JP2010227850A5 - - Google Patents

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Publication number
JP2010227850A5
JP2010227850A5 JP2009079303A JP2009079303A JP2010227850A5 JP 2010227850 A5 JP2010227850 A5 JP 2010227850A5 JP 2009079303 A JP2009079303 A JP 2009079303A JP 2009079303 A JP2009079303 A JP 2009079303A JP 2010227850 A5 JP2010227850 A5 JP 2010227850A5
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Japan
Prior art keywords
substrate
nozzle
gas flow
coating apparatus
gas
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JP2009079303A
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Japanese (ja)
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JP5346643B2 (en
JP2010227850A (en
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Priority to JP2009079303A priority Critical patent/JP5346643B2/en
Priority claimed from JP2009079303A external-priority patent/JP5346643B2/en
Priority to TW099106182A priority patent/TWI433731B/en
Priority to KR1020100026320A priority patent/KR101222387B1/en
Publication of JP2010227850A publication Critical patent/JP2010227850A/en
Publication of JP2010227850A5 publication Critical patent/JP2010227850A5/ja
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Claims (8)

基板に処理液を塗布するための基板塗布装置であって、
ステージ面に設けた気体孔を通る気体流により前記ステージ面上に圧力気体層を形成し、前記圧力気体層によって基板を浮上させる浮上ステージと、
前記基板に対して相対的に移動させるノズルから所定の処理液を前記基板上に吐出することにより、前記基板上に前記処理液を塗布する処理液供給手段と、
前記気体流の形成状態と停止状態とを切り替える気体流制御手段と、
を備え、
前記相対的な移動と並行して行う前記処理液の吐出の前に、前記ノズルからの前記処理液の吐出を止めた状態で、前記ノズルを、前記浮上ステージ上の基板存在領域から外れた位置から、前記基板存在領域まで相対的に移動させる空走期間が設定されており、
前記気体流制御手段は、前記空走期間のうち少なくとも一部の期間においては、前記ノズルの直下領域での前記気体流の形成を一時的に停止することを特徴とする基板塗布装置。
A substrate coating apparatus for applying a treatment liquid to a substrate,
Forming a pressure gas layer on the stage surface by a gas flow passing through a gas hole provided in the stage surface, and a floating stage for levitating the substrate by the pressure gas layer;
Processing liquid supply means for applying the processing liquid onto the substrate by discharging a predetermined processing liquid onto the substrate from a nozzle that moves relative to the substrate;
Gas flow control means for switching between the gas flow formation state and the stop state;
With
Before discharging the processing liquid performed in parallel with the relative movement, the nozzle is moved away from the substrate existing area on the floating stage in a state where the discharging of the processing liquid from the nozzle is stopped. , A free running period is set for relative movement to the substrate presence area,
The gas flow control means temporarily stops the formation of the gas flow in a region immediately below the nozzle during at least a part of the idle running period.
請求項1に記載された基板塗布装置であって、
前記ノズルを、前記浮上ステージの上方空間で昇降させる昇降手段、
をさらに備え、
前記空走期間は、前記ノズルが、所定の待機高さから下降する下降期間と、前記ノズルが下降状態になってから水平方向に前記ノズルを前記基板に対して相対的に接近させる水平移動期間とを有しており、
前記基板上への前記処理液の塗布は、前記下降状態において行われるものであり、
前記空走期間のうち少なくとも前記水平移動期間においては、前記気体流の形成を停止させておくことを特徴とする基板塗布装置。
The substrate coating apparatus according to claim 1,
Elevating means for elevating and lowering the nozzle in the space above the levitation stage,
Further comprising
The idle running period includes a descent period in which the nozzle descends from a predetermined standby height, and a horizontal movement period in which the nozzle relatively approaches the substrate in the horizontal direction after the nozzle is in a descent state. And
Application of the treatment liquid on the substrate is performed in the lowered state,
The substrate coating apparatus, wherein the formation of the gas flow is stopped during at least the horizontal movement period of the idle running period.
請求項1または2に記載された基板塗布装置であって、
前記浮上ステージにおいては、それぞれに気体孔が形成された複数の気体流形成領域が、別プレートまたは1つのプレートの別部分として隣接配置されており、
前記複数の気体流形成領域のそれぞれに対応して気体流路の開閉機構が設けられており、
前記気体流制御手段は、
前記開閉機構を用いた前記気体流の形成の一時的な停止を、前記複数の気体流形成領域のうち、前記ノズルの直下に存在するとともにその上には前記基板が存在しない領域についてのみ行うことを特徴とする基板塗布装置。
The substrate coating apparatus according to claim 1 or 2,
In the levitation stage, a plurality of gas flow forming regions each having a gas hole are disposed adjacent to each other as another plate or another portion of one plate,
A gas flow path opening / closing mechanism is provided corresponding to each of the plurality of gas flow forming regions,
The gas flow control means includes
Temporarily stopping the formation of the gas flow using the opening / closing mechanism is performed only in a region of the plurality of gas flow formation regions that exists immediately below the nozzle and does not have the substrate thereon. A substrate coating apparatus characterized by the above.
請求項1ないし3のいずれかに記載された基板塗布装置であって、
前記気体流の一時的な停止の後、前記基板の塗布開始位置から前記ノズルが前記処理液の吐出を開始するまでに、前記浮上ステージのすべての気体孔を用いた気体流の形成を再開することを特徴とする基板塗布装置。
A substrate coating apparatus according to any one of claims 1 to 3,
After the gas flow is temporarily stopped, the formation of the gas flow using all the gas holes of the levitation stage is resumed from the application start position of the substrate until the nozzle starts to discharge the processing liquid. A substrate coating apparatus.
請求項1ないし4のいずれかに記載された基板塗布装置であって、
前記基板の浮上高さを測定する浮上高さ測定手段、
をさらに備えるとともに、
前記処理液供給手段は、
前記ノズルのうち、前記相対的な移動において前方に相当する側に取付けられて前記ノズルの先端を保護する保護部材をさらに備え、
前記浮上高さ測定手段が前記基板端部の塗布開始位置の浮上高さを検出しつつ前記ノズルを下降させてから、前記ノズルと前記基板とを相対的に移動させることにより、前記保護部材が前記ノズルよりも先に基板端部に進入することを特徴とする基板塗布装置。
A substrate coating apparatus according to any one of claims 1 to 4, wherein
A flying height measuring means for measuring the flying height of the substrate;
And further comprising
The treatment liquid supply means includes
A protective member that is attached to a side corresponding to the front in the relative movement of the nozzle and protects the tip of the nozzle;
The protective member is moved by moving the nozzle and the substrate relatively after the flying height measuring means lowers the nozzle while detecting the flying height at the application start position of the substrate end. A substrate coating apparatus, wherein the substrate coating apparatus enters the substrate end portion before the nozzle.
請求項1ないし5のいずれかに記載された基板塗布装置であって、
前記気体流の形成の一時的な停止による前記基板の温度変動の許容値があらかじめ決定されており、
前記気体流の形成の前記一時的な停止状態の継続時間は、前記温度変動が前記許容値以下となる時間として決定されていることを特徴とする基板塗布装置。
A substrate coating apparatus according to any one of claims 1 to 5,
An allowable value of the temperature variation of the substrate due to the temporary stop of the formation of the gas flow is determined in advance;
The duration of the temporary stop state of the formation of the gas flow is determined as a time during which the temperature fluctuation is equal to or less than the allowable value.
請求項1ないし6のいずれかに記載された基板塗布装置であって、
前記浮上ステージには、前記気体を噴出する複数の噴出孔と、前記気体を吸引する複数の吸引孔とが混在して形成されており、
前記気体流は、前記複数の噴出孔から噴出した圧力気体が前記複数の吸引孔から吸引される過程において発生しており、
前記気体流制御手段は、前記複数の噴出孔への気体供給経路の開閉と、前記複数の吸引孔からの気体吸引経路の開閉とによって、前記気体流の形成状態と停止状態とを切り替えることを特徴とする基板塗布装置。
A substrate coating apparatus according to any one of claims 1 to 6,
The levitation stage is formed by mixing a plurality of ejection holes for ejecting the gas and a plurality of suction holes for sucking the gas,
The gas flow is generated in a process in which the pressure gas ejected from the plurality of ejection holes is sucked from the plurality of suction holes,
The gas flow control means switches between the formation state and the stop state of the gas flow by opening and closing a gas supply path to the plurality of ejection holes and opening and closing a gas suction path from the plurality of suction holes. A substrate coating apparatus.
所定のノズルから吐出した処理液を基板に塗布するための方法であって、
ステージ面に設けた気体孔を通る気体流により前記ステージ面上に圧力気体層を形成し、前記圧力気体層によって基板を浮上させる工程と、
前記ステージ面のうち、基板存在領域を外れており、かつノズルの直下となっている特定領域について前記気体流を一時的に停止する工程と、
所定の待機高さから前記特定領域に向けてノズルを降下させる工程と、
前記ノズルと前記基板とを相対的に移動させて前記ノズルを前記基板の塗布開始位置の上に到達させ、前記ノズルからの前記処理液の吐出を開始する工程と、
前記処理液の吐出を開始するまでに、前記特定領域についての前記気体流の形成を再開する工程と、
を備えることを特徴とする基板塗布方法。
A method for applying a processing liquid discharged from a predetermined nozzle to a substrate,
Forming a pressure gas layer on the stage surface by a gas flow through the gas hole provided on the stage surface, as engineering where Ru is floating the substrate by the pressure gas layer,
A step of temporarily stopping the gas flow for a specific area of the stage surface that is out of the substrate existing area and directly under the nozzle;
Lowering the nozzle from a predetermined standby height toward the specific area;
Relatively moving the nozzle and the substrate to cause the nozzle to reach the application start position of the substrate, and starting the discharge of the processing liquid from the nozzle;
Resuming the formation of the gas flow for the specific region before starting the discharge of the treatment liquid;
A substrate coating method comprising:
JP2009079303A 2009-03-27 2009-03-27 Substrate coating apparatus and substrate coating method Active JP5346643B2 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009079303A JP5346643B2 (en) 2009-03-27 2009-03-27 Substrate coating apparatus and substrate coating method
TW099106182A TWI433731B (en) 2009-03-27 2010-03-03 Substrate coating apparatus and substrate coating method
KR1020100026320A KR101222387B1 (en) 2009-03-27 2010-03-24 Substrate coating apparatus and substrate coating method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009079303A JP5346643B2 (en) 2009-03-27 2009-03-27 Substrate coating apparatus and substrate coating method

Publications (3)

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JP2010227850A JP2010227850A (en) 2010-10-14
JP2010227850A5 true JP2010227850A5 (en) 2010-12-09
JP5346643B2 JP5346643B2 (en) 2013-11-20

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CN102974508B (en) * 2012-12-10 2016-08-10 京东方科技集团股份有限公司 Spraying nozzle protector, coating nozzle component
JP6737649B2 (en) * 2016-07-04 2020-08-12 株式会社Screenホールディングス Coating device and coating method
JP2018043200A (en) * 2016-09-15 2018-03-22 株式会社Screenホールディングス Coating applicator and application method
JP6905830B2 (en) * 2017-01-11 2021-07-21 株式会社Screenホールディングス Substrate processing equipment and substrate processing method
JP2018113327A (en) * 2017-01-11 2018-07-19 株式会社Screenホールディングス Substrate processing apparatus
JP7029248B2 (en) * 2017-08-22 2022-03-03 Hoya株式会社 Manufacturing method of mask blank with resist film and photomask
CN107790329A (en) * 2017-10-27 2018-03-13 珠海市博杰电子有限公司 A kind of high-speed high-precision point gum machine
US10804133B2 (en) 2017-11-21 2020-10-13 Taiwan Semiconductor Manufacturing Co., Ltd. Article transferring method in semiconductor fabrication
JP6738373B2 (en) * 2018-05-31 2020-08-12 株式会社Screenホールディングス Substrate processing apparatus and substrate processing method

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JP4325084B2 (en) * 2000-06-19 2009-09-02 東レ株式会社 Coating method and color filter manufacturing method using the same
JP4670182B2 (en) * 2001-05-25 2011-04-13 凸版印刷株式会社 Single plate continuous coating equipment
JP4429825B2 (en) 2004-06-30 2010-03-10 東京エレクトロン株式会社 Substrate processing equipment
JP4673180B2 (en) 2005-10-13 2011-04-20 東京エレクトロン株式会社 Coating apparatus and coating method
JP4594241B2 (en) * 2006-01-06 2010-12-08 東京エレクトロン株式会社 Substrate transport apparatus, substrate transport method, and computer program
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