JP2010133934A5 - - Google Patents

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Publication number
JP2010133934A5
JP2010133934A5 JP2009232065A JP2009232065A JP2010133934A5 JP 2010133934 A5 JP2010133934 A5 JP 2010133934A5 JP 2009232065 A JP2009232065 A JP 2009232065A JP 2009232065 A JP2009232065 A JP 2009232065A JP 2010133934 A5 JP2010133934 A5 JP 2010133934A5
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JP
Japan
Prior art keywords
radiation
specific
measuring device
measurement
angle
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JP2009232065A
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English (en)
Japanese (ja)
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JP2010133934A (ja
JP5808519B2 (ja
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Priority claimed from DE200810051513 external-priority patent/DE102008051513A1/de
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Publication of JP2010133934A publication Critical patent/JP2010133934A/ja
Publication of JP2010133934A5 publication Critical patent/JP2010133934A5/ja
Application granted granted Critical
Publication of JP5808519B2 publication Critical patent/JP5808519B2/ja
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JP2009232065A 2008-10-14 2009-10-06 ２つの測定ユニットを有する表面測定装置 Active JP5808519B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE200810051513 DE102008051513A1 (de) 2008-10-14 2008-10-14 Oberflächenmessgerät mit zwei Messeinheiten
DE102008051513.2 2008-10-14

Publications (3)

Publication Number Publication Date
JP2010133934A JP2010133934A (ja) 2010-06-17
JP2010133934A5 true JP2010133934A5 (enExample) 2012-08-09
JP5808519B2 JP5808519B2 (ja) 2015-11-10

Family

ID=41821310

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009232065A Active JP5808519B2 (ja) 2008-10-14 2009-10-06 ２つの測定ユニットを有する表面測定装置

Country Status (4)

Country Link
US (1) US8928886B2 (enExample)
JP (1) JP5808519B2 (enExample)
CN (1) CN101726472B (enExample)
DE (1) DE102008051513A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5720134B2 (ja) * 2010-04-20 2015-05-20 株式会社リコー 画像検査装置及び画像形成装置
DE102010032600A1 (de) * 2010-07-28 2012-02-02 Byk-Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung von Oberflächeneigenschaften mit Mehrfachmessung
DE102011108599A1 (de) 2011-07-27 2013-01-31 Byk-Gardner Gmbh Vorrichtung und Verfahren zur Untersuchung von Beschichtungen mit Effektpigmenten
DE102011053140B4 (de) * 2011-08-31 2021-11-11 Byk-Gardner Gmbh Vorrichtung und Verfahren zum Messen optischer Eigenschaften von transparenten Materialien
US9025153B2 (en) * 2011-11-16 2015-05-05 Axalta Coating Systems Ip Co., Llc Process for predicting degree of mottling in coating compositions by wet color measurement
US9459206B2 (en) * 2012-05-02 2016-10-04 Datacolor Holding Ag System and apparatus for measurement of light scattering from a sample
JP2014077664A (ja) * 2012-10-09 2014-05-01 Ricoh Co Ltd 光沢性評価方法及び光沢性評価装置
JP6685500B2 (ja) * 2015-07-09 2020-04-22 株式会社リコー 光学センサ、画像形成装置及び対象物判別方法
EP3448010A1 (en) * 2017-08-23 2019-02-27 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. System for analyzing a document and corresponding method
RU178286U1 (ru) * 2017-12-11 2018-03-28 федеральное государственное бюджетное образовательное учреждение высшего образования "Московский государственный технический университет имени Н.Э. Баумана (национальный исследовательский университет)" (МГТУ им. Н.Э. Баумана) Автоматизированное оптико-электронное устройство для диагностики защитных голограмм
KR102599207B1 (ko) * 2018-07-20 2023-12-15 삼성전자 주식회사 전자 디바이스의 표면 측정 장치 및 방법
JP7701863B2 (ja) * 2021-11-26 2025-07-02 株式会社トヨタプロダクションエンジニアリング 光沢度面分布量測定装置

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61145436A (ja) * 1984-12-19 1986-07-03 Nippon Paint Co Ltd 塗膜外観性状評価方法および装置
CN86205111U (zh) * 1986-07-23 1987-08-12 北京毛纺织科学研究所 织物表面变形性测试仪
JPS63295945A (ja) * 1987-05-28 1988-12-02 Nippon Paint Co Ltd 光沢度測定装置
DE4434203C2 (de) * 1994-09-24 2003-06-12 Byk Gardner Gmbh Vorrichtung und Verfahren zum Messen visueller Eigenschaften von Oberflächen
DE19930688A1 (de) * 1999-07-02 2001-01-04 Byk Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung der Qualität von Oberflächen
DE19947819B4 (de) * 1999-10-05 2012-05-16 Byk Gardner Gmbh Verfahren zur Durchführung einer Referenzmessung
JP2001146630A (ja) * 1999-11-12 2001-05-29 Shoji Hyodo 超極細合成繊維を粉砕した微粉末
DE10122917A1 (de) * 2001-05-11 2002-11-14 Byk Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung der Eigenschaften von reflektierenden Körpern
US6914684B1 (en) * 2001-07-05 2005-07-05 Lexmark International, Inc. Method and apparatus for detecting media type
JP2003329586A (ja) * 2002-03-07 2003-11-19 Ricoh Co Ltd 鏡面光沢度予測方法及び鏡面光沢度予測装置
US7742168B2 (en) * 2003-04-29 2010-06-22 Surfoptic Limited Measuring a surface characteristic
DE102004034160A1 (de) * 2004-07-15 2006-02-09 Byk Gardner Gmbh Vorrichtung zur Untersuchung optischer Oberflächeneigenschaften
DE102004034167A1 (de) * 2004-07-15 2006-02-09 Byk Gardner Gmbh Vorrichtung zur goniometrischen Untersuchung optischer Oberflächeneigenschaften
DE202004011811U1 (de) * 2004-07-28 2005-12-08 Byk-Gardner Gmbh Vorrichtung zur goniometrischen Untersuchung optischer Oberflächeneigenschaften
US8016934B2 (en) * 2004-12-16 2011-09-13 Kao Corporation Pearlescent pigment
JP2007033099A (ja) * 2005-07-25 2007-02-08 Fuji Xerox Co Ltd 光沢特性評価方法および光沢特性評価装置並びにプログラム
DE102006032404B4 (de) 2006-07-13 2019-05-09 Byk-Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung von Oberflächeneigenschaften
DE102006037681A1 (de) * 2006-08-11 2008-02-14 Byk-Gardner Gmbh Vorrichtung und Verfahren zur topographischen Bestimmung von Oberflächeneigenschaften
US9404858B2 (en) * 2007-03-22 2016-08-02 Byk-Gardner Gmbh Method and apparatus for determination of surface properties of coatings by determining contrast of an evaluated image
JP2008256454A (ja) * 2007-04-03 2008-10-23 Konica Minolta Sensing Inc 光学特性測定装置および該方法
JP5211784B2 (ja) 2008-03-21 2013-06-12 日産自動車株式会社 通信システム
DE102010032600A1 (de) * 2010-07-28 2012-02-02 Byk-Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung von Oberflächeneigenschaften mit Mehrfachmessung
EP2930494B1 (de) * 2012-11-06 2021-08-04 X-Rite Switzerland GmbH Handmessgerät zur erfassung des visuellen eindrucks eines messobjekts

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