JP2010133982A5 - - Google Patents

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Publication number
JP2010133982A5
JP2010133982A5 JP2010057524A JP2010057524A JP2010133982A5 JP 2010133982 A5 JP2010133982 A5 JP 2010133982A5 JP 2010057524 A JP2010057524 A JP 2010057524A JP 2010057524 A JP2010057524 A JP 2010057524A JP 2010133982 A5 JP2010133982 A5 JP 2010133982A5
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JP
Japan
Prior art keywords
ray
detector
plane
ray detector
inspection apparatus
Prior art date
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Granted
Application number
JP2010057524A
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English (en)
Japanese (ja)
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JP2010133982A (ja
JP5263204B2 (ja
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Priority to JP2010057524A priority Critical patent/JP5263204B2/ja
Priority claimed from JP2010057524A external-priority patent/JP5263204B2/ja
Publication of JP2010133982A publication Critical patent/JP2010133982A/ja
Publication of JP2010133982A5 publication Critical patent/JP2010133982A5/ja
Application granted granted Critical
Publication of JP5263204B2 publication Critical patent/JP5263204B2/ja
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JP2010057524A 2010-03-15 2010-03-15 Ｘ線検査装置およびｘ線検査方法 Active JP5263204B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2010057524A JP5263204B2 (ja) 2010-03-15 2010-03-15 Ｘ線検査装置およびｘ線検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010057524A JP5263204B2 (ja) 2010-03-15 2010-03-15 Ｘ線検査装置およびｘ線検査方法

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2007337572A Division JP5167810B2 (ja) 2007-12-27 2007-12-27 Ｘ線検査装置

Publications (3)

Publication Number Publication Date
JP2010133982A JP2010133982A (ja) 2010-06-17
JP2010133982A5 true JP2010133982A5 (cg-RX-API-DMAC10.html) 2012-10-11
JP5263204B2 JP5263204B2 (ja) 2013-08-14

Family

ID=42345361

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010057524A Active JP5263204B2 (ja) 2010-03-15 2010-03-15 Ｘ線検査装置およびｘ線検査方法

Country Status (1)

Country Link
JP (1) JP5263204B2 (cg-RX-API-DMAC10.html)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9561008B2 (en) 2010-12-28 2017-02-07 General Electric Company Method of displaying image
JP5811159B2 (ja) 2013-11-14 2015-11-11 オムロン株式会社 電子機器分析装置、ライブラリ提供システム
KR102097508B1 (ko) * 2018-04-11 2020-04-06 한국원자력연구원 비파괴 검사 장치

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03186710A (ja) * 1989-12-18 1991-08-14 Hitachi Ltd Ｘ線断層撮影方法とその装置並びにｘ線発生用ターゲット
JPH0855887A (ja) * 1994-08-10 1996-02-27 Toshiba Corp ラミノグラフ
JPH11133200A (ja) * 1997-10-30 1999-05-21 Nippon Telegr & Teleph Corp <Ntt> Ｘ線走査顕微方法及び顕微鏡
JPH11326242A (ja) * 1998-05-18 1999-11-26 Matsushita Electric Ind Co Ltd Ｘ線検査装置
JP2000046760A (ja) * 1998-05-29 2000-02-18 Shimadzu Corp Ｘ線断層面検査装置
JP4590702B2 (ja) * 2000-08-31 2010-12-01 パナソニック株式会社 Ｘ線検査装置
JP2006162335A (ja) * 2004-12-03 2006-06-22 Nagoya Electric Works Co Ltd Ｘ線検査装置、ｘ線検査方法およびｘ線検査プログラム

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