JP2011522366A - 改善した質量分析法 - Google Patents
改善した質量分析法 Download PDFInfo
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- JP2011522366A JP2011522366A JP2011511093A JP2011511093A JP2011522366A JP 2011522366 A JP2011522366 A JP 2011522366A JP 2011511093 A JP2011511093 A JP 2011511093A JP 2011511093 A JP2011511093 A JP 2011511093A JP 2011522366 A JP2011522366 A JP 2011522366A
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- 238000004949 mass spectrometry Methods 0.000 title claims abstract description 12
- 239000013307 optical fiber Substances 0.000 claims abstract description 46
- 238000000034 method Methods 0.000 claims abstract description 11
- 238000003384 imaging method Methods 0.000 claims abstract description 8
- 239000011159 matrix material Substances 0.000 claims abstract description 6
- 238000003795 desorption Methods 0.000 claims abstract description 5
- 150000002500 ions Chemical class 0.000 claims description 21
- 229910052779 Neodymium Inorganic materials 0.000 claims description 5
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 claims description 5
- LSGOVYNHVSXFFJ-UHFFFAOYSA-N vanadate(3-) Chemical compound [O-][V]([O-])([O-])=O LSGOVYNHVSXFFJ-UHFFFAOYSA-N 0.000 claims description 3
- 229910052727 yttrium Inorganic materials 0.000 claims description 3
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 claims description 3
- 229910052769 Ytterbium Inorganic materials 0.000 claims description 2
- 239000013078 crystal Substances 0.000 claims description 2
- HIQSCMNRKRMPJT-UHFFFAOYSA-J lithium;yttrium(3+);tetrafluoride Chemical compound [Li+].[F-].[F-].[F-].[F-].[Y+3] HIQSCMNRKRMPJT-UHFFFAOYSA-J 0.000 claims description 2
- NAWDYIZEMPQZHO-UHFFFAOYSA-N ytterbium Chemical compound [Yb] NAWDYIZEMPQZHO-UHFFFAOYSA-N 0.000 claims description 2
- 230000008878 coupling Effects 0.000 abstract description 10
- 238000010168 coupling process Methods 0.000 abstract description 10
- 238000005859 coupling reaction Methods 0.000 abstract description 10
- 230000035945 sensitivity Effects 0.000 abstract description 9
- 238000013480 data collection Methods 0.000 abstract description 5
- 238000000816 matrix-assisted laser desorption--ionisation Methods 0.000 abstract 1
- 239000000523 sample Substances 0.000 description 30
- 238000001819 mass spectrum Methods 0.000 description 5
- 239000000835 fiber Substances 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 238000001871 ion mobility spectroscopy Methods 0.000 description 3
- 229910009372 YVO4 Inorganic materials 0.000 description 2
- 239000012472 biological sample Substances 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000011835 investigation Methods 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 229910019655 synthetic inorganic crystalline material Inorganic materials 0.000 description 2
- 239000008186 active pharmaceutical agent Substances 0.000 description 1
- JNDMLEXHDPKVFC-UHFFFAOYSA-N aluminum;oxygen(2-);yttrium(3+) Chemical compound [O-2].[O-2].[O-2].[Al+3].[Y+3] JNDMLEXHDPKVFC-UHFFFAOYSA-N 0.000 description 1
- 239000012491 analyte Substances 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000001413 cellular effect Effects 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 229940079593 drug Drugs 0.000 description 1
- 238000000105 evaporative light scattering detection Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 238000000752 ionisation method Methods 0.000 description 1
- 238000002157 matrix-assisted laser desorption-ionisation imaging mass spectrometry Methods 0.000 description 1
- 239000002207 metabolite Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000003094 perturbing effect Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 102000004169 proteins and genes Human genes 0.000 description 1
- 108090000623 proteins and genes Proteins 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 1
- 229910019901 yttrium aluminum garnet Inorganic materials 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
- H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
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- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
- Lasers (AREA)
Abstract
【選択図】図1
Description
振動連結部109が動作モードおよび非動作モードであるMALDI−MSI機器の感度における効果を測定して、比較調査を実施した。この結果を図2乃至図4に示す。
Claims (14)
- レーザ光を生成する手段と;
前記レーザ光をイオン源に送達するマルチモード光ファイバと;
前記イオン源における前記レーザ光の空間的な強度分布が1よりも多くの強度ピークを示すように、前記光ファイバを振動させるよう構成された振動手段とを具える質量分析計。 - 請求項1に記載の質量分析計において、前記振動手段が、機械的な振動装置を具えることを特徴とする質量分析計。
- 請求項1に記載の質量分析計において、前記振動手段が、圧電スイッチを具えることを特徴とする
- 請求項1乃至3の何れか一項に記載の質量分析計において、前記振動手段が、前記光ファイバと物理的に連結されることを特徴とする質量分析計。
- 請求項1に記載の質量分析計において、前記振動手段が、前記光ファイバを振動させるために当該光ファイバの領域に空気の波動を生成する手段を具えることを特徴とする質量分析計。
- 請求項1乃至5の何れか一項に記載の質量分析計において、前記レーザ光を生成する手段が利得媒体を具えており、当該利得媒体が:
YAGと;
イットリウムオルソバナジウム(Yttrium ortho vanadate)と;
イットリウム・フッ化リチウム(Yttrium lithium fluoride)のうちの任意の1つまたはこれらの組合せを含むことを特徴とする質量分析計。 - 請求項6に記載の質量分析計において、前記レーザ光を生成する手段がさらに:
ネオジムと;
イッテルビウムのうちの任意の1つまたはこれらの組合せを含むことを特徴とする質量分析計。 - 請求項6に記載の質量分析計において、前記レーザ光を生成する手段がさらに、周波数を変換する1またはそれ以上の非線形結晶を具えることを特徴とする質量分析計。
- 請求項1乃至8の何れか一項に記載の質量分析計がさらに試料チャンバを具えており、前記レーザ光が前記試料チャンバ内を向くように前記光ファイバが前記試料チャンバと連結されることを特徴とする質量分析計。
- 請求項9に記載の質量分析計において、前記振動手段が、前記光ファイバを振動させるために当該光ファイバの長さに沿って前記試料チャンバから1乃至5cm離れて配置されることを特徴とする質量分析計。
- 請求項1乃至10の何れか一項に記載の質量分析計が、イメージング質量分析計であることを特徴とする質量分析計。
- 請求項1乃至11の何れか一項に記載の質量分析計が、マトリックス支援レーザ脱離/イオン化質量分析計であることを特徴とする質量分析計。
- マトリックス支援レーザ脱離/イオン化質量分析の一部としてレーザ光を試料に送達する方法において:
レーザ光を生成するステップと;
マルチモード光ファイバを用いて前記レーザ光をイオン源に送達するステップと;
前記イオン源における前記レーザ光の空間的な強度分布が1よりも多くの強度ピークを示すように、前記光ファイバの長さに沿った領域において振動手段を用いて前記光ファイバを振動させるステップとを具えることを特徴とする方法。 - 請求項13に記載の方法が、質量分析イメージング法であることを特徴とする方法。
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB0809768.5A GB0809768D0 (en) | 2008-05-29 | 2008-05-29 | Improvements to mass spectrometry |
GB0809768.5 | 2008-05-29 | ||
GB0810917.5 | 2008-06-16 | ||
GB0810917A GB2460478B (en) | 2008-05-29 | 2008-06-16 | Improvements to mass spectrometry |
PCT/GB2009/050532 WO2009144487A2 (en) | 2008-05-29 | 2009-05-18 | Improvements to mass spectrometry |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2011522366A true JP2011522366A (ja) | 2011-07-28 |
Family
ID=39637790
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011511093A Pending JP2011522366A (ja) | 2008-05-29 | 2009-05-18 | 改善した質量分析法 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20120025068A1 (ja) |
EP (1) | EP2297770B1 (ja) |
JP (1) | JP2011522366A (ja) |
CN (1) | CN102124540B (ja) |
GB (2) | GB0809768D0 (ja) |
WO (1) | WO2009144487A2 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013073373A1 (en) * | 2011-11-17 | 2013-05-23 | Canon Kabushiki Kaisha | Mass distribution spectrometry method and mass distribution spectrometer |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8426806B2 (en) * | 2009-12-21 | 2013-04-23 | California Institute Of Technology | Differential mobility spectrometer with spatial ion detector and methods related thereto |
WO2018116464A1 (ja) * | 2016-12-22 | 2018-06-28 | オリンパス株式会社 | 走査型画像取得装置および走査型画像取得システム |
CN115248480B (zh) * | 2022-09-22 | 2022-11-29 | 鹏城实验室 | 一种基于分辨率靶标探测的空间光-光纤耦合装置及方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60121663A (ja) * | 1983-12-02 | 1985-06-29 | Murata Mfg Co Ltd | レ−ザ−励起イオン源 |
JPS63318061A (ja) * | 1987-06-19 | 1988-12-26 | Shimadzu Corp | 固体クロマトグラフィ質量分析方法 |
JPH09152308A (ja) * | 1995-11-29 | 1997-06-10 | Nissei Denki Kk | 変位センサ |
JP2005079084A (ja) * | 2003-08-29 | 2005-03-24 | Cyber Laser Kk | 赤外光源を搭載したイオン化装置 |
JP2007127485A (ja) * | 2005-11-02 | 2007-05-24 | Shimadzu Corp | イメージ質量分析装置 |
JP2007309860A (ja) * | 2006-05-22 | 2007-11-29 | Shimadzu Corp | Maldi用サンプル調製方法及び質量分析装置 |
Family Cites Families (11)
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GB2236185B (en) * | 1989-08-22 | 1994-03-23 | Finnigan Mat Gmbh | Process,specimen and device for making an analyte available for an investigation |
JP3249419B2 (ja) * | 1997-03-12 | 2002-01-21 | セイコーインスツルメンツ株式会社 | 走査型近接場光学顕微鏡 |
US6683894B1 (en) * | 2000-04-19 | 2004-01-27 | Science & Engineering Services, Inc. | Tunable IR laser source for MALDI |
AU8043901A (en) * | 2000-05-30 | 2001-12-11 | Univ Johns Hopkins | Threat identification for mass spectrometer system |
US6975898B2 (en) * | 2000-06-19 | 2005-12-13 | University Of Washington | Medical imaging, diagnosis, and therapy using a scanning single optical fiber system |
US7282706B2 (en) * | 2004-02-12 | 2007-10-16 | The Texas A&M University System | Advanced optics for rapidly patterned laser profiles in analytical spectrometry |
DE102004044196B4 (de) * | 2004-09-14 | 2019-03-07 | Bruker Daltonik Gmbh | Massenspektrometer mit einem Lasersystem für die Ionisation einer Probe durch matrixunterstützte Laserdesorption in der massenspektrometrischen Analyse |
DE102004061820A1 (de) * | 2004-12-22 | 2006-07-06 | Bruker Daltonik Gmbh | Lasersystem für die lonisation durch matrixunterstützte Laserdesorption (MALDI) im ultravioletten Spektralbereich (UV) |
GB2423187B (en) * | 2005-02-10 | 2010-10-27 | Bruker Daltonik Gmbh | Laser system for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis |
US7570889B2 (en) * | 2005-04-28 | 2009-08-04 | Lightwire, Inc. | Common electronic dispersion compensation arrangement for use with multiple optical communication channels |
WO2006132967A2 (en) * | 2005-06-03 | 2006-12-14 | Massachusetts Institute Of Technology | Method and apparatus for frequency-converting infrared light |
-
2008
- 2008-05-29 GB GBGB0809768.5A patent/GB0809768D0/en not_active Ceased
- 2008-06-16 GB GB0810917A patent/GB2460478B/en not_active Expired - Fee Related
-
2009
- 2009-05-18 EP EP09754132A patent/EP2297770B1/en not_active Not-in-force
- 2009-05-18 WO PCT/GB2009/050532 patent/WO2009144487A2/en active Application Filing
- 2009-05-18 CN CN2009801295981A patent/CN102124540B/zh not_active Expired - Fee Related
- 2009-05-18 US US12/994,684 patent/US20120025068A1/en not_active Abandoned
- 2009-05-18 JP JP2011511093A patent/JP2011522366A/ja active Pending
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60121663A (ja) * | 1983-12-02 | 1985-06-29 | Murata Mfg Co Ltd | レ−ザ−励起イオン源 |
JPS63318061A (ja) * | 1987-06-19 | 1988-12-26 | Shimadzu Corp | 固体クロマトグラフィ質量分析方法 |
JPH09152308A (ja) * | 1995-11-29 | 1997-06-10 | Nissei Denki Kk | 変位センサ |
JP2005079084A (ja) * | 2003-08-29 | 2005-03-24 | Cyber Laser Kk | 赤外光源を搭載したイオン化装置 |
JP2007127485A (ja) * | 2005-11-02 | 2007-05-24 | Shimadzu Corp | イメージ質量分析装置 |
JP2007309860A (ja) * | 2006-05-22 | 2007-11-29 | Shimadzu Corp | Maldi用サンプル調製方法及び質量分析装置 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013073373A1 (en) * | 2011-11-17 | 2013-05-23 | Canon Kabushiki Kaisha | Mass distribution spectrometry method and mass distribution spectrometer |
US9312116B2 (en) | 2011-11-17 | 2016-04-12 | Canon Kabushiki Kaisha | Mass distribution spectrometry method and mass distribution spectrometer |
Also Published As
Publication number | Publication date |
---|---|
GB0809768D0 (en) | 2008-07-09 |
US20120025068A1 (en) | 2012-02-02 |
GB2460478B (en) | 2011-08-03 |
EP2297770A2 (en) | 2011-03-23 |
CN102124540A (zh) | 2011-07-13 |
GB2460478A (en) | 2009-12-02 |
CN102124540B (zh) | 2013-10-23 |
EP2297770B1 (en) | 2012-12-05 |
WO2009144487A2 (en) | 2009-12-03 |
WO2009144487A3 (en) | 2010-02-11 |
GB0810917D0 (en) | 2008-07-23 |
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