JP2010507787A - ガス分析用に正および/または負にイオン化したガス検体を生成するための方法及び装置 - Google Patents
ガス分析用に正および/または負にイオン化したガス検体を生成するための方法及び装置 Download PDFInfo
- Publication number
- JP2010507787A JP2010507787A JP2009533676A JP2009533676A JP2010507787A JP 2010507787 A JP2010507787 A JP 2010507787A JP 2009533676 A JP2009533676 A JP 2009533676A JP 2009533676 A JP2009533676 A JP 2009533676A JP 2010507787 A JP2010507787 A JP 2010507787A
- Authority
- JP
- Japan
- Prior art keywords
- capillary
- gas
- ion mobility
- mobility spectrometer
- plasma
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 14
- 238000004868 gas analysis Methods 0.000 title claims abstract description 9
- 150000002500 ions Chemical class 0.000 claims abstract description 46
- 230000004888 barrier function Effects 0.000 claims abstract description 7
- 229910052756 noble gas Inorganic materials 0.000 claims abstract description 6
- 239000003989 dielectric material Substances 0.000 claims abstract description 5
- 230000001939 inductive effect Effects 0.000 claims description 4
- 239000011521 glass Substances 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 claims 1
- 239000012491 analyte Substances 0.000 abstract description 8
- 239000007789 gas Substances 0.000 description 22
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 230000035945 sensitivity Effects 0.000 description 4
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 239000012159 carrier gas Substances 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- 238000001871 ion mobility spectroscopy Methods 0.000 description 2
- 238000000752 ionisation method Methods 0.000 description 2
- 230000007774 longterm Effects 0.000 description 2
- 208000019693 Lung disease Diseases 0.000 description 1
- 238000006555 catalytic reaction Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000012777 electrically insulating material Substances 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- 238000002534 molecular mass spectrometry Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 239000004081 narcotic agent Substances 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000005588 protonation Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000012857 radioactive material Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/622—Ion mobility spectrometry
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/2406—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/2406—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes
- H05H1/2443—Generating plasma using dielectric barrier discharges, i.e. with a dielectric interposed between the electrodes the plasma fluid flowing through a dielectric tube
Abstract
Description
−紫外光:感度が低い。正イオンしか生成しない。
−部分放電:長時間の安定性が低い。
−β線:放射線であり、全ての用途に適しているわけではなく、あるいは、使用許可を必要とする。
Claims (9)
- イオン移動度分光計または質量分析計におけるガス分析用に正および/または負にイオン化したガス検体を生成するための方法において、
正および/または負のガスイオンがプラズマによって生成され、プラズマが誘電体バリア放電によって引き起こされ、誘電体バリア放電が、誘電体材料から成る毛細管を通じて希ガスが誘導されることによって生成され、その際、前記毛細管の出口領域に隣接して前記毛細管に配置された、電気絶縁された2つの電極を用いて交流電圧が印加され、前記ガス検体が前記毛細管の外側の前記出口領域へ誘導されることを特徴とする方法。 - 500Vから5000Vまでの範囲の交流電圧が用いられることを特徴とする請求項1に記載の方法。
- 前記誘電体バリア放電が、雰囲気圧力の下で駆動されることを特徴とする請求項1、2または3に記載の方法。
- 請求項1、2または3に記載の方法を実施するための、イオン移動度分光計または質量分析計におけるガス分析用に正および/または負にイオン化したガス検体を生成するための装置において、
希ガスを誘導するための、誘電体材料から成る毛細管(2)を有し、交流電圧が印加された、電気絶縁された2つの電極(3、4)が、前記毛細管(2)の出口領域に隣接して前記毛細管(2)に配置されていることを特徴とする装置。 - 前記毛細管(2)が、ガラスから成ることを特徴とする請求項4に記載の装置。
- 前記毛細管(2)が、50μmから500μmまでの直径を有することを特徴とする請求項5に記載の装置。
- 前記毛細管の長手方向に互いに間隔がおかれた電極(3、4)が、最大1cmという間隔で配置されていることを特徴とする請求項4〜6のいずれか一つに記載の装置。
- 前記毛細管(2)の出口領域が該イオン移動度分光計のイオン化空間内へ延在するイオン移動度分光計における、請求項4〜7のいずれか一つに記載の装置の使用方法。
- 質量分析計における請求項4〜7のいずれか一つに記載の装置の使用方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102006050136.5A DE102006050136B4 (de) | 2006-10-25 | 2006-10-25 | Verfahren und Vorrichtung zur Erzeugung von positiv und/oder negativ ionisierten Gasanalyten für die Gasanalyse |
DE102006050136.5 | 2006-10-25 | ||
PCT/EP2007/007999 WO2008049488A1 (de) | 2006-10-25 | 2007-09-14 | Verfahren und vorrichtung zur erzeugung von positiv und/oder negativ ionisierten gasanalyten für die gasanalyse |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2010507787A true JP2010507787A (ja) | 2010-03-11 |
JP5315248B2 JP5315248B2 (ja) | 2013-10-16 |
Family
ID=38792454
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009533676A Expired - Fee Related JP5315248B2 (ja) | 2006-10-25 | 2007-09-14 | ガス分析用に正および/または負にイオン化したガス検体を生成するための方法及び装置 |
Country Status (10)
Country | Link |
---|---|
US (1) | US7973279B2 (ja) |
EP (1) | EP2082221B1 (ja) |
JP (1) | JP5315248B2 (ja) |
CA (1) | CA2667216A1 (ja) |
DE (1) | DE102006050136B4 (ja) |
ES (1) | ES2615535T3 (ja) |
IL (1) | IL198255A (ja) |
PL (1) | PL2082221T3 (ja) |
RU (1) | RU2426983C2 (ja) |
WO (1) | WO2008049488A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013008606A (ja) * | 2011-06-27 | 2013-01-10 | Hitachi High-Technologies Corp | 質量分析装置及び質量分析方法 |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB0806673D0 (en) * | 2008-04-11 | 2008-05-14 | Finlan Martin F | Imaging apparatus & method |
WO2011089912A1 (ja) * | 2010-01-25 | 2011-07-28 | 株式会社日立ハイテクノロジーズ | 質量分析装置 |
JP5497615B2 (ja) * | 2010-11-08 | 2014-05-21 | 株式会社日立ハイテクノロジーズ | 質量分析装置 |
WO2017040359A1 (en) | 2015-08-28 | 2017-03-09 | Indiana University Research And Technology Corporation | Atmospheric-pressure ionization and fragmentation of molecules for structural elucidation |
WO2017114488A1 (zh) * | 2015-12-31 | 2017-07-06 | 中国科学院上海硅酸盐研究所 | 一种可气体直接进样用于重金属元素检测的液体阴极辉光放电等离子体原子发射光谱装置及方法 |
DE102016104852B4 (de) * | 2016-03-16 | 2017-11-09 | Leibniz - Institut Für Analytische Wissenschaften - Isas - E.V. | Verfahren zur Ionisierung von gasförmigen Proben mittels dielektrisch behinderter Entladung und zur nachfolgenden Analyse der erzeugten Probenionen in einem Analysegerät |
DE102016112629B3 (de) * | 2016-07-11 | 2017-09-28 | Leibniz - Institut Für Analytische Wissenschaften - Isas - E.V. | Verfahren zur Analyse von Gasen mittels der Gaschromatographie |
DE102017112726A1 (de) | 2017-06-09 | 2018-12-13 | Leibniz - Institut Für Analytische Wissenschaften - Isas - E.V. | Verfahren zur Ionisierung von gasförmigen Proben mittels dielektrisch behinderter Entladung und zur nachfolgenden Analyse der erzeugten Probenionen in einem Analysegerät |
DE102020132851B3 (de) | 2020-12-09 | 2021-12-30 | Bruker Optik Gmbh | Ionenmobilitätsspektrometer und verfahren zum betrieb eines ionenmobilitätsspektrometers |
CN113194592A (zh) * | 2021-04-16 | 2021-07-30 | 清华大学 | 一种等离子装置、用于儿童玩具质检的装置及方法 |
DE102022121736B3 (de) | 2022-08-29 | 2023-12-07 | Leibniz - Institut Für Analytische Wissenschaften - Isas - E.V. | Verfahren zur Ionisierung von gasförmigen Proben mittels Gasentladung |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5247841A (en) * | 1991-01-24 | 1993-09-28 | Bodenseewerk Perkin-Elmer Gmbh | Apparatus for producing sample vapor for transferral into an inductively coupled plasma |
JP2001108656A (ja) * | 1999-10-13 | 2001-04-20 | Mitsubishi Heavy Ind Ltd | 質量分析計用インターフェイスおよび質量分析システム |
JP2003315271A (ja) * | 2002-04-25 | 2003-11-06 | Mitsubishi Heavy Ind Ltd | プラズマ生成装置及びそれを用いたガス分析装置 |
JP2005512274A (ja) * | 2001-08-08 | 2005-04-28 | シオネックス・コーポレーション | 容量放電プラズマ・イオン源 |
JP2005116460A (ja) * | 2003-10-10 | 2005-04-28 | Japan Science & Technology Agency | スプレーグロー放電イオン化方法及び装置 |
JP2005221506A (ja) * | 2004-02-06 | 2005-08-18 | Micromass Uk Ltd | 質量分析計 |
WO2006060130A2 (en) * | 2004-11-09 | 2006-06-08 | E.I. Dupont De Nemours And Company | Ion source for a mass spectrometer |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4549082A (en) * | 1983-04-19 | 1985-10-22 | Mcmillan Michael R | Synthetic plasma ion source |
DE4416676C2 (de) * | 1994-05-11 | 2002-11-07 | Siemens Ag | Vorrichtung zur Entgiftung von Abgasen aus mobilen Anlagen |
DE19526211A1 (de) * | 1995-07-18 | 1997-01-23 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Verfahren zum Betreiben von Entladungslampen bzw. -strahler |
CA2299439C (en) * | 1997-09-12 | 2007-08-14 | Bruce A. Andrien | Multiple sample introduction mass spectrometry |
US5908566A (en) * | 1997-09-17 | 1999-06-01 | The United States Of America As Represented By The Secretary Of The Navy | Modified plasma torch design for introducing sample air into inductively coupled plasma |
US6326616B1 (en) * | 1997-10-15 | 2001-12-04 | Analytica Of Branford, Inc. | Curved introduction for mass spectrometry |
EP0926705A1 (de) * | 1997-12-23 | 1999-06-30 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Flachstrahler mit örtlich modulierter Flächenleuchtdichte |
DE19931366A1 (de) * | 1999-07-07 | 2001-02-01 | T E M Gmbh | Flache Baugruppe zur elektrischen Erzeugung eines Plasmas in Luft |
US6359275B1 (en) * | 1999-07-14 | 2002-03-19 | Agilent Technologies, Inc. | Dielectric conduit with end electrodes |
US6486469B1 (en) * | 1999-10-29 | 2002-11-26 | Agilent Technologies, Inc. | Dielectric capillary high pass ion filter |
US6794644B2 (en) * | 2000-02-18 | 2004-09-21 | Melvin A. Park | Method and apparatus for automating an atmospheric pressure ionization (API) source for mass spectrometry |
DE10045407A1 (de) * | 2000-09-14 | 2002-03-28 | Philips Corp Intellectual Pty | Flüssigkristallbildschirm mit Hintergrundbeleuchtung |
JP3731486B2 (ja) * | 2001-03-16 | 2006-01-05 | 富士ゼロックス株式会社 | トランジスタ |
EP1441774A2 (en) * | 2001-11-02 | 2004-08-04 | Plasmasol Corporation | Sterilization and decontamination system using a plasma discharge and a filter |
US7460225B2 (en) * | 2004-03-05 | 2008-12-02 | Vassili Karanassios | Miniaturized source devices for optical and mass spectrometry |
US7498592B2 (en) * | 2006-06-28 | 2009-03-03 | Wisconsin Alumni Research Foundation | Non-ambipolar radio-frequency plasma electron source and systems and methods for generating electron beams |
US7759643B2 (en) * | 2007-02-27 | 2010-07-20 | California Institute Of Technology | Single electrode corona discharge electrochemical/electrospray ionization |
CN202172060U (zh) * | 2008-05-30 | 2012-03-21 | 珀金埃尔默健康科学股份有限公司 | 用于电离化学种的设备 |
-
2006
- 2006-10-25 DE DE102006050136.5A patent/DE102006050136B4/de not_active Expired - Fee Related
-
2007
- 2007-09-14 WO PCT/EP2007/007999 patent/WO2008049488A1/de active Application Filing
- 2007-09-14 RU RU2009119420/28A patent/RU2426983C2/ru not_active IP Right Cessation
- 2007-09-14 PL PL07818152T patent/PL2082221T3/pl unknown
- 2007-09-14 JP JP2009533676A patent/JP5315248B2/ja not_active Expired - Fee Related
- 2007-09-14 CA CA002667216A patent/CA2667216A1/en not_active Abandoned
- 2007-09-14 ES ES07818152.6T patent/ES2615535T3/es active Active
- 2007-09-14 US US12/311,720 patent/US7973279B2/en not_active Expired - Fee Related
- 2007-09-14 EP EP07818152.6A patent/EP2082221B1/de active Active
-
2009
- 2009-04-21 IL IL198255A patent/IL198255A/en active IP Right Grant
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5247841A (en) * | 1991-01-24 | 1993-09-28 | Bodenseewerk Perkin-Elmer Gmbh | Apparatus for producing sample vapor for transferral into an inductively coupled plasma |
JP2001108656A (ja) * | 1999-10-13 | 2001-04-20 | Mitsubishi Heavy Ind Ltd | 質量分析計用インターフェイスおよび質量分析システム |
JP2005512274A (ja) * | 2001-08-08 | 2005-04-28 | シオネックス・コーポレーション | 容量放電プラズマ・イオン源 |
JP2003315271A (ja) * | 2002-04-25 | 2003-11-06 | Mitsubishi Heavy Ind Ltd | プラズマ生成装置及びそれを用いたガス分析装置 |
JP2005116460A (ja) * | 2003-10-10 | 2005-04-28 | Japan Science & Technology Agency | スプレーグロー放電イオン化方法及び装置 |
JP2005221506A (ja) * | 2004-02-06 | 2005-08-18 | Micromass Uk Ltd | 質量分析計 |
WO2006060130A2 (en) * | 2004-11-09 | 2006-06-08 | E.I. Dupont De Nemours And Company | Ion source for a mass spectrometer |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013008606A (ja) * | 2011-06-27 | 2013-01-10 | Hitachi High-Technologies Corp | 質量分析装置及び質量分析方法 |
US9184037B2 (en) | 2011-06-27 | 2015-11-10 | Hitachi High-Technologies Corporation | Mass spectrometer and mass analyzing method |
Also Published As
Publication number | Publication date |
---|---|
JP5315248B2 (ja) | 2013-10-16 |
ES2615535T3 (es) | 2017-06-07 |
US20090278038A1 (en) | 2009-11-12 |
IL198255A0 (en) | 2009-12-24 |
RU2009119420A (ru) | 2010-11-27 |
WO2008049488A1 (de) | 2008-05-02 |
US7973279B2 (en) | 2011-07-05 |
RU2426983C2 (ru) | 2011-08-20 |
IL198255A (en) | 2014-04-30 |
PL2082221T3 (pl) | 2017-07-31 |
EP2082221B1 (de) | 2016-12-14 |
DE102006050136B4 (de) | 2016-12-15 |
DE102006050136A1 (de) | 2008-05-08 |
EP2082221A1 (de) | 2009-07-29 |
CA2667216A1 (en) | 2008-05-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5315248B2 (ja) | ガス分析用に正および/または負にイオン化したガス検体を生成するための方法及び装置 | |
JP5678189B2 (ja) | Uv照射及び電子を用いる気体のイオン化方法及び気体の同定方法、ならびにその装置 | |
Meyer et al. | Dielectric barrier discharges in analytical chemistry | |
US6646256B2 (en) | Atmospheric pressure photoionization source in mass spectrometry | |
US7932489B2 (en) | Detection apparatus | |
US20090095901A1 (en) | Chemical ionization reaction or proton transfer reaction mass spectrometry with a quadrupole mass spectrometer | |
WO2011089912A1 (ja) | 質量分析装置 | |
US20100327155A1 (en) | Micro-plasma Illumination Device and Method | |
JP2008508511A (ja) | コロナ放電イオン化エレメントを備えたイオン移動度分光器 | |
JP5833801B1 (ja) | 別々に動作する二つのイオン化源を備えたガスクロマトグラフィー用光イオン化検出器 | |
US5969349A (en) | Ion mobility spectrometer | |
JP2007510272A (ja) | 砂時計型電気力学的漏斗および内部イオン漏斗を用いる改良された高速イオンモビリティースペクトル法 | |
US9029797B2 (en) | Plasma-based photon source, ion source, and related systems and methods | |
CN111916334A (zh) | 一种用于质谱分析仪的真空紫外光电离源 | |
US9082599B2 (en) | Mass spectrometer ion trap having asymmetric end cap apertures | |
US4816685A (en) | Ion volume ring | |
Pape et al. | Dielectric barrier discharge in mass spectrometry–An overview over plasma investigations and ion sources applications | |
JP3664977B2 (ja) | 化学物質検出装置 | |
JP2002189018A (ja) | 化学物質検出装置 | |
Kotkovskii et al. | A laser ion-mobility spectrometer | |
JP3664976B2 (ja) | 化学物質検出装置 | |
JP2007315847A (ja) | ガス分析用Jet−REMPI装置 | |
JP2002181790A (ja) | 化学物質検出装置 | |
JP2006040844A (ja) | レーザーイオン化質量分析装置およびレーザーイオン化質量分析方法 | |
RU2346249C1 (ru) | Способ получения и анализа ионов аналита |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20100329 |
|
RD04 | Notification of resignation of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7424 Effective date: 20100604 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20111220 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120315 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20120911 |
|
A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20121211 |
|
A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20121218 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20130110 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20130618 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20130708 |
|
R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 Ref document number: 5315248 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |