JP2010512828A5 - - Google Patents

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JP2010512828A5
JP2010512828A5 JP2009540965A JP2009540965A JP2010512828A5 JP 2010512828 A5 JP2010512828 A5 JP 2010512828A5 JP 2009540965 A JP2009540965 A JP 2009540965A JP 2009540965 A JP2009540965 A JP 2009540965A JP 2010512828 A5 JP2010512828 A5 JP 2010512828A5
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Japan
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impedance
measure
data
analyzing
rate
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JP2009540965A
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JP2010512828A (ja
JP5325115B2 (ja
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Priority claimed from US11/610,553 external-priority patent/US8211031B2/en
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JP2009540965A 2006-12-14 2007-11-15 非侵襲性頭蓋内モニタ Expired - Fee Related JP5325115B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/610,553 2006-12-14
US11/610,553 US8211031B2 (en) 2002-01-15 2006-12-14 Non-invasive intracranial monitor
PCT/IL2007/001421 WO2008072223A1 (en) 2006-12-14 2007-11-15 Non-invasive intracranial monitor

Publications (3)

Publication Number Publication Date
JP2010512828A JP2010512828A (ja) 2010-04-30
JP2010512828A5 true JP2010512828A5 (enExample) 2010-10-07
JP5325115B2 JP5325115B2 (ja) 2013-10-23

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JP2009540965A Expired - Fee Related JP5325115B2 (ja) 2006-12-14 2007-11-15 非侵襲性頭蓋内モニタ

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US (2) US8211031B2 (enExample)
EP (3) EP2124741B1 (enExample)
JP (1) JP5325115B2 (enExample)
CN (1) CN101668481B (enExample)
ES (1) ES2551586T3 (enExample)
WO (1) WO2008072223A1 (enExample)

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