JP2011196932A5 - - Google Patents
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- Publication number
- JP2011196932A5 JP2011196932A5 JP2010066472A JP2010066472A JP2011196932A5 JP 2011196932 A5 JP2011196932 A5 JP 2011196932A5 JP 2010066472 A JP2010066472 A JP 2010066472A JP 2010066472 A JP2010066472 A JP 2010066472A JP 2011196932 A5 JP2011196932 A5 JP 2011196932A5
- Authority
- JP
- Japan
- Prior art keywords
- impedance
- load
- measuring device
- engineering
- parameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 claims description 5
- 238000005259 measurement Methods 0.000 claims description 3
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010066472A JP5357091B2 (ja) | 2010-03-23 | 2010-03-23 | 高周波測定装置、および、高周波測定装置の校正方法 |
| US13/044,218 US8510071B2 (en) | 2010-03-23 | 2011-03-09 | High-frequency measuring device and high-frequency measuring device calibration method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010066472A JP5357091B2 (ja) | 2010-03-23 | 2010-03-23 | 高周波測定装置、および、高周波測定装置の校正方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011196932A JP2011196932A (ja) | 2011-10-06 |
| JP2011196932A5 true JP2011196932A5 (enExample) | 2013-03-14 |
| JP5357091B2 JP5357091B2 (ja) | 2013-12-04 |
Family
ID=44657357
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010066472A Expired - Fee Related JP5357091B2 (ja) | 2010-03-23 | 2010-03-23 | 高周波測定装置、および、高周波測定装置の校正方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US8510071B2 (enExample) |
| JP (1) | JP5357091B2 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5498217B2 (ja) * | 2010-03-24 | 2014-05-21 | 株式会社ダイヘン | 高周波測定装置、および、高周波測定装置の校正方法 |
| JP5524796B2 (ja) * | 2010-09-30 | 2014-06-18 | 株式会社ダイヘン | 高周波測定装置、および、高周波測定装置の校正方法 |
| JP5864313B2 (ja) * | 2012-03-14 | 2016-02-17 | 株式会社ダイヘン | 校正パラメータ生成システム |
| CN102636768B (zh) * | 2012-05-07 | 2016-04-27 | 宁波电业局 | 一种避雷器在线监测仪在线校验方法 |
| CN103543424A (zh) * | 2013-10-24 | 2014-01-29 | 国家电网公司 | 避雷器在线监测装置校验方法 |
| CN104267364A (zh) * | 2014-09-26 | 2015-01-07 | 天津电气科学研究院有限公司 | 一种大电流传感器的校准方法 |
| KR101673476B1 (ko) * | 2015-07-27 | 2016-11-08 | 린나이코리아 주식회사 | 보일러 내 각종 센서의 접지 임피던스 자동 매칭장치 및 그 방법 |
| JP6840618B2 (ja) * | 2017-05-17 | 2021-03-10 | 日置電機株式会社 | トランス損失測定装置およびトランス損失測定方法 |
| DE102019129449A1 (de) * | 2019-10-31 | 2021-05-06 | Bayerische Motoren Werke Aktiengesellschaft | Phasenbestimmung |
| CN112305324B (zh) * | 2020-10-28 | 2023-10-20 | 中国人民解放军军事科学院防化研究院 | 一种高频脉冲电场的测量方法和传感器 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0718898B2 (ja) * | 1986-11-20 | 1995-03-06 | 松下電器産業株式会社 | インピ−ダンスの測定方法 |
| JP3234339B2 (ja) * | 1993-03-19 | 2001-12-04 | アジレント・テクノロジー株式会社 | 電力測定装置および方法 |
| JP3350586B2 (ja) * | 1993-12-28 | 2002-11-25 | アジレント・テクノロジー株式会社 | 回路定数測定装置の校正方法 |
| JP2001013186A (ja) * | 1999-06-30 | 2001-01-19 | Agilent Technologies Japan Ltd | 高周波デバイス用測定治具装置 |
| JP4363062B2 (ja) | 2003-02-17 | 2009-11-11 | 株式会社村田製作所 | 電気特性測定装置および電気測定装置の測定誤差校正方法 |
| JP4648179B2 (ja) * | 2005-12-14 | 2011-03-09 | 株式会社ダイヘン | 高周波測定装置 |
| US7489145B2 (en) * | 2005-12-14 | 2009-02-10 | Daihen Corporation | Plasma processing system |
| JP5210659B2 (ja) * | 2008-02-28 | 2013-06-12 | 株式会社日立ハイテクノロジーズ | プラズマ処理装置 |
-
2010
- 2010-03-23 JP JP2010066472A patent/JP5357091B2/ja not_active Expired - Fee Related
-
2011
- 2011-03-09 US US13/044,218 patent/US8510071B2/en not_active Expired - Fee Related
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