・コーポレーション 電子ビーム検査方法とそのシステム
JPH0696712A (ja) * 1992-09-14 1994-04-08 Hitachi Ltd 集束イオンビーム装置
DE69638126D1 (de) * 1995-10-19 2010-04-01 Hitachi Ltd Rasterelektronenmikroskop
JP3749107B2 (ja) * 1999-11-05 2006-02-22 ファブソリューション株式会社 半導体デバイス検査装置
JP2003524867A (ja) * 2000-02-09 2003-08-19 エフ・イ−・アイ・カンパニー 集束イオンビームシステムのための二次粒子のレンズ通過捕捉
US6683320B2 (en) * 2000-05-18 2004-01-27 Fei Company Through-the-lens neutralization for charged particle beam system
EP1388883B1 (en) * 2002-08-07 2013-06-05 Fei Company Coaxial FIB-SEM column
EP1463087B1 (en) * 2003-03-24 2010-06-02 ICT, Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik Mbh Charged particle beam device
US7557359B2 (en) * 2003-10-16 2009-07-07 Alis Corporation Ion sources, systems and methods
CN101248505B (zh) * 2005-07-08 2010-12-15 耐克斯金思美控股公司 受控粒子束制造用的设备和方法
US20070227883A1 (en) * 2006-03-20 2007-10-04 Ward Billy W Systems and methods for a helium ion pump
US7541580B2 (en) * 2006-03-31 2009-06-02 Fei Company Detector for charged particle beam instrument
US7804068B2 (en) * 2006-11-15 2010-09-28 Alis Corporation Determining dopant information

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