JP2010249785A5 - - Google Patents

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Publication number
JP2010249785A5
JP2010249785A5 JP2009102422A JP2009102422A JP2010249785A5 JP 2010249785 A5 JP2010249785 A5 JP 2010249785A5 JP 2009102422 A JP2009102422 A JP 2009102422A JP 2009102422 A JP2009102422 A JP 2009102422A JP 2010249785 A5 JP2010249785 A5 JP 2010249785A5
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JP
Japan
Prior art keywords
signal intensity
pipe
detector
thickness reduction
thinning
Prior art date
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Application number
JP2009102422A
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English (en)
Japanese (ja)
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JP2010249785A (ja
JP5429788B2 (ja
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Priority to JP2009102422A priority Critical patent/JP5429788B2/ja
Priority claimed from JP2009102422A external-priority patent/JP5429788B2/ja
Publication of JP2010249785A publication Critical patent/JP2010249785A/ja
Publication of JP2010249785A5 publication Critical patent/JP2010249785A5/ja
Application granted granted Critical
Publication of JP5429788B2 publication Critical patent/JP5429788B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2009102422A 2009-04-20 2009-04-20 非破壊検査方法及びその装置 Expired - Fee Related JP5429788B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009102422A JP5429788B2 (ja) 2009-04-20 2009-04-20 非破壊検査方法及びその装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009102422A JP5429788B2 (ja) 2009-04-20 2009-04-20 非破壊検査方法及びその装置

Publications (3)

Publication Number Publication Date
JP2010249785A JP2010249785A (ja) 2010-11-04
JP2010249785A5 true JP2010249785A5 (cg-RX-API-DMAC10.html) 2012-05-31
JP5429788B2 JP5429788B2 (ja) 2014-02-26

Family

ID=43312274

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009102422A Expired - Fee Related JP5429788B2 (ja) 2009-04-20 2009-04-20 非破壊検査方法及びその装置

Country Status (1)

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JP (1) JP5429788B2 (cg-RX-API-DMAC10.html)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5481699B1 (ja) * 2013-04-04 2014-04-23 札幌施設管理株式会社 配管評価方法
JP5640286B2 (ja) * 2013-12-26 2014-12-17 札幌施設管理株式会社 配管評価方法
JP6278457B2 (ja) * 2014-05-12 2018-02-14 一般財団法人電力中央研究所 非破壊検査方法およびその装置
JP6277520B2 (ja) * 2014-05-12 2018-02-14 一般財団法人電力中央研究所 非破壊検査方法およびその装置
JP6497701B2 (ja) * 2014-05-12 2019-04-10 一般財団法人電力中央研究所 非破壊検査方法およびその装置
JP7449821B2 (ja) * 2020-08-26 2024-03-14 株式会社日立製作所 内部状態検査システム及び内部状態検査方法
JP7437337B2 (ja) * 2021-03-02 2024-02-22 株式会社日立製作所 内部状態画像化装置および内部状態画像化方法
KR102368868B1 (ko) * 2021-07-26 2022-03-04 한전케이피에스 주식회사 컴프턴 산란을 이용하는 파이프용 검사 장치
JP7858961B1 (ja) * 2025-02-19 2026-05-14 三菱電機株式会社 腐食評価方法、記録媒体、プログラムおよび腐食評価装置

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0619268B2 (ja) * 1987-08-07 1994-03-16 日本鋼管株式会社 金属上塗膜の厚さ測定方法
JP2004245729A (ja) * 2003-02-14 2004-09-02 Non-Destructive Inspection Co Ltd 放射線検査装置及び放射線検査方法

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