JP2011047693A - 光学ユニット - Google Patents
光学ユニット Download PDFInfo
- Publication number
- JP2011047693A JP2011047693A JP2009194369A JP2009194369A JP2011047693A JP 2011047693 A JP2011047693 A JP 2011047693A JP 2009194369 A JP2009194369 A JP 2009194369A JP 2009194369 A JP2009194369 A JP 2009194369A JP 2011047693 A JP2011047693 A JP 2011047693A
- Authority
- JP
- Japan
- Prior art keywords
- light
- filter member
- optical unit
- substrate
- wavelength
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 45
- 239000000758 substrate Substances 0.000 claims abstract description 33
- 229910052751 metal Inorganic materials 0.000 claims abstract description 27
- 239000002184 metal Substances 0.000 claims abstract description 27
- 239000007769 metal material Substances 0.000 claims abstract description 12
- 239000010931 gold Substances 0.000 claims description 14
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 11
- 229910052737 gold Inorganic materials 0.000 claims description 11
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 7
- 239000000463 material Substances 0.000 claims description 6
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 claims description 5
- 238000003384 imaging method Methods 0.000 claims description 5
- 239000011159 matrix material Substances 0.000 claims description 4
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 claims description 4
- 239000004065 semiconductor Substances 0.000 claims description 3
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 3
- 229910044991 metal oxide Inorganic materials 0.000 abstract 3
- 150000004706 metal oxides Chemical class 0.000 abstract 3
- 238000010586 diagram Methods 0.000 description 6
- 230000008033 biological extinction Effects 0.000 description 4
- 238000010894 electron beam technology Methods 0.000 description 4
- 239000010453 quartz Substances 0.000 description 4
- 238000010183 spectrum analysis Methods 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 230000003595 spectral effect Effects 0.000 description 3
- 238000009826 distribution Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000012447 hatching Effects 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
- G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
- G01J3/51—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors using colour filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0256—Compact construction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
- G01J3/1895—Generating the spectrum; Monochromators using diffraction elements, e.g. grating using fiber Bragg gratings or gratings integrated in a waveguide
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself
- G01J3/36—Investigating two or more bands of a spectrum by separate detectors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/1006—Beam splitting or combining systems for splitting or combining different wavelengths
- G02B27/1013—Beam splitting or combining systems for splitting or combining different wavelengths for colour or multispectral image sensors, e.g. splitting an image into monochromatic image components on respective sensors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/10—Beam splitting or combining systems
- G02B27/1086—Beam splitting or combining systems operating by diffraction only
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4233—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive element [DOE] contributing to a non-imaging application
- G02B27/4244—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive element [DOE] contributing to a non-imaging application in wavelength selecting devices
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/18—Diffraction gratings
- G02B5/1809—Diffraction gratings with pitch less than or comparable to the wavelength
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/204—Filters in which spectral selection is performed by means of a conductive grid or array, e.g. frequency selective surfaces
Abstract
【解決手段】透過する光を分光するフィルタ部材1と、複数の受光素子を有する光検出器2とを備えている。フィルタ部材1は、光透過性を有する基板と、基板の一方の面上に金属材料で形成された複数の凸部と、金属材料よりも屈折率の高い酸化金属材料によって、複数の凸部と共に基板の一方の面を覆うように形成された金属酸化膜とを備えている。複数の凸部は、隣り合う凸部間に存在する金属酸化膜が回折格子となり、凸部が導波路となるように配置される。回折格子の格子周期、凸部の高さ、及び金属酸化膜の厚みの少なくとも一つは、フィルタ部材を透過する光の波長が部分毎に変化するように、部分毎に異なる値に設定されている。光検出器2は、複数の受光素子21それぞれが、フィルタ部材1を透過する光を受光するように配置されている。
【選択図】図1
Description
定波長の種類を増やすことが難しく、スペクトル分析の精度を向上させることができないという問題がある。
前記フィルタ部材は、光透過性を有する基板と、前記基板の一方の面上に第1の金属材料で形成された複数の凸部と、前記第1の金属材料よりも屈折率の高い第2の金属材料によって、前記複数の凸部と共に前記基板の前記一方の面を覆うように形成された金属膜とを備え、
前記複数の凸部は、隣り合う凸部間に存在する前記金属膜が回折格子となり、前記凸部が導波路となるように配置され、
前記回折格子の格子周期、前記凸部の高さ、及び前記金属膜の厚みの少なくとも一つは、前記フィルタ部材を透過する光の波長が部分毎に変化するように、前記部分毎に異なる値に設定され、
前記光検出器は、前記複数の受光素子それぞれが、前記フィルタ部材を透過する光を前記部分毎に受光するように配置されている、ことを特徴とする。
以下、本発明の実施の形態における光学ユニットについて、図1〜図6を参照しながら説明する。最初に、図1〜図3を用いて、本実施の形態における光学ユニットの構成について説明する。
示されたフィルタ部材の構成を説明するための斜視図である。なお、図2においては、凸部の断面にのみハッチングが施されている。
部材の屈折率のうちいずれかを部分毎に変えることにより、部分毎に透過光の波長が異なるフィルタ部材1を得ることが可能となる。具体的には、凸部12の高さhを高くすれば、透過光の波長は、長波長側へとシフトする傾向にある。同様に、回折格子15の格子周期pを広くした場合、基板11の屈折率を大きくした場合も、透過光の波長は、長波長側へとシフトする傾向にある。
を部分毎に異なった値に設定できる。
2 光検出器
3 基盤
4 スリット部材
5 コリメータレンズ
10 光学ユニット
11 基板
12 凸部
13 金属膜
14 導波路
15 回折格子
21 半導体基板
22 受光素子
Claims (5)
- 透過する光を分光するフィルタ部材と、複数の受光素子を有する光検出器とを備え、
前記フィルタ部材は、光透過性を有する基板と、前記基板の一方の面上に第1の金属材料で形成された複数の凸部と、前記第1の金属材料よりも屈折率の高い第2の金属材料によって、前記複数の凸部と共に前記基板の前記一方の面を覆うように形成された金属膜とを備え、
前記複数の凸部は、隣り合う凸部間に存在する前記金属膜が回折格子となり、前記凸部が導波路となるように配置され、
前記回折格子の格子周期、前記凸部の高さ、及び前記金属膜の厚みの少なくとも一つは、前記フィルタ部材を透過する光の波長が部分毎に変化するように、前記部分毎に異なる値に設定され、
前記光検出器は、前記複数の受光素子それぞれが、前記フィルタ部材を透過する光を受光するように配置されている、ことを特徴とする光学ユニット。 - 前記回折格子の格子周期が、前記部分毎に、当該部分において透過することが求められている光の波長よりも短くなるように形成されている、請求項1に記載の光学ユニット。
- 前記基板の形成材料が酸化シリコンを含み、前記第1の金属材料が金(Au)を含み、前記第2の金属材料が酸化チタンを含む、請求項1または2に記載の光学ユニット。
- 前記複数の凸部が、角柱状に形成され、且つ、マトリクス状に配置されている、請求項1〜3のいずれかに記載の光学ユニット。
- 前記光検出器が、複数の受光素子がマトリクス状に形成された半導体基板を有する固体撮像装置である、請求項1〜4のいずれかに記載の光学ユニット。
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009194369A JP4743917B2 (ja) | 2009-08-25 | 2009-08-25 | 光学ユニット |
CN201080038143.1A CN102498374B (zh) | 2009-08-25 | 2010-07-28 | 光学单元 |
US13/390,650 US8570510B2 (en) | 2009-08-25 | 2010-07-28 | Optical unit |
EP10811641.9A EP2472239A4 (en) | 2009-08-25 | 2010-07-28 | Optical unit |
PCT/JP2010/062688 WO2011024590A1 (ja) | 2009-08-25 | 2010-07-28 | 光学ユニット |
KR1020127004913A KR20120088654A (ko) | 2009-08-25 | 2010-07-28 | 광학 유닛 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009194369A JP4743917B2 (ja) | 2009-08-25 | 2009-08-25 | 光学ユニット |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2011047693A true JP2011047693A (ja) | 2011-03-10 |
JP4743917B2 JP4743917B2 (ja) | 2011-08-10 |
Family
ID=43627700
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009194369A Expired - Fee Related JP4743917B2 (ja) | 2009-08-25 | 2009-08-25 | 光学ユニット |
Country Status (6)
Country | Link |
---|---|
US (1) | US8570510B2 (ja) |
EP (1) | EP2472239A4 (ja) |
JP (1) | JP4743917B2 (ja) |
KR (1) | KR20120088654A (ja) |
CN (1) | CN102498374B (ja) |
WO (1) | WO2011024590A1 (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103063299B (zh) * | 2012-12-27 | 2014-09-10 | 南京邮电大学 | 一种微型光谱仪 |
KR20160142426A (ko) * | 2015-06-02 | 2016-12-13 | 고려대학교 산학협력단 | 광학 필터링 유닛 및 이를 포함하는 분광 장치 |
TWI541493B (zh) * | 2015-09-01 | 2016-07-11 | 國立交通大學 | 一種分光器及其光譜儀 |
CN108458785A (zh) * | 2018-01-31 | 2018-08-28 | 云谷(固安)科技有限公司 | 光谱检测组件及其制备方法、光谱仪 |
EP3671310A1 (en) * | 2018-12-18 | 2020-06-24 | Thomson Licensing | Optical manipulation apparatus for trapping or moving micro or nanoparticles |
CN111141385B (zh) * | 2020-01-02 | 2022-05-24 | 暨南大学 | 窄带透射滤波器及片上光谱分析与成像系统 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002196123A (ja) * | 2000-12-26 | 2002-07-10 | Asahi Glass Co Ltd | 2波長用回折光学素子、2波長光源装置および光学ヘッド装置 |
JP2006012826A (ja) * | 2004-06-26 | 2006-01-12 | Samsung Sdi Co Ltd | 有機電界発光素子及びその製造方法 |
US20070115553A1 (en) * | 2004-01-14 | 2007-05-24 | Chang-Hasnain Connie J | Ultra broadband mirror using subwavelength grating |
WO2007118895A1 (fr) * | 2006-04-19 | 2007-10-25 | Commissariat A L'energie Atomique | Filtre spectral micro-structure et capteur d'images |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05249032A (ja) * | 1992-03-09 | 1993-09-28 | Masaya Yabe | 半導体分光検出装置 |
JP2002296116A (ja) * | 2001-03-30 | 2002-10-09 | Yokogawa Electric Corp | マルチチャンネル分光器 |
US7395698B2 (en) * | 2005-10-25 | 2008-07-08 | Georgia Institute Of Technology | Three-dimensional nanoscale metrology using FIRAT probe |
JP4621270B2 (ja) * | 2007-07-13 | 2011-01-26 | キヤノン株式会社 | 光学フィルタ |
JP2009194369A (ja) | 2008-01-16 | 2009-08-27 | Renesas Technology Corp | 半導体装置 |
-
2009
- 2009-08-25 JP JP2009194369A patent/JP4743917B2/ja not_active Expired - Fee Related
-
2010
- 2010-07-28 EP EP10811641.9A patent/EP2472239A4/en not_active Withdrawn
- 2010-07-28 US US13/390,650 patent/US8570510B2/en not_active Expired - Fee Related
- 2010-07-28 WO PCT/JP2010/062688 patent/WO2011024590A1/ja active Application Filing
- 2010-07-28 CN CN201080038143.1A patent/CN102498374B/zh not_active Expired - Fee Related
- 2010-07-28 KR KR1020127004913A patent/KR20120088654A/ko not_active Application Discontinuation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002196123A (ja) * | 2000-12-26 | 2002-07-10 | Asahi Glass Co Ltd | 2波長用回折光学素子、2波長光源装置および光学ヘッド装置 |
US20070115553A1 (en) * | 2004-01-14 | 2007-05-24 | Chang-Hasnain Connie J | Ultra broadband mirror using subwavelength grating |
JP2006012826A (ja) * | 2004-06-26 | 2006-01-12 | Samsung Sdi Co Ltd | 有機電界発光素子及びその製造方法 |
WO2007118895A1 (fr) * | 2006-04-19 | 2007-10-25 | Commissariat A L'energie Atomique | Filtre spectral micro-structure et capteur d'images |
Also Published As
Publication number | Publication date |
---|---|
EP2472239A1 (en) | 2012-07-04 |
US20120147373A1 (en) | 2012-06-14 |
CN102498374A (zh) | 2012-06-13 |
JP4743917B2 (ja) | 2011-08-10 |
US8570510B2 (en) | 2013-10-29 |
KR20120088654A (ko) | 2012-08-08 |
EP2472239A4 (en) | 2017-11-22 |
CN102498374B (zh) | 2015-02-18 |
WO2011024590A1 (ja) | 2011-03-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7315667B2 (en) | Propagating light to be sensed | |
US7522786B2 (en) | Transmitting light with photon energy information | |
JP6707105B2 (ja) | カラー撮像素子および撮像装置 | |
US7433552B2 (en) | Obtaining analyte information | |
JP7129809B2 (ja) | 光学フィルタ及び分光器 | |
KR102053561B1 (ko) | 광 검출 장치 및 광 검출 장치를 제조하는 방법 | |
JP4743917B2 (ja) | 光学ユニット | |
US7420677B2 (en) | Sensing photon energies of optical signals | |
US11171174B2 (en) | Device and method for multispectral imaging in the infrared | |
EP2450693A1 (en) | An arrayed waveguide grating (AWG) | |
US20170261738A1 (en) | Light detection device including light detector, light-transmissive first layer, first optical coupler, and second optical coupler, and light detection system including the same | |
KR20220061175A (ko) | 분광소자 어레이, 촬상소자 및 촬상장치 | |
JP2012013527A (ja) | 分光光度計 | |
US10976200B2 (en) | Optical sensing device and method for manufacturing an optical sensing device | |
JPH06229829A (ja) | 受光素子アレイ | |
TWI772902B (zh) | 攝像元件及攝像裝置 | |
JP6347070B2 (ja) | 分光分析装置 | |
Chen et al. | Application of surface plasmon polaritons in cmos digital imaging | |
JP2017162986A (ja) | 光検出装置および光検出システム | |
Pottier et al. | Design and properties of concave diffraction gratings based on elliptical Bragg mirrors | |
JP7191311B2 (ja) | 集光機能を有する分光素子を利用した分光装置 | |
JP2018116150A (ja) | 分光素子、固体撮像素子および分光素子の製造方法 | |
KR20230093052A (ko) | 광학 소자, 촬상 소자 및 촬상장치 | |
JPH06307932A (ja) | 受光素子アレイ | |
JP2008191041A (ja) | 分光器 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20110114 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20110310 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20110413 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20110509 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140520 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 4743917 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
S111 | Request for change of ownership or part of ownership |
Free format text: JAPANESE INTERMEDIATE CODE: R313111 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
LAPS | Cancellation because of no payment of annual fees |