JP2011523451A5 - - Google Patents

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Publication number
JP2011523451A5
JP2011523451A5 JP2010542706A JP2010542706A JP2011523451A5 JP 2011523451 A5 JP2011523451 A5 JP 2011523451A5 JP 2010542706 A JP2010542706 A JP 2010542706A JP 2010542706 A JP2010542706 A JP 2010542706A JP 2011523451 A5 JP2011523451 A5 JP 2011523451A5
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Japan
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light
detector
photon counting
light source
information
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JP2010542706A
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Japanese (ja)
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JP2011523451A (ja
JP5259736B2 (ja
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Priority claimed from PCT/IB2009/005020 external-priority patent/WO2009090562A2/en
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Publication of JP2011523451A5 publication Critical patent/JP2011523451A5/ja
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JP2010542706A 2008-01-15 2009-01-15 粒子測定装置及び粒子特性測定方法 Active JP5259736B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US1114308P 2008-01-15 2008-01-15
US61/011,143 2008-01-15
PCT/IB2009/005020 WO2009090562A2 (en) 2008-01-15 2009-01-15 Light scattering measurements using simultaneous detection

Publications (3)

Publication Number Publication Date
JP2011523451A JP2011523451A (ja) 2011-08-11
JP2011523451A5 true JP2011523451A5 (https=) 2011-11-10
JP5259736B2 JP5259736B2 (ja) 2013-08-07

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JP2010542706A Active JP5259736B2 (ja) 2008-01-15 2009-01-15 粒子測定装置及び粒子特性測定方法

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US (1) US10006851B2 (https=)
EP (1) EP2235501B1 (https=)
JP (1) JP5259736B2 (https=)
CN (1) CN102066901B (https=)
WO (1) WO2009090562A2 (https=)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10006851B2 (en) 2008-01-15 2018-06-26 Malvern Panalytical Limited Light scattering measurements using simultaneous detection
EP2467701B1 (en) 2009-08-17 2021-10-06 Malvern Panalytical Limited Dynamic light scattering based microrheology of complex fluids with improved single-scattering mode detection
JP5797884B2 (ja) * 2010-08-04 2015-10-21 株式会社日立ハイテクノロジーズ 光量検出方法及びその装置
GB2493391B (en) * 2011-08-05 2015-09-16 Malvern Instr Ltd Optical detection and analysis of particles
GB2494735B (en) * 2011-09-14 2017-10-25 Malvern Instr Ltd Apparatus for measuring particle-size distribution by light scattering
DE102013015016A1 (de) * 2013-09-07 2014-09-18 Testo Ag Verfahren zur Partikeldetektion in einem partikelhaltigen Fluid und korrespondierende Partikeldetektionsvorrichtung
US20150355147A1 (en) * 2014-06-06 2015-12-10 Biogénesis Bagó Uruguay S.A. High throughput quantification and characterization of foot and mouth disease virus and products thereof
US10203271B1 (en) * 2015-07-06 2019-02-12 Malvern Panalytical Limited Particle interaction characterization using overlapping scattering and concentration measurements
US11002655B2 (en) 2015-09-23 2021-05-11 Malvern Panalytical Limited Cuvette carrier
EP4215900A1 (en) 2015-09-23 2023-07-26 Malvern Panalytical Limited Particle characterisation
GB201604460D0 (en) * 2016-03-16 2016-04-27 Malvern Instr Ltd Dynamic light scattering
CN107884317A (zh) * 2016-09-29 2018-04-06 香港城市大学 颗粒物传感器
JP7492826B2 (ja) 2016-10-21 2024-05-30 ザ ユナイテッド ステイツ オブ アメリカ， アズ リプレゼンテッド バイ ザ セクレタリー， デパートメント オブ ヘルス アンド ヒューマン サービシーズ 分子ナノタグ
EP3379232A1 (en) 2017-03-23 2018-09-26 Malvern Panalytical Limited Particle characterisation
CN107782643A (zh) * 2017-09-27 2018-03-09 华中科技大学 一种高浓度颗粒群的光纤动态光散射检测方法
CN107796741A (zh) * 2017-09-27 2018-03-13 华中科技大学 一种高浓度颗粒群的光纤动态光散射检测装置
SE543406C2 (en) * 2019-05-15 2021-01-05 Nanosized Sweden Ab Water impurity measurements with dynamic light scattering
CN111404012B (zh) * 2020-02-24 2021-06-25 苏州大学 一种纳米球光场的前向零散射调控方法
SE545450C2 (en) * 2021-03-24 2023-09-12 Scienta Omicron Ab Charged particle spectrometer and method for calibration
CN117571708A (zh) * 2023-11-22 2024-02-20 拓荆科技(上海)有限公司 一种液态源的汽化状态监测装置及方法

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US4710025A (en) * 1982-06-22 1987-12-01 Wyatt Technology Company Process for characterizing suspensions of small particles
US4830494A (en) * 1986-07-10 1989-05-16 Kowa Company Ltd. Method and apparatus for measuring particles in a fluid
JPH02212742A (ja) * 1989-02-13 1990-08-23 Kowa Co 液中微粒子測定装置
JP3290786B2 (ja) * 1993-11-26 2002-06-10 シスメックス株式会社 粒子分析装置
FI98765C (fi) * 1995-01-16 1997-08-11 Erkki Soini Virtaussytometrinen menetelmä ja laite
US5627642A (en) * 1995-08-11 1997-05-06 The Research Foundation Of State University Of New York Method and apparatus for submicroscopic particle sizing by measuring degree of coherence
US5956139A (en) * 1997-08-04 1999-09-21 Ohio Aerospace Institute Cross-correlation method and apparatus for suppressing the effects of multiple scattering
JP3393817B2 (ja) * 1998-10-16 2003-04-07 株式会社堀場製作所 粒径分布測定装置
CN1116601C (zh) * 2001-03-30 2003-07-30 中国科学院上海光学精密机械研究所 光学尘埃粒子计数器的光学探头
JP4105888B2 (ja) 2002-04-17 2008-06-25 株式会社堀場製作所 粒子径分布測定装置
CN100434899C (zh) * 2004-04-29 2008-11-19 中国科学院安徽光学精密机械研究所 气溶胶粒谱(质谱)飞行时间检测方法及装置
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