JP2011043403A - 分析装置 - Google Patents

分析装置 Download PDF

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Publication number
JP2011043403A
JP2011043403A JP2009191644A JP2009191644A JP2011043403A JP 2011043403 A JP2011043403 A JP 2011043403A JP 2009191644 A JP2009191644 A JP 2009191644A JP 2009191644 A JP2009191644 A JP 2009191644A JP 2011043403 A JP2011043403 A JP 2011043403A
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JP
Japan
Prior art keywords
analysis
information
analysis condition
file
identification
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Pending
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JP2009191644A
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English (en)
Japanese (ja)
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JP2011043403A5 (enExample
Inventor
Akira Ogoshi
暁 大越
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Shimadzu Corp
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Shimadzu Corp
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Priority to JP2009191644A priority Critical patent/JP2011043403A/ja
Publication of JP2011043403A publication Critical patent/JP2011043403A/ja
Publication of JP2011043403A5 publication Critical patent/JP2011043403A5/ja
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  • Analysing Materials By The Use Of Radiation (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2009191644A 2009-08-21 2009-08-21 分析装置 Pending JP2011043403A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009191644A JP2011043403A (ja) 2009-08-21 2009-08-21 分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009191644A JP2011043403A (ja) 2009-08-21 2009-08-21 分析装置

Publications (2)

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JP2011043403A true JP2011043403A (ja) 2011-03-03
JP2011043403A5 JP2011043403A5 (enExample) 2012-01-19

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JP2009191644A Pending JP2011043403A (ja) 2009-08-21 2009-08-21 分析装置

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JP (1) JP2011043403A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012211771A (ja) * 2011-03-30 2012-11-01 Shimadzu Corp 電子線分析装置
JP2013245965A (ja) * 2012-05-23 2013-12-09 Horiba Ltd 試験システム
JP2015172507A (ja) * 2014-03-11 2015-10-01 株式会社東芝 自動分析装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05158670A (ja) * 1991-12-06 1993-06-25 Kyushu Nippon Denki Software Kk 画面型プログラムエディタ
JPH1082775A (ja) * 1996-09-09 1998-03-31 Shimadzu Corp 分析装置のデータ処理装置
JP2002133046A (ja) * 2000-10-30 2002-05-10 Foundation For Promotion Of Material Science & Technology Of Japan 分析サービスにおける電子メールを利用した分析データ納品方法
JP2003098129A (ja) * 2001-09-20 2003-04-03 Horiba Ltd エネルギー分散型マイクロアナライザ
JP2005300324A (ja) * 2004-04-09 2005-10-27 Agilent Technol Inc 被試験対象デバイスの測定データ解析方法、プログラム、および測定データ解析システム
JP2008116407A (ja) * 2006-11-07 2008-05-22 Omron Corp ファイルの保存方法、計測装置、計測方法およびプログラム

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05158670A (ja) * 1991-12-06 1993-06-25 Kyushu Nippon Denki Software Kk 画面型プログラムエディタ
JPH1082775A (ja) * 1996-09-09 1998-03-31 Shimadzu Corp 分析装置のデータ処理装置
JP2002133046A (ja) * 2000-10-30 2002-05-10 Foundation For Promotion Of Material Science & Technology Of Japan 分析サービスにおける電子メールを利用した分析データ納品方法
JP2003098129A (ja) * 2001-09-20 2003-04-03 Horiba Ltd エネルギー分散型マイクロアナライザ
JP2005300324A (ja) * 2004-04-09 2005-10-27 Agilent Technol Inc 被試験対象デバイスの測定データ解析方法、プログラム、および測定データ解析システム
JP2008116407A (ja) * 2006-11-07 2008-05-22 Omron Corp ファイルの保存方法、計測装置、計測方法およびプログラム

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012211771A (ja) * 2011-03-30 2012-11-01 Shimadzu Corp 電子線分析装置
JP2013245965A (ja) * 2012-05-23 2013-12-09 Horiba Ltd 試験システム
US9322743B2 (en) 2012-05-23 2016-04-26 Horiba, Ltd. Test system
JP2015172507A (ja) * 2014-03-11 2015-10-01 株式会社東芝 自動分析装置

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