JP2011227006A - Engraved mark inspection apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an engraved mark inspection apparatus enabling a laser beam irradiated on a bottom face of an engraved mark groove to be imaged surely while ensuring imaging brightness of the laser beam irradiated on both oblique faces of the engraved mark groove.SOLUTION: On a moving stage 43, there are provided a first line laser 51 that is arranged on a left side with an engraved mark section 4 of an inspection target 2 being a boundary and a second line laser 52 that is arranged on a right side with the engraved mark section 4 being the boundary. The first line laser 51 irradiates a first line laser beam 61 on an engraved mark face 3, and the second line laser 52 irradiates a second line laser beam 62 on the engraved mark face 3. A CCD camera 71 is provided between both of line lasers 51 and 52 of the moving stage 43 that images the engraved mark section 4 of the inspection target 2 from directly above, and thus, respective line laser beams 61 and 62 irradiated on the engraved mark section 4 can be imaged from a position facing the engraved mark section 4 by the CCD camera 71.

Description

  The present invention relates to a marking inspection apparatus for inspecting a stamped character or the like.

  Conventionally, when inspecting engraved characters engraved on a metal plate or the like, as shown in FIG. 3, a light cutting method 801 is used, and in this light cutting method 801, an object irradiated with a line laser beam 802 is used. In this method, a bright line 804 at a location 803 is captured by a camera, and the height is measured from the bright line position 806 of the captured image 805 (see, for example, Patent Document 1).

  In the marking inspection apparatus 811 using this light cutting method 801, as shown in FIG. 4, the line laser 814 provided on one side with the marking 813 of the target location 812 as a boundary, and the marking 813 as the boundary. A CCD camera 815 provided on the other side, which irradiates the target spot 812 with the line laser beam 816 from the line laser 814 and also emits a bright line 817 of the line laser beam 816 applied to the target spot 812. Can be imaged by the CCD camera 815.

  The CCD camera 815 is configured to output a captured image to a non-illustrated image processing device, and the image processing device performs image processing on the captured image from the CCD camera 815 to perform the imaging. The depth of the marking 813 provided at the target location 812 can be measured from the bright line position included in the image.

JP 2008-058150 A

  However, in such a conventional marking inspection apparatus 811, it is not possible to sufficiently secure the imaging brightness of the line laser beam 816 irradiated to the both inclined surfaces 822 and 823 of the marking groove 821 constituting the marking 813. It was. Further, the line laser beam 816 applied to the bottom surface 824 of the marking groove 821 could not be reliably imaged. For this reason, the presence / absence information of the engraving groove 821 can be obtained, but it has been difficult to obtain the depth information.

  More specifically, the line laser light 816 irradiated obliquely with respect to the marking 813 has a shallow incident angle on the laser-side marking groove slope 822 located on the line laser 814 side. For this reason, the line laser light 816 reflected by the laser-side marking groove slope 822 has a small reflection component toward the CCD camera 815 and is imaged very darkly.

  The CCD camera 815 is disposed obliquely with respect to the marking 813, and the line laser beam 816 reflected by the camera-side marking groove slope 823 located on the CCD camera 815 side has a shallow reflection angle in the camera direction. . For this reason, the line laser light 816 reflected by the camera-side marking groove slope 823 has a small reflection component toward the CCD camera 815 and is imaged very darkly.

  Since the CCD camera 815 is disposed obliquely with respect to the marking 813, the line laser beam 816 reflected by the bottom surface 824 of the marking groove 821 is blocked by the camera-side marking groove slope 823, and is successfully performed. I was unable to capture images.

  The present invention has been made in view of such a conventional problem. The laser light applied to the bottom surface of the marking groove is obtained while ensuring the imaging brightness of the laser light applied to both slopes of the marking groove. An object of the present invention is to provide a marking inspection apparatus capable of reliably imaging.

  In order to solve the above-mentioned problem, in the marking inspection apparatus according to claim 1 of the present invention, in the marking inspection apparatus for inspecting the marking portion stamped on the marking surface, the marking inspection device is arranged on one side with the marking portion as a boundary. A first slit light irradiating means for irradiating slit light in a line from an oblique direction with respect to the marking surface including the marking portion, and the other side of the marking portion as a boundary, and including the marking portion. A second slit light irradiating means for irradiating slit light in a line from an oblique direction with respect to the marking surface; and an imaging means for imaging the slit light irradiated to the marking portion from a position facing the marking portion. I have.

  That is, the marking portion formed on the marking surface is irradiated with slit light from the first slit light radiating means disposed on one side of the marking portion as a boundary from the oblique direction, and the marking portion is also marked with the marking portion. The slit light from the second slit light irradiating means arranged on the other side of the part is irradiated in a line from an oblique direction. Then, the slit light applied to the marking portion is imaged from a position facing the marking portion by an imaging unit.

  At this time, the marking portion stamped on the marking surface has a groove shape with a V-shaped cross section. For this reason, when the slit light from the first slit light irradiating means arranged on the one side is irradiated to the slope located on the other side of the marking groove from the diagonal direction, The reflection component in the direction is larger than the reflection component that reflects in the oblique direction on the other side.

  Further, when the slit light from the second slit light radiating means arranged on the other side is irradiated on the slope located on the one side of the marking groove from the oblique direction, the facing to the marking portion The reflection component in the direction is larger than the reflection component reflected in the one side oblique direction.

  Thereby, the reflected light of the slit light irradiated to the slopes located on the one and the other side is imaged with high brightness by an imaging means for imaging from a position facing the marking part.

  On the other hand, when the bottom surface of the marking groove forms a flat surface, the slit light applied to the bottom surface from the oblique direction on the one or the other side is imaged from the position facing the marking portion by the imaging means. For this reason, the slit light irradiated on the bottom surface is imaged by the imaging means without being obstructed by the slope as in the conventional case of imaging from the oblique direction of the one or the other side.

  Further, in the marking inspection apparatus according to claim 2, the angle formed between the perpendicular to the marking surface and the slit light from each of the slit light irradiation means is an inclined surface of a marking groove having a V-shaped cross section forming the marking portion. The slit light irradiation means are arranged so as to be smaller than the angle formed by the perpendicular.

  That is, the angle formed between the perpendicular to the marking surface and the slit light from each slit light irradiation means is set to be smaller than the angle formed between the slope of the marking groove and the perpendicular, and the slit light is caused by the slope. It reaches the bottom of the marking groove without being blocked.

  For this reason, compared with the case where the slit light can be blocked by the inclined surface by setting the angle formed by the perpendicular and the slit light to be larger than the angle formed by the inclined surface of the marking groove and the perpendicular, the slit Light can be irradiated over the entire bottom surface.

  As described above, in the marking inspection apparatus according to claim 1 of the present invention, the slit light applied to the inclined surfaces on the one side and the other side with the marking portion as a boundary is imaged from a position facing the marking portion. It is possible to pick up images with high brightness by the image pickup means.

  Thereby, it is possible to ensure the imaging brightness of the laser light applied to both slopes of the marking groove, and it is possible to clearly capture and analyze both slopes.

  On the other hand, the slit light irradiated on the bottom surface of the marking groove from the oblique direction of the one or the other side can be imaged from the position facing the marking portion by the imaging means.

  For this reason, it is possible to take an image with the imaging means without being obstructed by the slope as in the conventional case of taking an image of the slit light irradiated on the bottom surface from the oblique direction of the one or the other side.

  Thereby, since the laser beam irradiated to the bottom surface can be reliably imaged without omission, the state of the bottom surface can be clearly imaged and analyzed.

  Further, in the marking inspection apparatus according to claim 2, the angle formed between the perpendicular to the marking surface and the slit light from each slit light irradiation means is set to be smaller than the angle formed between the inclined surface of the marking groove and the perpendicular. Thus, the slit light can be applied to the bottom surface of the marking groove without being blocked by the inclined surface.

  For this reason, the angle formed by the perpendicular and the slit light is set to be larger than the angle formed by the slope of the marking groove and the perpendicular, so that the slit light can be blocked by the slope, Slit light can be irradiated over the entire bottom surface.

  Thereby, the laser beam irradiated over the whole bottom face can be imaged, and the state of the bottom face can be analyzed over the whole area.

It is a block diagram which shows one embodiment of this invention. It is explanatory drawing which shows operation | movement of the embodiment. It is explanatory drawing which shows the principle of operation of the conventional marking inspection apparatus. It is explanatory drawing which shows operation | movement of the conventional marking inspection apparatus.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

  FIG. 1 is a diagram showing a marking inspection apparatus 1 according to the present embodiment. The marking inspection apparatus 1 is an apparatus for inspecting a marking portion 4 stamped on a flat marking surface 3 provided on an inspection object 2. It is. The inspection object 2 is, for example, a product itself or a strip-shaped metal plate with a chassis number stamped thereon. In the present embodiment, the case of a metal plate will be described as an example.

  The inspection object 2 made of a metal plate set on the inspection table 11 is made of a rectangular metal plate, and the marking portion 4 made of a chassis number is formed on the marking surface 3 thereof. The marking portion 4 is composed of a plurality of marking characters, and each marking character is formed by a marking groove 12 stamped on the marking surface 3 as shown in FIG.

  The marking groove 12 has a V-shaped cross section, and the bottom surface 21 is a flat surface. A first inclined surface 22 and a second inclined surface 23 are erected from both ends of the bottom surface 21, and both the inclined surfaces 22, 23 are inclined so as to be separated from each other toward the marking surface 3 from the bottom surface 21.

  Both inclined surfaces 22 and 23 are configured to form a predetermined angle α, and the first inclined surface 22 forms a first inclination angle α1 with respect to a perpendicular 31 extending perpendicular to the marking surface 3. It is configured as follows. The second inclined surface 23 is configured to form a second inclination angle α2 with respect to the perpendicular line 31. In the present embodiment, the first inclination angle α1 and the second inclination angle α2 are , Are set to the same angle. The first inclination angle α1 and the second inclination angle α2 do not have to be the same angle.

  As shown in FIG. 1, a scanning unit 41 is provided on the inspection table 11, and a moving stage 43 is movably supported on the rail 42 of the scanning unit 41. Thereby, the scanning unit 41 is configured to be able to control the movement of the moving stage 43 in the vertical direction of the stamped character stamped on the inspection object 2. The moving stage 43 may be controlled to move in the arrangement direction of the stamped characters stamped on the inspection object 2.

  The moving stage 43 has a first slit light arranged on the left side in FIG. 1 with the marking portion 4 as a boundary in the inspection state in which the moving stage 43 is arranged on the marking portion 4 of the inspection object 2. A first line laser 51 as an irradiation means and a second line laser 52 as a second slit light irradiation means arranged on the right side in FIG. 1 with the marking portion 4 as a boundary are provided.

  Both line lasers 51 and 52 are formed of a laser device that irradiates a line-shaped laser beam, and the first line laser 51 is a first line-shaped slit beam from the upper left of the marking portion 4 in FIG. The line laser beam 61 is configured to irradiate the marking surface 3 including the marking portion 4 of the inspection object 2. Further, the second line laser 52 includes the marking surface 4 including the marking portion 4 of the inspection object 2 from the diagonally upper right in FIG. 3 is irradiated.

  The first line laser 51 is arranged such that an angle formed between the irradiated first line laser beam 61 and the perpendicular line 31 is a first laser angle β1, and the second line laser 52 is irradiated. It arrange | positions so that the angle which said 2nd line laser beam 62 and said perpendicular 31 may make may become 2nd laser angle (beta) 2.

  Further, the first line laser 51 has the marking groove in which the first laser angle β1 formed by the first line laser beam 61 and the perpendicular 31 forms the marking portion 4 as shown in FIG. The first line 22 is arranged to be smaller than a first inclination angle α 1 formed by the first slope 22 and the perpendicular 31, and the second line laser 52 is formed by the second line laser light 62 and the perpendicular 31. The second laser angle β2 is arranged to be smaller than a second inclination angle α2 formed by the second inclined surface 23 of the marking groove 12 forming the marking portion 4 and the perpendicular 31.

  In the present embodiment, the first laser angle β1 and the second laser angle β2 are set to the same angle, and the first line laser beam 61 and the second line laser beam 62 are formed. The angle β is set to be smaller than the predetermined angle α formed by the first inclined surface 22 and the second inclined surface 23 of the marking groove 12.

  The moving stage 43 includes a CCD camera 71 that images the marking portion 4 of the inspection object 2 set on the inspection table 11 from directly above the first line laser 51 and the second line laser 52. The CCD camera 71 is configured such that the line laser beams 61 and 62 irradiated on the marking unit 4 can be imaged from a position facing the marking unit 4.

  The first line laser 51, the second line laser 52, the CCD camera 71, and the scanning unit 41 are connected to a control device 81 configured by a computer or the like. Control signals are output to the line lasers 51 and 52 and the scanning unit 41.

  Thus, the moving stage 43 can be reciprocated along the rail 42. When the moving stage 43 is moved to one side and to the other side, the two line lasers 51, 52 and The CCD camera 71 is controlled to move in the vertical direction of the engraved characters imprinted on the inspection object 2, and the line laser beams 61 and 62 irradiated in a line shape in the width direction of the inspection object 2 are converted into line lines. The laser beam 61, 62 is configured to be movable in a direction orthogonal to the line drawn.

  At this time, when the moving stage 43 is moved to one side, inspection is performed by irradiating the corresponding line laser beams 61 and 62 from either one of the line lasers 51 and 52 selected from the both line lasers 51 and 52. When moving the moving stage 43 to the other side, the line laser beams 61 and 62 corresponding to the other line lasers 51 and 52 selected from the two line lasers 51 and 52 are irradiated for inspection. Assumed to be performed.

  The control device 81 is configured to analyze a captured image from the CCD camera 71 and measure the height from the bright line positions of the line laser beams 61 and 62 displayed in the captured image. Yes. At this time, the discrimination between the bright line position formed by the first line laser beam 61 from the first line laser 51 and the bright line position formed by the second line laser beam 62 from the second line laser 52 is performed. For example, it is assumed that the processing is performed by software processing by a program that operates the control device 81, such as irradiation at a different timing.

  When the marking inspection apparatus 1 performs the inspection in the above configuration, the control apparatus 81 outputs a control signal to the scanning unit 41 and moves the moving stage 43 along the rail 42 while moving the line lasers. Each line laser irradiated to the marking surface 3 of the inspection object 2 while outputting a control signal to 51 and 52 and irradiating the line laser light 61 and 62 in a line shape in the width direction of the inspection object 2 The light 61 and 62 is imaged from directly above by the CCD camera 71. Then, the captured image is taken into the control device 81 and processed to inspect the depth of the marking groove 12 and the like.

  At this time, the first line laser beam 61 from the first line laser 51 disposed on one side of the marking portion 3 is linearly formed in the marking portion 4 formed on the marking surface 3 from an oblique direction. Depending on the moving direction of the moving stage 43, the second line laser light 62 from the second line laser 52 disposed on the other side of the marking portion 3 as a boundary is irradiated in a line from an oblique direction. Is done. That is, according to the moving direction of the moving stage 43, the first line laser beam 61 from the first line laser 51 or the second line laser beam 62 from the second line laser 52 is lined from the oblique direction one by one. Irradiated in a shape.

  The line laser beams 61 and 62 applied to the marking unit 3 are picked up by the CCD camera 71 from the position facing the marking unit 4, that is, from directly above.

  At this time, the marking portion 4 engraved on the marking surface 3 has a groove shape with a V-shaped cross section. For this reason, as shown in FIG. 2, the first line laser beam 61 from the first line laser 51 arranged on the one side is inclined to the second inclined surface 23 located on the other side of the marking groove 12. When irradiated from the direction, the reflection component in the directly facing direction facing the marking portion 4 is larger than the reflection component reflected in the other side oblique direction.

  Further, when the first line laser light 62 from the second line laser 52 disposed on the other side is irradiated on the first slope 22 located on the one side of the marking groove 12 from the oblique direction, the marking is performed. The reflection component in the directly facing direction facing the portion 4 is larger than the reflection component reflected in the one side oblique direction.

  Thus, the slopes 22 and 23 of the marking groove 12 and the imaging angle of the CCD camera 71 are not shallow, and a sufficient angle can be obtained. Therefore, the CCD camera 71 that picks up the reflected light of the line laser beams 61 and 62 irradiated on the slopes 22 and 23 located on the one and other sides from the position facing the marking portion 4 is high. Images can be taken with brightness.

  Thereby, it is possible to ensure the imaging brightness of each of the line laser beams 61 and 62 irradiated to the both inclined surfaces 22 and 23 of the marking groove 12, and to clearly image and analyze the both inclined surfaces 22 and 23. Can do.

  On the other hand, in the present embodiment, the bottom surface 21 of the marking groove 12 is configured as a flat surface, and the line laser beams 61 and 62 applied to the bottom surface 21 from the oblique direction on the one or the other side are as follows. The CCD camera 71 captures an image of the bottom surface 21 from a position facing the marking portion 4 where it is easy to image.

  For this reason, the line laser beams 61 and 62 irradiated on the bottom surface 21 are not obstructed by the slopes 22 and 23 as in the conventional case of imaging from the oblique direction of the one or the other side. Images can be taken with the CCD camera 71.

  Thereby, since each said line laser beam 61 and 62 irradiated to the said bottom face 21 can be imaged reliably, without leaking, the state of the said bottom face 21 can be imaged clearly and analyzed.

  The laser angles β1 and β2 formed by the perpendicular line 31 with respect to the marking surface 3 and the line laser beams 61 and 62 from the line lasers 51 and 52 are respectively determined by the slopes 22 and 23 of the marking groove 12 and the The inclination angles α1 and α2 formed by the perpendicular line 31 are set to be smaller than the inclination angles α1 and α2, and the line laser beams 61 and 62 are not blocked by the inclined surfaces 22 and 23 but are formed in the marking groove 12. It reaches the bottom surface 21.

  For this reason, the respective laser angles β1 and β2 formed by the perpendicular line 31 and the respective line laser beams 61 and 62 correspond to the respective inclination angles α1 and the inclined surfaces 22 and 23 of the marking groove 12 and the perpendicular line 31. By setting larger than α2, the line laser beams 61 and 62 are spread over the entire bottom surface 21 as compared with the case where the line laser beams 61 and 62 can be blocked by the inclined surfaces 22 and 23. Can be irradiated.

  Thereby, each line laser beam 61 and 62 irradiated over the whole bottom face 21 can be imaged, and the state of the bottom face 21 can be analyzed over the whole area.

DESCRIPTION OF SYMBOLS 1 Marking inspection apparatus 2 Inspection object 3 Marking surface 4 Marking part 12 Marking groove 21 Bottom surface 22 First inclined surface 23 Second inclined surface 31 Perpendicular 51 First line laser 52 Second line laser 61 First line laser light 62 Second line Laser light α1 First tilt angle α2 Second tilt angle β1 First laser angle β2 Second laser angle

Claims (2)

In the marking inspection device that inspects the stamped part stamped on the stamped surface,
A first slit light irradiating means that is arranged on one side with the marking portion as a boundary, and irradiates slit light in a line from an oblique direction with respect to the marking surface including the marking portion;
A second slit light irradiating means that is arranged on the other side with the marking portion as a boundary, and irradiates the slit light in a line from an oblique direction with respect to the marking surface including the marking portion;
Imaging means for imaging the slit light irradiated to the marking portion from a position facing the marking portion;
A stamp inspection device characterized by comprising:   The angle formed between the perpendicular to the marking surface and the slit light from each slit light irradiation means is smaller than the angle formed between the slope of the V-shaped marking groove forming the marking portion and the perpendicular. 2. A marking inspection apparatus according to claim 1, further comprising a slit light irradiation means.

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