JP2010060563A - 移動レンズマルチビームスキャナを備えたウェハ欠陥検出システム - Google Patents
移動レンズマルチビームスキャナを備えたウェハ欠陥検出システム Download PDFInfo
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- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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Abstract
【解決手段】レーザ光源101からの光ビーム151は、活性領域を有し、複数の移動レンズを活性領域に選択的に生成するようにRF入力信号に対して応答する移動レンズ音響光学デバイス104に適用される。該音響光学デバイスは、生成された移動レンズの各々の焦点のそれぞれで、光ビームを受け、複数のフライングスポットビームを生成するように動作する。該ポットビームは半導体ウェハ108を走査する。使用可能な走査データを生成するために、複数の検出器セクションを有する光検出器ユニット110が使用され、各検出器セクションは、複数の光検出器と、複数の光検出器からの入力を並列に受けるように動作する少なくとも1つのマルチステージ格納デバイスとを有する。格納デバイスの各々に格納された情報は、複数のステージから同時に連続して読み出される。
【選択図】図1
Description
Claims (7)
- 複数の同時走査スポットビームを検出するためのリニア光検出器装置であって、
共通軸に沿って直線的に位置する複数の隣接する光検出器セクションを備え、各検出器セクションが、
複数の隣接する光検出器と、
前記複数の光検出器からの入力を並列に受け、前記複数のステージに格納された情報を連続して読み出すように動作する少なくとも1つのマルチステージ格納デバイスと、
を備える、リニア光検出器。 - 前記各光検出器セクションが、セクション転送信号用の入力と、前記セクションの連続読出し用の出力とを備える、請求項1に記載のリニア光検出器。
- 前記各検出器セクションが、複数のステージを有する一時的なシフトレジスタを備え、前記シフトレジスタが、対応する検出器の内容を並列に各ステージにおいて受け、連続して読み出されるように動作する、請求項2に記載のリニア光検出器。
- セクション転送信号源を更に備え、前記信号源が、複数の前記ステージを連続して読み出すためにセクション転送信号を供給し、前記連続して読み出された信号を搬送するためにバッファを含むデータ出力ラインを供給する、請求項1に記載のリニア検出器装置。
- 各々が第2の複数のピクセル格納要素を備え、第3の複数の同時走査ビームのそれぞれから入力を受ける第1の複数のセクションを有するリニアCCDに格納された複数のピクセルの検出方法であって、
それぞれの信号格納セクションにおいて前記第3の複数のビームの各々の内容を同時に取り込み格納するステップと、
格納された信号を同時に連続して読み出すステップと、
を含む、方法。 - 前記第3の複数のビームの前記走査のタイミングと前記格納信号の前記読出しのタイミングを同期させるステップを更に含む、請求項5に記載の方法。
- 前記取込みおよび格納ステップが、前記第1の複数のセクションの一部分のみにおいて同時に実行される、請求項5に記載の方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/103,560 US6809808B2 (en) | 2002-03-22 | 2002-03-22 | Wafer defect detection system with traveling lens multi-beam scanner |
US10/103,560 | 2002-03-22 |
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JP2003580838A Division JP4423046B2 (ja) | 2002-03-22 | 2003-03-14 | 移動レンズを備えた音響光学デバイスおよびその動作方法 |
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JP2010060563A true JP2010060563A (ja) | 2010-03-18 |
JP5523787B2 JP5523787B2 (ja) | 2014-06-18 |
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JP2003580839A Expired - Fee Related JP4439268B2 (ja) | 2002-03-22 | 2003-03-14 | 移動レンズマルチビームスキャナを備えた暗視野検出装置およびその方法 |
JP2003580838A Expired - Fee Related JP4423046B2 (ja) | 2002-03-22 | 2003-03-14 | 移動レンズを備えた音響光学デバイスおよびその動作方法 |
JP2009240412A Expired - Fee Related JP5523787B2 (ja) | 2002-03-22 | 2009-10-19 | 移動レンズマルチビームスキャナを備えたウェハ欠陥検出システム |
JP2009240418A Expired - Fee Related JP5523788B2 (ja) | 2002-03-22 | 2009-10-19 | 移動レンズマルチビームスキャナを備えたウェハ欠陥検出システム |
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JP2003580839A Expired - Fee Related JP4439268B2 (ja) | 2002-03-22 | 2003-03-14 | 移動レンズマルチビームスキャナを備えた暗視野検出装置およびその方法 |
JP2003580838A Expired - Fee Related JP4423046B2 (ja) | 2002-03-22 | 2003-03-14 | 移動レンズを備えた音響光学デバイスおよびその動作方法 |
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JP2009240418A Expired - Fee Related JP5523788B2 (ja) | 2002-03-22 | 2009-10-19 | 移動レンズマルチビームスキャナを備えたウェハ欠陥検出システム |
Country Status (7)
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US (3) | US6809808B2 (ja) |
EP (3) | EP1490669A4 (ja) |
JP (4) | JP4439268B2 (ja) |
KR (3) | KR101108353B1 (ja) |
CN (3) | CN101738398B (ja) |
AU (2) | AU2003217935A1 (ja) |
WO (2) | WO2003083449A1 (ja) |
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