JP2010180425A - Electrical contact and production method therefor - Google Patents

Electrical contact and production method therefor Download PDF

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JP2010180425A
JP2010180425A JP2009022194A JP2009022194A JP2010180425A JP 2010180425 A JP2010180425 A JP 2010180425A JP 2009022194 A JP2009022194 A JP 2009022194A JP 2009022194 A JP2009022194 A JP 2009022194A JP 2010180425 A JP2010180425 A JP 2010180425A
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electrical contact
noble metal
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Shinichi Nagano
真一 長野
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Alps Alpine Co Ltd
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Alps Electric Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To solve a problem that a plated noble-metal film for an electrical contact or a plated Ni film to be used as the underlayer lowers a contact performance or the adhesiveness of the plated film when having a large amount of a brightener deposited on the surface of the plated film, though the films are required to be dense and have superior corrosion resistance. <P>SOLUTION: This production method includes reducing the amount of the brightener contained in the plated noble-metal film of Au and Ag of the electrical contact and the plated Ni film to be used as the underlayer of the films, in the surface of the film, compared to the inner part of the film. Thereby obtained plated film has the surface superior in the contact performance or the adhesiveness of the plated film, though being dense because of containing crystal grains with small grain sizes in the inner part, which constitute the plated film. The plated film containing different amounts of the brightener in the plated film is produced by controlling the current density on the surface of the substrate, for instance, by changing a distance between the anode and a substrate, through tilting the anode or curving the anode to change the shape. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

本発明は、スイッチ、コネクタ等の表面に貴金属膜がめっきされた電気接点及びその製造方法に関する。   The present invention relates to an electrical contact in which a noble metal film is plated on the surface of a switch, a connector, or the like, and a manufacturing method thereof.

従来より、めっきなどの表面処理では形成される膜の均一性が求められており、これはスイッチやコネクタ等の電気接点に用いられるAu(金)またはAg(銀)などの貴金属めっき、およびこれらのめっきの下地であるNi(ニッケル)めっきでも同じであった。   Conventionally, surface uniformity such as plating has required uniformity of the formed film, which includes precious metal plating such as Au (gold) or Ag (silver) used for electrical contacts such as switches and connectors, and these The same was true for Ni (nickel) plating, which is the base of the plating.

例えば、下記特許文献1では、電極の形状を変えて電流密度を均一化し、めっき膜中の合金組成および被膜特性を均一にしている。また、下記特許文献2では、電極を分割して独立に制御して電流密度のばらつきを抑えて、めっき付着量の均一化を図っている。   For example, in Patent Document 1 described below, the current density is made uniform by changing the shape of the electrode, and the alloy composition and coating properties in the plating film are made uniform. Further, in Patent Document 2 below, the electrodes are divided and controlled independently to suppress variations in current density, thereby achieving uniform plating adhesion.

特開昭62−188799号公報Japanese Patent Laid-Open No. 62-188799 特開昭63−293200号公報JP 63-293200 A

ところで、AuまたはAgなどの貴金属めっき、またはNi下地めっきでは、めっき浴に光沢剤を添加する。従来では、上記のようにめっき膜を均一に形成しており、前記添加剤もめっき膜全体にほぼ均一に含まれていた。   By the way, in noble metal plating such as Au or Ag, or Ni base plating, a brightener is added to the plating bath. Conventionally, the plating film is uniformly formed as described above, and the additive is also contained almost uniformly in the entire plating film.

ところで、光沢剤がめっき膜全体に多く含まれ、めっき膜表面に析出する前記光沢剤の量が多いと、接触性能が低下する、あるいはその上に形成されるめっき層との密着性が悪くなるという問題があった。   By the way, if the brightening agent is contained in the entire plating film and the amount of the brightening agent deposited on the plating film surface is large, the contact performance is lowered or the adhesion with the plating layer formed thereon is deteriorated. There was a problem.

そこで、例えば、めっき膜を多層めっきで形成し、このとき各めっき膜の表面に多量の光沢剤が析出するのを防ぐために各めっき膜をめっき形成するたびに表面活性化処理を行う方法もあったが、かかる方法では製造工程が複雑化し且つ製造コストも高くなり生産性が悪かった。   Therefore, for example, there is a method of forming a plating film by multi-layer plating and performing a surface activation treatment each time each plating film is formed in order to prevent a large amount of brightener from being deposited on the surface of each plating film. However, in this method, the manufacturing process is complicated and the manufacturing cost is high, and the productivity is poor.

一方、めっき膜中に含まれる前記光沢剤がめっき膜全体に少ないと、めっき膜の結晶粒径が全体的に大きくなり、緻密なめっき膜が得られず耐食性が低下する問題が発生した。   On the other hand, when the brightening agent contained in the plating film is small in the entire plating film, the crystal grain size of the plating film increases as a whole, and a dense plating film cannot be obtained, resulting in a problem that the corrosion resistance is lowered.

そこで本発明は上記従来の問題を解決するものであり、特に、緻密なめっき膜でありながら、めっき表面の接触性能または密着性に優れた電気接点およびその製造方法を提供することを目的としている。   Therefore, the present invention solves the above-mentioned conventional problems, and in particular, an object of the present invention is to provide an electrical contact excellent in contact performance or adhesion on a plating surface and a manufacturing method thereof, while being a dense plating film. .

本発明は、AuまたはAgでめっき形成された貴金属膜を有する電気接点において、
前記貴金属膜に含まれる光沢剤量が、前記貴金属膜の膜内部に比べて膜表面で少なくなっており、前記貴金属膜を構成する結晶粒の粒子径が、前記膜表面に比べて前記膜内部で小さくなっていることを特徴とするものである。
これにより、緻密で耐食性に優れ且つ接触性能に優れた電気接点を得ることができる。
The present invention relates to an electrical contact having a noble metal film plated with Au or Ag.
The amount of brightener contained in the noble metal film is smaller on the film surface than on the inside of the noble metal film, and the particle diameter of the crystal grains constituting the noble metal film is on the inside of the film compared to the film surface. It is characterized by being smaller.
Thereby, it is possible to obtain a dense electrical contact having excellent corrosion resistance and excellent contact performance.

または本発明は、めっき形成されたNi膜と、前記Ni膜の表面にAuまたはAgでめっき形成された貴金属膜とを有する電気接点において、
前記Ni膜に含まれる光沢剤量が、前記Ni膜の膜内部に比べて膜表面で少なくなっており、前記Ni膜を構成する結晶粒の粒子径が、前記膜表面に比べて前記膜内部で小さくなっていることを特徴とするものである。
Alternatively, the present invention relates to an electrical contact having a plated Ni film and a noble metal film plated with Au or Ag on the surface of the Ni film.
The amount of brightener contained in the Ni film is smaller on the film surface than on the inside of the Ni film, and the particle diameter of the crystal grains constituting the Ni film is on the inside of the film compared to the film surface. It is characterized by being smaller.

これにより、緻密で耐食性に優れ且つNi膜と貴金属膜間の密着性に優れた電気接点を得ることができる。   Thereby, it is possible to obtain a dense electrical contact having excellent corrosion resistance and excellent adhesion between the Ni film and the noble metal film.

また、本発明は、AuまたはAgの貴金属膜を有する電気接点の製造方法において、
光沢剤が添加されためっき槽内で前記貴金属膜を電解めっき法にてめっき形成するとき、前記貴金属膜の膜内部をめっき形成する際の電流密度に比べて膜表面をめっき形成する際の電流密度を小さくして、前記貴金属膜に含まれる光沢剤量を、前記膜内部に比べて膜表面で少なくすることを特徴とするものである。
Further, the present invention relates to a method for manufacturing an electrical contact having a noble metal film of Au or Ag.
When the noble metal film is plated by electrolytic plating in a plating bath to which a brightener is added, the current when the film surface is plated compared to the current density when the inside of the noble metal film is plated. The density is reduced, and the amount of the brightener contained in the noble metal film is reduced on the film surface as compared with the inside of the film.

あるいは、本発明は、Ni膜とAuまたはAgの貴金属膜とが積層めっきされた電気接点の製造方法において、
光沢剤が添加されためっき槽内で前記Ni膜を電解めっき法にてめっき形成するとき、前記Ni膜の膜内部をめっき形成する際の電流密度に比べて膜表面をめっき形成する際の電流密度を小さくして、前記Ni膜に含まれる光沢剤量を、前記膜内部に比べて膜表面で少なくする工程、
前記Ni膜の表面に、前記貴金属膜をめっき形成する工程、
を有することを特徴とするものである。
Alternatively, the present invention provides a method for producing an electrical contact in which a Ni film and a noble metal film of Au or Ag are laminated and plated.
When the Ni film is formed by electroplating in a plating tank to which a brightening agent has been added, the current when the film surface is plated compared to the current density when the inside of the Ni film is formed by plating. Reducing the density and reducing the amount of brightener contained in the Ni film on the film surface compared to the inside of the film;
Plating the noble metal film on the surface of the Ni film;
It is characterized by having.

本発明では電流密度を変化させることで、適切且つ簡単に、めっき膜の内部と表面に析出する光沢剤量を異ならせることができる。上記のように電流密度を調整することで、めっき膜の膜表面に析出する光沢剤量を、膜内部に比べて少なくできる。しかも、前記膜内部での光沢剤量を多くできるため、膜内部での結晶粒の粒径を膜表面に比べて小さくでき緻密化できる。   In the present invention, the amount of brightener deposited on the inside and the surface of the plating film can be varied appropriately and simply by changing the current density. By adjusting the current density as described above, the amount of brightener deposited on the surface of the plating film can be reduced as compared with the inside of the film. In addition, since the amount of the brightening agent inside the film can be increased, the grain size of the crystal grains inside the film can be made smaller than that of the film surface, and densification can be achieved.

本発明では、前記めっき槽に設けられた陽極と、陰極である基板表面に設けられた前記電気接点の形成領域との間の距離を変えて、前記電流密度を変化させることが好ましい。   In the present invention, it is preferable to change the current density by changing a distance between an anode provided in the plating tank and a region where the electrical contact is provided on the substrate surface which is a cathode.

あるいは本発明では、前記めっき槽に設けられた陽極と、陰極である基板表面に設けられた前記電気接点の形成領域との間に開孔を有するマスク板を配置し、開孔径を変化させて、前記電流密度を変化させることが好ましい。   Alternatively, in the present invention, a mask plate having an aperture is disposed between the anode provided in the plating tank and the electrical contact formation region provided on the substrate surface as the cathode, and the aperture diameter is changed. It is preferable to change the current density.

または本発明では、前記めっき槽に複数の陽極を配置し、各陽極に個別に電流密度を調整可能に整流器を接続し、陰極である基板表面に設けられた前記電気接点の形成領域に対向する前記陽極を変化させて、前記電流密度を変化させることが好ましい。
上記により簡単且つ適切に電流密度を変化させることができる。
Alternatively, in the present invention, a plurality of anodes are arranged in the plating tank, a rectifier is connected to each anode so that the current density can be individually adjusted, and the anode is opposed to a region where the electrical contact is provided on the substrate surface. It is preferable to change the current density by changing the anode.
As described above, the current density can be changed easily and appropriately.

本発明の電気接点によれば、緻密で耐食性に優れ且つ接触性能またはめっき膜間の密着性に優れた電気接点を得ることができる。   According to the electrical contact of the present invention, it is possible to obtain a dense electrical contact having excellent corrosion resistance and excellent contact performance or adhesion between plating films.

また本発明の電気接点の製造方法によれば、電流密度の調整により、適切且つ簡単に、めっき膜の膜表面に析出する光沢剤量を、膜内部に比べて少なくできる。しかも、前記膜内部での光沢剤量を多くできるため、膜内部での結晶粒の粒径を膜表面に比べて小さくでき緻密化できる。   Further, according to the method for producing an electrical contact of the present invention, the amount of brightener deposited on the surface of the plating film can be reduced appropriately and easily by adjusting the current density as compared with the inside of the film. In addition, since the amount of the brightening agent inside the film can be increased, the grain size of the crystal grains inside the film can be made smaller than that of the film surface, and densification can be achieved.

第1実施形態の電気接点の部分断面図、The fragmentary sectional view of the electrical contact of a 1st embodiment, 第2実施形態の電気接点の部分断面図、The fragmentary sectional view of the electrical contact of 2nd Embodiment, 電気接点の形成領域を備える基板の部分平面図、A partial plan view of a substrate with a region for forming electrical contacts; めっき槽内の陽極の配置(第1の実施形態)を示す概略図、Schematic showing the arrangement (first embodiment) of the anode in the plating tank, めっき槽内の陽極の配置(第2の実施形態)を示す概略図、Schematic showing the arrangement (second embodiment) of the anode in the plating tank, マスク板を配置しためっき層内の配置(第3の実施形態)を示す概略図、Schematic which shows arrangement | positioning (3rd Embodiment) in the plating layer which has arrange | positioned the mask board, 図6におけるマスク板の平面図、FIG. 6 is a plan view of the mask plate in FIG. めっき槽内の陽極の配置(第4の実施形態)を示す概略図、Schematic which shows arrangement | positioning (4th Embodiment) of the anode in a plating tank,

図1は、第1実施形態の電気接点の部分断面図、図2は、第2実施形態の電気接点の部分断面図、である。   FIG. 1 is a partial cross-sectional view of the electrical contact of the first embodiment, and FIG. 2 is a partial cross-sectional view of the electrical contact of the second embodiment.

図1,図2に示す図中Z方向は高さ方向(膜厚方向)を示し、下から上に向かって積層されためっき膜を示している。   In FIG. 1 and FIG. 2, the Z direction indicates the height direction (film thickness direction), and shows the plating films laminated from the bottom to the top.

図1に示す電気接点は、AuやAgの貴金属膜33を有して構成される。貴金属膜33は膜全体が結晶状態である。   The electrical contact shown in FIG. 1 includes a noble metal film 33 of Au or Ag. The entire noble metal film 33 is in a crystalline state.

前記貴金属膜33は、光沢剤量が多い膜内部33aと、光沢剤量が前記膜内部33aより少ない膜表面33bとで形成される。   The noble metal film 33 is formed by a film interior 33a having a large amount of brightener and a film surface 33b having a smaller amount of brightener than the film interior 33a.

めっきに含まれる光沢剤量が多いと、結晶粒が微細化する。よって、膜内部33aは、結晶粒が小さい緻密なめっき膜であり、耐食性に優れる。例えば、膜内部33aに含まれる光沢剤量は0.01〜1(mg/cm3)である。 If the amount of brightener contained in the plating is large, the crystal grains become finer. Therefore, the film interior 33a is a dense plating film with small crystal grains and is excellent in corrosion resistance. For example, the amount of the brightener contained in the film interior 33a is 0.01 to 1 (mg / cm 3 ).

一方、めっきに含まれる光沢剤量が少ないと、結晶粒が粗大化するが、有機物などの不純物である光沢剤が少ないため、接触抵抗が安定化する。よって、膜表面33bでの接触抵抗を安定にでき、接触性能を向上させることができる。膜表面33bに含まれる光沢剤量は、例えば、0.0001〜0.01(mg/cm3)である。 On the other hand, if the amount of the brightener contained in the plating is small, the crystal grains become coarse, but the contact resistance is stabilized because the brightener that is an impurity such as an organic substance is small. Therefore, the contact resistance on the film surface 33b can be stabilized and the contact performance can be improved. The amount of the brightener contained in the film surface 33b is, for example, 0.0001 to 0.01 (mg / cm 3 ).

貴金属膜33は、図1に示すように、光沢剤量の多い膜内部33aの形成範囲が、光沢剤量の少ない膜表面33bに比べて大きい。このように形成すると、貴金属膜33は緻密な膜で形成される割合が大きいため、より耐食性に優れる。ただし、光沢剤量の少ない膜表面33bを形成しているので、貴金属膜33の接触抵抗を安定にできる。例えば、膜内部33aの膜厚は貴金属膜33の膜厚全体の50〜99%であることが好ましい。   As shown in FIG. 1, the noble metal film 33 has a larger formation range of the film interior 33a with a large amount of the brightener than the film surface 33b with a small amount of the brightener. When formed in this way, the noble metal film 33 is more excellent in corrosion resistance because of a large proportion of the dense film formed. However, since the film surface 33b with a small amount of brightener is formed, the contact resistance of the noble metal film 33 can be stabilized. For example, the film thickness of the film interior 33 a is preferably 50 to 99% of the entire film thickness of the noble metal film 33.

また図1に示す貴金属膜33の膜裏面も、膜表面33bと同様に、光沢剤量が膜内部33aに比べて少なく且つ結晶粒の粒径が膜内部33bに比べて大きくなるように調整されてもよい。これにより貴金属膜33の両面を接触面として形成できる。   Further, the film back surface of the noble metal film 33 shown in FIG. 1 is also adjusted so that the amount of the brightener is smaller than that of the film interior 33a and the crystal grain size is larger than that of the film interior 33b, similarly to the film surface 33b. May be. Thereby, both surfaces of the noble metal film 33 can be formed as contact surfaces.

なお図1に示す貴金属膜33に含まれる光沢剤は例えば、セレンやアンチモン等を含んでいる。   Note that the brightener contained in the noble metal film 33 shown in FIG. 1 contains, for example, selenium, antimony, or the like.

図2に示す実施形態の電気接点は、めっき形成されたNi膜32の表面にAuあるいはAgの貴金属膜33がめっき形成された構成である。   The electrical contact of the embodiment shown in FIG. 2 has a configuration in which a noble metal film 33 of Au or Ag is formed on the surface of the plated Ni film 32 by plating.

図2に示す実施形態では、Ni膜32は、めっきに含まれる光沢剤量が多い膜内部32aと、膜内部32aよりめっきに含まれる光沢剤量が少ない膜表面32bとで形成される。   In the embodiment shown in FIG. 2, the Ni film 32 is formed of a film interior 32 a having a larger amount of brightener contained in plating and a film surface 32 b having a smaller amount of brightener contained in plating than the film interior 32 a.

Ni膜32は、めっきに含まれる光沢剤量が多いと、結晶粒が微細化する。よって、膜内部32aは、結晶粒が小さい緻密なめっき膜であり、耐食性に優れる。例えば、膜内部32aに含まれる光沢剤量は0.01〜1(mg/cm3)である。 When the amount of brightener contained in the plating is large, the Ni film 32 has fine crystal grains. Therefore, the film interior 32a is a dense plating film with small crystal grains and is excellent in corrosion resistance. For example, the amount of the brightener contained in the film interior 32a is 0.01 to 1 (mg / cm 3 ).

一方、めっきに含まれる光沢剤量が少ないと、結晶粒が粗大化するが、有機物などの不純物である光沢剤が少ないため、光沢剤が少ない膜表面33bは、その上にめっきされるAuやAgの貴金属膜33との密着性に優れる。膜表面32bに含まれる光沢剤量は、例えば、0.0001〜0.01(mg/cm3)である。 On the other hand, if the amount of the brightener contained in the plating is small, the crystal grains are coarsened. However, since the brightener that is an impurity such as an organic substance is small, the film surface 33b with a small amount of brightener can be used as Au or Excellent adhesion to Ag noble metal film 33. The amount of the brightener contained in the film surface 32b is, for example, 0.0001 to 0.01 (mg / cm 3 ).

図2に示すように、Ni膜32は光沢剤量の多い膜内部32aの形成範囲が、光沢剤量の少ない膜表面32bに比べて大きい。このように形成すると、Ni膜32は緻密な膜で形成される割合が大きいため、より耐食性に優れる。ただし、光沢剤量の少ない膜表面32bを形成しているので、AuやAgの貴金属膜33との密着性に優れる。例えば、膜内部32aの膜厚はNi膜32の膜厚全体の50〜99%であることが好ましい。   As shown in FIG. 2, in the Ni film 32, the formation range of the film interior 32a with a large amount of brightener is larger than the film surface 32b with a small amount of brightener. When formed in this manner, the Ni film 32 is more excellent in corrosion resistance because the Ni film 32 is formed with a dense film. However, since the film surface 32b with a small amount of brightener is formed, the adhesion with the noble metal film 33 of Au or Ag is excellent. For example, the film thickness of the film interior 32 a is preferably 50 to 99% of the entire film thickness of the Ni film 32.

また図1,図2に示す電気接点の、膜内部32a,33aに含まれる光沢剤量及び結晶粒の大きさの変化は連続的、あるいは段階的である。例えば連続変化では、膜内部32a,33aでの光沢剤量及び結晶粒の大きさがほぼ一定で、膜表面32b,33bでの光沢剤量及び結晶粒の大きさが連続変化する構成、膜内部32a,33aでの光沢剤量及び結晶粒の大きさが連続変化し、膜表面32b,33bでの光沢剤量及び結晶粒の大きさがほぼ一定の構成、膜内部32a,33aから膜表面32b,33bにかけて光沢剤量及び結晶粒の大きさが連続変化する構成にできる。また段階変化の場合、膜内部32a,33a及び膜表面32b,33bでの光沢剤量及び結晶粒の大きさをそれぞれ、ほぼ一定にする構成のほかに、例えば、膜内部32a,33aでの光沢剤量及び結晶粒の大きさを多段階に変化させることもできる。   The change in the amount of brightener and the size of crystal grains contained in the film interiors 32a and 33a of the electrical contacts shown in FIGS. 1 and 2 is continuous or stepwise. For example, in the case of continuous change, the amount of brightener and the size of crystal grains in the film interiors 32a and 33a are substantially constant, and the amount of brightener and crystal grain size on the film surfaces 32b and 33b are continuously changed. The amount of the brightener and the crystal grain size at 32a and 33a are continuously changed, and the amount of the brightener and the crystal grain size at the film surfaces 32b and 33b are substantially constant. From the film interior 32a and 33a to the film surface 32b. , 33b, the amount of brightener and the size of crystal grains can be continuously changed. In the case of step change, in addition to the configuration in which the amount of the brightener and the size of the crystal grains in the film interiors 32a and 33a and the film surfaces 32b and 33b are substantially constant, for example, the gloss in the film interiors 32a and 33a. The amount of the agent and the size of the crystal grains can be changed in multiple stages.

また図2に示す電気接点での貴金属膜33は図1に示す膜表面33bと同様の構成で形成されることが、Ni膜32との密着性および接触性能をより効果的に向上させることができ好適である。ただし、貴金属膜33の内部には、図1の膜内部33aと同様に、結晶粒が小さい緻密な膜を形成することで、密着性且つ接触性能とともに、貴金属膜33の耐食性を効果的に向上させることが可能になる。   Further, the noble metal film 33 at the electrical contact shown in FIG. 2 is formed in the same configuration as the film surface 33b shown in FIG. 1, so that the adhesion and contact performance with the Ni film 32 can be more effectively improved. This is preferable. However, as in the case of the film interior 33a of FIG. 1, a dense film with small crystal grains is formed inside the noble metal film 33, thereby effectively improving the corrosion resistance of the noble metal film 33 as well as adhesion and contact performance. It becomes possible to make it.

なお図2のNi膜32に含まれる光沢剤は、例えば、m−ベンゼンスルフォン酸やブチンジオール、サッカリン等である。   The brightener contained in the Ni film 32 in FIG. 2 is, for example, m-benzenesulfonic acid, butynediol, saccharin, or the like.

第1および第2の実施形態の電気接点の製造方法について説明する。
まず電気接点を電解めっきする形成面を有する基板(フープ材)35を用意する。例えば、基板35の表面にレジスト層36を塗布し、前記レジスト層36に各電気接点の形成領域36aに抜きパターンを形成する。図3に示す斜線部分が残されるレジスト層36の領域である。図3では電気接点の形成領域36aを多数配置している。図3では形成領域36aを円形状としているが、製造する電気接点の形状にしたがって形成領域36aの形状を種々変更する。
A method for manufacturing the electrical contact according to the first and second embodiments will be described.
First, a substrate (hoop material) 35 having a formation surface for electrolytic plating of electrical contacts is prepared. For example, a resist layer 36 is applied to the surface of the substrate 35, and a punching pattern is formed on the resist layer 36 in each electrical contact formation region 36 a. The hatched portion shown in FIG. 3 is the region of the resist layer 36 that remains. In FIG. 3, a large number of electrical contact formation regions 36a are arranged. In FIG. 3, the formation region 36a is circular, but the shape of the formation region 36a is variously changed according to the shape of the electrical contact to be manufactured.

図1に示す貴金属膜33及び図2に示すNi膜32を電解めっき法によりめっき形成するためのめっき浴には光沢剤が含まれる。本実施形態では、電流密度を変化させることで、図1に示す貴金属膜33及び図2に示すNi膜32に含まれる光沢剤を膜内部と膜表面とで変化させている。   A brightening agent is contained in the plating bath for plating the noble metal film 33 shown in FIG. 1 and the Ni film 32 shown in FIG. 2 by electrolytic plating. In the present embodiment, the brightener contained in the noble metal film 33 shown in FIG. 1 and the Ni film 32 shown in FIG. 2 is changed between the inside of the film and the film surface by changing the current density.

図1に示す電気接点の貴金属膜33を電解めっき法にてめっき形成するとき、貴金属膜33の膜内部33aをめっきする際の電流密度に比べて、膜表面33bをめっき形成する際の電流密度を小さく設定する。例えば、膜内部33aをめっき形成する際の電流密度を15〜100(A/dm2)とし、膜表面33bをめっき形成する際の電流密度を10(A/dm2)以下に設定する。 When the noble metal film 33 of the electrical contact shown in FIG. 1 is formed by electroplating, the current density when the film surface 33b is formed as compared with the current density when the inside 33a of the noble metal film 33 is plated. Set to a smaller value. For example, the current density at the time of plating a film inner 33a and 15~100 (A / dm 2), sets the current density at the time of plating the film surface 33b to 10 (A / dm 2) or less.

これにより貴金属膜33に含まれる光沢剤量を膜内部33aで多く、膜表面33bで少なくできる。このように、膜内部33aでの光沢剤量を多くできることで、膜内部33aでの結晶粒の粒径を膜表面33bに比べて小さくでき緻密化できる。   As a result, the amount of the brightener contained in the noble metal film 33 can be increased at the film interior 33a and decreased at the film surface 33b. As described above, since the amount of the brightening agent in the film interior 33a can be increased, the grain size of the crystal grains in the film interior 33a can be made smaller than that of the film surface 33b, and the density can be increased.

次に、電流密度を変化させる具体的方法について説明する。
図4に示すめっき装置では、めっき槽51内に配置される基板(フープ材)35は図4の矢印方向に移動可能に支持されている。
Next, a specific method for changing the current density will be described.
In the plating apparatus shown in FIG. 4, a substrate (hoop material) 35 disposed in the plating tank 51 is supported so as to be movable in the direction of the arrow in FIG.

図4に示すようにめっき層51内に配置される陽極53,53は固定側であり、前記陽極53,53は前記基板35の移動方向に対して傾斜して配置されている。   As shown in FIG. 4, the anodes 53 and 53 disposed in the plating layer 51 are on the fixed side, and the anodes 53 and 53 are disposed to be inclined with respect to the moving direction of the substrate 35.

図4の実施形態では、前記基板35をめっき槽51の左側の入口からめっき浴に入れ、右側の出口から排出する。   In the embodiment of FIG. 4, the substrate 35 is put into the plating bath from the left inlet of the plating tank 51 and discharged from the right outlet.

陽極53には整流器(図示せず)が接続されて電流が制御される。また基板35の移動速度は特に制限はないが、1〜10(m/秒)の範囲が好ましい。   A rectifier (not shown) is connected to the anode 53 to control the current. The moving speed of the substrate 35 is not particularly limited, but is preferably in the range of 1 to 10 (m / sec).

図4に示すように、陽極53を配置することにより、基板35を矢印方向へ移動させると、基板35に設けられた各形成領域36aと陽極53との間の距離が徐々に大きくなり、各形成領域36aに作用する電流密度は、前記基板35の移動に伴って減少する。   As shown in FIG. 4, when the substrate 53 is moved in the direction of the arrow by disposing the anode 53, the distance between each formation region 36a provided on the substrate 35 and the anode 53 gradually increases. The current density acting on the formation region 36a decreases as the substrate 35 moves.

ここで、図1に示す貴金属膜33を例えばAgでめっき形成するときのめっき浴組成(一例)は、以下の通りである。   Here, the plating bath composition (one example) when the noble metal film 33 shown in FIG. 1 is formed by plating with Ag, for example, is as follows.

シアン化銀(AgCN) 100(g/L)
シアン化カリウム(KCN) 100(g/L)
炭酸カリウム(K2CO3) 30(g/L)
光沢剤 2(mg/L)
Silver cyanide (AgCN) 100 (g / L)
Potassium cyanide (KCN) 100 (g / L)
Potassium carbonate (K 2 CO 3 ) 30 (g / L)
Brightener 2 (mg / L)

光沢剤は、アンチモン(Sb)を含む有機化合物が用いられる。また、他に光沢剤としてニッケル(Ni)等の無機物を好適に用いることができる。このめっき浴はAg+イオンを80(g/L)含む。めっき浴は液温35〜40℃、pH11〜13の範囲となるように管理することが好ましい。また、陽極としては、銀板又は、白金めっきチタン材を用いることが好ましい。 As the brightener, an organic compound containing antimony (Sb) is used. In addition, an inorganic material such as nickel (Ni) can be suitably used as a brightener. This plating bath contains 80 (g / L) Ag + ions. It is preferable to manage the plating bath so that the temperature of the solution is 35 to 40 ° C. and the pH is 11 to 13. Moreover, it is preferable to use a silver plate or a platinum plating titanium material as an anode.

あるいは図2に示すNi膜32をめっき形成するときのめっき浴組成(一例)は、以下の通りである。   Alternatively, the plating bath composition (one example) when the Ni film 32 shown in FIG. 2 is formed by plating is as follows.

硫酸ニッケル(NiSO4 184.6(g/L)
塩化ニッケル(NiCl2・6H2O) 36.6(g/L)
ホウ酸(H3BO3) 45(g/L)
光沢剤 5(g/L)
Nickel sulfate (NiSO 4 ) 184.6 (g / L)
Nickel chloride (NiCl 2 · 6H 2 O) 36.6 (g / L)
Boric acid (H 3 BO 3 ) 45 (g / L)
Brightener 5 (g / L)

光沢剤は、m−ベンゼンスルフォン酸が用いられる。また、光沢剤としては、ブチンジオール、サッカリン等などの有機光沢剤が好適に用いられる。このめっき浴はNi2+イオンを70(g/L)、Cl-イオンを20(g/L)含む。めっき浴は液温40〜55℃、pH3.5〜4.5の範囲となるように管理することが好ましい。また、陽極としては、ニッケル板を用いることが好ましい。 As the brightening agent, m-benzenesulfonic acid is used. As the brightener, organic brighteners such as butynediol and saccharin are preferably used. This plating bath contains 70 (g / L) Ni 2+ ions and 20 (g / L) Cl ions. It is preferable to manage the plating bath so that the liquid temperature is in the range of 40 to 55 ° C. and the pH is in the range of 3.5 to 4.5. Moreover, it is preferable to use a nickel plate as an anode.

本実施形態では、図4に示すめっき装置を用いることで、上記しためっき浴の組成を変えずとも、図1に示すAg膜(貴金属膜33)や図2のNi膜32に含まれる光沢剤量を膜内部32a,33aで多く膜表面32b,33bで少なくできる。   In the present embodiment, the brightener contained in the Ag film (noble metal film 33) shown in FIG. 1 or the Ni film 32 shown in FIG. 2 can be used without changing the composition of the plating bath by using the plating apparatus shown in FIG. The amount can be increased at the film interiors 32a and 33a and decreased at the film surfaces 32b and 33b.

図4に示す形態では、陽極53の傾斜角が基板35の移動方向に対してほぼ一定になっているが、図5のように、陽極53の傾斜角度を途中から変えることもできる。   In the form shown in FIG. 4, the inclination angle of the anode 53 is substantially constant with respect to the moving direction of the substrate 35, but the inclination angle of the anode 53 can be changed from the middle as shown in FIG.

図5では、基板35の移動方向の途中から出口まで基板35の移動方向に対する陽極53の傾斜角度が急激に大きくなっている。   In FIG. 5, the inclination angle of the anode 53 with respect to the moving direction of the substrate 35 increases rapidly from the middle of the moving direction of the substrate 35 to the exit.

図5では、各形成領域36aにおいてめっき形成される図1の貴金属膜33やNi膜32の膜内部32a,33aに含まれる光沢剤量をほぼ一定にでき(あるいは増加率が非常に小さく)、膜表面32b,33bで急激に少なくできる。   In FIG. 5, the amount of the brightener contained in the noble metal film 33 of FIG. 1 and the film interiors 32a, 33a of the Ni film 32 formed in each forming region 36a can be made substantially constant (or the increase rate is very small). The film surfaces 32b and 33b can be reduced rapidly.

図4、図5に示す実施形態では、陽極53は、基板35の移動方向に対して傾斜しているので、各形成領域36aにめっき形成される図1の貴金属膜33や図2のNi膜32に含まれる光沢剤量は連続的に変化しやすい。一方、陽極53を基板35の移動方向に対して階段状に配置することで、前記光沢剤量を段階的に変化させることができる。   In the embodiment shown in FIGS. 4 and 5, since the anode 53 is inclined with respect to the moving direction of the substrate 35, the noble metal film 33 shown in FIG. 1 and the Ni film shown in FIG. The amount of the brightener contained in 32 tends to change continuously. On the other hand, by arranging the anode 53 stepwise with respect to the moving direction of the substrate 35, the amount of the brightener can be changed stepwise.

なお、図4、図5では、いずれも2つの陽極53,53を備え、前記陽極53,53の間に陰極である基板35を介在させているが、これにより基板35の両面に電気接点をめっき形成できる。当然、陽極53を一つとし、基板35の片面にのみ電気接点をめっき形成することもできる。以下、図6、図8の実施形態においても同様である。   4 and 5 each include two anodes 53 and 53, and a substrate 35 serving as a cathode is interposed between the anodes 53 and 53, whereby electrical contacts are provided on both surfaces of the substrate 35. Plating can be formed. Of course, it is also possible to have only one anode 53 and to form an electrical contact on only one side of the substrate 35 by plating. The same applies to the embodiments shown in FIGS.

次に、図6に示す実施形態では、陽極53は基板35に対して平行に配置されているが、陰極である基板35と陽極53との間に複数の開孔55を有するマスク板54を配置している。このマスク板54は、例えば、図7の平面図に示されるように、開孔径の異なる複数の開孔55が基板35の移動方向に沿って並んで設けられている。   Next, in the embodiment shown in FIG. 6, the anode 53 is arranged in parallel to the substrate 35, but a mask plate 54 having a plurality of openings 55 between the substrate 35 that is a cathode and the anode 53 is provided. It is arranged. For example, as shown in the plan view of FIG. 7, the mask plate 54 is provided with a plurality of apertures 55 having different aperture diameters along the moving direction of the substrate 35.

図6に示されるように、各開孔55の開孔径が基板35の移動方向における入口側から出口側に向かって順次小さくなるように形成されたマスク板54を用い、前記基板35を矢印方向に移動させると、基板35表面に形成された電気接点の各形成領域36aに対する電流密度が前記基板35の移動に伴って徐々に小さくなるので、各形成領域36aにめっき形成される図1に示す貴金属膜33や図2に示すNi膜32の膜内部32a,33aでの光沢剤量を多く、膜表面32b,33bでの光沢剤量を少なく調整できる。   As shown in FIG. 6, a mask plate 54 formed so that the aperture diameter of each aperture 55 gradually decreases from the entrance side to the exit side in the movement direction of the substrate 35 is used. 1, the current density with respect to each formation region 36 a of the electrical contacts formed on the surface of the substrate 35 gradually decreases with the movement of the substrate 35, so that each formation region 36 a is plated as shown in FIG. 1. It is possible to adjust the amount of the brightener on the noble metal film 33 or the Ni film 32 shown in FIG.

図8に示す実施形態では、陽極53は基板35の移動方向に沿って複数に分割された分割陽極53a〜53fにされている。分割陽極53a〜53fは、それぞれ整流器56a〜56fに接続されて電流が制御され、各分割陽極53a〜53fにおいて、個別に電流密度を調整可能となっている。   In the embodiment shown in FIG. 8, the anode 53 is divided anodes 53 a to 53 f that are divided into a plurality along the moving direction of the substrate 35. The divided anodes 53a to 53f are connected to rectifiers 56a to 56f, respectively, to control the current, and the current density can be individually adjusted in each of the divided anodes 53a to 53f.

図8に示すように陰極側である基板35を矢印方向に移動させると、各接点電極の形成領域36aに対向する分割陽極53a〜53fが次々と変わる。このため、基板35の移動に伴って、各形成領域36aに作用する電流密度を変化させることができる。本実施形態では、基板35の移動方向に向けて、次々に対向する陽極との電流密度が小さくなるように調整することで、各形成領域36aにめっき形成される図1に示す貴金属膜33や図2に示すNi膜32の膜内部32a,33aでの光沢剤量を多く膜表面32b,33bでの光沢剤量を少なくできる。   As shown in FIG. 8, when the substrate 35 on the cathode side is moved in the direction of the arrow, the divided anodes 53a to 53f facing the contact electrode formation regions 36a change one after another. For this reason, with the movement of the substrate 35, the current density acting on each formation region 36a can be changed. In the present embodiment, the noble metal film 33 shown in FIG. 1 formed by plating in each formation region 36a is adjusted by adjusting the current density with the anodes facing each other successively in the moving direction of the substrate 35. It is possible to increase the amount of brightener in the film interiors 32a and 33a of the Ni film 32 shown in FIG. 2 and to reduce the amount of brightener on the film surfaces 32b and 33b.

図2に示す電気接点の製造方法では、Ni膜32を電解めっき法にてめっき形成した後、別のめっき槽に移動させて、Ni膜32の表面に貴金属膜33を電解めっき法によりめっき形成する。このとき、貴金属膜33を図1に示す膜表面33bと同様の構成でめっき形成することが、Ni膜32との密着性および接触性能をより効果的に向上させることができ好適である。よって、貴金属膜33をめっき形成するめっき槽では、例えば基板と陽極との間の距離を離すことで、電流密度を小さくして、貴金属膜33に含まれる光沢剤量を減らすことが好ましい。ただし、図2における貴金属膜33の内部には、図1の膜内部33aと同様に、光沢剤量を増やして結晶粒が小さい緻密な膜を形成すべく、電流密度を膜内部のめっきの際に大きくすることで、密着性および接触性能とともに、貴金属膜33の耐食性を効果的に向上させることが可能になる。   In the electrical contact manufacturing method shown in FIG. 2, after the Ni film 32 is formed by electroplating, it is moved to another plating tank, and a noble metal film 33 is formed on the surface of the Ni film 32 by electroplating. To do. At this time, it is preferable to form the noble metal film 33 by plating with the same structure as the film surface 33b shown in FIG. 1 because the adhesion and contact performance with the Ni film 32 can be improved more effectively. Therefore, in the plating tank in which the noble metal film 33 is formed by plating, it is preferable to reduce the current density and reduce the amount of the brightener contained in the noble metal film 33, for example, by separating the distance between the substrate and the anode. However, in the noble metal film 33 in FIG. 2, as in the film interior 33a in FIG. 1, in order to form a dense film with a small amount of crystal grains by increasing the amount of brightener, the current density is set at the time of plating inside the film. By increasing the thickness, it is possible to effectively improve the corrosion resistance of the noble metal film 33 as well as the adhesion and contact performance.

図1に示す貴金属膜33や図2に示すNi膜32をバッチ式めっきによって製造することもできる。かかる場合、例えば、図1に示す貴金属膜33の膜内部33aと膜表面33bのそれぞれをめっき形成する各めっき槽を用意し、各めっき槽のめっき浴組成を同じにする。そして、例えば図4に示す構成を利用して、膜内部33aに対するめっき槽での基板と陽極間の距離を、膜表面33bに対するめっき槽での基板と陽極間の距離よりも小さく設定する。   The noble metal film 33 shown in FIG. 1 and the Ni film 32 shown in FIG. 2 can be manufactured by batch plating. In this case, for example, each plating tank for plating each of the film interior 33a and the film surface 33b of the noble metal film 33 shown in FIG. 1 is prepared, and the plating bath composition of each plating tank is made the same. Then, for example, using the configuration shown in FIG. 4, the distance between the substrate and the anode in the plating tank relative to the film interior 33a is set smaller than the distance between the substrate and the anode in the plating tank relative to the film surface 33b.

32 Ni膜
33 貴金属膜
32a、33a 膜内部
32b、33b 膜表面
51 めっき槽
53 陽極
53a〜53b 分割陽極
54 マスク板
55 開孔
56a〜56f 整流器
32 Ni film 33 Noble metal film 32a, 33a Film interior 32b, 33b Film surface 51 Plating tank 53 Anode 53a-53b Divided anode 54 Mask plate 55 Opening 56a-56f Rectifier

Claims (7)

AuまたはAgでめっき形成された貴金属膜を有する電気接点において、
前記貴金属膜に含まれる光沢剤量が、前記貴金属膜の膜内部に比べて膜表面で少なくなっており、前記貴金属膜を構成する結晶粒の粒子径が、前記膜表面に比べて前記膜内部で小さくなっていることを特徴とする電気接点。
In an electrical contact having a noble metal film plated with Au or Ag,
The amount of brightener contained in the noble metal film is smaller on the film surface than on the inside of the noble metal film, and the particle diameter of the crystal grains constituting the noble metal film is on the inside of the film compared to the film surface. An electrical contact characterized by being reduced in size.
めっき形成されたNi膜と、前記Ni膜の表面にAuまたはAgでめっき形成された貴金属膜とを有する電気接点において、
前記Ni膜に含まれる光沢剤量が、前記Ni膜の膜内部に比べて膜表面で少なくなっており、前記Ni膜を構成する結晶粒の粒子径が、前記膜表面に比べて前記膜内部で小さくなっていることを特徴とする電気接点。
In an electrical contact having a plated Ni film and a noble metal film plated with Au or Ag on the surface of the Ni film,
The amount of brightener contained in the Ni film is smaller on the film surface than on the inside of the Ni film, and the particle diameter of the crystal grains constituting the Ni film is on the inside of the film compared to the film surface. An electrical contact characterized by being reduced in size.
AuまたはAgの貴金属膜を有する電気接点の製造方法において、
光沢剤が添加されためっき槽内で前記貴金属膜を電解めっき法にてめっき形成するとき、前記貴金属膜の膜内部をめっき形成する際の電流密度に比べて膜表面をめっき形成する際の電流密度を小さくして、前記貴金属膜に含まれる光沢剤量を、前記膜内部に比べて膜表面で少なくすることを特徴とする電気接点の製造方法。
In a method for manufacturing an electrical contact having a noble metal film of Au or Ag,
When the noble metal film is plated by electrolytic plating in a plating bath to which a brightener is added, the current when the film surface is plated compared to the current density when the inside of the noble metal film is plated. A method for producing an electrical contact, wherein the density is reduced and the amount of brightener contained in the noble metal film is reduced on the film surface as compared with the inside of the film.
Ni膜とAuまたはAgの貴金属膜とが積層めっきされた電気接点の製造方法において、
光沢剤が添加されためっき槽内で前記Ni膜を電解めっき法にてめっき形成するとき、前記Ni膜の膜内部をめっき形成する際の電流密度に比べて膜表面をめっき形成する際の電流密度を小さくして、前記Ni膜に含まれる光沢剤量を、前記膜内部に比べて膜表面で少なくする工程、
前記Ni膜の表面に、前記貴金属膜をめっき形成する工程、
を有することを特徴とする電気接点の製造方法。
In a method for manufacturing an electrical contact in which a Ni film and a noble metal film of Au or Ag are laminated and plated,
When the Ni film is formed by electroplating in a plating tank to which a brightening agent has been added, the current when the film surface is plated compared to the current density when the inside of the Ni film is formed by plating. Reducing the density and reducing the amount of brightener contained in the Ni film on the film surface compared to the inside of the film;
Plating the noble metal film on the surface of the Ni film;
A method for producing an electrical contact, comprising:
前記めっき槽に設けられた陽極と、陰極である基板表面に設けられた前記電気接点の形成領域との間の距離を変えて、前記電流密度を変化させる請求項3又は4に記載の電気接点の製造方法。   5. The electrical contact according to claim 3, wherein the current density is changed by changing a distance between an anode provided in the plating tank and a formation region of the electrical contact provided on a substrate surface which is a cathode. Manufacturing method. 前記めっき槽に設けられた陽極と、陰極である基板表面に設けられた前記電気接点の形成領域との間に開孔を有するマスク板を配置し、開孔径を変化させて、前記電流密度を変化させる請求項3又は4に記載の電気接点の製造方法。   A mask plate having an opening is disposed between the anode provided in the plating tank and the electric contact formation area provided on the substrate surface which is a cathode, and the current density is changed by changing the opening diameter. The method of manufacturing an electrical contact according to claim 3 or 4, wherein the electrical contact is changed. 前記めっき槽に複数の陽極を配置し、各陽極に個別に電流密度を調整可能に整流器を接続し、陰極である基板表面に設けられた前記電気接点の形成領域に対向する前記陽極を変化させて、前記電流密度を変化させる請求項3又は4に記載の電気接点の製造方法。   A plurality of anodes are arranged in the plating tank, rectifiers are connected to the respective anodes so that the current density can be adjusted individually, and the anodes facing the electric contact formation regions provided on the substrate surface as the cathodes are changed. The method for manufacturing an electrical contact according to claim 3 or 4, wherein the current density is changed.
JP2009022194A 2009-02-03 2009-02-03 Electrical contact and production method therefor Withdrawn JP2010180425A (en)

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Cited By (9)

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Publication number Priority date Publication date Assignee Title
JP2012119308A (en) * 2010-11-11 2012-06-21 Dowa Metaltech Kk Silver plating material and method for producing the same
WO2014178259A1 (en) * 2013-04-30 2014-11-06 第一電子工業株式会社 Electronic component
JPWO2014178259A1 (en) * 2013-04-30 2017-02-23 第一電子工業株式会社 Electronic components
US9705221B2 (en) 2013-04-30 2017-07-11 Ddk Ltd. Electronic component
JP2014227572A (en) * 2013-05-22 2014-12-08 住友金属鉱山株式会社 Chemical treatment apparatus
JP2016089186A (en) * 2014-10-30 2016-05-23 京セラサーキットソリューションズ株式会社 Electrolytic plating apparatus
JP2016204719A (en) * 2015-04-27 2016-12-08 Dowaメタルテック株式会社 Silver plated material and method for producing the same
WO2016194738A1 (en) * 2015-06-01 2016-12-08 古河電気工業株式会社 Electrically conductive bar stock and manufacturing method therefor
JPWO2016194738A1 (en) * 2015-06-01 2017-06-15 古河電気工業株式会社 Conductive strip and manufacturing method thereof

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